JPH0332735B2 - - Google Patents
Info
- Publication number
- JPH0332735B2 JPH0332735B2 JP56103040A JP10304081A JPH0332735B2 JP H0332735 B2 JPH0332735 B2 JP H0332735B2 JP 56103040 A JP56103040 A JP 56103040A JP 10304081 A JP10304081 A JP 10304081A JP H0332735 B2 JPH0332735 B2 JP H0332735B2
- Authority
- JP
- Japan
- Prior art keywords
- ray
- component
- fluorescent
- sample container
- concentration
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10304081A JPS585639A (ja) | 1981-06-30 | 1981-06-30 | メッキ液成分濃度測定方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10304081A JPS585639A (ja) | 1981-06-30 | 1981-06-30 | メッキ液成分濃度測定方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS585639A JPS585639A (ja) | 1983-01-13 |
| JPH0332735B2 true JPH0332735B2 (de) | 1991-05-14 |
Family
ID=14343548
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10304081A Granted JPS585639A (ja) | 1981-06-30 | 1981-06-30 | メッキ液成分濃度測定方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS585639A (de) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11047814B2 (en) | 2017-08-07 | 2021-06-29 | C. Uyemura & Co., Ltd. | X-ray fluorescence analysis measurement method and X-ray fluorescence analysis measurement device |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60164239A (ja) * | 1984-02-06 | 1985-08-27 | Seiko Instr & Electronics Ltd | 螢光ｘ線メツキ液分析装置 |
| CN111487271A (zh) * | 2020-05-21 | 2020-08-04 | 上海朴维自控科技有限公司 | 一种镀金槽液在线xrf分析系统 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6048598B2 (ja) * | 1976-03-31 | 1985-10-28 | 住友金属工業株式会社 | 連続電気亜鉛メツキ方法 |
-
1981
- 1981-06-30 JP JP10304081A patent/JPS585639A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11047814B2 (en) | 2017-08-07 | 2021-06-29 | C. Uyemura & Co., Ltd. | X-ray fluorescence analysis measurement method and X-ray fluorescence analysis measurement device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS585639A (ja) | 1983-01-13 |
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