JPH0342324Y2 - - Google Patents

Description

[Detailed description of the invention] <Technical field> The present invention relates to a sensor (detection device) for detecting the position of a rotating body. Used as a sensor to detect the rotational position of a disc.

<Prior Art> Conventionally, a sensor for detecting the position of a rotating body has a configuration shown in FIG.

That is, a pattern disk 10 having a conductor pattern 11 connected to a rotating body, and the conductor pattern 1
It is composed of a group of contacts 20 that are contacted by the contact point 1.

The conductor pattern 11 of the pattern disk 10 is a circular pattern 11A provided at the center of the disk.
It has patterns 11B, 11C, and 11D that are provided at positions shifted in the radial and circumferential directions, and each pattern 11B, 11C, and 11D is connected sequentially from pattern 11A.

The contact groups 20 are arranged in parallel at appropriate intervals on the disk 10, and the contacts 20A are arranged in a pattern 11D.
Also, the contact 20B is connected to the pattern 11C and the contact 20
C is configured to face the pattern 11B, respectively.

In addition, the contacts 20A to 20C are clamped by a +V power supply, and the contacts 20A and 20C are clamped by a +V power source.
Output signals from B and 20C are output from terminals A, B, and C, respectively. On the other hand, another contact 20G is provided, and this is for connecting the pattern 11A to ground.

In this sensor configuration, the pattern disk 10
is rotated together with the rotating body, and the _X1 position is the contact group 2
If it corresponds to 0, the contact 20C becomes the ground level and the contacts 20A and 20B become the clamp level.

Further, when the X ₂ position of the disk 10 corresponds to the contact group 20, the contact 20B becomes the ground level, and the contacts 20A and 20C become the clamp level.

Further, when the X ₃ position of the disk 10 corresponds to the contact group 20, the contact 20A becomes the ground level, and the contacts 20B and 20C become the clamp level.

FIG. 2 is a linearly expanded view of the pattern of the pattern disk 10 of FIG. 1, showing the positional relationship with the contact group 20. FIG.

Contact group 20 (contacts 20A, 20B, 20C, 2
0G) is supported by a support 30 using a mold or the like, and this support 30 is attached with screws 32 and 33 via long grooves 31 and 31 at both ends. This support body 30 can be adjusted in the direction of the arrow within the range of the long grooves 31, 31.

By the way, as shown in FIG. 2, the relationship between the contact point and the corresponding pattern is d=e, that is, the contact point passes through the center of the pattern.

However, due to manufacturing errors, assembly errors, etc., the above relationship becomes d≠e, and sometimes e or d becomes almost "0" or negative (contact with adjacent pattern).

Among these, if it is negative, it can be checked by rotating the pattern disk and using signals from terminals A, B, and C of each contact, but the problem occurs when e or d is almost "0".

In this case, when the pattern disk is rotated and the output signal is checked, a normal signal is output even though the margin is almost "0", so the check cannot be performed using this output signal. In addition, this type of sensor is often mounted in a position that cannot be seen visually in order to protect the contacts and the like from dust, making it difficult to make visual adjustments.

Therefore, as mentioned above, if the product is assembled with almost zero margin, it will be used without being able to check it, and malfunctions may occur during use due to factors such as external force, wear, vibration, and temperature changes. This was often the case.

<Purpose> The present invention was proposed in order to solve the above-mentioned problem, and in particular, the above-mentioned margins, that is, d and e, can be easily secured.

<Example> FIG. 3 is a linearly expanded view of the pattern of the pattern disk according to the present invention, showing the positional relationship with the contact points.

The pattern disk has a pattern 11 similar to that in Figure 1.
A, 11B, 11C, 11D are provided, and the contact group 20 is also provided with contacts 20A, 20B, 2 similar to that in FIG.
0C and 20G, and only the contact 20B is shown in FIG. 3 for convenience.

In addition, the pattern disk includes the patterns 11A to 11A.
In addition to 11D, a test pattern 40 is provided at a rotational position that is not normally used.

This test pattern 40 has a width K of the pattern 40C corresponding to the contact 20B, and an effective width F of the pattern 11C that the contact 20B actually contacts during use.
Similarly, the width of the pattern 40D, which is set narrower and corresponds to the contact point 20A, is the same as that of the pattern 11D.
is set narrower than the effective width of . The patterns 40C and 40D are formed at positions out of phase with each other.

This test pattern 40 is the contact point 20
This is for checking the electrical continuity between contacts A, 20B, and 20C, and during testing, each terminal A, B, and C of contacts 20A to 20C is connected to a test circuit using a connector.

That is, after assembly, the contact group 20 and patterns 11A to 1
The test pattern 40 is used to check the 1D relationship.

When checking with this test pattern 40, if the contacts 20A to 20C are placed at proper positions, there is no conduction between the contacts.

However, the position of the contact point 20B in FIG. 3 is slightly shifted, and when checking with the test pattern 40 in this state, the contact point 20B is located in the pattern 4.
At the timing S when the contact 20A contacts the pattern 40D, the contacts 20A and 20
It is possible to check that B is conductive and in a defective state.

In this case, even if the margin between the contact point 20B and the pattern 40F is "0", the original pattern 11C
Above, a margin of "H" can still be secured. Conversely, the margin is “0” on the original pattern 11C.
When in this state, the contacts 20A and 20B are electrically connected on the test pattern 40 side, and it is possible to check whether it is in a defective state.

The relationship between the contact point 20B of the test pattern 40 and the pattern 40E is also the same as above.
The margin between contact 20B and pattern 40E is “0”
Even if it is, a margin of J can still be secured on the original pattern 11C.

Note that there is no problem because the test pattern 40 does not have a pattern for the contact 20G in normal use.

<Effects> As described above, the position detection device of the present invention can easily check the contacts by providing a test pattern, which prevents malfunctions due to factors such as external force, wear, vibration, and temperature changes during use. It also has the features of being simple in structure and highly practical.

[Brief explanation of the drawing]

Fig. 1 is a diagram showing a conventional sensor configuration for detecting the position of a rotating body, Fig. 2 is a linear development of the pattern disk pattern in Fig. 1, and Fig. 3 is a diagram showing the configuration of a sensor for detecting the position of a rotating body. FIG. 3 is a diagram showing a sensor configuration to be used. 10... Pattern disk, 11... Conductor pattern, 20A to 20C and 20G... Contact, 30...
...Support, 40...Test pattern.

Claims (1)

[Claims for Utility Model Registration] A position detecting device for a rotating body comprising a pattern disk 10 having a conductive pattern 11 connected to the rotating body, and a contact 20 contacting the conductive pattern 11, comprising: 11 includes a plurality of position detection patterns 11B, 11C, and 11D whose phases are shifted in the radial direction and circumferential direction of the pattern disk, and
The contact point 20 is connected to the plurality of position detection patterns 11
Multiple contacts 2 corresponding to B, 11C, and 11D, respectively
0A, 20B, 20C, a plurality of conductors are set on the pattern disk 10, corresponding to the position detection patterns 11B, 11C, 11D, and set narrower than the effective width with which the contacts 20A, 20B, 20C contact. Pattern 40C, 4
The plurality of contacts 20 are composed of conductor patterns 40C and 40D formed at mutually shifted positions, and connection patterns 40E and 40F that connect the conductor patterns 40C and 40D.
A, 20B, 20C and the position detection pattern 11
A position detection device for a rotating body, characterized in that a test pattern 40 for checking the matching relationship with the position detection patterns 11B, 11C, and 11D is provided separately from the position detection patterns 11B, 11C, and 11D.