JPH0328480U - - Google Patents
Info
- Publication number
- JPH0328480U JPH0328480U JP8896489U JP8896489U JPH0328480U JP H0328480 U JPH0328480 U JP H0328480U JP 8896489 U JP8896489 U JP 8896489U JP 8896489 U JP8896489 U JP 8896489U JP H0328480 U JPH0328480 U JP H0328480U
- Authority
- JP
- Japan
- Prior art keywords
- signal
- relay
- bias voltage
- voltage source
- under test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000010586 diagram Methods 0.000 description 3
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
Description
第１図はこの出願の第１考案の実施例を示す接
続図、第２図はこの出願の第２考案の実施例を示
す接続図、第３図は従来技術を説明するための接
続図である。
１……ＩＣ試験装置本体、２……ピンエレクト
ロニクスボード、３……被試験ＩＣ、４Ａ……駆
動回路、４……信号取込回路、５……終端抵抗器
、６……リレー、７……第１バイアス電圧源、７
Ａ……第２バイアス電圧源、Ｑ１，Ｑ２……終端
抵抗器に校正信号発生機能を付加するスイツチ素
子、１４……校正信号源。
Fig. 1 is a connection diagram showing an embodiment of the first invention of this application, Fig. 2 is a connection diagram showing an embodiment of the second invention of this application, and Fig. 3 is a connection diagram for explaining the prior art. be. DESCRIPTION OF SYMBOLS 1... IC test equipment main body, 2... Pin electronics board, 3... IC under test, 4A... Drive circuit, 4... Signal acquisition circuit, 5... Terminating resistor, 6... Relay, 7... ...first bias voltage source, 7
A...Second bias voltage source, Q1 , Q2 ...Switch element that adds a calibration signal generation function to the termination resistor, 14...Calibration signal source.
Claims (1)
る駆動回路と、 Ｂ 被試験ＩＣの入出力端子から出力される論
理信号を取り込んで正規のレベルを持つ信号を取
り込む信号取込回路と、 Ｃ 駆動回路と信号取込回路の接続点に一端が
接続されたリレーと、 Ｄ このリレーの他端側に接続された終端抵抗
器と、 Ｅ この終端抵抗器の他端側に接続されたバイ
アス電圧源と、 Ｆ 上記終端抵抗器に流れる電流を制御し、終
端抵抗器に発生する電圧降下を利用して上記信号
取込回路に校正信号を与える一対のスイツチ素子
と、 によつて構成して成るＩＣ試験装置。 (2) Ａ 被試験ＩＣの入出力端子に信号を与え
る駆動回路と、 Ｂ 被試験ＩＣの入出力端子から出力される論
理信号を取り込んで正規のレベルを持つ信号を取
り込む信号取込回路と、 Ｃ 駆動回路と信号取込回路の接続点に一端が
接続されたリレーと、 Ｄ このリレーの他端側に接続された終端抵抗
器と、 Ｅ この終端抵抗器の他端側に設けられた第１
バイアス電圧源と、 Ｆ この第１バイアス電圧源の電圧を校正信号
の一方の論理値とし、校正信号の他方の論理値を
与える第２ハイアス電圧源と、 Ｇ 上記終端抵抗器の他端を上記第１バイアス
電圧源と第２バイアス電圧源とに交互に接続して
校正信号を発生させる切替回路と、 によつて構成して成るＩＣ試験装置。[Scope of Claim for Utility Model Registration] (1) A: A drive circuit that provides signals to the input/output terminals of the IC under test, and B: A signal that takes in the logic signal output from the input/output terminal of the IC under test and has a normal level. C. A relay whose one end is connected to the connection point between the drive circuit and the signal acquisition circuit; D. A terminating resistor connected to the other end of this relay; E. a bias voltage source connected to the other end; F; a pair of switch elements that control the current flowing through the termination resistor and provide a calibration signal to the signal acquisition circuit using the voltage drop generated in the termination resistor; An IC testing device comprising: and. (2) A: a drive circuit that provides signals to the input/output terminals of the IC under test; B: a signal capture circuit that captures logic signals output from the input/output terminals of the IC under test and captures signals with normal levels; C A relay whose one end is connected to the connection point between the drive circuit and the signal acquisition circuit, D A terminating resistor connected to the other end of this relay, E A relay connected to the other end of this terminating resistor. 1
a bias voltage source; An IC testing device comprising: a switching circuit that is alternately connected to a first bias voltage source and a second bias voltage source to generate a calibration signal;
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8896489U JP2532081Y2 (en) | 1989-07-28 | 1989-07-28 | IC test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8896489U JP2532081Y2 (en) | 1989-07-28 | 1989-07-28 | IC test equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0328480U true JPH0328480U (en) | 1991-03-20 |
| JP2532081Y2 JP2532081Y2 (en) | 1997-04-09 |
Family
ID=31638559
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8896489U Expired - Lifetime JP2532081Y2 (en) | 1989-07-28 | 1989-07-28 | IC test equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2532081Y2 (en) |
-
1989
- 1989-07-28 JP JP8896489U patent/JP2532081Y2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JP2532081Y2 (en) | 1997-04-09 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPH0328480U (en) | ||
| DK0705439T3 (en) | Test device and method for an integrated circuit soldered to a circuit board | |
| JPH0645909Y2 (en) | IC test equipment | |
| JPS5923676U (en) | IC test equipment with self-diagnosis function | |
| CA1180772A (en) | Detector for time difference between transitions in two wave forms | |
| JPS63190975U (en) | ||
| JPH0774746B2 (en) | Calibration circuit | |
| CN220855086U (en) | Test adapter suitable for 555 time base circuit | |
| JP4043201B2 (en) | Electronic circuit unit with test connector | |
| JP3149925B2 (en) | Circuit board probing method | |
| JPH0641179Y2 (en) | Current switching circuit | |
| JPS62152276U (en) | ||
| KR940006067Y1 (en) | Input dc current testing circuit | |
| JPH0654338B2 (en) | Short-circuit position detection device for multilayer printed wiring boards | |
| JPS6358772U (en) | ||
| JP3174895B2 (en) | Test method of signal selection circuit | |
| SU1626221A1 (en) | Device for measuring the gain of analog chips | |
| JPH08292227A (en) | Terminal circuit | |
| JPH11211787A (en) | Ic tester | |
| JPH08129051A (en) | Element characteristic measuring device and method | |
| JPS62123573U (en) | ||
| SU645097A1 (en) | Multichannel remote measuring converter of resistance to time interval | |
| JPS60177275A (en) | Testing circuit for wiring continuity | |
| JPH03101519A (en) | Ecl output circuit | |
| JPS61173018U (en) |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |