JPH0360087U - - Google Patents

Info

Publication number
JPH0360087U
JPH0360087U JP12180389U JP12180389U JPH0360087U JP H0360087 U JPH0360087 U JP H0360087U JP 12180389 U JP12180389 U JP 12180389U JP 12180389 U JP12180389 U JP 12180389U JP H0360087 U JPH0360087 U JP H0360087U
Authority
JP
Japan
Prior art keywords
calibration
timing calibration
timing
determined
tester
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12180389U
Other languages
Japanese (ja)
Other versions
JP2573401Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1989121803U priority Critical patent/JP2573401Y2/en
Publication of JPH0360087U publication Critical patent/JPH0360087U/ja
Application granted granted Critical
Publication of JP2573401Y2 publication Critical patent/JP2573401Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの考案の実施例の要部を示すブロツ
ク図、第2図は従来のICテスタを示すブロツク
図である。
FIG. 1 is a block diagram showing the main parts of an embodiment of this invention, and FIG. 2 is a block diagram showing a conventional IC tester.

Claims (1)

【実用新案登録請求の範囲】 テストプログラム中のタイミング較正命令ごと
にタイミング較正が必要か否かを判定し、タイミ
ング較正が必要と判定されるとタイミング較正を
行い、かつその較正データを記憶しておき、タイ
ミング較正を必要としないと判定されると先に記
憶した対応する較正データをタイミング較正回路
に設定するようにしたICテスタにおいて、 上記較正データの記憶のために半導体メモリが
用いられることを特徴とするICテスタ。
[Claim for Utility Model Registration] It is determined whether or not timing calibration is necessary for each timing calibration command in the test program, and when it is determined that timing calibration is necessary, the timing calibration is performed and the calibration data is stored. In an IC tester that sets the previously stored corresponding calibration data to the timing calibration circuit when it is determined that timing calibration is not required, a semiconductor memory is used to store the calibration data. Features of IC tester.
JP1989121803U 1989-10-18 1989-10-18 IC tester Expired - Lifetime JP2573401Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1989121803U JP2573401Y2 (en) 1989-10-18 1989-10-18 IC tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1989121803U JP2573401Y2 (en) 1989-10-18 1989-10-18 IC tester

Publications (2)

Publication Number Publication Date
JPH0360087U true JPH0360087U (en) 1991-06-13
JP2573401Y2 JP2573401Y2 (en) 1998-05-28

Family

ID=31669827

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1989121803U Expired - Lifetime JP2573401Y2 (en) 1989-10-18 1989-10-18 IC tester

Country Status (1)

Country Link
JP (1) JP2573401Y2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007114366A (en) * 2005-10-19 2007-05-10 Riido:Kk On-roof indication lamp of taxi

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007114366A (en) * 2005-10-19 2007-05-10 Riido:Kk On-roof indication lamp of taxi

Also Published As

Publication number Publication date
JP2573401Y2 (en) 1998-05-28

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Legal Events

Date Code Title Description
R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

EXPY Cancellation because of completion of term