JPH0348545Y2 - - Google Patents

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Publication number
JPH0348545Y2
JPH0348545Y2 JP2996889U JP2996889U JPH0348545Y2 JP H0348545 Y2 JPH0348545 Y2 JP H0348545Y2 JP 2996889 U JP2996889 U JP 2996889U JP 2996889 U JP2996889 U JP 2996889U JP H0348545 Y2 JPH0348545 Y2 JP H0348545Y2
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JP
Japan
Prior art keywords
light
receiving element
switch
signal
light emitting
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Expired
Application number
JP2996889U
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Japanese (ja)
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JPH01144881U (en
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Priority to JP2996889U priority Critical patent/JPH0348545Y2/ja
Publication of JPH01144881U publication Critical patent/JPH01144881U/ja
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Description

【考案の詳細な説明】 [考案の目的] (産業上の利用分野) 本考案は、電子機器の特性を試験する電子機器
の特性試験端子装置に関する。
[Detailed Description of the Invention] [Purpose of the Invention] (Field of Industrial Application) The present invention relates to a terminal device for testing the characteristics of electronic equipment, which tests the characteristics of electronic equipment.

(従来の技術) この種の装置の一例として例えば電子式電力量
計に適用した場合について第4図に示す構成図を
参照して説明する。この装置にあつては、入力電
力Pに比例するパルス周波数信号に変換する電力
−周波数変換回路1の出力部と、このパルス周波
数信号を分周する分周回路2の入力部とにそれぞ
れ特性試験用端子3,4を設け、これら特性試験
用端子3,4に切離自在な接続導体5を接続して
なる構成である。6は分周回路2の分周信号を計
数する計数回路、7は計数回路6で計数した電力
量を表示する表示部である。
(Prior Art) As an example of this type of device, a case where the device is applied to an electronic watt-hour meter will be described with reference to the configuration diagram shown in FIG. In this device, characteristics tests were conducted on the output part of the power-frequency conversion circuit 1 that converts the input power P into a pulse frequency signal proportional to the input power P, and the input part of the frequency divider circuit 2 that divides this pulse frequency signal. Terminals 3 and 4 are provided, and a detachable connection conductor 5 is connected to these terminals 3 and 4 for characteristic testing. 6 is a counting circuit that counts the frequency-divided signal of the frequency dividing circuit 2, and 7 is a display unit that displays the amount of power counted by the counting circuit 6.

而して、以上の装置において特性試験を行なう
場合、試験用端子3,4から接続導体5を取り外
し、端子3に特性試験用機器(図示せず)を接続
して電力−周波数回路1の特性を試験し、また端
子4に試験用信号源(図示せず)を接続し分周回
路2以後の特性を試験している。
When performing a characteristic test on the above device, the connecting conductor 5 is removed from the test terminals 3 and 4, and a characteristic test device (not shown) is connected to the terminal 3 to test the characteristics of the power-frequency circuit 1. A test signal source (not shown) is connected to terminal 4 to test the characteristics of frequency divider circuit 2 and beyond.

しかし、以上のような特性試験端子装置では、
機械的な接続換えのために試験作業が煩雑であ
り、特に各構成部分1と2,2と6,6と7相互
間にそれぞれ特性試験用端子3,4を設けて各構
成部分1,2,6,7の特性試験を行なう場合に
はそれぞれの試験用端子3,4から接続導体5を
切り離し、試験用信号源などの接続、再度接続導
体5の接続を行なう必要から試験作業が益々煩雑
なものとなる。このことは、電子式電力量計に限
らず多くの構成部分を持つ電子機器にあつても同
様の弊害を生ずる。
However, with the above characteristic test terminal device,
Test work is complicated due to mechanical connection changes, and in particular, characteristic test terminals 3 and 4 are provided between each component part 1 and 2, 2 and 6, and 6 and 7, respectively. , 6 and 7, it is necessary to disconnect the connecting conductor 5 from each of the test terminals 3 and 4, connect the test signal source, etc., and reconnect the connecting conductor 5, making the test work increasingly complicated. Become something. This problem occurs not only in electronic wattmeters but also in electronic devices having many components.

(考案が解決しようとする課題) 以上のように複数の構成部分から成る電子機器
の特性試験作業は煩雑となつている。
(Problems to be solved by the invention) As described above, the task of testing the characteristics of electronic devices consisting of multiple components has become complicated.

そこで本考案は、構成部分の多少に拘らず容易
に特性試験の作業を行なうことができる電子機器
の特性試験端子装置を提供することを目的とす
る。
SUMMARY OF THE INVENTION Therefore, an object of the present invention is to provide a characteristic test terminal device for an electronic device, which allows a characteristic test to be easily performed regardless of the number of components.

[考案の構成] (課題を解決するための手段) 本考案は、電子機器における直列接続された複
数の構成部分の各間に設けられ前段構成部分と後
段構成部分とを接続・分離するスイツチ,光の受
光に応じてスイツチを開閉する第1受光素子、ス
イツチに対して前段構成部分側に接続されこの前
段構成部分からの特性信号に応じて発光する第1
発光素子及びスイツチに対して後段構成部分側に
接続され後段構成部分に対する特性試験用信号を
光として受光する第2受光素子を有する特性試験
用接続端子部と、スイツチに対するスイツチ開閉
用信号を光として発光する第2発光素子及び特性
試験用信号を光として発光する第3発光素子と特
性信号を光として受光する第3受光素子とを有す
るとともにこれら第2及び第3発光素子と第3受
光素子とに対して接続された各端子を有し、かつ
ブロツク体に第2及び第3発光素子をそれぞれ第
1及び第2受光素子と対峙させる位置に配列する
とともに第3受光素子を第1発光素子と対峙させ
る位置に配置した信号入出力端子部とを備えて上
記目的を達成しようとする電子機器の特性試験端
子装置である。
[Structure of the invention] (Means for solving the problem) The present invention provides a switch that is provided between each of a plurality of series-connected components in an electronic device and connects and separates the preceding component and the subsequent component. A first light-receiving element that opens and closes the switch in response to light reception;
A characteristic test connection terminal section having a second light receiving element connected to a downstream component side of the light emitting element and the switch and receiving a characteristic test signal for the downstream component as light; It has a second light emitting element that emits light, a third light emitting element that emits the characteristic test signal as light, and a third light receiving element that receives the characteristic signal as light, and the second and third light emitting elements and the third light receiving element. The second and third light emitting elements are arranged on the block body at positions facing the first and second light receiving elements, respectively, and the third light receiving element is connected to the first light emitting element. This is a characteristic test terminal device for an electronic device that attempts to achieve the above object by including signal input/output terminal portions arranged in opposing positions.

(作用) このような手段を備えたことにより、特性試験
用接続端子部のスイツチが前段構成部分と後段構
成部分との間に接続されるとともに同部の第1受
光素子、第2受光素子及び第1発光素子に対して
それぞれ信号入出力端子部の第2発光素子、第3
発光素子及び第3受光素子が対峙し、この状態に
第2発光素子にスイツチ開閉用信号が加えられる
とこのスイツチ開閉用信号が光として第1受光素
子に送られてスイツチが開閉し前段構成部分と後
段構成部分とが接続・分離される。又、前段構成
部分からの特性信号は光として第1受光素子から
第3受光素子へ伝えられ、さらに後段構成部分に
供給する特性試験用信号は光として第3発光素子
から第2受光素子へ伝えられて後段構成部分に供
給される。
(Function) By providing such a means, the switch of the connection terminal section for characteristic testing is connected between the front stage component and the rear stage component, and the first light receiving element, second light receiving element and the second light receiving element of the same part are connected. The second light emitting element and the third light emitting element are respectively located in the signal input/output terminal section with respect to the first light emitting element.
The light-emitting element and the third light-receiving element face each other, and when a switch opening/closing signal is applied to the second light-emitting element in this state, this switch opening/closing signal is sent as light to the first light-receiving element, which opens and closes the switch, thereby opening and closing the previous stage component. and the subsequent component are connected and separated. Further, the characteristic signal from the first stage component is transmitted as light from the first light receiving element to the third light receiving element, and the characteristic test signal supplied to the second stage component is transmitted as light from the third light emitting element to the second light receiving element. and supplied to subsequent components.

(実施例) 以下、本考案の一実施例を例えば電子式電力量
計に適用した場合について図面を参照して説明す
る。第1図において11は入力電力Pに比例する
パルス周波数信号に変換する電力−周波数変換回
路、12は回路11の出力信号を分周する分周回
路、13は分周回路12の分周信号を計数する計
数回路、14は計数回路13で計数した電力量を
表示する表示部である。さらに、各構成部分相互
間例えば11と12の間、12と13の間、13
と14の間にそれぞれ特性試験用接続端子部15
を設けている。
(Embodiment) Hereinafter, a case where an embodiment of the present invention is applied to, for example, an electronic watt-hour meter will be described with reference to the drawings. In FIG. 1, 11 is a power-frequency converter circuit that converts the input power P into a pulse frequency signal proportional to the input power P, 12 is a frequency divider circuit that divides the output signal of the circuit 11, and 13 is a frequency divider circuit that divides the frequency divided signal of the frequency divider circuit 12. A counting circuit 14 is a display unit that displays the amount of power counted by the counting circuit 13. Further, between each component part, for example, between 11 and 12, between 12 and 13, and between 13
and 14, respectively, a connection terminal section 15 for characteristic testing.
has been established.

次に、第2図は第1図に示す特性試験用接続端
子部15および信号入出力端子部16の具体的構
成例を示す図である。15−1は各構成部分相互
間に介挿してなるスイツチであつて、これは受光
素子15−2で光を受光したときオフする機能を
持つている。この受光素子15−2は、その一端
を接地し、他端出力側をスイツチ15−1に接続
するとともに、また抵抗を介して電源VDDに接続
している。15−3は前段側構成部分例えば電力
−周波数回路11側に接続してなるトランジスタ
であつて、このトランジスタ15−3の一端を接
地し、他端側を受光素子15−4および抵抗の直
列回路を介して前記直流電源VDDに接続してい
る。15−5は受光素子であつて、その一端を接
地し、他端側をインバータ15−6を介して後段
構成部分例えば分周回路12に接続するととも
に、また抵抗を介して前記直流電源VDDに接続し
ている。
Next, FIG. 2 is a diagram showing a specific configuration example of the characteristic test connection terminal section 15 and the signal input/output terminal section 16 shown in FIG. 1. Reference numeral 15-1 is a switch inserted between each component, and has the function of turning off when light is received by the light receiving element 15-2. This light receiving element 15-2 has one end grounded, and the other output end connected to the switch 15-1 and also to the power supply VDD via a resistor. Reference numeral 15-3 is a transistor connected to a component on the previous stage, for example, the power-frequency circuit 11 side, one end of this transistor 15-3 is grounded, and the other end is connected to a series circuit of a light receiving element 15-4 and a resistor. It is connected to the DC power supply VDD via. Reference numeral 15-5 denotes a light receiving element, one end of which is grounded, and the other end connected to a downstream component such as the frequency dividing circuit 12 via an inverter 15-6, and also connected to the DC power supply V DD via a resistor. is connected to.

一方、信号入出力端子部16にあつては、スイ
ツチ開閉用信号を入力する端子16−1を入力部
に持つトランジスタ16−2の出力側に前記受光
素子15−2に光を入射する受光素子16−3を
接続した第1の回路、また前記受光素子15−4
の光を受光する受光素子16−4、特性試験用信
号を入力する端子16−5を入力部に持つトラン
ジスタ16−6の出力側に前記受光素子15−5
に光を入射する発光素子16−7を接続した第2
の回路を備えている。
On the other hand, in the case of the signal input/output terminal section 16, a light-receiving element that inputs light to the light-receiving element 15-2 is connected to the output side of a transistor 16-2, which has a terminal 16-1 for inputting a switch opening/closing signal as an input part. 16-3, and the light receiving element 15-4.
The light receiving element 15-5 is connected to the output side of the transistor 16-6, which has a terminal 16-5 as an input section for inputting a characteristic test signal.
A second light emitting element 16-7 is connected to which the light is incident.
It is equipped with a circuit.

第3図は特性試験用接続端子部15に信号入出
力端子部16を実装する一例を示す図である。例
えば接続端子ブロツク21に長孔部22を設ける
とともに、この長孔部22の壁部に所定の配列で
特性試験用接続端子部15の受光素子15−2,
15−5および発行素子15−3を設け、一方、
信号入出力部16は発行素子16−3、受光素子
16−4、発光素子16−7を所定の配列とした
ブロツク体23とし、これを前記長孔部22に挿
入する構成としたものである。
FIG. 3 is a diagram showing an example of mounting the signal input/output terminal section 16 on the characteristic test connection terminal section 15. For example, the connection terminal block 21 is provided with a long hole 22, and the light receiving elements 15-2 of the connection terminal 15 for characteristic testing are arranged in a predetermined arrangement on the wall of the long hole 22.
15-5 and an emitting element 15-3, while
The signal input/output section 16 is a block body 23 in which an emitting element 16-3, a light receiving element 16-4, and a light emitting element 16-7 are arranged in a predetermined arrangement, and this block body 23 is inserted into the elongated hole section 22. .

次に、以上のように構成した装置の作用を説明
する。なお、説明の便宜上、例えば電力−周波数
変換回路11の特性および分周回路12以後の特
性試験を行なう場合について述べる。
Next, the operation of the device configured as above will be explained. For convenience of explanation, a case will be described in which, for example, the characteristics of the power-frequency conversion circuit 11 and the characteristics after the frequency dividing circuit 12 are tested.

先ず、ブロツク体23を接続端子ブロツク21
の長孔部22に挿入する。これにより、受光素子
15−2と発光素子16−3が対峙し、同様に発
光素子15−4と受光素子16−4、受光素子1
5−5と発光素子16−7がそれぞれ対峙し、こ
れら発光素子と受光素子との対峙によりそれぞれ
ホトカプラが形成される。
First, connect the block body 23 to the connecting terminal block 21.
Insert into the long hole 22 of. As a result, the light receiving element 15-2 and the light emitting element 16-3 face each other, and similarly the light emitting element 15-4 and the light receiving element 16-4, and the light receiving element 1
5-5 and the light-emitting element 16-7 face each other, and photocouplers are formed by the light-emitting element and the light-receiving element facing each other.

而して、以上のような状態に設定した後、端子
16−1にスイツチ開閉用信号を入力すると、こ
の信号でトランジスタ16−2がオンし発光素子
16−3に電流が流れる。この結果、発光素子1
6−3が発光を行なうので、この光を特性試験用
接続端子部15の受光素子15−2で受光しこの
受光動作でスイツチ15−1を開放する。従つ
て、以上の動作によつて電力−周波数変換回路1
1と分周回路12とが電気的に分離される。
After setting the state as described above, when a switch opening/closing signal is input to the terminal 16-1, this signal turns on the transistor 16-2 and current flows through the light emitting element 16-3. As a result, light emitting element 1
6-3 emits light, this light is received by the light receiving element 15-2 of the connection terminal section 15 for characteristic testing, and the switch 15-1 is opened by this light receiving operation. Therefore, by the above operation, the power-frequency conversion circuit 1
1 and the frequency dividing circuit 12 are electrically separated.

ところで、電力−周波数変換回路11の出力部
に特性試験用接続端子部15が接続されているの
で、回路11に入力電力P又は特性試験用信号を
入れると、トランジスタ15−3がオンし発光素
子15−4に電流が流れる。従つて、発光素子1
5−4が発光し、これが信号入出力部16の受光
素子16−4で受光して動作する。そこで、信号
入出力部16の端子16−8、16−9に特性試
験用機器を接続すれば、電力−周波数変換回路1
1の特性を試験することができる。
By the way, since the characteristic test connection terminal section 15 is connected to the output section of the power-frequency conversion circuit 11, when the input power P or the characteristic test signal is input to the circuit 11, the transistor 15-3 is turned on and the light emitting element is turned on. A current flows through 15-4. Therefore, light emitting element 1
5-4 emits light, which is received by the light receiving element 16-4 of the signal input/output section 16 and operates. Therefore, by connecting the characteristic test equipment to the terminals 16-8 and 16-9 of the signal input/output section 16, the power-frequency conversion circuit 1
1 property can be tested.

また、信号入出力部16の端子16−5に特性
試験用信号を入力すると、トランジスタ16−6
のオンによつて発光素子16−7が発光し、この
光が特性試験用接続端子部15の受光素子15−
5で受光する。そして、この素子15−5の受光
動作信号がインバータ15−6を介して分周回路
12の入力部に供給される。これによつて、分周
回路12以後の構成部分が動作しその結果が表示
部14に表示される。従つて、この表示結果から
分周回路12以後の特性を容易に試験することが
できる。
Furthermore, when a characteristic test signal is input to the terminal 16-5 of the signal input/output section 16, the transistor 16-6
When turned on, the light emitting element 16-7 emits light, and this light is transmitted to the light receiving element 15-7 of the connection terminal section 15 for characteristic testing.
Receives light at 5. The light receiving operation signal of this element 15-5 is then supplied to the input section of the frequency dividing circuit 12 via an inverter 15-6. As a result, the components after the frequency dividing circuit 12 operate, and the results are displayed on the display section 14. Therefore, the characteristics after the frequency dividing circuit 12 can be easily tested from this display result.

なお、分周回路12と計数回路13以後の特
性、その他各構成部分ごとの特性については、そ
れに対応する適宜な特性試験用接続端子部15を
選択して信号入出力端子部16を実装すれば容易
に特性試験を行なうことができる。
The characteristics after the frequency dividing circuit 12 and the counting circuit 13, as well as the characteristics of each other component part, can be determined by selecting the appropriate connection terminal section 15 for characteristic testing and mounting the signal input/output terminal section 16. Characteristic tests can be easily performed.

なお、上記実施例では、電子式電力量計につい
て適用したがこれに限らないことは言うまでもな
い。また、特性試験用接続端子部15への信号入
出力端子部16の実装手段は種々考えられる。例
えば、各構成部分11〜14の総ての特性試験を
行なう場合には、特性試験用接続端子部15,…
の総ての受光素子15−2,…、発光素子15−
3,…および受光素子15−5,…を同一の接続
端子ブロツク21に配列するようにしてもよい。
その他、本考案の要旨を変更しない範囲で種々変
形実施が可能である。
In addition, although the above embodiment was applied to an electronic watt-hour meter, it goes without saying that the present invention is not limited to this. Moreover, various means for mounting the signal input/output terminal section 16 to the characteristic test connection terminal section 15 are conceivable. For example, when performing a characteristic test on all of the component parts 11 to 14, the characteristic test connection terminal section 15,...
All the light receiving elements 15-2,..., the light emitting elements 15-
3, . . . and the light receiving elements 15-5, . . . may be arranged in the same connection terminal block 21.
In addition, various modifications can be made without changing the gist of the present invention.

[考案の効果] 以上詳記したように本考案によれば、電子機器
の各構成部分の間に特性試験用接続端子部を設け
て各構成部分間にスイツチを接続し、かつこの特
性試験用接続端子部の第1受光素子、第2受光素
子及び第1発光素子に対してそれぞれ信号入出力
端子部の第2発光素子、第3発光素子及び第3受
光素子を対峙させ、この状態に第2発光素子にス
イツチ開閉用信号を加えてスイツチを開閉して前
段構成部分と後段構成部分とを接続・分離し、又
前段構成部分からの特性信号を光として第1発光
素子から第3受光素子を通して取出し、かつ後段
構成部分に供給する特性試験用信号を光として第
3発光素子から第2受光素子へ伝て行うようにし
たので、煩雑な試験作業をとることなく簡単にか
つ迅速に特性試験ができ、そのうえ各構成部分ご
とに調整及び特性測定ができるとともにこれら調
整及び特性測定を同時にかつ短時間で行うことが
できる。さらに各発光素子と各受光素子とが対峙
することによりホトカプラが形成されるので、電
気的に絶縁されてノイズ等の影響を受けにくい。
[Effects of the invention] As detailed above, according to the invention, a connection terminal section for characteristic testing is provided between each component part of an electronic device, a switch is connected between each component part, and a connection terminal section for this characteristic test is provided. The second light-emitting element, the third light-emitting element, and the third light-receiving element of the signal input/output terminal part are respectively opposed to the first light-receiving element, the second light-receiving element, and the first light-emitting element of the connection terminal part. A switch opening/closing signal is applied to the two light-emitting elements to open and close the switch to connect and separate the front-stage component and the rear-stage component, and the characteristic signal from the front-stage component is used as light to pass from the first light-emitting element to the third light-receiving element. Since the characteristic test signal taken out through the cable and supplied to the subsequent components is transmitted as light from the third light emitting element to the second light receiving element, characteristic tests can be easily and quickly performed without complicated test work. Moreover, it is possible to adjust and measure the characteristics of each component, and to perform these adjustments and characteristics measurements simultaneously and in a short time. Furthermore, since a photocoupler is formed by each light emitting element and each light receiving element facing each other, they are electrically insulated and are less susceptible to noise and the like.

【図面の簡単な説明】[Brief explanation of drawings]

第1図ないし第3図は本考案に係る電子機器の
特性試験端子装置の一実施例を説明するための図
であつて、第1図は電子式電力量計に適用した概
略構成図、第2図は本考案の要部を示す回路構成
図、第3図は第2図の特性試験用接続端子部に信
号入出力端子部を実装する状態を示す図、第4図
は電子式電力量計に適用した従来装置の概略構成
を示す図である。 11……電力−周波数回路、12……分周回
路、13……計数回路、14……表示部、15…
…特性試験用接続端子部、15−1……スイツ
チ、15−2……受光素子、15−4……発光素
子、15−5……受光素子、16……信号入出力
端子部、16−3……発光素子、16−4……受
光素子、16−7……発光素子。
1 to 3 are diagrams for explaining one embodiment of the characteristic test terminal device for electronic equipment according to the present invention, in which FIG. 1 is a schematic configuration diagram applied to an electronic watt-hour meter, and FIG. Figure 2 is a circuit configuration diagram showing the main parts of the present invention, Figure 3 is a diagram showing how the signal input/output terminal section is mounted on the connection terminal section for characteristic testing in Figure 2, and Figure 4 is an electronic power consumption diagram. 1 is a diagram showing a schematic configuration of a conventional device applied to a meter. 11... Power-frequency circuit, 12... Frequency dividing circuit, 13... Counting circuit, 14... Display unit, 15...
... Connection terminal section for characteristic test, 15-1... Switch, 15-2... Light receiving element, 15-4... Light emitting element, 15-5... Light receiving element, 16... Signal input/output terminal section, 16- 3... Light emitting element, 16-4... Light receiving element, 16-7... Light emitting element.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 電子機器における直列接続された複数の構成部
分の各間に設けられ前段構成部分と後段構成部分
とを接続・分離するスイツチ,光の受光に応じて
前記スイツチを開閉する第1受光素子、前記スイ
ツチに対して前記前段構成部分側に接続されこの
前段構成部分からの特性信号に応じて発光する第
1発光素子及び前記スイツチに対して前記後段構
成部分側に接続され前記後段構成部分に対する特
性試験用信号を光として受光する第2受光素子を
有する特性試験用接続端子部と、前記スイツチに
対するスイツチ開閉用信号を光として発光する第
2発光素子及び前記特性試験用信号を光として発
光する第3発光素子と前記特性信号を光として受
光する第3受光素子とを有するとともにこれら第
2及び第3発光素子と第3受光素子とに対して接
続された各端子を有し、かつブロツク体に前記第
2及び第3発光素子をそれぞれ前記第1及び第2
受光素子と対峙させる位置に配列するとともに前
記第3受光素子を前記第1発光素子と対峙させる
位置に配置した信号入出力端子部とを具備したこ
とを特徴とする電子機器の特性試験端子装置。
A switch provided between each of a plurality of series-connected components in an electronic device to connect and separate the preceding component and the subsequent component, a first light receiving element that opens and closes the switch in response to light reception, and the switch. A first light emitting element connected to the front component side of the switch and emitting light in response to a characteristic signal from the front component part; and a first light emitting element connected to the rear component side of the switch and used for characteristic testing of the rear component part. a characteristic test connection terminal portion having a second light receiving element that receives a signal as light; a second light emitting element that emits a switch opening/closing signal for the switch as light; and a third light emitting element that emits the characteristic test signal as light. and a third light-receiving element that receives the characteristic signal as light, and has respective terminals connected to the second and third light-emitting elements and the third light-receiving element; The second and third light emitting elements are respectively connected to the first and second light emitting elements.
A characteristic testing terminal device for electronic equipment, comprising: a signal input/output terminal section arranged at a position facing a light receiving element and at a position where the third light receiving element faces the first light emitting element.
JP2996889U 1989-03-16 1989-03-16 Expired JPH0348545Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2996889U JPH0348545Y2 (en) 1989-03-16 1989-03-16

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2996889U JPH0348545Y2 (en) 1989-03-16 1989-03-16

Publications (2)

Publication Number Publication Date
JPH01144881U JPH01144881U (en) 1989-10-04
JPH0348545Y2 true JPH0348545Y2 (en) 1991-10-16

Family

ID=31254610

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2996889U Expired JPH0348545Y2 (en) 1989-03-16 1989-03-16

Country Status (1)

Country Link
JP (1) JPH0348545Y2 (en)

Also Published As

Publication number Publication date
JPH01144881U (en) 1989-10-04

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