JPH0333637A - Material tester - Google Patents
Material testerInfo
- Publication number
- JPH0333637A JPH0333637A JP16880789A JP16880789A JPH0333637A JP H0333637 A JPH0333637 A JP H0333637A JP 16880789 A JP16880789 A JP 16880789A JP 16880789 A JP16880789 A JP 16880789A JP H0333637 A JPH0333637 A JP H0333637A
- Authority
- JP
- Japan
- Prior art keywords
- load
- displacement
- deflection
- specimen
- frame
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Abstract
Description
【発明の詳細な説明】
Ａ、産業上の利用分野
本発明は、Ｏ（状体の荷重−変位特性を精度よく測定す
る材料試験機に関する。DETAILED DESCRIPTION OF THE INVENTION A. Field of Industrial Application The present invention relates to a material testing machine that accurately measures the load-displacement characteristics of an O (shaped body).
■、従来の技術
従来から、例えば基台上に一対の支柱を立設させそこに
クロスヘツドを横架して成る負荷枠内に０（状体を設置
し、供試体を負荷しながらロードセルと差動トランス等
によって荷重と変位とを測定し、第５図に示すような供
試体の荷重−変位特性を求める材料試験機が知られてい
る。■, Conventional technology Traditionally, for example, a pair of support columns are erected on a base, and a crosshead is placed horizontally on the support frame. A material testing machine is known that measures load and displacement using a dynamic transformer or the like and determines the load-displacement characteristics of a specimen as shown in FIG.
Ｃ０発明が解決しようとする課題
しかしながら、このような材料試験機の負荷枠はそれ自
体が負荷により変形し、ある荷重−たわみ特性を有して
いるので、測定結果には負荷枠のたわみ分が誤差として
含まれている。この誤差は、負荷枠の剛性を上げれば黒
視てきる程度に小さくすることが可能であるが、剛性を
高くすると負荷枠が大形化して重量増を什ない＋Ｉまし
くない。C0 Problems to be Solved by the Invention However, the load frame of such a material testing machine itself deforms under load and has a certain load-deflection characteristic, so the measurement results may include the deflection of the load frame. It is included as an error. This error can be reduced to such an extent that it becomes visible by increasing the rigidity of the load frame, but increasing the rigidity increases the size of the load frame and increases the weight.
本発明の技術的課題は、負荷枠の剛性を」−げることな
く供試体の荷重−変位特性を正確に４］す足することに
ある。The technical problem of the present invention is to accurately improve the load-displacement characteristics of a specimen without reducing the rigidity of the load frame.
００課題を解決するための手段
一実施例を示す第１図により本発明を説明すると、本発
明は、一対の対向部材の間に供試体ＳＰを設置して負荷
するための負荷枠ＬＦと、この供試体ＳＰを負荷するア
クチュエータ１０ｅと、供試体ＳＰの負荷荷重を検出す
る荷重検、１１手段Ｊ２と、供試体ｓｐの変位を検出す
る変位検出手段１３とを備え、荷重検出手段１２が検出
した荷重と変位検出手段］３が検出した変位とにより０
（状体ｓｐの荷重−変位特性を求める材料試験機に適用
される。そして上述の技術的課題は、負荷枠型、Ｆのた
わみを検出するたわみ検出手段１４と、供試体ＴＰを設
置しない状態で負荷枠＋、Ｆに荷重を加え荷重検出手段
１２で検出される荷重とたわみ検出手段１４て検出され
るたオ）みから荷重−たわみ特性を記憶する記憶手段１
６と、供試体Ｓ Ｉ”を負荷して荷重検出手段１２て得
られた荷車と変；１
位検出手段１３で検出した変位から得られる供試体Ｓ
Ｐの荷重−変（＜ｌ特性を負荷枠ＬＦの荷重−たわみ特
性で補正する補正′ト段２５とをＪｌ、 ｍｉすること
により解決される
Ｆ０作用
記憶手段１にには負荷枠１、Ｆの荷ｉｉ−たわみ特性が
記憶されている。供試体ｓ■〕を負荷しつつ’Ｑｊ重と
変位を検出する。記憶手段］６に記憶した負荷枠Ｌ Ｉ
’の荷重−たわみ特性を用いて、検出された変位データ
から同一荷重に対応する負荷枠Ｌ Ｆのたわみを減算し
て補正後の変位データを得る。The present invention will be described with reference to FIG. 1 showing an embodiment of the present invention.The present invention includes a load frame LF for installing and loading a specimen SP between a pair of opposing members; It includes an actuator 10e that loads this specimen SP, a load detection means J2 that detects the applied load on the specimen SP, and a displacement detection means 13 that detects the displacement of the specimen SP, and the load detection means 12 detects the displacement of the specimen SP. 0 due to the load detected by the displacement detection means] 3.
(Applied to a material testing machine that determines the load-displacement characteristics of a shaped body sp.The above-mentioned technical problem is solved by the load frame type, the deflection detection means 14 for detecting the deflection of F, and the state where the specimen TP is not installed. A storage means 1 stores the load-deflection characteristics from the load detected by the load detection means 12 and the deflection detected by the load detection means 14.
6, and the cart and displacement obtained by loading the specimen S I'' by the load detection means 12;
The load-deflection characteristic of P is corrected by the load-deflection characteristic of the load frame LF. The load ii-deflection characteristics of the sample s are memorized.The load and displacement of 'Qj are detected while the specimen s) is loaded.The load frame L I stored in the storage means]6 is
Using the load-deflection characteristic of ', the deflection of the load frame LF corresponding to the same load is subtracted from the detected displacement data to obtain corrected displacement data.
この変位テークにより供試体ｓ ｐの荷重−変位特性を
求めれば、負荷枠り、 Ｆのたわみ分を除去した正確な
結果が得られる。If the load-displacement characteristics of the specimen sp are determined using this displacement take, accurate results can be obtained with the deflection of the load frame F removed.
なお、本発明の詳細な説明する−に記り項およびＥ ｘ
ｒｔでは、本発明を分かり易くするために実施例の図を
用いたが、これにより本発明が実施例に限定されるもの
ではない。In addition, in the detailed explanation of the present invention, the items described in - and Ex
In rt, figures of examples are used to make the present invention easier to understand, but the present invention is not limited to the examples.
ド、実施例 第１ト１は本発明の・実施例を示す全体構成口である。Example The first part 1 shows the overall configuration of an embodiment of the present invention.
同図において、１０は供試体ＳＰに圧縮荷重または引張
荷重などを加える試験機本体であり、この試験機本体］
Ｏは負荷枠Ｔ、Ｆを備えている。In the figure, 10 is a testing machine main body that applies a compressive load or a tensile load to the specimen SP, and this testing machine main body]
O has load frames T and F.
負荷枠■、Ｆは、基台１０ｄ上に立設された一対の支柱
１．０に、］、Ｏｍの上端にヨーク１０ａを横架すると
共に、支柱１０に、１０ｍにト下移動可能にクロスヘツ
ド１０ ｂを取付けて構成される。ノ、（台１０ｄには
負命用の抽圧アクチュエータ１０（うが設置され、油圧
アクチュエータ１０ｅの可＠部に取付けた下部治具１０
ｆとクロスヘツド１ｏｌＪにロ−ドセル１２を介して取
付けた上部治具１０ｃとの間に供試体ＳＰが設置される
。１３は、Ｒｔ＋圧アクチュエータ１． Ｏｃのストロ
ーク、すなわち供試体ｓｐの変位を検出する差動トラン
ス、１４は、負荷枠Ｌ Ｆのたわみを検出するたわみ検
出器である。The load frame ■, F is a pair of columns 1.0 erected on a base 10d, and a yoke 10a is horizontally mounted on the upper end of the column 10. 10b is attached. (The stand 10d is equipped with a negative pressure extraction actuator 10, and the lower jig 10 is attached to the flexible part of the hydraulic actuator 10e.
The specimen SP is installed between the upper jig 10c attached to the crosshead 1olJ via the load cell 12. 13 is the Rt+pressure actuator 1. The differential transformer 14 detects the stroke of Oc, that is, the displacement of the specimen sp, and 14 is a deflection detector that detects the deflection of the load frame LF.
このたわみ検出器１４は、例えば第２図の拡大断面図に
示すように、油圧アクチュエータ１ｏ（４内のピストン
１０１１の周面に取付けた磁性片］Ｏｊと、シリンダ側
壁に取付けられ磁性バ］Ｏ４の位ＩＭｔを磁気的に検出
する磁気センサ］Ｏｊとで構成される。なお、油圧アク
チュエータ１０ｅは、サーボ弁１．０ ｇによって圧Ｒ
１＋力″向と圧油量が制御されてピストン１０ ｈが伸
縮するもので、このビス１〜ン１． Ｏｈに連結したピ
ストンロッドに下部治具１０ｆが装着されている。For example, as shown in the enlarged sectional view of FIG. 2, this deflection detector 14 includes a hydraulic actuator 1o (a magnetic piece attached to the circumferential surface of the piston 1011 in 4) Oj, and a magnetic bar attached to the cylinder side wall] O4. The hydraulic actuator 10e is configured with a magnetic sensor which magnetically detects the position IMt.The hydraulic actuator 10e is configured with a pressure R
The piston 10h expands and contracts by controlling the direction and the amount of pressurized oil, and a lower jig 10f is attached to the piston rod connected to the screws 1 to 1.Oh.
試験機本体］Ｏを制御する制御系は、全体を制御する制
御回路２１と、負荷枠ｒ、Ｆの荷重−たゎみ特性を記憶
するメモリ２２と、試験条件入力部２３から制御回路２
１を介して指示された荷重負荷パターンに対応した負荷
パターン波形を発生する波形発生回路２４とを有する。The control system that controls the test machine body] O includes a control circuit 21 that controls the whole, a memory 22 that stores the load-deflection characteristics of the load frames r and F, and a test condition input section 23 that controls the control circuit 21.
1, and a waveform generation circuit 24 that generates a load pattern waveform corresponding to the load pattern instructed via the load pattern.
また、波形発生回路２４が発生した負荷パターン波形と
ロードセル１２が検出した荷重値との偏差を求める加算
器２５と、その偏差信号を増幅してサーボ弁１ｏｇに入
力するサーボアンプ２６とをイｆする。さらに、ロード
セル１２からの出力を増幅する増幅器２７と、増幅した
荷重信号をデジタル信号に変換して制御回路２１に入力
するＡ ｒ）変換器２８と、斧動トランス１３およびた
オ）み検出器１４が検出した変位信号およびたわみ信珍
をそれぞれ増幅する増幅器２９．３０と、増幅器２９．
３０の出力信シ）を選択する切換スイッチ３】と、この
切換スイッチ３］の出力信号をテジタル信号に変換して
制御回路２］に入力するＡ Ｉ）変換器３２とを右する
１゜さらにまた、ロードセル１２が検出した荷重４．１
号と差１１１１ ＋−ランス１３が検出した変位信号と
が人力され、このうち変位信号については制御回路２１
からの補正信号によって補正して出力する補正回路３３
と、この補正回路３３から出力される荷重信号と変位信
号によって供試体ｓ ｐの荷重変位特性をグラフ化して
出力するレコーダ３４とを備える。また、３５は、材料
試験機自体の荷重たわみ特性を測定して記憶するメモリ
モー１−を指示するスイッチ、３６は、使用する上下治
具に応して操作される治具選択スイッチてあり、メモリ
２２に格納された複数の治具に応じた複数の荷重−たわ
み特性を選択するものである。Additionally, an adder 25 that calculates the deviation between the load pattern waveform generated by the waveform generation circuit 24 and the load value detected by the load cell 12, and a servo amplifier 26 that amplifies the deviation signal and inputs it to the servo valve 1og are installed. do. Further, an amplifier 27 that amplifies the output from the load cell 12, an A converter 28 that converts the amplified load signal into a digital signal and inputs it to the control circuit 21, an axle motion transformer 13, and a fold detector. Amplifiers 29 and 30 amplify the displacement signal and deflection signal detected by the amplifiers 29 and 14, respectively.
A selector switch 3] that selects the output signal of the switch 3) and a converter 32 that converts the output signal of the selector switch 3 into a digital signal and inputs it to the control circuit 2. In addition, the load 4.1 detected by the load cell 12
The difference 1111 + - the displacement signal detected by the lance 13 is manually input, and the displacement signal is input by the control circuit 21.
A correction circuit 33 that corrects and outputs the correction signal from the
and a recorder 34 that graphs and outputs the load displacement characteristics of the specimen sp based on the load signal and displacement signal output from the correction circuit 33. Further, 35 is a switch for instructing memory mode 1- which measures and stores the load deflection characteristics of the material testing machine itself, and 36 is a jig selection switch that is operated according to the upper and lower jigs to be used. A plurality of load-deflection characteristics corresponding to a plurality of jigs stored in 22 are selected.
次に動作について説明する。Next, the operation will be explained.
まず、メモリモードスイッチ３５をオンすると切換スイ
ッチ３１がｂ側に切換わりたわみ信号選択モードとなる
。負荷枠Ｌ Ｆの荷重−たわみ特性を求めるために上下
治具１． Ｃ）ｃ、 １０ ｆに供試体を数代しない
状態で制御開路２１から波形発生回路２４に指令を与え
、波形発生＋ｉｌ路２４から例えばある比例定数で直線
的に増加するパターンの負荷パターン波形（ランプ波形
）を発生させる。この【１荷パターン波形は加算器２５
に入力され、そこでロー１−セル１２が検出している現
在の荷重信２シとの偏差を求め、その偏差信号が増幅器
２６で増幅されてサーボ弁１．０ ｇに入力される。サ
ーボづｆｌｏｇは、負負荷パターン波形のある瞬時植と
現在の荷重信号との差が零になるように油圧アクチュエ
ータ１００を制御するので、負荷枠Ｌ Ｆは」１下治具
１０ｃ、１．Ｏｆを介して負荷パターン波形に従った荷
重パターンで供試体ＳＰを圧縮する。First, when the memory mode switch 35 is turned on, the selector switch 31 is switched to the b side, and the mode becomes the deflection signal selection mode. Upper and lower jigs 1. C) Give a command to the waveform generation circuit 24 from the control circuit 21 without passing the specimen to c, 10f, and generate a load pattern waveform (for example, a pattern that increases linearly with a certain proportionality constant) from the waveform generation +il path 24. (ramp waveform). This [1st load pattern waveform is the adder 25
The deviation from the current load signal 2 detected by the row 1 cell 12 is determined, and the deviation signal is amplified by the amplifier 26 and input to the servo valve 1.0 g. Since the servo zuflog controls the hydraulic actuator 100 so that the difference between the instantaneous implantation with the negative load pattern waveform and the current load signal becomes zero, the load frame L F is set to ``1 lower jig 10c, 1. The specimen SP is compressed with a load pattern according to the load pattern waveform via Of.
この圧縮の過程で負荷枠Ｌ Ｆは、第４図の模式口に破
線で示すようにたオ〕み、そのたオ）み量は圧縮荀ｉＰ
、の増加と井に大きくなる。この時、ロードセル］２が
検出している圧縮荷重を増幅器２７を介してＡ／Ｄ変換
器２８に入力し、デジタル変換された荷重信号を制御回
路２１に人力する。また、たわみ検出器］４が検出して
いるたわみ借りを増幅器３０および切換スイッチ３１を
介してＡ／Ｄ変換器３２に入力し、デジタル変換された
たわみ信号を制御回路２１に入力する。これにより、制
御回路２」は入力された荷重信号とたわみ信号を順次サ
ンプリングし、第３図のグラフの失線Ａで示すように、
負荷枠型、Ｆの荷重−たわみ特性としてメモリ２２に記
憶させる。During this compression process, the load frame L F sag as shown by the broken line in the schematic opening of Fig. 4, and the amount of the sag is equal to
, and the well becomes larger. At this time, the compressive load detected by the load cell] 2 is input to the A/D converter 28 via the amplifier 27, and the digitally converted load signal is input to the control circuit 21 manually. Further, the deflection detected by the deflection detector] 4 is input to the A/D converter 32 via the amplifier 30 and the changeover switch 31, and the digitally converted deflection signal is input to the control circuit 21. As a result, the control circuit 2 sequentially samples the input load signal and deflection signal, and as shown by the lost line A in the graph of FIG.
It is stored in the memory 22 as the load-deflection characteristic of the load frame type F.
次に、供試体ｓｐの荷重−変位特性をイ１す定するため
治具１０ ｃ、と１Ｏｆとの間に供試体ＳＰを設置し、
メモリスイッチ３６をオフして切換スイッチ３１をａ側
に切換える。その後、波形発生回路２４から所望の勾配
で変化する負荷パターン波形を出力し」二連したと同様
にサーボ弁１０ｇにより油圧アクチュエータ１０ｅを制
御して供試体Ｓ ｌ）に負荷パターン波形に従った圧縮
荷重を加える。Next, in order to determine the load-displacement characteristics of the specimen SP, the specimen SP was installed between the jigs 10c and 1Of,
Turn off the memory switch 36 and switch the changeover switch 31 to the a side. Thereafter, a load pattern waveform that changes at a desired slope is output from the waveform generation circuit 24, and the hydraulic actuator 10e is controlled by the servo valve 10g in the same way as in the case of the double series, so that the specimen Sl) is compressed according to the load pattern waveform. Add load.
制御回路２１は、Ａ／Ｄ変換器３２から入力される変位
信号およびＡ／Ｄ変換器２８から入力される荷重信号を
順次にサンプリングする。これにより、第３０の実線ｎ
に示すように負荷枠Ｔ、Ｆの荷重−たわみ特性を包含し
た供試体Ｓ Ｐの荷重−変位特性がサンプリングされる
が、ある荷ｊｅｔ Ｐ ｉの荷重信号をサンプリングし
たならば、この荷重Ｐｌをアクセスポイントとしてメモ
リ２２をアクセスし、荷重Ｐ］における負荷枠Ｉ、Ｆの
たわみｒｌ］を読み１１ｊシ、補正回路３３に補正信号
として入力する。The control circuit 21 sequentially samples the displacement signal input from the A/D converter 32 and the load signal input from the A/D converter 28. As a result, the 30th solid line n
As shown in , the load-displacement characteristics of the specimen S P including the load-deflection characteristics of the load frames T and F are sampled, but if the load signal of a certain load P i is sampled, this load Pl is The memory 22 is accessed as an access point, and the deflection rl of the load frames I and F under the load P is read 11j and inputted to the correction circuit 33 as a correction signal.
補正回路３３にはロードセル１２が検出している荷重信
号と差動トランス１３が検出している変位信号が人力さ
れて′いるが、たわみＲ１を示す補正信号が入力される
と、差動トランス１３から入力されている変位信号から
たオ）み８ｊに相当する変位を減算する。そして、この
補正された変位信号と荷重信号とをレコーダ３４に出力
する。The correction circuit 33 is manually inputted with the load signal detected by the load cell 12 and the displacement signal detected by the differential transformer 13. When the correction signal indicating the deflection R1 is input, the differential transformer 13 The displacement corresponding to 8j is subtracted from the displacement signal inputted from . The corrected displacement signal and load signal are then output to the recorder 34.
これにより、レコーダ３４ては、第３図の破線Ｃて示す
ように４ｊ（状体Ｓ ｌ”の荷重−変イＳｔ特性かグラ
フ化されて出力される。すなわち、負荷枠型、Ｆの荷車
−たわみ特性（たオ）み分）が含まれない供試体ｓｐに
固有の荷重−変位特性が正確に測定されて出力される。As a result, the recorder 34 outputs a graph of the load-variation St characteristics of the 4j (shaped body S1) as shown by the broken line C in FIG. - The load-displacement characteristics unique to the specimen sp, which do not include the deflection characteristics (deflection), are accurately measured and output.
また、制御回路２１内でも同様な補正演算を行ない補正
後の荷重−変位特性を記憶する。Further, similar correction calculations are performed within the control circuit 21 and the corrected load-displacement characteristics are stored.
このように、負荷枠ＬＦの荷重−たわみ特性をキャンセ
ルする機能を設けたことにより、負荷枠ＬＦの剛性を高
くすることなく小形、軽量の材料試験機で精度の高い荷
重−変位特性を得ることができる。In this way, by providing a function to cancel the load-deflection characteristics of the load frame LF, it is possible to obtain highly accurate load-displacement characteristics with a small and lightweight material testing machine without increasing the rigidity of the load frame LF. I can do it.
なお、負荷枠の荷重−たわみ特性は上下治具により異な
るので、使用する治具ごとに予め荷重たわみ特性を測定
してそれらをメモリ２２に記憶しておき、試験時に使用
治具選択スイッチ３６により補正演算に供する荷重−た
わみ特性を選択するようにしてもよい。この場合、メモ
リ２２を電池等によってバンクアップしておく。また、
圧縮試験以外の各挿試験にも本発明を実施できる。さら
に、負荷枠のたわみを実施例以外の部位で異なった方式
で計測してもよい。例えば、特別のたわみ検出手段を設
けることなく、供試体なしで圧縮１１
を行なった際に、変位検出用差動トランスなどで測定さ
れる変位量を負荷枠のたわみと考えてもよい。この場合
には構成が簡素化される。この発明が特許請求の範囲で
ぃう「たオ）み検出手段」はこれらを包含するものであ
る。Note that the load-deflection characteristics of the load frame differ depending on the upper and lower jigs, so measure the load-deflection characteristics for each jig used in advance and store them in the memory 22, and use the jig selection switch 36 to select the load-deflection characteristics during the test. The load-deflection characteristics to be subjected to the correction calculation may be selected. In this case, the memory 22 is banked up using a battery or the like. Also,
The present invention can also be implemented in various insertion tests other than compression tests. Furthermore, the deflection of the load frame may be measured using a different method at locations other than those in the embodiment. For example, when compression 11 is performed without providing a special deflection detection means and without a specimen, the amount of displacement measured by a displacement detection differential transformer or the like may be considered as the deflection of the load frame. In this case, the configuration is simplified. The "touch detection means" in the claims of this invention includes these.
Ｇ１発明の詳細
な説明したように本発明においては、測定したａ（状体
の荷重−変イＱ特性から負荷枠のたわみ分をキャンセル
するようにしたので、剛性を高めることなく供試体に固
有の荷重−変位特性を正確に１１１１１定することがで
き、材料試験機の小形軒量化に寄与する。As explained in detail about the G1 invention, in the present invention, the deflection of the load frame is canceled from the measured load-variable Q characteristic of the a It is possible to accurately determine the load-displacement characteristics of 11111, contributing to the downsizing of material testing machines.
４、口面の筒車な説明
第１図は本発明の一実施例を示す全体構成図、第２図は
たわみ検出器の一例を示す拡大断面図、第３図は負荷枠
と供試体の荷重−変位（たわみ）特性の一例を示すグラ
フ、第４図は負荷枠がたわむ様子を示す模式図、第５図
は供試体の荷重−変位特性の一例を示すグラフである。4. Explanation of the hour wheel on the mouth surface Fig. 1 is an overall configuration diagram showing one embodiment of the present invention, Fig. 2 is an enlarged sectional view showing an example of a deflection detector, and Fig. 3 is an illustration of the load frame and the specimen. FIG. 4 is a graph showing an example of the load-displacement (deflection) characteristic, FIG. 4 is a schematic diagram showing how the load frame is deflected, and FIG. 5 is a graph showing an example of the load-displacement characteristic of the specimen.
ＪＯ：試験機本体 １． Ｏｂ ：クロスヘッド２
１０ｏ：上側治具 １．ｏｄ：基台
１０ｃ：抽圧アクチュエータ
１０ｆ：下側治具 ｌｏｇ：サーボ弁１０ｉ：磁性片
１０ｊ：磁気センサ１２：ロードセル １３：
差動１−ランス１４：たわみ検出器 ２１：制御回路
２２：メモリ ２４：波形発生回路３１；切換ス
イッチ ３３：補正回路JO: Test machine main body 1. Ob: Crosshead 2 10o: Upper jig 1. od: Base 10c: Extraction actuator 10f: Lower jig log: Servo valve 10i: Magnetic piece 10j: Magnetic sensor 12: Load cell 13:
Differential 1-Lance 14: Deflection detector 21: Control circuit 22: Memory 24: Waveform generation circuit 31; Selector switch 33: Correction circuit
Claims (1)
負荷枠と、この供試体を負荷するアクチュエータと、供
試体の負荷荷重を検出する荷重検出手段と、供試体の変
位を検出する変位検出手段とを備え、前記荷重検出手段
が検出した荷重と前記変位検出手段が検出した変位とに
より供試体の荷重−変位特性を求める材料試験機におい
て、前記負荷枠のたわみを検出するたわみ検出手段と、
供試体を設置しない状態で前記負荷枠に荷重を加え前記
荷重検出手段で検出される荷重と前記たわみ検出手段で
検出されるたわみから荷重−たわみ特性を記憶する記憶
手段と、前記供試体を負荷して前記荷重検出手段で得ら
れた荷重と変位検出手段で検出した変位から得られる供
試体の荷重−変位特性を前記負荷枠の荷重−たわみ特性
で補正する補正手段とを具備することを特徴とする材料
試験機。A load frame for installing and applying a load to a specimen between a pair of opposing members, an actuator for loading this specimen, a load detection means for detecting a load applied to the specimen, and a displacement detection means for detecting the displacement of the specimen. a deflection detection method for detecting deflection of the load frame in a material testing machine, which includes a displacement detection means and determines a load-displacement characteristic of a specimen based on the load detected by the load detection means and the displacement detected by the displacement detection means; means and
storage means for storing a load-deflection characteristic based on the load detected by the load detection means and the deflection detected by the deflection detection means by applying a load to the load frame without the specimen installed; and correction means for correcting the load-displacement characteristic of the specimen obtained from the load obtained by the load detection means and the displacement detected by the displacement detection means, using the load-deflection characteristic of the load frame. Material testing machine.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1168807A JP2720529B2 (en) | 1989-06-30 | 1989-06-30 | Material testing machine |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1168807A JP2720529B2 (en) | 1989-06-30 | 1989-06-30 | Material testing machine |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0333637A true JPH0333637A (en) | 1991-02-13 |
| JP2720529B2 JP2720529B2 (en) | 1998-03-04 |
Family
ID=15874858
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1168807A Expired - Fee Related JP2720529B2 (en) | 1989-06-30 | 1989-06-30 | Material testing machine |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2720529B2 (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007218809A (en) * | 2006-02-17 | 2007-08-30 | Shimadzu Corp | Material testing machine |
| JP2009156725A (en) * | 2007-12-27 | 2009-07-16 | Hyogo Prefecture | Thin film test piece structure, manufacturing method thereof, tensile test method thereof, and tensile test apparatus |
| JP2010127797A (en) * | 2008-11-28 | 2010-06-10 | Shimadzu Corp | Small-sized material testing machine |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5951331A (en) * | 1982-09-18 | 1984-03-24 | Shimadzu Corp | Deflection compensation type material testing machine |
| JPS62121334A (en) * | 1985-11-21 | 1987-06-02 | Shimadzu Corp | Test piece elongation measuring device for material fatigue testing machine |
-
1989
- 1989-06-30 JP JP1168807A patent/JP2720529B2/en not_active Expired - Fee Related
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5951331A (en) * | 1982-09-18 | 1984-03-24 | Shimadzu Corp | Deflection compensation type material testing machine |
| JPS62121334A (en) * | 1985-11-21 | 1987-06-02 | Shimadzu Corp | Test piece elongation measuring device for material fatigue testing machine |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007218809A (en) * | 2006-02-17 | 2007-08-30 | Shimadzu Corp | Material testing machine |
| JP2009156725A (en) * | 2007-12-27 | 2009-07-16 | Hyogo Prefecture | Thin film test piece structure, manufacturing method thereof, tensile test method thereof, and tensile test apparatus |
| JP2010127797A (en) * | 2008-11-28 | 2010-06-10 | Shimadzu Corp | Small-sized material testing machine |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2720529B2 (en) | 1998-03-04 |
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