JPH0350989B2 - - Google Patents
Info
- Publication number
- JPH0350989B2 JPH0350989B2 JP58023527A JP2352783A JPH0350989B2 JP H0350989 B2 JPH0350989 B2 JP H0350989B2 JP 58023527 A JP58023527 A JP 58023527A JP 2352783 A JP2352783 A JP 2352783A JP H0350989 B2 JPH0350989 B2 JP H0350989B2
- Authority
- JP
- Japan
- Prior art keywords
- defect
- flaw detection
- probe
- angle
- information
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/26—Arrangements for orientation or scanning by relative movement of the head and the sensor
- G01N29/262—Arrangements for orientation or scanning by relative movement of the head and the sensor by electronic orientation or focusing, e.g. with phased arrays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/10—Number of transducers
- G01N2291/106—Number of transducers one or more transducer arrays
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58023527A JPS59148865A (ja) | 1983-02-14 | 1983-02-14 | 超音波探傷による皮下欠陥検出方法 |
| US06/563,953 US4537073A (en) | 1982-12-24 | 1983-12-21 | Inspection method of square billet using electronic scanning |
| CA000444221A CA1222314A (fr) | 1982-12-24 | 1983-12-23 | Verification des largets, equilateraux par balayage electronique |
| DE19833346791 DE3346791A1 (de) | 1982-12-24 | 1983-12-23 | Verfahren zur pruefung eines quadratischen knueppels mit elektronischer abtastung |
| KR1019830006135A KR870001259B1 (ko) | 1982-12-24 | 1983-12-23 | 전자주사를 이용하는 각 강편의 검사방법 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58023527A JPS59148865A (ja) | 1983-02-14 | 1983-02-14 | 超音波探傷による皮下欠陥検出方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS59148865A JPS59148865A (ja) | 1984-08-25 |
| JPH0350989B2 true JPH0350989B2 (fr) | 1991-08-05 |
Family
ID=12112914
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58023527A Granted JPS59148865A (ja) | 1982-12-24 | 1983-02-14 | 超音波探傷による皮下欠陥検出方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59148865A (fr) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6238716B2 (ja) * | 2013-12-09 | 2017-11-29 | 株式会社神戸製鋼所 | 被検査体の表面欠陥深さの弁別方法及びその装置 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5642136A (en) * | 1979-09-14 | 1981-04-20 | Toshiba Corp | Ultrasonic flaw detecting method |
| JPS57132054A (en) * | 1981-02-10 | 1982-08-16 | Sumitomo Metal Ind Ltd | Flaw detector |
-
1983
- 1983-02-14 JP JP58023527A patent/JPS59148865A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS59148865A (ja) | 1984-08-25 |
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