JPH0327353B2 - - Google Patents

Info

Publication number
JPH0327353B2
JPH0327353B2 JP58225915A JP22591583A JPH0327353B2 JP H0327353 B2 JPH0327353 B2 JP H0327353B2 JP 58225915 A JP58225915 A JP 58225915A JP 22591583 A JP22591583 A JP 22591583A JP H0327353 B2 JPH0327353 B2 JP H0327353B2
Authority
JP
Japan
Prior art keywords
vacuum
chip
electronic component
degree
type electronic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58225915A
Other languages
Japanese (ja)
Other versions
JPS60118481A (en
Inventor
Masayuki Seno
Yoshihiko Misawa
Yoshinobu Hashiguchi
Yoshinobu Maeda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP58225915A priority Critical patent/JPS60118481A/en
Publication of JPS60118481A publication Critical patent/JPS60118481A/en
Publication of JPH0327353B2 publication Critical patent/JPH0327353B2/ja
Granted legal-status Critical Current

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Description

【発明の詳細な説明】 産業上の利用分野 本発明はチツプ型電子部品を吸着し移載、実装
する場合に正常な姿勢で吸着しているか否かを検
出する装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION Field of Industrial Application The present invention relates to an apparatus for detecting whether or not a chip-type electronic component is being picked up in a normal posture when being picked up, transferred, and mounted.

従来例の構成とその問題点 従来のチツプ型電子部品をノズルにて真空吸着
した場合の検出方法は、第1図にその具体構成を
示すように、真空発生器につながる管1を2つに
分岐し、管2、及び3にて空気式ブリツジ回路を
構成し、一方をノズル4、一方を絞り弁5を通じ
て大気に開放する。ノズル4にチツプ型電子部品
6が吸着されると、管2側の真空度が高くなり、
管2と3の間に設けられているマグネツトのフロ
ート7が管2の方に吸上げられる。このとき、こ
のフロートの近傍に設けられているリードスイツ
チ8と9のON、OFFの状態が入れ替り、チツプ
型電子部品6が正常に吸着されているという出力
を発生する。10,11は、管路の空気流量を調
整するオリフイスである。
Conventional configuration and its problems The conventional detection method when chip-type electronic components are vacuum-adsorbed with a nozzle is as follows: As shown in Figure 1, the tube 1 connected to the vacuum generator is divided into two. The pipes 2 and 3 are branched to form a pneumatic bridge circuit, one of which is opened to the atmosphere through a nozzle 4 and the other through a throttle valve 5. When the chip-type electronic component 6 is attracted to the nozzle 4, the degree of vacuum on the tube 2 side increases,
A magnetic float 7 placed between tubes 2 and 3 is drawn up towards tube 2. At this time, the ON and OFF states of reed switches 8 and 9 provided near the float are switched, and an output is generated indicating that the chip-type electronic component 6 is being normally attracted. 10 and 11 are orifices that adjust the air flow rate in the pipe line.

しかしながら上記のような構成では、第2図〜
第3図に示すように、チツプ型電子部品により検
出が不可能な場合が発生する。第2図は角型のチ
ツプ型電子部品6′を吸着した例であり、aは正
常な姿勢でノズル4に吸着されている。bはチツ
プ型電子部品6′が横向きに吸着された状態で、
ノズル4と、チツプ型電子部品6′の間にはすき
ま12ができる。第2図c,d,eは円筒型のチ
ツプ型電子部品6″をノズル4に吸着した例であ
り、cは正常吸着の状態で、ノズル4とチツプ型
電子部品6″との間にすきま12′ができる。dは
チツプ型電子部品6″が立てに吸着された状態で
すきまは発生しない。eは斜めに吸着された状態
ですきま12″ができる。第3図に第2図のa,
b,c,d,eの各々の状態での真空度を示す。
縦軸が真空度を示す。真空度13の部分が第2図
のa、真空度14が第2図のb、真空度15が第
2図のd、真空度16が同c、真空度17が同e
の状態である。
However, in the above configuration, Figure 2~
As shown in FIG. 3, there are cases where detection is impossible due to chip-type electronic components. FIG. 2 shows an example in which a rectangular chip-type electronic component 6' is suctioned, and a is suctioned to the nozzle 4 in a normal posture. b is a state in which the chip-type electronic component 6' is sucked horizontally;
A gap 12 is created between the nozzle 4 and the chip-type electronic component 6'. Figure 2 c, d, and e are examples of a cylindrical chip-type electronic component 6'' being sucked into the nozzle 4, and c is a normal suction state with no gap between the nozzle 4 and the chip-type electronic component 6''. 12' is made. In d, the chip type electronic component 6'' is vertically attracted and no gap is created. In e, the chip type electronic component 6'' is attracted in an oblique manner, and a gap 12'' is created. Figure 3 shows a in Figure 2,
The degree of vacuum in each state of b, c, d, and e is shown.
The vertical axis shows the degree of vacuum. The part with vacuum level 13 is a in Figure 2, the part with vacuum level 14 is part b in Figure 2, the part with vacuum level 15 is part d in Figure 2, the part with vacuum level 16 is part c, and the part with vacuum level 17 is part e.
It is in a state of

前記、従来例においては、真空度が一定のレベ
ルに達したか否のみを判断しているので、このよ
うな様々の状態を判断できないという欠点を有し
ていた。
In the conventional example described above, only whether or not the degree of vacuum has reached a certain level is determined, so it has the drawback that such various states cannot be determined.

発明の目的 本発明は上記欠点に鑑み、ノズルとチツプ型電
子部品の形状と、また吸着された姿勢により発生
するすきまと真空度の関係を求め、正常、異常の
吸着状態を判定する検出方法を提供するものであ
る。
Purpose of the Invention In view of the above-mentioned drawbacks, the present invention provides a detection method for determining the normal or abnormal suction state by determining the relationship between the shape of the nozzle and the chip-type electronic component, and the vacuum level and the gap generated by the suction posture. This is what we provide.

発明の構成 本発明は真空度に比例した出力電圧を発生する
圧力センサーと、所定の真空度に対応する電圧と
前記圧力センサにより発生した出力電圧の電圧値
を比較する複数のコンパレータとを備え、これら
各コンパレータの所定の真空度に対応する電圧
を、電子部品の吸着状態に対応した値に設定し、
かつ真空発生器とこの真空発生器に接続されたノ
ズルとの間に前記圧力センサーを設けたものであ
り様々な形状のチツプ型電子部品の吸着の有無や
姿勢の状態を判断することができるという特有の
効果を有する。
Structure of the Invention The present invention includes a pressure sensor that generates an output voltage proportional to the degree of vacuum, and a plurality of comparators that compare the voltage corresponding to a predetermined degree of vacuum with the voltage value of the output voltage generated by the pressure sensor, The voltage corresponding to the predetermined degree of vacuum of each of these comparators is set to a value corresponding to the adsorption state of the electronic component,
In addition, the pressure sensor is installed between the vacuum generator and the nozzle connected to the vacuum generator, and it is said that it is possible to determine whether or not chip-type electronic components of various shapes are being attracted, and the state of their posture. It has a unique effect.

実施例の説明 以下本発明の一実施例について説明する。第5
図は本発明の実施例における構成図であり、管1
8は真空発生器(図示せず)とノズル4につなが
つている。圧力センサー19は、絶対真空を封入
したチエンバ20が設けられたピエゾ抵抗形圧力
センサーで真空度に正比例したリニア出力電圧が
得られる。21はアンプで出力電圧を増幅する。
22,23,24は各々コンパレータで、アンプ
21よりの電圧と、あらかじめ第4図に示した各
状態での真空度に対応した電圧、例えば、真空度
13と14のしきい値に対応する電圧E1、真空
度15と16のしきい値に対応する電圧E2、真
空度17と18のしきい値に対応する電圧E3
の比較を行うものであり、どのコンパレータの出
力がONになつているかにより、チツプ型電子部
品6の吸着状態の判断が可能となる。25は空気
流量調整用オリフイス、26,27,28はコン
パレータの設定電圧値調整用のボリユウムであ
る。
DESCRIPTION OF EMBODIMENTS An embodiment of the present invention will be described below. Fifth
The figure is a configuration diagram in an embodiment of the present invention, and the pipe 1
8 is connected to a vacuum generator (not shown) and nozzle 4. The pressure sensor 19 is a piezoresistive pressure sensor provided with a chamber 20 that encloses an absolute vacuum, and can obtain a linear output voltage that is directly proportional to the degree of vacuum. 21 is an amplifier that amplifies the output voltage.
Reference numerals 22, 23, and 24 each indicate a comparator, which compares the voltage from the amplifier 21 with the voltage corresponding to the degree of vacuum in each state shown in FIG. 4, for example, the voltage corresponding to the threshold value of degree of vacuum 13 and 14. E 1 , voltage E 2 corresponding to the threshold value for vacuum degrees 15 and 16, and voltage E 3 corresponding to the threshold values for vacuum degrees 17 and 18 are compared, and it is determined which comparator output is ON. The suction state of the chip-type electronic component 6 can be determined based on whether the chip-type electronic component 6 is attached or not. 25 is an orifice for adjusting the air flow rate, and 26, 27, and 28 are volumes for adjusting the set voltage value of the comparator.

第6図は本実施例の概略図であり、ブロツク2
9にノズル4、圧力センサー19、及び管18さ
らにノズル4から流入するゴミを除去するフイル
タ30を組み込んでいる。第5図のアンプ21と
コンパレータ22,23,24及びボリユーム2
6,27,28が第6図基板31に組み込まれて
いる。
FIG. 6 is a schematic diagram of this embodiment, in which block 2
9 incorporates a nozzle 4, a pressure sensor 19, a pipe 18, and a filter 30 for removing dust flowing from the nozzle 4. Amplifier 21, comparators 22, 23, 24 and volume 2 in Fig. 5
6, 27, and 28 are assembled in the substrate 31 in FIG.

発明の効果 以上のように本発明は、真空度に比例した出力
電圧を発生する圧力センサーと、真空度に対応し
て設定された電圧と、圧力センサーの出力電圧を
比較するコンパレータを複数個設けることによ
り、種々の形状のチツプ型電子部品の吸着の有
無、姿勢の状態を判断することができ、チツプ型
電子部品の移載装置や実装機に適用することによ
りその実用的効果は大なるものがある。
Effects of the Invention As described above, the present invention includes a pressure sensor that generates an output voltage proportional to the degree of vacuum, and a plurality of comparators that compare the voltage set corresponding to the degree of vacuum and the output voltage of the pressure sensor. By this, it is possible to judge whether or not chip-shaped electronic components are attracted or not, and the state of their posture, and its practical effects will be great if applied to transfer equipment and mounting machines for chip-shaped electronic components. There is.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来の検出装置の構成図、第2図a,
bは角型のチツプ型電子部品の吸着状態を示す
図、第2図c,d,eは円筒型のチツプ型電子部
品の吸着状態を示す図、第3図は各チツプ型電子
部品の吸着状態と真空度との関係図、第4図は本
発明の一実施例の構成図、第5図は同実施例の概
略見取図である。 4……ノズル、6′……角型のチツプ型電子部
品、6″……円筒型のチツプ型電子部品、13,
14,15,16,17……真空度、19……圧
力センサー、22,23,24……コンパレー
タ。
Figure 1 is a configuration diagram of a conventional detection device, Figure 2a,
b is a diagram showing the suction state of a square chip-type electronic component, Figures 2c, d, and e are diagrams showing the suction state of a cylindrical chip-type electronic component, and Figure 3 is a diagram showing the suction state of each chip-type electronic component. FIG. 4 is a diagram showing the relationship between the state and the degree of vacuum, FIG. 4 is a configuration diagram of an embodiment of the present invention, and FIG. 5 is a schematic diagram of the embodiment. 4...Nozzle, 6'...Square chip type electronic component, 6''...Cylindrical chip type electronic component, 13,
14, 15, 16, 17...Degree of vacuum, 19...Pressure sensor, 22, 23, 24...Comparator.

Claims (1)

【特許請求の範囲】[Claims] 1 電子部品をノズルの先端にて真空吸着し、こ
の電子部品の吸着状態を検出する装置であつて、
真空度に比例した出力電圧を発生する圧力センサ
ーと、所定の真空度に対応する電圧と前記圧力セ
ンサーにより発生した出力電圧の電圧値を比較す
る複数のコンパレータとを備え、これらの各コン
パレータの所定の真空度に対応する電圧を、電子
部品の吸着状態に対応した値に設定し、かつ真空
発生器とこの真空発生器に接続されたノズルとの
間に前記圧力センサーを設けた吸着検出装置。
1 A device for vacuum suctioning electronic components at the tip of a nozzle and detecting the suction state of the electronic components,
It includes a pressure sensor that generates an output voltage proportional to the degree of vacuum, and a plurality of comparators that compare the voltage corresponding to a predetermined degree of vacuum with the voltage value of the output voltage generated by the pressure sensor. A suction detection device, wherein a voltage corresponding to a degree of vacuum is set to a value corresponding to a suction state of an electronic component, and the pressure sensor is provided between a vacuum generator and a nozzle connected to the vacuum generator.
JP58225915A 1983-11-30 1983-11-30 Detector for suction Granted JPS60118481A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58225915A JPS60118481A (en) 1983-11-30 1983-11-30 Detector for suction

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58225915A JPS60118481A (en) 1983-11-30 1983-11-30 Detector for suction

Publications (2)

Publication Number Publication Date
JPS60118481A JPS60118481A (en) 1985-06-25
JPH0327353B2 true JPH0327353B2 (en) 1991-04-15

Family

ID=16836875

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58225915A Granted JPS60118481A (en) 1983-11-30 1983-11-30 Detector for suction

Country Status (1)

Country Link
JP (1) JPS60118481A (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2629738B2 (en) * 1987-09-29 1997-07-16 松下電器産業株式会社 Parts suction detector
JPH0727119Y2 (en) * 1987-10-23 1995-06-21 豊田合成株式会社 Residual material adsorption device
DE69225486T2 (en) * 1991-09-09 1999-01-07 Smc K.K., Tokio/Tokyo DEVICE FOR MONITORING THE FUNCTION OF A SUCTION GRIPPER AND METHOD FOR SETTING THE PRESSURE LEVEL FOR THE FUNCTIONAL MONITORING OF A SUCTION CUP

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49134056A (en) * 1973-04-25 1974-12-24

Also Published As

Publication number Publication date
JPS60118481A (en) 1985-06-25

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