JPH0355268Y2 - - Google Patents
Info
- Publication number
- JPH0355268Y2 JPH0355268Y2 JP1985061329U JP6132985U JPH0355268Y2 JP H0355268 Y2 JPH0355268 Y2 JP H0355268Y2 JP 1985061329 U JP1985061329 U JP 1985061329U JP 6132985 U JP6132985 U JP 6132985U JP H0355268 Y2 JPH0355268 Y2 JP H0355268Y2
- Authority
- JP
- Japan
- Prior art keywords
- contact
- socket
- protrusion
- insulator
- contactor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Connecting Device With Holders (AREA)
Description
【考案の詳細な説明】
〔概要〕
半導体集積回路を装着するソケツトにおいて隙
間を介して対向する接触片を具えた接触子を内部
側面に隆起部を有する絶縁体の孔に収納し、隆起
部が該接触子の先端を内側に変位せしめて接触片
に予圧(プレロード)を発生させるように構成す
ることによつて、接触子の製造を容易にしたもの
である。また孔の内部側面に接触片の先端に設け
た突起を嵌入する孔を設け、該突起を該溝の壁に
当接させることによつて過荷重(オーバーストレ
ース)による接触子の変形を防止している。[Detailed description of the invention] [Summary] In a socket for mounting a semiconductor integrated circuit, a contactor having contact pieces facing each other with a gap is housed in a hole in an insulator having a raised part on the inner side surface, and the raised part By displacing the tip of the contact inward to generate a preload on the contact piece, manufacturing of the contact is facilitated. In addition, a hole is provided on the inner side surface of the hole into which the protrusion provided at the tip of the contact piece is inserted, and by bringing the protrusion into contact with the wall of the groove, deformation of the contact due to overload (overstrain) is prevented. ing.
本考案は印刷配線板に実装し半導体集積回路を
印刷配線板に挿抜自在に装着するための半導体集
積回路用ソケツトに関する。
The present invention relates to a socket for a semiconductor integrated circuit which is mounted on a printed wiring board and allows the semiconductor integrated circuit to be inserted into and removed from the printed wiring board.
半導体集積回路(以下ICと略称する)の実装
は一般にリード端子を印刷配線板の孔に嵌挿し、
はんだ付けによつてリード端子と印刷配線板上の
配線導体との接続を行うが、例えば半導体メモリ
特に読出し専用半導体メモリ等は、内蔵している
プログラムを変更する際に印刷配線板から取り外
す必要があり、印刷配線板には半導体集積回路用
ソケツト(以下ICソケツトと称する)を介して
実装される場合が多い。 Generally, semiconductor integrated circuits (hereinafter abbreviated as IC) are mounted by inserting lead terminals into holes in a printed wiring board.
The lead terminals and the wiring conductors on the printed wiring board are connected by soldering, but for example, semiconductor memory, especially read-only semiconductor memory, etc., must be removed from the printed wiring board when changing the built-in program. It is often mounted on a printed wiring board via a semiconductor integrated circuit socket (hereinafter referred to as an IC socket).
かかるICソケツトは対象となる電圧レベルが
低い場合が多く、接触部におけるノイズの発生は
極力避けなければならない。そのために接触子に
接触抵抗が低く且つ劣化され難い金属がめつきさ
れている。高品質のICソケツトを構成するには
めつきを容易に且つ確実に施すことのできる接触
子の構造を開発する必要がある。 Such IC sockets often operate at low voltage levels, and noise generation at contact points must be avoided as much as possible. For this purpose, the contacts are plated with a metal that has low contact resistance and is resistant to deterioration. In order to construct a high quality IC socket, it is necessary to develop a contact structure that can be easily and reliably fitted.
またICソケツトは接触子の数が多く狭い空間
に実装されているために、ICの装着および抜去
に際して過荷重を受け易く過荷重によつて接触子
が変形し接触不良を発生することがある。接触子
不良を発生するとICソケツトの交換に多くの時
間を必要とし、それを組み込んだ装置はICソケ
ツトを交換する間停止するとか、或いは接触子の
変形に気付かなかつた場合は原因不明の障害が発
生し、原因の追求に多くの時間が割かれる等甚大
な被害を被る。したがつてICの装着および抜去
に際し過荷重を受けても接触子が変形し難い構造
を具え、且つ低価格化を実現できるICソケツト
の実現が望まれている。 Furthermore, since IC sockets have a large number of contacts and are mounted in a narrow space, they are susceptible to overload when inserting and removing ICs, and the overload can deform the contacts and cause poor contact. If a defective contact occurs, it will take a lot of time to replace the IC socket, and the equipment incorporating it may stop working while the IC socket is replaced, or if the deformation of the contact is not noticed, an unknown failure may occur. This causes serious damage, as a lot of time is wasted searching for the cause. Therefore, it is desired to realize an IC socket which has a structure in which the contacts are not easily deformed even if overload is applied during the mounting and removal of the IC, and which can realize low cost.
第4図は従来のICソケツトの一例を示す分割
斜視図である。
FIG. 4 is a divided perspective view showing an example of a conventional IC socket.
図において接触子1は対向する接触片11およ
び12とリード端子13を具えており、接触片1
1および12の間に図示していないICのリード
端子を挿入した際に十分な接触圧力が得られるよ
うに、接触片11および12は所定の圧力(プレ
ロード)のもとに弾接するように構成されてい
る。 In the figure, the contact 1 includes opposing contact pieces 11 and 12 and a lead terminal 13.
Contact pieces 11 and 12 are configured to come into elastic contact under a predetermined pressure (preload) so that sufficient contact pressure can be obtained when a lead terminal of an IC (not shown) is inserted between 1 and 12. has been done.
一方絶縁体2は接触子1を収納する複数個の孔
21を具えており、孔21は上部にICのリード
端子を接触片11および12の間に導入するガイ
ド部22を具えている。 On the other hand, the insulator 2 is provided with a plurality of holes 21 for accommodating the contacts 1, and the holes 21 are provided with guide portions 22 at the upper portions for introducing the lead terminals of the IC between the contact pieces 11 and 12.
上記ICソケツトにおいて接触子1は対向する
接触片11および12が所定の圧力のもとに弾接
するように構成されており、接触子1をかかる形
状に成形した後めつきを施すと弾接した部分はめ
つきされないばかりでなく、めつき液や洗浄液に
よつて汚染されノイズや接触不良の原因になる。
そこで接触片を形成する第1の曲げ工程と接触片
を対向させる第2の曲げ工程の間でめつきを施し
ている。しかし第1の曲げ工程と第2の曲げ工程
の間にめつき工程を挿入することは、曲げ工程が
分断され作業に要する時間が増大するばかりでな
く、めつきした面に第2の曲げ工程において傷を
付けたり油等を付着させたりする。また接触片1
1および12は片持梁構造でありICの装着およ
び抜去に際し過荷重を受けると塑性変形を生じ、
ICのリード端子を挿入した際に十分な接触圧力
が得られないという問題がある。
In the above IC socket, the contact 1 is constructed so that the opposing contact pieces 11 and 12 come into elastic contact under a predetermined pressure, and when the contact 1 is molded into such a shape and then plated, the elastic contact occurs. Not only will the parts not be plated, but they will also be contaminated by the plating solution and cleaning solution, causing noise and poor contact.
Therefore, plating is performed between the first bending step for forming the contact piece and the second bending step for making the contact piece face each other. However, inserting a plating process between the first bending process and the second bending process not only divides the bending process and increases the time required for the work, but also requires the second bending process to be performed on the plated surface. Do not damage the product or get oil, etc. on it. Also contact piece 1
1 and 12 have a cantilever structure, which causes plastic deformation when subjected to overload when installing and removing ICs.
There is a problem in that sufficient contact pressure cannot be obtained when inserting the IC lead terminal.
第1図は本考案になるICソケツトの一実施例
を示す分割斜視図である。
FIG. 1 is a divided perspective view showing an embodiment of an IC socket according to the present invention.
上記問題点は第1図に示す弾性を有する金属か
らなり隙間31を介して対向する接触片11およ
び12を具えた複数個の接触子3と、接触子3を
収納する複数個の孔41を有する絶縁体4とで構
成され、且つ接触子3を絶縁体4の孔41に収納
すると接触子3の先端を内側に変位せしめる隆起
部42を、孔41の内部側面に設けると共に、接
触片11および12の先端に過荷重による変形を
防止する突起32を設け、孔41の内部側面に突
起32を収納する溝43を設けてなる本考案の
ICソケツトによつて解決される。 The above-mentioned problem is caused by a plurality of contacts 3 made of elastic metal and having contact pieces 11 and 12 facing each other with a gap 31 as shown in FIG. A protrusion 42 is provided on the inner side surface of the hole 41 to displace the tip of the contact 3 inward when the contact 3 is accommodated in the hole 41 of the insulator 4. A protrusion 32 is provided at the tip of the hole 41 to prevent deformation due to overload, and a groove 43 for accommodating the protrusion 32 is provided on the inner side surface of the hole 41.
Solved by IC socket.
第1図において接触子3に具えた接触片11お
よび12を隙間31を介して対向せしめることに
よつて、予め図示の形状に成形した後めつきを施
すことが可能になり、第1の曲げ工程と第2の曲
げ工程を連続的に行えるために作業に要する時間
が短縮され、めつきした面に傷を付けたり油等を
付着させたりすることが無くなる。なお接触子3
を孔41に収納すると隆起部42によつて接触子
3の先端が内側に変位し、接触片11および12
の間にプレロードが発生してICのリード端子を
挿入した際に十分な接触圧力を得ることができ
る。
By arranging the contact pieces 11 and 12 provided on the contactor 3 in FIG. Since the process and the second bending process can be performed continuously, the time required for the work is shortened, and there is no possibility of damaging the plated surface or attaching oil or the like. In addition, contact 3
When the contact piece 3 is housed in the hole 41, the tip of the contact piece 3 is displaced inward by the raised part 42, and the contact pieces 11 and 12
A preload is generated between the two and enough contact pressure can be obtained when inserting the IC lead terminal.
また接触片11または12に過荷重が掛かり接
触片が拡がる方向に曲げられても、突起32が溝
43の壁に当接して接触片11または12が両端
支持梁構造になり、それ以上曲げられて塑性変形
を起こすのを防止することができる。 Furthermore, even if an overload is applied to the contact piece 11 or 12 and the contact piece is bent in the direction of expansion, the protrusion 32 will come into contact with the wall of the groove 43 and the contact piece 11 or 12 will have a beam structure with both ends supported, and will not be bent any further. This can prevent plastic deformation from occurring.
以下添付図により本考案の実施例を詳細に説明
する。第1図は本考案になるICソケツトの一実
施例を示す分割斜視図、第2図は本考案の他の実
施例を示す分割斜視図、第3図は本考案の変形例
を示す分割斜視図で、全図を通し同じ対象物は同
一記号で表している。
Embodiments of the present invention will be described in detail below with reference to the accompanying drawings. Figure 1 is a divided perspective view showing one embodiment of the IC socket of the present invention, Figure 2 is a divided perspective view showing another embodiment of the present invention, and Figure 3 is a divided perspective view showing a modification of the present invention. In the figures, the same objects are represented by the same symbols throughout the figures.
第1図に示すICソケツトは上述の如く第1の
曲げ工程と第2の曲げ工程を連続的に行つて、作
業に要する時間を短縮しICソケツトの製造価格
を低減すると共に、めつきした面に傷を付けたり
油等を付着させたりする等の障害を無くし品質を
向上させることができる。また接触片11または
12に過荷重が掛かり接触片が拡がる方向に曲げ
られても、突起32が溝43の壁に当接しそれ以
上曲げられて塑性変形を起こすのを防止すること
ができる等多くの利点を具えている。 The IC socket shown in Fig. 1 is manufactured by performing the first bending process and the second bending process continuously as described above, thereby shortening the time required for the work and reducing the manufacturing cost of the IC socket. It is possible to improve quality by eliminating problems such as scratches or adhesion of oil, etc. Furthermore, even if an overload is applied to the contact piece 11 or 12 and the contact piece is bent in the direction of expansion, the protrusion 32 can be prevented from coming into contact with the wall of the groove 43 and being further bent and causing plastic deformation, etc. It has the advantages of
また第2図に示すICソケツトは第1図に示す
ICソケツトから、接触片11および12の先端
に設けた突起22と孔41の内部側面に設けた溝
43を削除しており、接触子3および絶縁体4の
加工を簡略化してICソケツトの製造価格を一層
低減させると共に、めつきした面に傷を付けたり
油等を付着させたりする等の障害を無くし品質を
向上させることができる。 Also, the IC socket shown in Figure 2 is shown in Figure 1.
The protrusions 22 provided at the tips of the contact pieces 11 and 12 and the grooves 43 provided on the inner side of the hole 41 are removed from the IC socket, simplifying the processing of the contacts 3 and the insulator 4, and facilitating the manufacture of the IC socket. In addition to further reducing the price, it is possible to improve quality by eliminating problems such as scratches on the plated surface or adhesion of oil or the like.
更に第3図において複数個の接触子5は隙間5
1を介して対向する接触片52および53とリー
ド端子54を具えており、接触片52の先端には
過荷重による変形を防止する突起32が形成され
ている。 Furthermore, in FIG.
The contact piece 52 is provided with contact pieces 52 and 53 and a lead terminal 54 that face each other with the contact piece 52 interposed therebetween, and a protrusion 32 is formed at the tip of the contact piece 52 to prevent deformation due to overload.
一方絶縁体6は接触子5を収納する複数個の孔
61を具えており、孔61は下部にリード端子5
4を貫通させるための貫通口62を有し、側面に
は接触子5の先端を内側に変位せしめる隆起部4
2と、突起32を嵌挿する溝43が形成されてい
る。 On the other hand, the insulator 6 has a plurality of holes 61 for accommodating the contacts 5, and the holes 61 have lead terminals 5 at the bottom.
It has a through hole 62 for passing through the contactor 4, and a raised part 4 on the side surface that displaces the tip of the contactor 5 inward.
2, and a groove 43 into which the protrusion 32 is inserted is formed.
かかる構造を有するICソケツトも第1図に示
すICソケツトと同様に、接触子の曲げ工程を簡
略化して作業に要する時間を短縮しICソケツト
の製造価格を低減すると共に、めつきした面に傷
を付けたり油等を付着させたりする等の障害を無
くし品質を向上させることができる。また接触片
53に過荷重が掛かり接触片が拡がる方向に曲げ
られても、突起32が溝43の壁に当接しそれ以
上曲げられても塑性変形を起こすのを防止するこ
とができる。 Like the IC socket shown in Figure 1, the IC socket with this structure also simplifies the process of bending the contact, shortens the time required for the work, reduces the manufacturing cost of the IC socket, and prevents scratches on the plated surface. It is possible to improve quality by eliminating problems such as adhesion of oil or oil. Further, even if an overload is applied to the contact piece 53 and the contact piece is bent in the direction of expansion, the protrusion 32 comes into contact with the wall of the groove 43, and even if the protrusion 32 is bent further, plastic deformation can be prevented.
上述の如く本考案によれば高品質で安く過荷重
による接触子変形防止機構を具えたICソケツト
を提供することができる。
As described above, according to the present invention, it is possible to provide a high-quality, inexpensive IC socket equipped with a mechanism for preventing contact deformation due to overload.
第1図は本考案になるICソケツトの一実施例
を示す分割斜視図、第2図は本考案の他の実施例
を示す分割斜視図、第3図は本考案の変形例を示
す分割斜視図、第4図は従来のICソケツトを示
す分割斜視図、である。
図において、3,5は接触子、4,6は絶縁
体、11,12,52,53は接触片、22はガ
イド部、31,51は隙間、32は突起、41,
61は孔、42は隆起部、43は溝、54はリー
ド端子、62は貫通口、をそれぞれ表す。
Figure 1 is a divided perspective view showing one embodiment of the IC socket of the present invention, Figure 2 is a divided perspective view showing another embodiment of the present invention, and Figure 3 is a divided perspective view showing a modification of the present invention. 4 are split perspective views showing a conventional IC socket. In the figure, 3 and 5 are contacts, 4 and 6 are insulators, 11, 12, 52, and 53 are contact pieces, 22 is a guide portion, 31 and 51 are gaps, 32 is a protrusion, 41,
61 represents a hole, 42 a raised portion, 43 a groove, 54 a lead terminal, and 62 a through hole, respectively.
Claims (1)
複数個の接触片11,12を有するものであ
り、かつ弾性を有する金属からなり、 前記絶縁体4は、前記接触子3が収納され、
かつ前記接触片11,12を内側に変位せしめ
る隆起部42を内側面に具えた複数個の孔41
を有するものであり、 前記接触子3は、前記絶縁体4に収納された
際、接触片11,12が弾接するものである ことを特徴とする半導体集積回路用ソケツト。 2 前記接触子3は、接触片11,12の先端
に、過荷重による変形を防止する突起32を有
するものであり、 前記絶縁体4は、内側面に前記突起32が収
納される溝43を有するものである 実用新案登録請求の範囲第1項記載の半導体
集積回路用ソケツト。[Claims for Utility Model Registration] 1. A contactor 3 and an insulator 4, the contactor 3 having a plurality of contact pieces 11 and 12 facing each other with a gap 31 in between, and having elasticity. The insulator 4 houses the contact 3, and
and a plurality of holes 41 provided with protrusions 42 on the inner surface for displacing the contact pieces 11, 12 inwardly.
A socket for a semiconductor integrated circuit, characterized in that when the contactor 3 is housed in the insulator 4, contact pieces 11 and 12 come into elastic contact with each other. 2. The contactor 3 has a protrusion 32 at the tip of the contact pieces 11, 12 to prevent deformation due to overload, and the insulator 4 has a groove 43 on the inner surface in which the protrusion 32 is accommodated. A socket for a semiconductor integrated circuit according to claim 1 of the utility model registration claim.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985061329U JPH0355268Y2 (en) | 1985-04-24 | 1985-04-24 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985061329U JPH0355268Y2 (en) | 1985-04-24 | 1985-04-24 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61176789U JPS61176789U (en) | 1986-11-04 |
| JPH0355268Y2 true JPH0355268Y2 (en) | 1991-12-09 |
Family
ID=30589506
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1985061329U Expired JPH0355268Y2 (en) | 1985-04-24 | 1985-04-24 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0355268Y2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0512944Y2 (en) * | 1987-10-30 | 1993-04-05 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5432442Y2 (en) * | 1975-01-16 | 1979-10-08 |
-
1985
- 1985-04-24 JP JP1985061329U patent/JPH0355268Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61176789U (en) | 1986-11-04 |
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