JPH035391A - Semiconductor single crystal production device - Google Patents

Semiconductor single crystal production device

Info

Publication number
JPH035391A
JPH035391A JP13998189A JP13998189A JPH035391A JP H035391 A JPH035391 A JP H035391A JP 13998189 A JP13998189 A JP 13998189A JP 13998189 A JP13998189 A JP 13998189A JP H035391 A JPH035391 A JP H035391A
Authority
JP
Japan
Prior art keywords
focus
multiple crystal
temp
crystal body
single crystal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13998189A
Other languages
Japanese (ja)
Inventor
Toshio Yasunaga
安永 壽夫
Joshi Nishio
譲司 西尾
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP13998189A priority Critical patent/JPH035391A/en
Publication of JPH035391A publication Critical patent/JPH035391A/en
Pending legal-status Critical Current

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  • Crystals, And After-Treatments Of Crystals (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)

Abstract

PURPOSE:To improve the quality by disposing a temp. averaging member between a focus heating unit and a multiple crystal semiconductor lacated at the focus position of the unit and moving the focus position successively to melt and solidify the semiconductor multiple crystal body into a single crystal. CONSTITUTION:Between the focus heating unit 101 and the multiple crystal body 10, such as GaAs, a part of which is located in the focus position, the temp. an averaging member 11 made of tubular material of high melting point and high thermal conductivity, such as Mo, is disposed coaxially with the multiple crystal body 10. The multiple crystal body 10 is uniformly heated by the temp. averaging member 11 which once absorbs the heat to be collected at the focus sent from the focus heating unit 101 and gets high temp. By this heating, the temp. of the bar-shaped multiple crystal body 10 is uniformly raised in the peripheral direction, and the melting area is formed at the central position of the temp. averaging member 11. In this case, there are three cases: the case in which the focus heating unit 101 is fixed and the multiple crystal body 10 is moved, the case in which the multiple crystal body 10 is fixed and the forcus heating unit 101 is moved, and the case in which both are moved.

Description

【発明の詳細な説明】 〔発明の目的〕 (産業上の利用分野) 本発明は、半導体単結晶製造装置にかかり。[Detailed description of the invention] [Purpose of the invention] (Industrial application field) The present invention relates to a semiconductor single crystal manufacturing apparatus.

特にトラベリング・ヒータ法(Travelling 
HaatarMethod : THMと略称する)、
またはトラベリング・ソルベント法(Travelli
ng 5olvent Method : TSMと略
称する)による半導体単結晶製造装置に関する。
In particular, the traveling heater method
HaatarMethod: abbreviated as THM),
or the traveling solvent method (Travelli
The present invention relates to a semiconductor single crystal manufacturing apparatus using the ng 5olvent Method (abbreviated as TSM).

(従来の技術) 従来のTHM法、またはTSM法による半導体単結晶製
造装置を第3図、および第4図を参照して説明する。
(Prior Art) A semiconductor single crystal manufacturing apparatus using the conventional THM method or TSM method will be described with reference to FIGS. 3 and 4.

この半導体単結晶製造装置とこの装置により、例えばG
aAsの如き半導体多結晶体を単結晶化する状態を第3
図に斜視図で示す。この第3図に示すように、トーラス
形状の焦点加熱装置部101の焦点位置に半導体多結晶
体100(以下多結晶体と略称する)の一部を位置させ
るとともに、焦点加熱装置部101、または多結晶体1
00の少なくとも一方を移動させ多結晶体100を順次
前記焦点位置を通過させる。前記移動は一般の直線状移
動に用いられる移動機構102によって達成される。こ
の移動により、−例として棒状の多結晶体100はその
一端部から順次他端に向は溶融、凝固し単結晶体となる
With this semiconductor single crystal manufacturing apparatus and this apparatus, for example, G
The third state is the state in which a semiconductor polycrystalline material such as aAs is made into a single crystal.
It is shown in a perspective view in the figure. As shown in FIG. 3, a part of the semiconductor polycrystalline body 100 (hereinafter abbreviated as polycrystalline body) is positioned at the focal point position of the torus-shaped focal heating device section 101, and the focal heating device section 101 or Polycrystalline 1
00 to cause the polycrystalline body 100 to sequentially pass through the focal position. The movement is achieved by a movement mechanism 102 that is used for general linear movement. As a result of this movement, the rod-shaped polycrystalline body 100, for example, is melted and solidified from one end to the other end to become a single crystalline body.

次に前記単結晶製造装置の焦点加熱装置部101を断面
図で第4図に示す。同図において、棒状の多結晶体10
0は常に焦点加熱装置部101の焦点位置(中心)に位
置しつつ移動機構102によって同図の左から右へ所定
の速度で移動する。そして、溶融、凝固後には単結晶体
が得られる。
Next, FIG. 4 shows a cross-sectional view of the focal heating device section 101 of the single crystal manufacturing apparatus. In the figure, a rod-shaped polycrystalline body 10
0 is always located at the focus position (center) of the focus heating device section 101 and is moved by the moving mechanism 102 from left to right in the figure at a predetermined speed. After melting and solidification, a single crystal is obtained.

(発明が解決しようとする課題) 焦点加熱装置部の焦点は極めて小さなもので、多結晶体
を均一に加熱しようとすると、多結晶体の直径は焦点加
熱装置部の大きさに比べて小さなものにしなくてはなら
ない。逆に、原料のサイズを大きくすると、焦点から外
れてしまい、均一な加熱が出来ず、製造される半導体材
料の品質の低下をもたらすという重大な問題がある。
(Problem to be Solved by the Invention) The focal point of the focal heating device is extremely small, and when trying to uniformly heat a polycrystal, the diameter of the polycrystal is small compared to the size of the focal heating device. must be done. On the other hand, if the size of the raw material is increased, there is a serious problem that the raw material will be out of focus and cannot be heated uniformly, leading to a decrease in the quality of the semiconductor material produced.

本発明は、以上の従来の装置における問題点に鑑み、原
料を均一に加熱することが出来る半導体単結晶製造装置
の改良構造を提供する6〔発明の構成〕 (課題を解決するための手段) 本発明の半導体単結晶製造装置は、焦点加熱装置部の焦
点位置に一部を位置させた多結晶体と、前記焦点位置を
前記多結晶体上に順次移動させ多結晶体を徐々に溶融、
凝固させて単結晶化するために焦点加熱装置部又は多結
晶体の少なくとも一方を移動させる移動機構と、前記焦
点加熱装置部と多結晶体との間に配置された均温部材と
を具備したものである。
In view of the above-mentioned problems with conventional devices, the present invention provides an improved structure of a semiconductor single crystal manufacturing device that can uniformly heat raw materials.6 [Structure of the Invention] (Means for Solving the Problems) The semiconductor single crystal manufacturing apparatus of the present invention includes a polycrystalline body partially positioned at a focus position of a focus heating device section, and a step of gradually melting the polycrystalline body by sequentially moving the focus position onto the polycrystalline body.
A moving mechanism for moving at least one of the focal heating device section or the polycrystalline body in order to solidify and convert the polycrystalline body into a single crystal, and a temperature equalizing member disposed between the focal heating device section and the polycrystalline body. It is something.

(作 用) 焦点加熱装置部とその中心に配置した多結晶体との間に
、高融点で熱伝導率の大きい材料で形成された均温部材
を配置し、多結晶体における溶融部の均質化をはかるも
のである。
(Function) An isothermal member made of a material with a high melting point and high thermal conductivity is placed between the focal heating device section and the polycrystalline body placed at the center of the unit, and the molten part of the polycrystalline body is homogeneous. The goal is to make the world more popular.

(実施例) 以下、本発明の1実施例につき第1図と第2図を参照し
て説明する。この第1図と第2図は前記従来例における
第3図と第4図に夫々対応して示すものであり、従来例
と変わらない部分に対しては図面に従来の各部分と同じ
符号を付けて示し説明を省略する。
(Example) Hereinafter, one example of the present invention will be described with reference to FIGS. 1 and 2. These FIGS. 1 and 2 correspond to FIGS. 3 and 4 in the conventional example, respectively, and parts that are the same as in the conventional example are given the same reference numerals as those in the conventional example. The description will be omitted.

図示の如く、焦点加熱装置部101と、その焦点位置に
一部が位置する例えばGaAsの如き多結晶体10との
間に多結晶体と同軸に円筒型の均温部材11が配置され
ている。この均温部材11は高融点で熱伝導率の高い物
質、例えばモリブデンで形成されており、焦点で集光さ
れるべき焦点加熱装置部101の熱を一旦吸収して等温
かつ高温になった均温部材11により多結晶体10は均
温加熱される。この加熱によって、棒状の多結晶体は特
に周方向に均等に昇温し、均温部材の中央位置に均温の
溶融域が形成される。
As shown in the figure, a cylindrical temperature-uniforming member 11 is disposed coaxially with the polycrystalline body 10 between the focal point heating device section 101 and a polycrystalline body 10 such as GaAs, which is partially located at the focal point position. . This temperature-isolating member 11 is made of a material with a high melting point and high thermal conductivity, for example, molybdenum, and once absorbs the heat of the focus heating device section 101 to be focused at the focal point, it becomes an isothermal and high-temperature equalizer. The polycrystalline body 10 is uniformly heated by the heating member 11 . By this heating, the temperature of the rod-shaped polycrystalline body rises evenly, especially in the circumferential direction, and a uniform temperature melting zone is formed at the center of the temperature uniform member.

なお、軟土の実施例において、焦点加熱装置部101を
固定し多結晶体10を移動させるものを例示したが、こ
れに限られることなく、この逆、すなわち多結晶体10
を固定し焦点加熱装置部101を移動させてもよく、さ
らには両者を共に移動させてもよい。
In addition, in the example of soft soil, the focal heating device section 101 is fixed and the polycrystalline body 10 is moved, but the invention is not limited to this, and the reverse, that is, the polycrystalline body 10 is moved.
may be fixed and the focus heating device section 101 may be moved, or both may be moved together.

〔発明の効果〕〔Effect of the invention〕

本発明によれば、従来の半導体単結晶製造装置における
均温ゾーンが狭いために小さい多結晶体しか使用できな
い不具合と、製造の効率が低い点と、得られる単結晶体
の品質が悪い点とを改良できる。すなわち、多結晶体の
大きさについては、従来−例の棒状多結晶体が径10m
m未満に限られていたものが、径20m+++を超える
ものが良好な効率と品質で達成できるなどの顕著な効果
がある。また、この発明は実施が容易で、比較的廉価に
達成できる利点もある。
According to the present invention, the drawbacks of conventional semiconductor single crystal manufacturing equipment in which only small polycrystals can be used due to the narrow isothermal zone, low manufacturing efficiency, and poor quality of the obtained single crystals can be overcome. can be improved. That is, regarding the size of the polycrystalline body, the rod-shaped polycrystalline body of the conventional example has a diameter of 10 m.
There are remarkable effects such as the ability to achieve a diameter of more than 20m+++ with good efficiency and quality, whereas the diameter was previously limited to less than 20m. The invention also has the advantage of being easy to implement and relatively inexpensive to achieve.

【図面の簡単な説明】[Brief explanation of drawings]

第1図と第2図は本発明の一実施例にかかり、第1図は
半導体単結晶製造装置を説明するための斜視図、第2図
は半導体単結晶製造装置の断面図、第3図は従来例の半
導体単結晶製造装置を説明するための斜視図、第4図は
従来例の半導体単結晶製造装置の断面図である。
1 and 2 show an embodiment of the present invention, in which FIG. 1 is a perspective view for explaining a semiconductor single crystal manufacturing device, FIG. 2 is a sectional view of the semiconductor single crystal manufacturing device, and FIG. 3 is a sectional view of the semiconductor single crystal manufacturing device. 4 is a perspective view for explaining a conventional semiconductor single crystal manufacturing apparatus, and FIG. 4 is a sectional view of the conventional semiconductor single crystal manufacturing apparatus.

Claims (1)

【特許請求の範囲】[Claims] 焦点加熱装置部の焦点位置に一部を位置させた半導体多
結晶体と、前記焦点位置を前記半導体多結晶体上に順次
移動させ半導体多結晶体を徐々に溶融、凝固させて単結
晶化するために焦点加熱装置部又は半導体多結晶体の少
なくとも一方を移動させる移動機構と、前記焦点加熱装
置部と半導体多結晶体との間に配置された均温部材とを
具備した半導体単結晶製造装置。
A semiconductor polycrystalline body is partially positioned at the focal point of a focal point heating device, and the focal point position is sequentially moved onto the semiconductor polycrystalline body to gradually melt and solidify the semiconductor polycrystalline body to form a single crystal. A semiconductor single crystal manufacturing apparatus comprising: a moving mechanism for moving at least one of a focal heating device section or a semiconductor polycrystalline body; and a temperature isotherm member disposed between the focal heating device section and the semiconductor polycrystalline body. .
JP13998189A 1989-06-01 1989-06-01 Semiconductor single crystal production device Pending JPH035391A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13998189A JPH035391A (en) 1989-06-01 1989-06-01 Semiconductor single crystal production device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13998189A JPH035391A (en) 1989-06-01 1989-06-01 Semiconductor single crystal production device

Publications (1)

Publication Number Publication Date
JPH035391A true JPH035391A (en) 1991-01-11

Family

ID=15258166

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13998189A Pending JPH035391A (en) 1989-06-01 1989-06-01 Semiconductor single crystal production device

Country Status (1)

Country Link
JP (1) JPH035391A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008054634A (en) * 2006-09-02 2008-03-13 Okinawa Shokuryo Kk Rice mixed with minor grain and method for producing the same

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008054634A (en) * 2006-09-02 2008-03-13 Okinawa Shokuryo Kk Rice mixed with minor grain and method for producing the same

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