JPH0348468A - Luminous circuit - Google Patents
Luminous circuitInfo
- Publication number
- JPH0348468A JPH0348468A JP1183148A JP18314889A JPH0348468A JP H0348468 A JPH0348468 A JP H0348468A JP 1183148 A JP1183148 A JP 1183148A JP 18314889 A JP18314889 A JP 18314889A JP H0348468 A JPH0348468 A JP H0348468A
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- light
- light emitting
- temperature coefficient
- current
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001514 detection method Methods 0.000 abstract 2
- 238000010586 diagram Methods 0.000 description 5
- 230000007423 decrease Effects 0.000 description 2
- 229920006395 saturated elastomer Polymers 0.000 description 1
- 239000000779 smoke Substances 0.000 description 1
Landscapes
- Audible And Visible Signals (AREA)
- Fire-Detection Mechanisms (AREA)
- Led Devices (AREA)
Abstract
Description
【発明の詳細な説明】
[産業上の利用分野]
本発明は、発光回路に関するものであり、例えば光電式
煙感知器における発光回路として用いられるものである
.
[従来の技術]
従来の発光回路では、発光素子やドライブ回路が温度係
数を持つために、発光回路全体としても温度の変化に従
って発光特性が変化していた.第3図は従来の発光回路
の回路図である.発光ダイオード(LED)よりなる発
光素子1に流れる電流■は、
I = (Vce − Vl− − Vsat)/ R
−■となる.ここで、VCCは電源
電圧、VFは発光ダイオードの+e方向電圧、Vsat
はトランジスタQの飽和電圧である.この式から、電流
Iの温度特性は、
1 a I
I aT
という式で表され、■式の特性を持つ電流Iの温度変化
と、発光素子1の単独での発光特性の温度変化の2つの
要因によって発光回路全体としての発光特性が決まる.
■式がら分がるように、電流Iの温度変化はVcc,
Vp, Vsatにより決まり、これらは電源の構成や
発光素子自体の構造により決まるもので、それらの温度
特性を任意の値に調整することは困難である.したがっ
て、発光素子1の発光特性の温度係数と合わせるように
、発光回路全体の発光特性を任意に設定することは非常
に難しい.
[発明が解決しようとする課題]
上述のような発光回路は、例えば第2図に示すような受
光回路と組み合わせてアナログ的な光検出回路として用
いられる.このような光検出回路において、発光側と受
光側の温度係数を相殺できれば、総合的な温度変動をほ
ぼ零にすることができると考えられる.
本発明はこのような点に鑑みてなされたものであり、そ
の目的とするところは、発光回路の温度係数を受光回路
側の温度係数に合わせて任意の値に設定できるようにす
ることにある.
[課題を解決するための手段]
本発明に係る発光回路にあっては、上記の課題を解決す
るために、第1図に示すように、駆動電流■に応じた輝
度の光を放射する発光素子1と、発光素子1に駆動電流
を供給するドライブ回路2とから成り、発光素子1の発
光効率の温度係数に合わせてドライブ回路2の駆動電流
の温度係数を任意に調整する手段を設けたことを特徴と
するものである.
[作用]
第1図に示す発光回路を、第2図に示す受光回路と組み
合わせて光検出回路として用いる場合に、受光出力電流
I2の温度係数を3000ppm/’C、抵抗R6の温
度係数を3 7 0 0ppet/”Cとすると、受光
側回路の受光量に対する温度係数は6700ppm/
’Cとなる.したがって、発光側回路における発光量の
温度係数が−6 7 0 0 ppm/ ”Cとなれば
、光検出回路の出力電圧Voは、周囲温度によっては変
動しない.発光素子1として発光ダイオード(LED)
を用いた場合、その発光効率(駆動電流I1に対する発
光量)は、温度上昇に応じて低下し、その温度係数が例
えば−1 0 0 0 0ppm/’Cであると、ドラ
イブ回路2による駆動電流I,の温度係数を3 3 0
0ppm/”Cにすれば良い.具体的には、第1図に
示す抵抗R1〜R,の値を任意に調節することにより、
第1図に示す発光回路と第2図に示す受光回路を組み合
わせた光検出回路全体の出力電圧Voの温度係数を零に
することができる.
[実施例]
第1図は本発明の一実施例の回路図である.発光信号S
はPMOS トランジスータQ,とNMOSトランジス
タQ,のゲートに印加されると共に、インバータNによ
り論理値を反転されて、NMOSトランジスタQ,,Q
.。のゲートに印加されている。発光信号Sが゜’Hi
gh”レベルになると、PMOSトランジスタQ,がオ
フ、NMosトランジスタQ8はオンとなる。これによ
り、PMOS}ランジスタQ.,Q,とNMOS}ラン
ジスタQ,及び抵抗R5で構成されるカレントミラー回
路が動作する.また、インバータNの出力は“L os
”レベルとなるので、NMOS}ランジスタQ..Q,
。はオフとなる.これにより、NPNトランジスタQQ
2.Q..Q.及び抵抗R + , R 2 , R
sで構成されるバンドギャップリファレンス回路に電流
が供給される.
この結果、第1図に示す回路のB点には、という式で表
される電圧VBが発生する.ここで、V.E,はトラン
ジスタQ,のベース・エミッタ間順方向電圧、VTはk
をボルツマン定数、qを電子電荷、Tを絶対温度とする
と、次式で表される.
V T= kt/q
・・・■ここで、NPN}ランジスタQ5が非飽和状態
で動作しているので、そのベース・エミッタ間電圧をV
BE,とすると、C点には、
VC:VB−vBE5
なる電圧が発生するので、結局、発光素子1には、I
1 = Vc/ R 4= (Va VBES)/
R 4 −■なる一定電流が流れる.
一方、発光信号Sが゛L ow”レベルになると、トラ
ンジスタQ,がオン、トランジスタQ.がオフとなり、
トランジスタQ.,Q,,Q.及び抵抗R,で構戒され
るカレントミラー回路には電流が流れず、また、トラン
ジスタQs.Q+oがオンすることで、トランジスタQ
..Q5のベースには、ベース電流が供給されず、共に
オフ状態となり、発光素子1には電流が流れない.
ここで、第2図に示す受光回路の受光素子3に光が照射
され、光電流I2が発生したときの出力電圧V0の変化
分をv0とすると、
vo=I2・R6 ・・・
■となる.第2図において、4はオペアンプ、5は基準
電圧源であり、オペアンプ4の入力インピーダンスは非
常に高いので、受光素子3に流れる光電流■2は全て帰
還抵抗R,を介して流れることになり、■式が成立する
ものである.この式よりV.の温度変動分は、
となる.ここで、受光素子3をフォトダイオードとし、
抵抗R6を集積回路の拡散抵抗よりなるものとし、その
温度変動分(1/I2)(θr./θT)及び<1/R
i)(θR./θT)をそれぞれ3000ppm/”C
及び3700ppm/’Cと仮定すると、出力電圧v0
の温度変動分(1/v0)(δvo/θT〉は670
0 ppm/ ”Cとなる.また、第1図に示す発光素
子1を一般的な発光ダイオード(LED)とし、第1図
及び第2図に示す回路を組み合わせた光検出回路におい
て、全体の温度変動分を零にしようとすると、発光回路
の電流I1の温度変動分を3300pp曽/℃としてや
れば良い.
今、I1は■式で表されるので、これより、1 θ
L
I1 δT
また、■式より、
ここで、抵抗R,は温度変動を無視できるディスクリー
ト部品とし、また、VBE3= VsEs−0 .7v
、θV BE)/ a T−θVBes/θT= 2
+*V/℃、θVT/δT=0.085mV/”CとL
、抵抗R1〜R,の値をR+=3KΩ、R2=30KΩ
、R3=IKΩに選ぶと、
■式より
VB=2.5V
・・・[相]
また、
■式より、
3 .8 7a+V/ ’C ・
・・■[相]式と■式を■式に代入すると、
ζ 3 3 0 0 ppm/”Cとなる.以上
のように、抵抗R1〜R,の値を適当に選ぶことにより
、第1図及び第2図に示す回路を組み合わせた光検出回
路において、総合的に温度変動分を零にすることができ
る,
[発明の効果]
本発明によれば、発光回路の発光素子に流れる電流の温
度変動分を受光側回路の温度変動に合わせて容易に任意
の値に設定できるので、受光回路と組み合わせたときの
総合的な温度変動が少ない光検出回路を容易に実現でき
るという効果がある.DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] The present invention relates to a light emitting circuit, and is used, for example, as a light emitting circuit in a photoelectric smoke detector. [Prior Art] In conventional light emitting circuits, the light emitting elements and drive circuits have temperature coefficients, so the light emitting characteristics of the entire light emitting circuit change as the temperature changes. Figure 3 is a circuit diagram of a conventional light emitting circuit. The current ■ flowing through the light emitting element 1 made of a light emitting diode (LED) is I = (Vce − Vl− − Vsat)/R
−■ becomes. Here, VCC is the power supply voltage, VF is the +e direction voltage of the light emitting diode, and Vsat
is the saturation voltage of transistor Q. From this equation, the temperature characteristics of the current I are expressed by the equation 1 a I I aT , and there are two factors: the temperature change of the current I, which has the characteristics of the formula (■), and the temperature change of the light emission characteristics of the light emitting element 1 alone. The light emitting characteristics of the entire light emitting circuit are determined by these factors.
■As you can see from the equation, the temperature change in current I is Vcc,
Vp and Vsat, which are determined by the configuration of the power source and the structure of the light emitting element itself, and it is difficult to adjust their temperature characteristics to arbitrary values. Therefore, it is very difficult to arbitrarily set the light emitting characteristics of the entire light emitting circuit so as to match the temperature coefficient of the light emitting characteristics of the light emitting element 1. [Problems to be Solved by the Invention] The light emitting circuit as described above is used as an analog photodetecting circuit in combination with a light receiving circuit as shown in FIG. 2, for example. In such a photodetection circuit, if the temperature coefficients on the light emitting side and the light receiving side can be canceled out, it is thought that the overall temperature fluctuation can be reduced to almost zero. The present invention has been made in view of these points, and its purpose is to enable the temperature coefficient of the light emitting circuit to be set to an arbitrary value in accordance with the temperature coefficient of the light receiving circuit side. .. [Means for Solving the Problems] In order to solve the above problems, in the light emitting circuit according to the present invention, as shown in FIG. It consists of an element 1 and a drive circuit 2 that supplies a drive current to the light emitting element 1, and is provided with means for arbitrarily adjusting the temperature coefficient of the drive current of the drive circuit 2 in accordance with the temperature coefficient of the luminous efficiency of the light emitting element 1. It is characterized by this. [Function] When using the light emitting circuit shown in FIG. 1 in combination with the light receiving circuit shown in FIG. Assuming 700ppet/"C, the temperature coefficient of the light receiving circuit for the amount of light received is 6700ppm/"
'C. Therefore, if the temperature coefficient of the amount of light emission in the light emitting circuit is -6700 ppm/''C, the output voltage Vo of the photodetection circuit will not vary depending on the ambient temperature.A light emitting diode (LED) is used as the light emitting element 1.
, the luminous efficiency (the amount of light emitted with respect to the drive current I1) decreases as the temperature rises, and if the temperature coefficient is, for example, -100000ppm/'C, the drive current by the drive circuit 2 decreases. The temperature coefficient of I, is 3 3 0
It is sufficient to set it to 0 ppm/"C. Specifically, by arbitrarily adjusting the values of the resistors R1 to R shown in FIG.
The temperature coefficient of the output voltage Vo of the entire photodetection circuit, which is a combination of the light emitting circuit shown in FIG. 1 and the light receiving circuit shown in FIG. 2, can be made zero. [Embodiment] Figure 1 is a circuit diagram of an embodiment of the present invention. Luminous signal S
is applied to the gates of PMOS transistor Q and NMOS transistor Q, and its logic value is inverted by inverter N, and the NMOS transistor Q,,Q
.. . is applied to the gate of Light emission signal S is ゜'Hi
gh” level, the PMOS transistor Q, turns off and the NMOS transistor Q8 turns on. As a result, a current mirror circuit consisting of the PMOS transistor Q, Q, the NMOS transistor Q, and the resistor R5 operates. In addition, the output of inverter N is “L os
” level, so NMOS} transistor Q..Q,
. is off. As a result, the NPN transistor QQ
2. Q. .. Q. and resistances R + , R 2 , R
Current is supplied to a bandgap reference circuit consisting of s. As a result, a voltage VB expressed by the equation is generated at point B of the circuit shown in FIG. Here, V. E, is the forward voltage between the base and emitter of transistor Q, and VT is k
When is the Boltzmann constant, q is the electron charge, and T is the absolute temperature, it is expressed by the following formula. V T = kt/q
...■Here, since the NPN transistor Q5 is operating in a non-saturated state, the voltage between its base and emitter is set to V.
BE, then a voltage of VC:VB-vBE5 is generated at point C, so in the end, the light emitting element 1 has I
1 = Vc/R 4= (Va VBES)/
A constant current of R 4 -■ flows. On the other hand, when the light emission signal S reaches the "Low" level, the transistor Q is turned on and the transistor Q is turned off.
Transistor Q. ,Q,,Q. No current flows through the current mirror circuit formed by the transistors Qs. By turning on Q+o, transistor Q
.. .. No base current is supplied to the base of Q5, both are in an off state, and no current flows through the light emitting element 1. Here, if the change in the output voltage V0 when the light receiving element 3 of the light receiving circuit shown in FIG. 2 is irradiated with light and the photocurrent I2 is generated is v0, then vo=I2・R6...
■It becomes. In Fig. 2, 4 is an operational amplifier and 5 is a reference voltage source.Since the input impedance of the operational amplifier 4 is very high, all of the photocurrent (2) flowing to the photodetector 3 flows through the feedback resistor R. ,■Equation holds true. From this formula, V. The temperature variation is as follows. Here, the light receiving element 3 is a photodiode,
The resistor R6 is made of a diffused resistor of the integrated circuit, and its temperature fluctuation (1/I2) (θr./θT) and <1/R
i) (θR./θT) each at 3000 ppm/”C
and 3700 ppm/'C, the output voltage v0
The temperature variation (1/v0) (δvo/θT> is 670
0 ppm/''C.In addition, in a photodetection circuit in which the light emitting element 1 shown in Fig. 1 is a general light emitting diode (LED) and the circuits shown in Figs. 1 and 2 are combined, the overall temperature If you want to make the fluctuation part zero, you can make the temperature fluctuation part of the current I1 of the light emitting circuit 3300 pp so/℃.Now, since I1 is expressed by the formula ■, from this, 1 θ
L I1 δT Also, from equation (2), here, the resistance R is a discrete component whose temperature fluctuation can be ignored, and VBE3=VsEs-0 . 7v
, θV BE)/a T−θVBes/θT= 2
+*V/℃, θVT/δT=0.085mV/”C and L
, the values of resistors R1 to R are R+=3KΩ, R2=30KΩ
, R3=IKΩ, then from formula (①) VB = 2.5V... [phase] Also, from formula (①), 3. 8 7a+V/ 'C ・
... Substituting the ■ [phase] formula and the ■ formula into the ■ formula gives ζ 3 3 0 0 ppm/''C. As mentioned above, by appropriately selecting the values of the resistors R1 to R, the first In a photodetection circuit that combines the circuits shown in FIGS. Since the temperature fluctuation can be easily set to any value according to the temperature fluctuation of the light-receiving circuit, it has the effect of easily realizing a photodetector circuit with less overall temperature fluctuation when combined with the light-receiving circuit.
第1図は本発明の一実施例に係る発光回路の回路図、第
2図は同上の発光回路と組み合わせて使用される受光回
路の回路図、第3図は従来の発光回路の回路図である.Fig. 1 is a circuit diagram of a light emitting circuit according to an embodiment of the present invention, Fig. 2 is a circuit diagram of a light receiving circuit used in combination with the above light emitting circuit, and Fig. 3 is a circuit diagram of a conventional light emitting circuit. be.
Claims (1)
、発光素子に駆動電流を供給するドライブ回路とから成
り、発光素子の発光効率の温度係数に合わせてドライブ
回路の駆動電流の温度係数を任意に調整する手段を設け
たことを特徴とする発光回路。(1) Consisting of a light emitting element that emits light with a brightness that corresponds to the drive current, and a drive circuit that supplies the drive current to the light emitting element, the temperature of the drive current of the drive circuit is adjusted according to the temperature coefficient of the luminous efficiency of the light emitting element. A light emitting circuit characterized in that a means for arbitrarily adjusting a coefficient is provided.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18314889A JPH0775263B2 (en) | 1989-07-15 | 1989-07-15 | Light emitting circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18314889A JPH0775263B2 (en) | 1989-07-15 | 1989-07-15 | Light emitting circuit |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0348468A true JPH0348468A (en) | 1991-03-01 |
| JPH0775263B2 JPH0775263B2 (en) | 1995-08-09 |
Family
ID=16130642
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18314889A Expired - Lifetime JPH0775263B2 (en) | 1989-07-15 | 1989-07-15 | Light emitting circuit |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0775263B2 (en) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5468182A (en) * | 1977-11-11 | 1979-06-01 | Fujitsu Ltd | Light emission diode driving circuit |
-
1989
- 1989-07-15 JP JP18314889A patent/JPH0775263B2/en not_active Expired - Lifetime
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5468182A (en) * | 1977-11-11 | 1979-06-01 | Fujitsu Ltd | Light emission diode driving circuit |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0775263B2 (en) | 1995-08-09 |
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