JPH0331221B2 - - Google Patents

Info

Publication number
JPH0331221B2
JPH0331221B2 JP57160669A JP16066982A JPH0331221B2 JP H0331221 B2 JPH0331221 B2 JP H0331221B2 JP 57160669 A JP57160669 A JP 57160669A JP 16066982 A JP16066982 A JP 16066982A JP H0331221 B2 JPH0331221 B2 JP H0331221B2
Authority
JP
Japan
Prior art keywords
glass bottle
light
bottle
flaw
flaws
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57160669A
Other languages
Japanese (ja)
Other versions
JPS5950345A (en
Inventor
Shigeo Sato
Masao Takato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Meidensha Electric Manufacturing Co Ltd
Original Assignee
Meidensha Electric Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Meidensha Electric Manufacturing Co Ltd filed Critical Meidensha Electric Manufacturing Co Ltd
Priority to JP16066982A priority Critical patent/JPS5950345A/en
Publication of JPS5950345A publication Critical patent/JPS5950345A/en
Publication of JPH0331221B2 publication Critical patent/JPH0331221B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/90Investigating the presence of flaws or contamination in a container or its contents

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Re-Forming, After-Treatment, Cutting And Transporting Of Glass Products (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Description

【発明の詳細な説明】 本発明は、散乱光の強度変化を利用した硝子ビ
ンのきず検出方法に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for detecting flaws in glass bottles using changes in the intensity of scattered light.

ビール、清涼飲料水などの容器にされる硝子ビ
ンは、一般に回収されて何回も使用されるが、そ
の使用回数が増加するに従いビンの円筒部上部お
よび下端部にはちまき状のすりきずが生じ、同時
にきず強度(きずの深さ)およびきずの幅が大き
くなる。さらに使用回数が増大すると、円筒部全
面に規則性のないきずも増加する。このような硝
子ビンは商品価値が低下すると共に強度的にも劣
化し、破損の危険がある。特に炭酸飲料水の容器
として使用する場合は、内部が加圧状態になつて
いるため破損し易くなる。
Glass bottles used as containers for beer, soft drinks, etc. are generally collected and used many times, but as the number of times they are used increases, the top and bottom ends of the cylindrical part of the bottle tend to develop scratches. At the same time, the flaw strength (flaw depth) and flaw width increase. Furthermore, as the number of uses increases, the number of irregular flaws on the entire surface of the cylindrical portion increases. Such glass bottles have a reduced commercial value and deteriorated strength, and are at risk of breakage. In particular, when used as a container for carbonated beverages, the interior is under pressure and is easily damaged.

そこで、ビン詰め工場では、その工程の自動
化、省力化のため硝子ビンのきずを検出する装置
が必要となる。
Therefore, in order to automate the process and save labor, bottling factories need a device that can detect flaws in glass bottles.

しかしながら、現状ではきずのある硝子ビンを
検出するに当り、人間の目視判断により選別して
おり、正確な検出ができない。また最近はきずを
散乱光、反射光、透過光の変化として捕える光学
式のきず検出装置が発表されているが、ビン全周
の強度の不均一性や移送装置で送られるビンの送
り速度の不均一性等により検出受光量の変化、き
ず情報を得るタイミングのずれ等を起し易く、以
下に詳述するように誤り判定が多くなる問題があ
つた。
However, at present, when detecting glass bottles with flaws, they are sorted by human visual judgment, and accurate detection is not possible. Recently, optical flaw detection devices have been announced that detect flaws as changes in scattered light, reflected light, and transmitted light. Due to non-uniformity, etc., changes in the amount of detected light received, a shift in the timing of obtaining flaw information, etc. are likely to occur, and as will be described in detail below, there is a problem that there are many erroneous determinations.

ビールビンを例としてそのきずの強度分布状態
を第1図を参照して説明すると以下のように判定
基準が設定される。
Using a beer bottle as an example, the intensity distribution of flaws will be explained with reference to FIG. 1. The determination criteria are set as follows.

初期状態;きずが殆んどないか全くない。Initial state: There are few or no flaws.

第2期状態;円筒部下端に弱いはちまき状のきず
Aが生じる。
2nd stage state: A weak, bead-shaped flaw A occurs at the lower end of the cylinder.

第3期状態;円筒部上端Bと下端Aにはつきり認
められるはちまき状のきずが生じるが、きず強
さは軽い。
3rd stage state: Although there are visible flaws in the shape of a bead on the upper end B and lower end A of the cylindrical part, the strength of the flaws is light.

第4期状態;円筒部上端と下端に強度のはちまき
状のきずが生じ、円筒部全体にもきずが生じ
る。
Fourth stage state: Intense flaws are formed on the upper and lower ends of the cylindrical portion, and flaws are also formed on the entire cylindrical portion.

末期状態;円筒部上端と下端に強度のはちまき状
のきずがあり、円筒部全体にも相当のきずが生
じる。
Terminal condition: There are strong, bead-like flaws on the upper and lower ends of the cylinder, and considerable flaws also occur on the entire cylinder.

上述の各きず状態のうち、商品として許容でき
るのは第3期までであるが、これら基準は概念的
基準であつて目視によつて同じきず程度と認めら
れるものにあつても個々を詳細に見ると、はちま
き状のきずにおいて強度(きず深さ)は小さいが
幅の広いきずがあるもの、逆に幅は狭いが強度の
大きいきずがあるもの、一周の分布に強度と幅の
違いが殆んどないもの、強度と幅が周面位置で大
きく違うものなど一様でない。特に、一周のきず
強度と幅については、ビンにそのメーカ名C、す
べり止めD、容量E等を表示する文字、印が凹凸
状にある場合には第4期及び末期状態のビンでは
該表示部分での判定の差異が顕著となり、光学式
検出では判定のバラツキが一層大きくなる。
Of the above-mentioned flaws, only the third stage is acceptable as a product; however, these standards are conceptual standards, and even if the flaws are of the same degree visually, they must be examined in detail. Looking at the flaws, there are flaws that are small in strength (flaw depth) but wide, and conversely, flaws that are narrow in width but strong, and there is little difference in strength and width in the distribution around the circumference. They are not uniform, and their strength and width vary greatly depending on their circumferential position. In particular, regarding the strength and width of one round of flaws, if the bottle has uneven letters or marks that indicate the manufacturer's name C, anti-slip D, capacity E, etc., the fourth or final stage of the bottle should be marked accordingly. Differences in judgments between parts become noticeable, and in optical detection, the dispersion in judgments becomes even larger.

第2図は凸状の容量表示面に重量発生したビー
ルビンの下端はちまき状のきずを横幅1mmで一周
走査した光学式センサ出力を例示し、同図イは第
3期状態のうちの平均的と判定されるビンの検出
結果であり、ロは末期状態に近い第4期状態と判
定されるビンの検出結果である。こうした検出結
果からその平均値を基準値と比較するなどの信号
処理できず強度状態の判別が可能となるが、ビン
を一周走査するためには生産ラインのビン移送装
置の大幅な変更が必要となつて、これまでの移送
装置と比較して非常に複雑、精密なものを必要と
する。また、第2図に示すようなセンサ出力曲線
のある1点の検出又は狭い範囲の走査によるきず
強度判別では検出位置の差異によつてきず強度が
著しく異なり、誤判別の確率が非常に高くなる。
Figure 2 shows an example of the optical sensor output obtained by scanning the convex capacitance display surface at the bottom end of a beer bottle, where weight is generated. These are the detection results of the bins that are determined, and (b) is the detection result of the bins that are determined to be in the fourth stage state, which is close to the terminal state. From these detection results, it is possible to determine the intensity state without signal processing, such as comparing the average value with a reference value, but in order to scan the bottle once, it is necessary to make major changes to the bottle transfer device on the production line. As a result, it requires a much more complex and precise transfer device than conventional transfer devices. Furthermore, when determining the flaw intensity by detecting a single point on the sensor output curve or scanning a narrow range as shown in Figure 2, the flaw intensity varies significantly depending on the detection position, and the probability of misjudgment is extremely high. Become.

本発明は上述までの事情に鑑みてなされたもの
で、投光器と受光器を同じ平面位置でビン移送方
向とほぼ垂直になる平面位置にし、ビン移送によ
る約半周分のきず強度を検出し、この検出値のピ
ーク値が基準値を越えたことできず強度の判定を
することにより、比較的低廉にして確実なきず強
度検出を可能にした検出方法を提供することを目
的とする。
The present invention has been made in view of the above-mentioned circumstances.The projector and the receiver are placed in the same plane position and approximately perpendicular to the bottle transport direction, and the flaw intensity of about half a circle due to the bottle transport is detected. It is an object of the present invention to provide a detection method that enables reliable flaw intensity detection at a relatively low cost by determining the intensity when the peak value of a detected value does not exceed a reference value.

第3図は本発明における投光器と受光器の配置
構成を示す。移送装置1によつて図中矢印で示す
方向に移送されるビン2に対して、1つ以上の光
源を持つてビン2のきず部位を光照射する投光器
3及びビン2のきず部位からの散乱光を光検出す
る受光器4は夫々の光軸角度αを持つてほぼ同一
平面内でしかもビン移送方向とほぼ垂直になる配
置にしている。
FIG. 3 shows the arrangement of a light projector and a light receiver in the present invention. The bottle 2 is transferred by the transfer device 1 in the direction shown by the arrow in the figure, and a projector 3 has one or more light sources to irradiate the flawed part of the bottle 2 with light, and scattering from the flawed part of the bottle 2. The light receivers 4 for detecting light are arranged with their respective optical axes at angles α on substantially the same plane and substantially perpendicular to the direction of bottle transport.

この構成において、ビン2は移送装置1で矢印
方向に移送され、投光器3と受光器4の光軸の交
点を通過する過程でその周面の約半周分が光走査
され、該交点を下端部等のきず部位にしておくこ
とで受光器4にはきず強度に応じたきず強度分布
曲線が検出される。
In this configuration, the bottle 2 is transported in the direction of the arrow by the transport device 1, and in the process of passing through the intersection of the optical axes of the emitter 3 and the light receiver 4, about half of its circumferential surface is optically scanned, and the intersection is moved to the lower end. By setting such a flaw location, the light receiver 4 detects a flaw intensity distribution curve corresponding to the flaw intensity.

投光器3と受光器4及びその信号処理回路は第
4図に示すように構成される。投光器3は、電源
5によつて通電点灯されるランプ6の背面に反射
鏡7を有してビン2のきず検出部位側への平行光
束を得、この平行光は集光レンズ8,9によつて
きず部位の幅寸法程度までスポツト状に集束され
る構成としている。受光器4は、ビン2のきず部
位からの散乱光を光軸として、該散乱光がレンズ
10,11によつて捕集され、スリツト12によ
つてきず部位の検出エリアが第5図に示すように
幅aで高さbになるよう縦長枠に設定され、スリ
ツト12を経た受光束が受光素子13で光強度に
対応する電圧(又は電流)信号として検出される
構成としている。受光素子13の検出信号は増幅
回路14で適当なレベルまで増幅され、この増幅
した信号は比較判定回路15によつて比較基準値
との比較判定がなされる。この比較判定にはビン
位置信号と比較基準値が与えられる。
The emitter 3, the receiver 4, and their signal processing circuits are constructed as shown in FIG. The projector 3 has a reflector 7 on the back of a lamp 6 that is powered on by a power source 5 to obtain a parallel beam of light toward the flaw detection area of the bottle 2, and this parallel light is sent to condensing lenses 8 and 9. It is configured to be focused into a spot shape up to the width of the flawed part. The light receiver 4 has the scattered light from the flawed part of the bottle 2 as its optical axis, and the scattered light is collected by lenses 10 and 11, and the detection area of the flawed part is set by the slit 12 as shown in FIG. As shown, the vertical frame is set to have a width a and a height b, and the light receiving flux passing through the slit 12 is detected by the light receiving element 13 as a voltage (or current) signal corresponding to the light intensity. The detection signal of the light-receiving element 13 is amplified to an appropriate level by the amplifier circuit 14, and the amplified signal is compared with a comparison reference value by the comparison/judgment circuit 15. A bin position signal and a comparison reference value are given to this comparison judgment.

こうした構成において、ビン2が移送され、き
ず部位がa×bの検出エリアで走査された場合、
第6図に示すように検出エリアが−π/2<θ<
π/2で移動する。このとき、受光素子13が受
ける光量Iθは、きず強度が全走査範囲で一様にあ
つてきずによる散乱光に方向性がなければ下記式
の関係になる。
In such a configuration, when the bottle 2 is transported and the flaw site is scanned in the axb detection area,
As shown in Figure 6, the detection area is −π/2<θ<
Move at π/2. At this time, the amount of light Iθ received by the light-receiving element 13 has the following relationship if the intensity of the flaw is uniform over the entire scanning range and the scattered light due to the flaw has no directionality.

Iθ=K・Io・a・b・cosθ/(cosθ) {L+r(1−cosθ)}2 K=・Io・a・b/{L+r(1−cosθ)}2 但し、Ioは投光器によつてビンに照射される光
束密度、Kは散乱光量定数、Lはビンと受光面の
最短距離、rはビンの半径である。
Iθ=K・Io・a・b・cosθ/(cosθ) {L+r(1−cosθ)} 2 K=・Io・a・b/{L+r(1−cosθ)} 2However , Io depends on the projector. The luminous flux density irradiated to the bin, K is the scattered light quantity constant, L is the shortest distance between the bin and the light receiving surface, and r is the radius of the bin.

上記式において、Lをrに比較して十分に大き
くすれば、受光量Iθは走査範囲においてほぼ一定
となる。従つて、実際のきず検出には走査方向の
きず強度分布を増幅回路14の出力として得るこ
とができるし、きず強度分布からピーク値が比較
基準値を越えるか否かを比較判定回路15によつ
て検出してビンの良否判定結果を得ることができ
る。
In the above equation, if L is made sufficiently larger than r, the amount of received light Iθ will be approximately constant in the scanning range. Therefore, for actual flaw detection, the flaw intensity distribution in the scanning direction can be obtained as the output of the amplifier circuit 14, and the comparison judgment circuit 15 determines whether the peak value from the flaw intensity distribution exceeds the comparison reference value. It is possible to obtain a result of determining whether the bottle is good or bad.

第7図は受光量Iθが走査範囲内でほぼ一定にな
ることの検証のための実験データである。同図a
中、イ,ロ,ハで示す各きず強度分布曲線はbに
示すイ,ロ,ハのように投光器3と受光器4を試
料ビン2Aに対してその中心線上に位置させる場
合イと、中心線から20mmずらせて位置させる場合
ロと、中心線から35mmずらせて位置させる場合ハ
で夫々ビン2Aを一回転させた測定結果である。
なお、実験にはビン2Aの半径rが37.5mm、受光
器までの最短距離Lが600mm、検出エリアの幅a
が1mm、高さbが20mm、投光器と受光器の角度α
が45度としている。第7図aの各曲線から明らか
なように、投光器と受光器の位置がビン中心線上
からずれてもきず位置に対して絶対レベルに差異
があるも相似形になり、ビンの移送によつてその
半周面を走査したきず強度分布を正確に測定でき
る。
FIG. 7 shows experimental data for verifying that the amount of received light Iθ is approximately constant within the scanning range. Figure a
The flaw intensity distribution curves shown in center, a, b, and c are shown in a, center, and center when the emitter 3 and receiver 4 are located on the center line with respect to the sample bottle 2A, as in a, b, and c shown in b. These are the measurement results obtained by rotating the bottle 2A once in B when the bottle is positioned 20 mm from the center line, and C when the bottle is positioned 35 mm from the center line.
In the experiment, the radius r of the bin 2A was 37.5 mm, the shortest distance L to the receiver was 600 mm, and the detection area width a
is 1 mm, height b is 20 mm, and angle α between emitter and receiver is
is set to 45 degrees. As is clear from the curves in Figure 7a, even if the positions of the emitter and receiver are off the center line of the bottle, even if there is a difference in absolute level with respect to the flaw position, they become similar, and as the bottle is moved, It is possible to accurately measure the flaw intensity distribution by scanning the half circumferential surface.

なお、イ,ロ,ハのきず強度分布の絶対値の差
異は距離Lを大きくすること及び角度αを小さく
することで少なくすることができるし、ビン走査
位置信号によつて自動補正することもできる。
Note that the difference in the absolute values of the flaw intensity distributions A, B, and C can be reduced by increasing the distance L and decreasing the angle α, and can also be automatically corrected using the bin scanning position signal. can.

第8図は目視によつて予め前述の5つの判定基
準により分けた試料ビン(各状態20本)につい
て、夫々移送方向に対して試料ビンを90度走査位
置を変えて4回の走査を行ない、各位置での最高
ピーク値を取り、さらに4回の走査についてその
最高値と最低値を示したものである。同図Aは初
期状態の試料ビンについての測定結果を、B〜E
は第2期状態から末期状態までの各測定結果を示
す。この実験からも明らかなように、ビンがどの
方向を向いてもそのきず強度分布の中で比較的高
い出力(ピーク)を得る部分が存在し、ビンのほ
ぼ半周分の走査で確実なきず強度を測定してその
判定からビン良否判別を可能にする。例えば、第
8図中、比較基準をVREFに設定すると、目視で初
期、第2期状態と判別される試料ビンは本発明方
法でも全て良品と判定されるし、目視で末期と判
別されるビンについては1本のビンを除いて全て
不良品と判定されるし、また第3期、第4期につ
いても目視判別の不確さを考慮すれば良好な判定
結果を得ることができ、目視判別との間に相等の
相関を得ることができた。実際のきず検出として
基準値VREFを与えて試料ビンの良否判別し、その
後試料ビンを目視で検討したが、その判別は十分
に妥当性あるという結果が得られた。
Figure 8 shows sample bottles (20 bottles for each condition) that have been visually classified in advance according to the five criteria described above, and each sample bottle is scanned four times by changing its scanning position by 90 degrees with respect to the transport direction. , the highest peak value at each position is taken, and the highest and lowest values are further shown for four scans. Figure A shows the measurement results for the sample bottle in the initial state, B to E.
shows each measurement result from the second stage state to the final stage state. As is clear from this experiment, no matter which direction the bin is oriented, there is a part in the flaw intensity distribution where a relatively high output (peak) is obtained, and the flaw intensity can be determined with certainty by scanning approximately half the circumference of the bin. It is possible to determine whether the bottle is good or bad based on the measurement. For example, in Fig. 8, if the comparison standard is set to V REF , all sample bottles that are visually determined to be in the early stage or second stage state are also determined to be good products by the method of the present invention, and are visually determined to be in the final stage. Regarding the bottles, all but one bottle is judged to be defective, and good judgment results can be obtained for the third and fourth periods as well, considering the uncertainty of visual judgment. We were able to obtain a comparable correlation with discrimination. For actual flaw detection, a reference value V REF was given to determine the quality of the sample bottle, and then the sample bottle was visually inspected, and the results showed that the discrimination was sufficiently valid.

以上のとおり、本発明方法によれば、ビン移送
装置は既存のものを使つてビンのきず強度分布と
その良否判定を容易かつ確実に得ることができ
る。また、きず強度分布曲線のピーク値を比較基
準と比較して良否判別することにより、ビンのき
ず強度部分の不均一性、ビン送り速度の不均一性
による誤判定を殆んど無くすことができる。な
お、本発明は散乱光を利用しているため、ビンの
色の違いによる判定への影響が殆んどない。ま
た、投光はスポツト状にしてビンのレツテルなど
からの散乱光に影響を受けにくくなる。特に本発
明では受光器と硝子ビンとの距離を移送される硝
子ビン半周面からの受光量がほぼ一定となる距離
に配置することにより、受光器の検出領域でビン
を回転させることを不要としながらほぼ半周面に
渡つてきず度合を検出でき、ビンの回転を不要に
すると共に検出スピードを高める等の効果があ
る。
As described above, according to the method of the present invention, it is possible to easily and reliably obtain the flaw intensity distribution of a bottle and its quality determination using an existing bottle transfer device. In addition, by comparing the peak value of the flaw intensity distribution curve with a comparison standard to determine pass/fail, it is possible to almost eliminate misjudgments due to non-uniformity in the flaw intensity portion of the bottle and non-uniformity in the bottle feed speed. . Note that since the present invention uses scattered light, there is almost no influence on the determination due to differences in the color of the bottles. Furthermore, the projected light is made into a spot so that it is less susceptible to scattered light from bottles and the like. In particular, in the present invention, by arranging the distance between the light receiver and the glass bottle at such a distance that the amount of light received from the half circumference of the transported glass bottle is approximately constant, it is not necessary to rotate the bottle in the detection area of the light receiver. However, the degree of flaw can be detected over almost half the circumference, making it unnecessary to rotate the bottle and increasing the detection speed.

なお、本発明方法は丸ビンに限らず角ビンさら
には特殊曲面、凹凸面を持つ種々材質の容器、部
品検出にも応用できるのは勿論である。
It goes without saying that the method of the present invention can be applied not only to round bottles but also to square bottles, containers made of various materials having special curved surfaces and uneven surfaces, and detection of parts.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は硝子ビンのきず発生状況を示す図、第
2図は光学式きず検出例を示す図、第3図は本発
明方法の装置配置構成図、第4図は本発明方法に
おける装置構成図、第5図は本発明方法における
きず検出エリアの説明図、第6図は本発明方法に
おける検出面の走査を原理的に説明するための
図、第7図は本発明方法を検証するための実験例
を示す図、第8図は本発明方法による試料ビンの
判別結果を示す図である。 1……移送装置、2……ビン、3……投光器、
4……受光器、5……電源、12……スリツト、
13……受光素子、14……増幅回路、15……
比較判定回路。
Fig. 1 is a diagram showing the occurrence of flaws in a glass bottle, Fig. 2 is a diagram showing an example of optical flaw detection, Fig. 3 is a diagram of the equipment layout of the method of the present invention, and Fig. 4 is the equipment configuration of the method of the present invention. Figure 5 is an explanatory diagram of the flaw detection area in the method of the present invention, Figure 6 is a diagram for explaining the principle of scanning the detection surface in the method of the present invention, and Figure 7 is a diagram for verifying the method of the present invention. FIG. 8 is a diagram showing a sample bottle discrimination result by the method of the present invention. 1... Transfer device, 2... Bin, 3... Floodlight,
4...Receiver, 5...Power supply, 12...Slit,
13... Light receiving element, 14... Amplifying circuit, 15...
Comparison judgment circuit.

Claims (1)

【特許請求の範囲】 1 一定方向に移送される硝子ビンのきず検出部
位に向かつて投光器で光照射し、この投光器との
光軸をほぼ同一平面内にかつ硝子ビン移送方向と
ほぼ垂直になるよう配置される受光器によつて硝
子ビンのきず部位からの散乱光を検出し、この受
光器の検出信号と比較基準との大小比較によつて
硝子ビンの良否判定をする硝子ビンのきず検出方
法において、上記受光器は硝子ビンとの間を硝子
ビンの移送に伴つて受光する硝子ビン半周面から
の受光量がほぼ一定となる距離以上離して配置す
ることを特徴とする硝子ビンのきず検出方法。 2 特許請求の範囲第1項において、受光器の検
出信号のうちのピーク値を比較基準と大小比較す
ることにより硝子ビンの良否判定をすることを特
徴とする硝子ビンのきず検出方法。 3 特許請求の範囲第1項又は第2項において、
受光器は硝子ビンのきず検出エリアをスリツトで
調整することを特徴とする硝子ビンのきず検出方
法。
[Scope of Claims] 1. Light is irradiated by a projector toward a flaw detection site on a glass bottle that is being transported in a certain direction, and the optical axis of the projector is approximately in the same plane and approximately perpendicular to the direction in which the glass bottle is being transported. A glass bottle flaw detection method detects scattered light from a flawed part of a glass bottle using a light receiver arranged as shown in FIG. In the method, the light receiver is arranged at least a distance from the glass bottle such that the amount of light received from the half circumferential surface of the glass bottle is approximately constant as the glass bottle is transported. Detection method. 2. A method for detecting flaws in a glass bottle according to claim 1, characterized in that the quality of the glass bottle is determined by comparing the peak value of the detection signal of the light receiver with a comparison standard. 3 In claim 1 or 2,
A glass bottle flaw detection method characterized by adjusting the flaw detection area of the glass bottle with a slit in the photo receiver.
JP16066982A 1982-09-14 1982-09-14 Detection of flaw of glass bottle Granted JPS5950345A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16066982A JPS5950345A (en) 1982-09-14 1982-09-14 Detection of flaw of glass bottle

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16066982A JPS5950345A (en) 1982-09-14 1982-09-14 Detection of flaw of glass bottle

Publications (2)

Publication Number Publication Date
JPS5950345A JPS5950345A (en) 1984-03-23
JPH0331221B2 true JPH0331221B2 (en) 1991-05-02

Family

ID=15719921

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16066982A Granted JPS5950345A (en) 1982-09-14 1982-09-14 Detection of flaw of glass bottle

Country Status (1)

Country Link
JP (1) JPS5950345A (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61240144A (en) * 1985-04-18 1986-10-25 Toshiba Corp Apparatus for inspecting surface
JPH067104B2 (en) * 1985-06-11 1994-01-26 株式会社東芝 Surface inspection device
JPS61288108A (en) * 1985-06-15 1986-12-18 Ishizuka Glass Ltd Inspecting method for body concavity of glass bottle

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4876585A (en) * 1972-01-17 1973-10-15
JPS5527917A (en) * 1978-08-17 1980-02-28 Hitachi Zosen Corp Method of detecting crack on bottle type body

Also Published As

Publication number Publication date
JPS5950345A (en) 1984-03-23

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