JPH0339575B2 - - Google Patents

Description

[Detailed Description of the Invention] [Technical field to which the invention pertains] This invention relates to a data processing device for testing viscoelastic materials, and in particular, for testing abnormalities such as peeling and tearing of viscoelastic materials such as rubber. The present invention relates to a data processing device for viscoelastic material testing that allows for appropriate analysis of peeling force, tearing force, etc. even if a cracking or tearing condition occurs.

[Prior art and its problems]

Tear tests and peel tests of viscoelastic materials, such as rubber, and composite materials of this material and fiber cords or metal cords, are generally performed using a tensile tester or the like. The tearing force or peeling force of such materials is determined by applying a load as peeling force or tearing force to the test piece, converting the load into an electrical signal using a load cell, etc., and detecting this. It is obtained by obtaining time characteristics, continuously recording them, and analyzing the data.

In other words, there are standards already established by JIS for these tests, and the test results are determined by analyzing records of changes in tearing force or peeling force. An example of the recorded results is as follows:
The waveform has a sawtooth-like complex shape as shown in Figures 1 and 2. For example, by reading the upper limit peak value (see symbol x) in Figure 1, ISO6133 requires that the median value obtained from each of these waveforms be used as the tear force. and ISOR36,
JISK6301 stipulates that the average value of the upper limit peak values be analyzed as the peeling force.

Conventionally, when performing tear tests and peel tests in accordance with these standards, the peak value (the value of the peak or valley of the detected waveform) is read manually, which has many errors and makes it impossible to analyze the test results properly. There is a drawback.

If proper analysis cannot be performed in this way, retesting may be required, but depending on the material, similar samples may not be obtained in many cases, which is a problem.

In order to solve this problem, a device has been proposed that automatically reads the peak using a processing device equipped with a microprocessor, etc. The contents of the changes vary depending on the material, and are often very complex, so that it is currently difficult to distinguish the peaks of each noise waveform. Moreover, there are cases where the interval between peaks disappears.

Therefore, in the conventional case, there are problems such as attachment/detachment abnormalities such as when the test piece is cut off by the grip part of the test piece during the test, or the composite material does not peel off at the interface and the material itself If an abnormal phenomenon such as destruction occurs, it is necessary to conduct a new test for such automatic processing equipment.

Moreover, such tests are time-consuming and often involve redoing the test with a new sample, including other tests, resulting in poor work efficiency.Furthermore, the sample piece itself is difficult to handle. It also has the disadvantage that there are cases where you may not be able to enter the exam, making it impossible to take the exam.

[Purpose of the invention]

The present invention has been made in view of the drawbacks and problems of the prior art, and it solves these drawbacks and problems, and also improves the performance of peeling and tearing tests on viscoelastic materials such as rubber. It is an object of the present invention to provide a data processing device for viscoelastic material testing that can appropriately analyze peeling force, tearing force, etc. even if an abnormal peeling or tearing state occurs.

[Key points of the invention]

A feature of the present invention to achieve such an object is that an operator monitors whether an abnormality such as attachment/detachment abnormality or material destruction occurs in a test piece, and when such an abnormality occurs, abnormal data is transmitted. It is a cancellation process that removes the
The configuration includes a detector that detects a load applied to the viscoelastic material as a peeling force, a tearing force, etc., and a processing device, and the processing device detects at least an upper limit peak value of the load detected by the detector. an upper limit peak value detection means for sequentially detecting the detected upper limit peak values, a first storage means for sequentially storing the detected upper limit peak values, and a second storage means for storing a reference value serving as a reference for determining abnormal data such as peeling force or tearing force. storage means; abnormal data removal means for removing abnormal upper peak value data from among the stored upper limit peak values by referring to the reference value in accordance with a predetermined control signal; and storage in the first storage means. It has calculation means for calculating peeling force, tearing force, etc. from the upper limit peak value.

By doing this, by generating a predetermined control signal by the operator or by a processing device as a predetermined condition signal, abnormal upper limit peak values can be removed, and the cutting force can be adjusted using the detection data of the correct upper limit peak value. It is possible to calculate the value of , etc. using arithmetic processing.

[Embodiments of the invention]

Hereinafter, one embodiment of the present invention will be described in detail using the drawings.

FIG. 3 is a block diagram mainly showing the functions of a viscoelastic material testing system for tear testing, peeling testing, etc. to which the present invention is applied.

In the figure, 10 is a viscoelastic material testing system, which includes a testing machine 2 in which a test piece 1 of a viscoelastic material such as rubber is set, an A/D converter 3, a processing device 4, a display 5, and It is equipped with a keyboard 6.

Here, the testing machine 2 is provided with a load cell 11 that detects the load value applied to the test piece 1 as an electrical signal, and sends the detection signal to the A/D converter 3. do. A/D converter 3
converts the detected load value into a digital signal and inputs it to the processing device 4.

The processing device 4 includes an upper/lower limit peak value detection section 20
, a peak value storage means 26, a calculation means 27 for calculating peeling force, etc., and a reference value storage means 2 for storing a reference value serving as a reference for determining abnormal data such as peeling force or tearing force.
8, and an abnormal data eliminating means 29 for excluding abnormal data from among the stored upper limit peak values with reference to this reference value.

Here, the upper limit/lower limit peak value detection section 20 includes a peak side/valley side peak detection means 21 and a first holding means 2.
2 (peak value holding means), time measuring means 23, current value holding means 24, and large/small judgment means 25
It receives the detected load value for the test piece 1 in the form of a digital signal and detects the upper and lower peak values. Note that the current value holding means 24 and the time measuring means 23 constitute one specific example of the second holding means.

On the other hand, the testing machine 2 includes a control panel 12 that controls the application of a load to the test piece 1, and a recorder 13 that records the load-time characteristics.

Now, the processing device 4 transmits the digital signal of the input load value to the peak side/valley side peak detection means 21 of the upper/lower limit peak value detection section 20 and the first holding means 2.
2 and the current value holding means 24.

The peak side/valley side peak detection means 21 is supplied from the A/D converter 3 in response to, for example, an activation signal in an initial state inputted from the keyboard 6 or a activation signal of a large/small determination means 25 to be described later. The signal of the load value is sampled at a constant cycle and compared with the previous sampling data, and based on the increase/decrease state, it is determined whether the sampled data has a peak on the mountain side or a peak on the valley side. Then, it is detected whether or not there is a peak, and respective peak detection signals corresponding to the mountain side and the valley side are sent to the first holding means 22, and the time measuring means 23 is activated.

When the peak detection signal is on the mountain side, the first holding means 22 of the upper/lower limit peak value detection unit 20 stores the peak value as the peak value on the mountain side according to the peak detection signal.
The load value detection signal is captured and stored. Furthermore, when the peak detection signal is on the valley side, the detection signal of the load value is taken in as the peak value on the valley side.

On the other hand, the time measuring means 23 of the upper limit/lower limit peak value detection section 20 receives the activation signal from the peak side/valley side peak detecting means 21, counts this for a predetermined time set in advance, and measures this for a predetermined time. When the time has elapsed, a control signal is sent to the current value holding means 24 and the large/small determining means 25.

The current value holding means 24 which received this control signal,
The input load value detection signal is captured and held.

Now, the large/small determining means 25 of the upper/lower limit peak value detecting section 20 reads respective data from the current value holding means 24 and the first holding means 22 in accordance with the control signal from the time measuring means 23, Compare these sizes. Here, the first holding means 2
When the data currently held in 2 is the peak value on the mountain side, the large/small determination means 25 determines whether the peak value of the first holding means 22 is larger than the current value, and when it is larger, Peak value holding means 22
Control is performed to transfer the value stored in the upper limit peak value (maximum peak value) to a predetermined area of the peak value storage means 26 and store it.

On the other hand, when the data currently held in the first holding means 22 is a peak value on the valley side, the large/small determination means 25 determines whether the peak value of the first holding means 22 is smaller than the current value. control to transfer the value stored in the peak value holding means 22 as a lower limit peak value (minimum peak value) to a predetermined area of the peak value storage means 26 and store it when the value is determined to be small; do.

When this process is completed, the mountain side/valley side peak detection means 21 is activated to perform control to detect the next peak. As a result, each time an upper limit peak and a lower limit peak are detected, these peak values are sequentially stored in a predetermined area of the peak value storage means 26.

In this way, when the peak is on the mountain side, only the peak value determined to be larger than the current value is held as the upper limit peak value to be obtained, and when it is not determined to be larger, the mountain side/valley side peak detection means 21 is activated again. Then, the next peak value is held in the first holding means 22 and subjected to the same judgment. Also,
When it is on the valley side, only the peak value that is determined to be smaller than the current value is held as the lower limit peak value to be obtained, and when it is not determined to be smaller than the current value, the mountain side/valley side peak detection means 21 is restarted to detect the next peak. The value is held in the first holding means 22 and subjected to a similar determination.

As a result of the above, the upper limit peak value and lower limit peak value of the test piece 1 are sequentially stored in a predetermined area of the peak value storage means 26. This process ends when one or both of these upper limit peaks and lower limit peaks reaches a predetermined number, or when a predetermined key is input from the keyboard 6 to end the test.

Here, the peeling force calculation means 27 counts either the upper limit peak or the lower limit peak of the peak value storage means 26, or both. Then, when this count value reaches a predetermined value, a termination signal is generated to terminate the process.

Here, the peeling force calculation means 27 that generates this end signal or receives the processing end signal from the keyboard 6 determines whether or not there is a key input signal indicating cancel processing from the keyboard 6. .
Then, when there is no key input signal for the cancel processing, calculation processing such as peeling etc. is started.

That is, the peeling force calculation means 27 reads the upper limit peak value and the lower limit peak value stored in the peak value storage means 26, and counts the number of the upper limit peak value and lower limit peak value, respectively. , the average value of the upper limit and the lower limit, and calculate these average values. Furthermore, in the case of tear force, the median value of the upper limit peak values is calculated.

These results are sent from the peeling force calculation means 27 to the display 5 and displayed.
It is output to a printer if necessary.

In addition, it is of course possible to detect only the peak on the mountain side, store its upper limit peak value, and calculate the median value according to the ISO method, JIS method, etc. /The valley side peak detection means 21 only needs to be able to detect the mountain side peaks. Further, the large/small determination means 25 only needs to make a large determination, and the upper/lower limit peak value detection unit 20
It becomes the upper limit peak value detection section.

Incidentally, the abnormality reference value Q corresponding to the test piece 1 is input in advance from the keyboard 6 and stored in the reference value storage means 28 that stores the reference value that is the standard for determining abnormal data such as peeling force or tearing force. ing.

In the peeling test or tearing test, if an abnormal phenomenon such as attachment/detachment abnormality or material destruction occurs to the test piece 1 during the test, the keyboard 6
Then, a function key indicating cancel processing of predetermined abnormal data is input.

Now, when a key input signal indicating cancel processing is input from the keyboard 6, the peeling force calculation means 27 activates the abnormal data elimination means 29. When the abnormal data elimination means 29 is activated, the abnormal reference value Q of the reference value storage means 28 is referred to and the upper limit peak value (or upper limit peak value and lower limit peak value) stored in the peak value storage means 26 is calculated. Abnormal data cancellation processing is performed by detecting a value in which an abnormality has occurred, invalidating subsequent data, and leaving only valid data. Note that the abnormality reference value Q is determined through experience.

Hereinafter, a process in which the abnormal data eliminating means 29 eliminates abnormal data will be described as an abnormal data cancellation process.

First, for a certain upper limit peak value to be determined as whether or not it is abnormal data, the difference between it and the average value of all or some upper limit peak values detected previously is taken. Then, it is determined whether this difference value Sm exceeds the abnormality reference value Q, and the upper limit peak value of the abnormal state is detected. If it is determined that the peak value data is abnormal, the subsequent upper limit peak value and lower limit peak value are invalidated, and the stored value in the peak value storage means 26 is erased. Here, the same process may be performed for the lower limit peak value, and the stricter of these conditions may be adopted to invalidate the subsequent upper and lower limit peak values.

Note that the first two upper limit peak values for which the average value cannot be calculated are treated as correct, and the data is determined starting from the third and subsequent values.

The upper limit peak value and lower limit peak value excluding abnormal data obtained in this way are then read out from the peak value storage means 26 by the peeling force calculation means 27, and as described above, the peeling force etc. calculation means 27 reads out the upper limit peak value and the lower limit peak value. In this case, for example, the numbers of the upper limit peak value and the lower limit peak value are counted, and the average value of the upper limit and the lower limit, and the average value thereof are calculated. Furthermore, in the case of tear force, the median value of the upper limit peak values is calculated.

Next, an embodiment of the present invention in which processing is performed using a microcomputer as a processing device will be specifically described.

Fig. 4 is a block diagram of an example of a viscoelastic material testing system realized using a microcomputer, Fig. 5 is a detection waveform diagram of the load-time characteristic of the load cell 11, and Fig. 6 is a diagram of the detection waveform of the load cell 11 using a microcomputer. FIG. 7 is a flowchart of the process of peak analysis, and FIG. 7 is a flowchart of the process of canceling abnormal data. In addition, in FIG. 4, the same reference numerals as in FIG. 3 indicate the same parts.

30 shown in FIG. 4 is the main block of the viscoelastic material testing system, and 31 is a microcomputer, which includes an interface 32, a common bus 33, and an arithmetic processing unit 34 (microprocessor;
MPU) and memory 35.

Here, the signal detected by the load cell 11 is as shown at 36 in FIG.
This is input to the A/D converter 3, converted into a digital value, and input to the interface 32. Then, from the interface 32 to the common bus 3
3, the data is transferred to the arithmetic processing unit 34 and subjected to predetermined processing.

On the other hand, from the keyboard 6, at predetermined timing, a start signal, an analysis end signal, etc. for the peak analysis program shown in FIG. . On the other hand, the results of processing according to a predetermined program are sent from the arithmetic processing unit 34 to the interface 32 via the common bus 33, and transferred to the display 5 via the interface 32, where predetermined data is displayed. This is what is displayed.

Now, the peak analysis process of the arithmetic processing unit 34 will be explained according to FIGS. 4, 5, and 6. First, the peak analysis program in FIG. are respectively stored in the memory 35 as the program 35b.
It is assumed that the data is stored in a predetermined area of . When a predetermined function key on the keyboard 6 is input, this program 35a is activated and peak analysis processing is executed according to the following steps.

That is, the step shown in FIG. 6 is an initial setting step, in which variables P ₁ , P ₂ , i, M,
Clear N and V to “0”. Here, the variable P ₁ is
It sets the current load sampling data detected by the load cell 11, and the variable _P2 is
The previous sampling data is set. Further, the variable i indicates the storage address position of the upper limit peak value and the lower limit peak value on the memory 35, the variable M stores a flag indicating an increasing state, and the variable N indicates a decreasing state. It stores flags. On the other hand, the variable V stores a flag indicating the detection state on the valley side.

Each of these variables is set as one data storage area on the memory 35, and it goes without saying that registers may be used instead of these variables.

In the next step, the value of the variable _P1 is transferred to the variable _P2 , and in the step, detected data is taken in according to a predetermined sampling timing, and this is set in the variable _P1 in the step. Note that this sampling timing corresponds to the waveform 36 shown in FIG.
This is done in accordance with the timing indicated by reference numeral 37.

Then, in the next step, the variable P ₁ indicating the current load sampling data is compared with the variable P ₂ indicating the previous load sampling data, and P ₁ >
Make a P ₂ judgment.

If the result of this judgment is YES, it is considered to be in an increasing state, and the increase flag is set to “1” in the step.
is set to variable M. Then, in the step, it is determined whether the variable N indicating the decrease flag has been set first, based on whether N=1.

When it is in the increasing state shown in the region of FIG. 5, there is no decreasing state at the beginning, so the determination at the step is NO and the process returns to the step, which is what is called a circular loop process. Then, in the same way as above, in step, the value of variable P ₁ is transferred to variable P ₂ , in step, the load value of load cell 11 is taken in as detection data according to the predetermined sampling timing, and this is transferred to variable P 2 in step. Set to P ₁ . Then, again in step, it is determined that P ₁ >P ₂ . Now, assuming that the sampling has exceeded the first peak 38, the current sampling data P ₁ decreases with respect to the previous sampling data P ₂ . As a result, the process moves to step a and enters the determination of P ₁ = P _2. If by any chance it becomes YES (when P ₁ = P ₂ ), the process returns to step a, and through the same process, here, The decision will be made again and the result will be NO.

As a result of this determination, it is determined that the number is in a decreasing state, and in step a, a variable N is set to "1" as a decreasing flag.
Then, in step a, it is determined whether a flag indicating an increasing state is set. Here, at peak 38, there is a change from increase to decrease, so
YES, the previous sampling data _P2 is detected as a peak, and in step a, memory 3 is
The value of variable _P2 (the peak value on the mountain side) is transferred and stored at the location MAXi indicated by address i in the area labeled MAX on 5.

By the way, if the NO condition is reached in the determination at step a, this is the case as shown in the area of FIG. 5, where the condition is in a decreasing state from the beginning. Such a decreasing state is a case of peak detection on the valley side, and this peak detection on the valley side is detected by shifting from a decrease to an increase. Therefore, when the answer is NO at step a, the process moves to step a, where "1" is set in the variable V as the valley side flag, and the process returns to the step. and,
When the same circulation process as before is carried out and, for example, the peak on the valley side such as peak 40 shown in FIG.
YES, the previous sampling data P ₂ is detected as the lower limit peak, and similarly, the value of variable P ₂ (the peak on the valley side value)
Transfer and store.

In this way, the peaks on the mountain side and the peaks on the valley side are detected by the process from step to step and from step to step a. Therefore, the processing up to this point is one specific example of the mountain side/valley side peak detection means 21 shown in FIG. moreover,
The processes of step and step a are a specific example of the first holding means 22 (peak value holding means) and a specific example of the peak value storage means 26, respectively.

After detecting the peak in this way, the process moves to the step, the timer is set to _T1 , the time is measured in the step, and the process waits until the time is finished.
It enters a so-called time waiting loop. This step is one specific example of the time measuring means shown in FIG. 3 above.

Then, in a step, the load value of the load cell 11 is taken in as detection data according to a predetermined sampling timing, and this is converted into a variable in a step.
Set to P ₁ . In the next step, it is determined whether the variable V is V=1 or not, and if it is NO, the process moves to the step and the previously detected peak value MAXi is set after a certain time _T1 set by the timer. It is determined whether the current sampling data P is larger than ₁ . As a result, if it is not large, the process moves to step a, resets the decrease flag N set at the time of peak detection to invalidate it (N=0), returns to step A, and performs similar processing. Then, in the step, the peak value MAXi is again set for a certain time T ₁ set by the timer.
It is determined whether the current sampling data _P1 is greater than the subsequent current sampling data P1. In the process of such circulation, when the upper limit peak 39 (see FIG. 5) is detected as a peak and the peak value is set to MAXi, the sampling data _P1 becomes smaller than this. As a result, the judgment in the step is YES, and in the step, i=i+1, this peak value is held as the upper limit peak value in MAXi, the address of the memory 35 is updated, and the next step is performed.
Prepare to hold the next upper limit peak value at MAX _i+1 and move on to step.

In the step, the information stored in the memory 35 is
It is determined whether the number of MAXi and/or MINi has reached a predetermined number, or whether the end key has not been input from the keyboard 6, and the end of the process is determined. Sometimes it moves to steps. Since the decreasing state has already been determined in the step, only the increasing state flag is reset (M=0) in this step, and the process returns to the step to start the process of detecting the next peak on the valley side.

Now, when the valley side detection process is started and a valley side peak is detected in the step, the peak value will be stored in the area MINI of the memory 35.

In this case, in the step determination, the variable V indicating the valley side flag is determined to be V=1, and YES
Then, the process moves to step a.

In step a, it is determined whether the previously detected peak value of MINI is smaller than the current sampling data _P1 after a certain time _T1 set by the timer. As a result, if it is not small, the process moves to step, resets the increase flag M set at the time of peak detection to invalidate it, returns to step, performs similar processing, and returns to step a. Then, it is determined again whether the peak value MIni is smaller than the current sampling data _P1 after a certain time _T1 set by the timer. In the process of such circulation, when the lower limit peak 41 (see FIG. 5) is detected as a peak and the peak value is set to MIni, the sampling data _P1 becomes larger than this. the result,
The judgment at step a is YES, and at step a, i=i+1, the valley side flag "V" is reset (V=0), and this peak value is held in MINI as the lower limit peak value, and the memory is stored. 35 is updated, preparations are made to hold the next lower limit peak value at the next MIN _i+1 location, and the process moves to step a.

At step a, it is determined whether the process has ended in the same way as in step a, and if the determination is NO, the process moves to step a. Since the increasing state has already been determined in step a, only the decreasing state flag is reset in step a, and the process returns to the step to begin the process of detecting the next mountain side peak.

Here, the process of setting the detected data in the step variable _P1 is one of the specific examples of the current value holding means in FIG. This is one specific example. In addition, the processing of step or step a and the areas MAX and MIN of the memory 35 are as follows:
This is one specific example of the peak value storage means 26 shown in FIG.

In this way, each upper limit peak and lower limit peak are detected, and sequentially from MAX ₁ in the memory 35.
Store the upper peak value in MAXn and sequentially set it to MIN ₁
The lower limit peak value is stored in MINn. However, n is the upper limit, lower limit, and the number of detected peaks until the end of the test.

As described above, analysis can be performed by sequentially detecting the upper limit value and lower limit value among the load values detected from the load cell 11, and holding the respective upper limit peak value and lower limit peak value corresponding to these. can.

Next, the cancel processing of abnormal data by the arithmetic processing unit 34 will be explained according to FIGS. 4 and 7. First, the cancel processing program shown in FIG. 7 is stored in a predetermined area of the memory 35 as a program 35c. Suppose that Here, when the operator observes the test situation and notices that an abnormal phenomenon has occurred, such as attachment/detachment abnormality or material failure where the composite material does not peel off at the interface but the material itself peels off, The operator inputs a predetermined function key from the keyboard 6 to perform the cancel process.

When a predetermined function key is input, this program 35c is started after the completion of the peak analysis processing program processing, and abnormal data cancellation processing is executed according to the following steps.

That is, step b shown in FIG.
In the initial setting step, variables k and m are set to k=3 and m=2, respectively, and variable i is set to "0".
clear. Here, the variable k indicates the number of the upper limit peak value, and the variable m indicates the final number of the upper limit peak value for which the average value is calculated. Here, by setting k = 3, it means that abnormal data judgment starts from the third upper limit peak value, and by m = 2, it means that the determination of abnormal data starts from the third upper limit peak value.
It starts by taking the average of the numbers from the first to the second.

Each of these variables is set as one data storage area on the memory 35 as in the case described above, and it goes without saying that registers may be used instead of these variables.

In the next step b, the average value of the upper _limit peak values before the upper limit peak value for determining an abnormal state _is calculated. The average value S _n is calculated by reading out the value of S _n = _n 〓 ^l=1 P _i /m.

Then, in the next step b, the abnormal reference value Q is stored in the reference value storage means 28 and the peak value storage means 26
The peak value P _k is read from the peak value P k and it is determined whether P _k −S _n ≧Q.

If the result of this judgment is NO, proceed to step b.
In step b, the variable m is set to m=m+1, and in step b, the variable k is updated to k=k+1. Then, in step b, the peak value is compared with the number n of final peak values, and if it is less than n, the process returns to step b, and the same determination is made for the next peak value.

In this circular loop from step b to step b, abnormal data is sequentially inspected for the upper limit peak value, and in the judgment of step b,
If the determination is YES, the process moves to step b. Then, in step b, the peak value stored in the peak value storage means 26 is
Upper peak value (or upper limit value and lower limit value) after P _k
This process is then erased and invalidated.

If the process ends without any abnormal data, the determination in step b becomes YES and the process ends. In such a case, it is possible to display this on the display 5, change the reference value Q for determining abnormality, and input it again to perform the cancel process again.

Here, the average value calculated for the peak value to be determined may be a predetermined number of previous peak values, rather than all previous peak values.

Note that the above processing steps are one specific example of the abnormal data elimination means 29 in FIG.

By the way, the peak analysis processing program shown in FIG. Any method may be used as long as the peak value of one of the two is detected.

For example, in this step of the peak analysis processing program, P ₁ > P ₂ is determined, and step a
P ₁ = P ₂ is determined in P 1 = P 2 to determine the increase or decrease in the detected load value, but due to the relationship with noise, a certain percentage of the previous sampling data P ₂ is determined.
Only those that have increased or decreased above this level may be considered as the original increase or decrease, and may be subjected to each peak detection.

In such a case, the steps may be e.g.
(P ₁ − P ₂ )/P ₂ > 0.05, and if NO,
At step a, −0.05≦(P ₁ −P ₂ )/P ₂ ≦
You can make a determination of 0.05 and return to the step when it is YES. By doing this, peak detection will be performed when there is an increase or decrease of 5% or more. As a result, noise can be sufficiently removed, making the analysis process more reliable.

Furthermore, when detecting peaks, each peak may be detected on the condition that a lower limit peak exists between the upper limit peaks, and that an upper limit peak exists between the lower limit peaks. .

In such a case, the peaks are detected alternately on the mountain side and the valley side, and when the peak is on the mountain side, the step returns from step to step when the YES condition of the step is set, and step a and step a are omitted, and the process returns to step A. All you have to do is move to step a.On the other hand, if you are on the valley side, move to step NO.
It is possible to return from step to step when the condition is met, omit step and step, and move to step. Furthermore, even in such a case, it is possible to provide a step a and add a condition such that a peak is detected when the increase or decrease exceeds the predetermined value shown above in the judgment of step a. be.

In addition, peak detection can be performed by detecting each peak point using a general peak detection circuit, and then performing A/D conversion without relying on program processing on the arithmetic processing unit side. The data may be processed on the arithmetic processing device side. In this case, the program processing for peak detection becomes unnecessary, and time is measured based on the detected peak. Incidentally, time measurement in such a case may also be realized by hardware using a one-shot multi-function device, and may be integrated with the peak detection circuit.

By the way, _the fixed time _T1 set in the step of FIG. Well, 5th
In the case of a waveform as shown in the figure, it is preferable to set it to about 2/3 or 2/3+α of the average value of the intervals between a plurality of peaks. This is because the point at which the peak is detected is actually the next sampling point after the peak point, and the actual time is measured at this point, so it is about 2/3 or 2/3 + α of the average value. If you set it to
Even if valleys or peaks appear due to noise, 2/3 of the average value
This is because at a sampling point after a time period of 2/3+α has elapsed, unless it is an upper or lower limit value, it can almost certainly take a value that increases or decreases from the previous peak value. As a result, the noise between the peaks is reliably suppressed during this period.

Now, if the process ends at the step or step a shown in FIG.
Step 5 starts the program 35b for calculating the peeling force, etc. from the memory 35, and enters the process of calculating the peeling force, etc.

Here, the upper limit peak value and lower limit peak value stored in the memory 35 are each counted by the arithmetic processing unit 34, and the numbers are stored.
In addition, at this time, the first j peak values and the last l
It is possible to perform arithmetic processing by excluding these peak values (j, l, arbitrary integers).

Then, the peeling force and tearing force are calculated by the known peak point method, area method, JIS method, etc.

Although detailed description has been made above, the processing shown in this embodiment is just one example, and the present invention is not limited thereto.

In addition, the upper limit/lower limit peak value detection unit 20 of the embodiment
Here, the detected load data is taken in as detection data each time through sampling processing, and peak detection is performed, but regardless of the presence or absence of peak values, all load data from the load cell is sampled first Only the sampling process may be performed independently, and after being stored in the memory, the peak detection process may be performed and the upper limit peak value and the lower limit peak value may be extracted by arithmetic processing. When performing such processing, the time measurement processing for each step is performed by excluding a predetermined number of sampling data.

Furthermore, only each peak and its peak value may be detected after time measurement, and the detected peak values may be compared later to extract the upper limit peak value or the lower limit peak value.

Incidentally, in the embodiment, both the upper limit peak value and the lower limit peak value are detected, but it goes without saying that only the upper limit peak value may be detected.

In addition, in the cancel process, the removal of the upper limit peak value that becomes abnormal data is determined based on the average value of the previous upper limit peak value and the abnormality reference value, but this is just an example. ,
The method is not limited to this method.

〔Effect of the invention〕

As can be understood from the above description, the present invention includes a detector for detecting the load applied to the viscoelastic material as peeling force or tearing force, and a processing device, and the processing device includes: Upper limit peak value detection means for sequentially detecting at least the upper limit peak value of the load detected by the detector, first storage means for sequentially storing the detected upper limit peak values, and abnormal data determination such as peeling force or tearing force. a second storage means for storing a reference value serving as a reference; and an abnormality for removing abnormal upper peak value data from among the stored upper limit peak values by referring to this reference value in accordance with a predetermined control signal. Since it has a data elimination means and a calculation means for calculating peeling force, tearing force, etc. from the upper limit peak value stored in the first storage means, a predetermined control signal can be input to an operator or a predetermined condition signal. It is possible to remove the abnormal upper peak value by generating it in a processing device, etc., and calculate the value of the cutting force, tearing force, etc. using the detection data of the correct upper limit peak value through arithmetic processing.

As a result, attachment/detachment abnormalities may occur, such as when the test piece is cut off by the grip part of the test piece during the test, or the composite material does not peel off at the interface, but the material itself peels off. Even if an abnormal phenomenon such as material destruction occurs, the value of the cutting force or tearing force can be calculated using correct detection data.

Moreover, there is no need to redo a new test, and peel tests, tear tests, etc. can be carried out efficiently.

[Brief explanation of drawings]

FIGS. 1 and 2 are explanatory diagrams of waveforms of load-time characteristics in conventional peeling tests and tear tests on test pieces of viscoelastic materials, respectively, and FIG.
A block diagram focusing on the functions of a viscoelastic material testing system such as a tear test or a peel test applied to this invention, and FIG. 4 is an embodiment in which the viscoelastic material testing system of this invention is realized using a microcomputer. Figure 5 is a waveform diagram of the detection of load-time characteristics by the load cell, Figure 6 is a flowchart of the process of peak value analysis by the microcomputer, and Figure 7 is the cancel process when an abnormal condition occurs. This is a flowchart. 1... Test piece, 2... Testing machine, 3... A/D converter, 4... Processing device, 5... Display, 6
... Keyboard, 10 ... Viscoelastic material testing system, 11 ... Load cell, 20 ... Upper limit/lower limit peak value detection section, 21 ... Mountain side/valley side peak detection means, 22 ... Peak value holding means, 23 ... ...Time measuring means, 24...Current value holding means, 25...Large/
Small determination means, 26...Peak value storage means, 27...
. . . Peeling force calculation means, 28 . . . Reference value storage means, 29 . . . Abnormal data elimination means.

Claims (1)

[Scope of Claims] 1. In a test for peeling, tearing, etc. of a viscoelastic material, a detector for detecting a load applied to the viscoelastic material as a peeling force or a tearing force, etc., and a processing device, The device includes upper limit peak value detection means for sequentially detecting at least upper limit peak values of the load detected by the detector, first storage means for sequentially storing the detected upper limit peak values, and peeling force, tearing force, etc. a second storage means for storing a reference value serving as a reference for abnormal data determination; and a second storage means for storing a reference value as a reference for determining abnormal data; A viscoelastic material test characterized by comprising: abnormal data elimination means for eliminating data; and calculation means for calculating peeling force, tearing force, etc. from the upper limit peak value stored in the first storage means. Data processing equipment. 2. The upper limit peak value detection means includes a peak detection means for detecting the peak of the load detected by the detector, a first holding means for holding the load value of the detected peak, and a first holding means for holding the load value of the detected peak, and a a second holding means for holding the detected load value; and a determination for determining whether the peak value held by the first holding means is larger than the value held by the second holding means. means, and when it is determined that the peak is not large as a result of the determination by the determining means, a similar determination is made for the next detected peak, and when it is determined that the peak is large, the first holding means is Data in a viscoelastic material test according to claim 1, characterized in that the retained peak value is determined as the upper limit peak value for peeling force, tearing force, etc., and the upper limit peak value is detected. Processing equipment. 3. A data processing device for viscoelastic material testing according to claim 1 or 2, characterized in that the processing device includes an arithmetic processing device and a memory.