JPH0335460U - - Google Patents
Info
- Publication number
- JPH0335460U JPH0335460U JP9592189U JP9592189U JPH0335460U JP H0335460 U JPH0335460 U JP H0335460U JP 9592189 U JP9592189 U JP 9592189U JP 9592189 U JP9592189 U JP 9592189U JP H0335460 U JPH0335460 U JP H0335460U
- Authority
- JP
- Japan
- Prior art keywords
- sample
- ray diffraction
- curved
- dimensional
- around
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000002441 X-ray diffraction Methods 0.000 claims description 5
- 230000003287 optical effect Effects 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 4
- PZNPLUBHRSSFHT-RRHRGVEJSA-N 1-hexadecanoyl-2-octadecanoyl-sn-glycero-3-phosphocholine Chemical compound CCCCCCCCCCCCCCCCCC(=O)O[C@@H](COP([O-])(=O)OCC[N+](C)(C)C)COC(=O)CCCCCCCCCCCCCCC PZNPLUBHRSSFHT-RRHRGVEJSA-N 0.000 description 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Description
第１図は本考案に係るＸ線回折装置の１実施例
を示す図、第２図は検出器の退避動作を説明する
ための図、第３図は従来のＸ線回折装置の概要を
説明するための図である。
１……湾曲形一次元ＰＳＰＣ、２……光学顕微
鏡、３……試料、４……試料台、５……移動レー
ル、６〜８……回転機構。
Fig. 1 is a diagram showing one embodiment of the X-ray diffraction device according to the present invention, Fig. 2 is a diagram for explaining the retracting operation of the detector, and Fig. 3 is a diagram explaining the outline of the conventional X-ray diffraction device. This is a diagram for 1... Curved one-dimensional PSPC, 2... Optical microscope, 3... Sample, 4... Sample stage, 5... Moving rail, 6-8... Rotating mechanism.
Claims (1)
回転機構、光学顕微鏡を備えたＸ線回折装置にお
いて、湾曲形一次元Ｘ線検出器を試料の周りから
移動し退避させる機構を備えたことを特徴とする
Ｘ線回折装置。 In an X-ray diffraction apparatus equipped with a curved one-dimensional X-ray detector, a sample rotation mechanism, and an optical microscope around the sample, the X-ray diffraction apparatus is equipped with a mechanism for moving and retracting the curved one-dimensional X-ray detector from around the sample. An X-ray diffraction device characterized by:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1989095921U JP2535480Y2 (en) | 1989-08-16 | 1989-08-16 | X-ray diffractometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1989095921U JP2535480Y2 (en) | 1989-08-16 | 1989-08-16 | X-ray diffractometer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0335460U true JPH0335460U (en) | 1991-04-08 |
| JP2535480Y2 JP2535480Y2 (en) | 1997-05-14 |
Family
ID=31645155
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1989095921U Expired - Lifetime JP2535480Y2 (en) | 1989-08-16 | 1989-08-16 | X-ray diffractometer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2535480Y2 (en) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5560843A (en) * | 1978-10-30 | 1980-05-08 | Nippon X Sen Kk | Minute region x-ray diffractometer |
-
1989
- 1989-08-16 JP JP1989095921U patent/JP2535480Y2/en not_active Expired - Lifetime
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5560843A (en) * | 1978-10-30 | 1980-05-08 | Nippon X Sen Kk | Minute region x-ray diffractometer |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2535480Y2 (en) | 1997-05-14 |
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