JPS643220U - - Google Patents

Info

Publication number
JPS643220U
JPS643220U JP9553487U JP9553487U JPS643220U JP S643220 U JPS643220 U JP S643220U JP 9553487 U JP9553487 U JP 9553487U JP 9553487 U JP9553487 U JP 9553487U JP S643220 U JPS643220 U JP S643220U
Authority
JP
Japan
Prior art keywords
semiconductor integrated
output
control gate
logic
output control
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9553487U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP9553487U priority Critical patent/JPS643220U/ja
Publication of JPS643220U publication Critical patent/JPS643220U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Electronic Switches (AREA)
  • Logic Circuits (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図aはこの考案の一実施例である半導体集
積回路を示す論理回路図、第1図b及びcは第1
図aの半導体集積回路における出力制御ゲートコ
ントロール・ロジツクの一例を示す回路図、及び
その各コントロール信号のタイミングチヤート、
第2図は従来の半導体集積回路を示す論理回路図
である。 図において、1……LSI内部論理回路、2…
…出力制御ゲート、3……出力バツフア、4……
出力ピン、5……出力制御ゲートコントロール・
ロジツク、6……コントロール信号、7……制御
信号(1)、8……制御信号(2)、9……デイレイ用
素子である。なお、図中、同一符号は同一、又は
相当部分を示す。
Figure 1a is a logic circuit diagram showing a semiconductor integrated circuit which is an embodiment of this invention, and Figures 1b and c are the first
A circuit diagram showing an example of the output control gate control logic in the semiconductor integrated circuit of FIG. a, and a timing chart of each control signal,
FIG. 2 is a logic circuit diagram showing a conventional semiconductor integrated circuit. In the figure, 1...LSI internal logic circuit, 2...
...Output control gate, 3...Output buffer, 4...
Output pin, 5... Output control gate control
Logic, 6... Control signal, 7... Control signal (1), 8... Control signal (2), 9... Delay element. In addition, in the figures, the same reference numerals indicate the same or equivalent parts.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 論理装置に使用する半導体集積回路において、
出力ピンによる外部への出力信号の同時変化数を
コントロールする出力制御ゲートと出力制御ゲー
トコントロール・ロジツクを備えたことを特徴と
する半導体集積回路。
In semiconductor integrated circuits used in logic devices,
A semiconductor integrated circuit characterized by comprising an output control gate and output control gate control logic for controlling the number of simultaneous changes in external output signals by an output pin.
JP9553487U 1987-06-22 1987-06-22 Pending JPS643220U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9553487U JPS643220U (en) 1987-06-22 1987-06-22

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9553487U JPS643220U (en) 1987-06-22 1987-06-22

Publications (1)

Publication Number Publication Date
JPS643220U true JPS643220U (en) 1989-01-10

Family

ID=31320205

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9553487U Pending JPS643220U (en) 1987-06-22 1987-06-22

Country Status (1)

Country Link
JP (1) JPS643220U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001091305A1 (en) * 2000-05-24 2001-11-29 Thine Electronics, Inc. Semiconductor integrated circuit
US7363804B2 (en) 1996-12-17 2008-04-29 Denso Corporation Method for detecting malfunction of a cooling system based on detected coolant temperature

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7363804B2 (en) 1996-12-17 2008-04-29 Denso Corporation Method for detecting malfunction of a cooling system based on detected coolant temperature
US7743651B2 (en) 1996-12-17 2010-06-29 Denso Corporation Method for detecting malfunction of a cooling system based on detected coolant temperature
WO2001091305A1 (en) * 2000-05-24 2001-11-29 Thine Electronics, Inc. Semiconductor integrated circuit

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