JPH0360183A - Manufacture of circuit board covered with thin copper foil - Google Patents

Manufacture of circuit board covered with thin copper foil

Info

Publication number
JPH0360183A
JPH0360183A JP1196265A JP19626589A JPH0360183A JP H0360183 A JPH0360183 A JP H0360183A JP 1196265 A JP1196265 A JP 1196265A JP 19626589 A JP19626589 A JP 19626589A JP H0360183 A JPH0360183 A JP H0360183A
Authority
JP
Japan
Prior art keywords
copper foil
etching
thickness
circuit board
copper
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1196265A
Other languages
Japanese (ja)
Other versions
JP2797488B2 (en
Inventor
Shoichiro Kajiwara
庄一郎 梶原
Kenji Ishii
賢治 石井
Takamasa Nakai
中井 孝昌
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Gas Chemical Co Inc
Original Assignee
Mitsubishi Gas Chemical Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Gas Chemical Co Inc filed Critical Mitsubishi Gas Chemical Co Inc
Priority to JP1196265A priority Critical patent/JP2797488B2/en
Publication of JPH0360183A publication Critical patent/JPH0360183A/en
Application granted granted Critical
Publication of JP2797488B2 publication Critical patent/JP2797488B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Manufacturing Of Printed Circuit Boards (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、電子部品を実装するプリント配線板製造用の
銅箔と電気絶縁体とより製造された銅箔張積層板、銅張
フィルム、銅張シートなどの銅箔張回路基板や補強され
た銅箔であって、平均厚みが数LIM〜20−1所望厚
みに対する厚みのバラツキが±1.0−以下である薄銅
箔張回路基板の製造法である。
[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a copper foil-clad laminate, a copper-clad film, and a copper foil-clad laminate manufactured from copper foil and an electrical insulator for manufacturing printed wiring boards on which electronic components are mounted. A thin copper foil-clad circuit board that is a copper foil-clad circuit board such as a copper-clad sheet or a reinforced copper foil, and has an average thickness of several LIM to 20-1 and a thickness variation of ±1.0- or less with respect to a desired thickness. This is the manufacturing method.

〔従来の技術およびその課題〕[Conventional technology and its problems]

銅箔張回路基板の製造法は、銅箔と絶縁体とを重ね通常
積層成形等によって製造され、用いる銅箔としては、電
解法による厚み1051.rm170−135an、1
earn、12−などが量産され、アルミニウム箔等の
担体上に形成された5−19−などの銅箔も作られてい
る。又、圧延法にょる銅箔があるが、製造法との関係か
ら薄くなるほど高価なものとなり実質的には35−未満
の厚さの箔は試作段階にあり、商業的には一般化してい
ない。
Copper foil-clad circuit boards are manufactured by laminating copper foil and insulators, usually by lamination molding, etc., and the copper foil used has a thickness of 105mm by electrolytic method. rm170-135an, 1
Earn, 12-, etc. are mass-produced, and copper foils such as 5-19-, which are formed on carriers such as aluminum foil, are also produced. In addition, there is copper foil made by rolling, but due to the manufacturing method, the thinner the foil, the more expensive it becomes, and foils with a thickness of less than 35 mm are in the prototype stage and have not been commercially common. .

このようなKMを積層成形に用いる場合、その厚みが薄
いと皺になりやすく、銅箔を絶縁体と重ね合わせる作業
が極めて困難となるので殆ど実用化されていない。また
、アルミニウム箔等の担体上に形成された銅箔は、この
点を改善したものであるが高価であり、更に銅箔による
プリント配線を形成する前に担体であるアルミニウム箔
等の除去工程が必要という問題があった。
When such a KM is used for lamination molding, it is hardly put into practical use because if it is thin, it tends to wrinkle and the work of overlapping the copper foil with the insulator becomes extremely difficult. In addition, copper foil formed on a carrier such as aluminum foil improves this point, but it is expensive, and furthermore, the process of removing the carrier such as aluminum foil is required before forming printed wiring using copper foil. There was a question of necessity.

また、プリント配線板加工工程において塩化銅や塩化鉄
などのエツチング液にて銅箔張回路基板を予備エツチン
グして銅箔を研磨した後、プリント配線板の製造工程に
用いる方法が知られていたが、予備エツチングによる銅
箔の除去量を数−以上と多くしたり、或いは500X5
00 m+n角などの大面積をエツチングして、薄銅張
回路基板を製造する場合には残存銅箔の厚さのバラツキ
が大きくなり、商品化可能な薄銅張回路基板を製造する
ことは出来なかった。
Another known method is to pre-etch a copper foil-clad circuit board with an etching solution such as copper chloride or iron chloride in the printed wiring board processing process, polish the copper foil, and then use it in the printed wiring board manufacturing process. However, if the amount of copper foil removed by preliminary etching is increased to several times or more, or if 500×5
When manufacturing a thin copper-clad circuit board by etching a large area such as 00m+n square, the thickness of the remaining copper foil will vary greatly, making it impossible to manufacture a commercially viable thin copper-clad circuit board. There wasn't.

例えば、特開昭62−200796号公報に平均厚さ1
8−以上の銅箔を、機械的研磨、電気化学的研磨或いは
化学的エツチングにより、銅箔の厚さを12−以下にし
た極薄wJ箔張回路基板を製造することが開示されてい
る。
For example, in Japanese Patent Application Laid-Open No. 62-200796, an average thickness of 1
It is disclosed that an ultra-thin wJ foil-clad circuit board can be manufactured by reducing the thickness of copper foil to 12 or less by mechanically polishing, electrochemically polishing, or chemically etching copper foil having a thickness of 8 or more.

この特開昭の実施例1には、340mmX340 mm
角の銅箔の平均厚さ18−のものを塩化第二銅(1,0
mol/Iり /塩酸(6,6mol/ R)からなる
エツチング液で全面エツチングして平均厚さ10−の薄
銅箔としたとの記載がある。しかし、本発明者らの検討
によれば市販のスプレー式エツチングでは、わずか5枚
の銅張積層板を6−エツチングする場合、平均厚さに対
するバラツキ上3.5JE対するバラツキ±4.8μと
エツチング量に相当する程大きいものであった。これは
、このエツチング速度が約0. 5−/秒と高速であり
、1秒のエツチング時間のずれが平均厚さ0.5−の差
として現れ、しかも場所によるエツチング液の有効接触
時間の差が加算されることによる。さらにこの傾向はエ
ツチング量を多くする程、また、多量に生産する場合程
、大きくなるものであった。また、この特開昭に記載の
その他の手段である機械的研磨、電解研磨等も同様であ
り、商品化できるものではなかった。更に、この特開昭
の実施例に記載のように通常のエツチング液を用いて、
銅箔全面をエツチングした薄銅張回路基板の残存銅箔の
表面は極めて活性に富み、空気中に放置されると短時間
で錆が発生するものであった。
In this example 1 of JP-A-Sho, 340 mm x 340 mm
The corner copper foil with an average thickness of 18-
There is a description that the entire surface was etched with an etching solution consisting of mol/I / hydrochloric acid (6.6 mol/R) to obtain a thin copper foil with an average thickness of 10. However, according to studies by the present inventors, when using a commercially available spray etching method, when performing 6-etching on only five copper-clad laminates, the variation in average thickness is 3.5JE, and the variation in etching is ±4.8μ. It was so large that it corresponded to the amount. This means that the etching rate is approximately 0. The etching speed is as high as 5-/second, and a difference in etching time of 1 second appears as a difference in average thickness of 0.5-second, and this is due to the fact that the difference in effective contact time of the etching solution depending on the location is added. Furthermore, this tendency became more pronounced as the amount of etching was increased and as the amount of production was increased. Further, the other methods described in this publication, such as mechanical polishing and electrolytic polishing, were also similar and could not be commercialized. Furthermore, as described in the example of this JP-A-Sho, using an ordinary etching solution,
The surface of the remaining copper foil on a thin copper-clad circuit board whose entire surface was etched was extremely active, and if left in the air, it would rust in a short period of time.

〔課題を解決するための手段〕[Means to solve the problem]

本発明は、大型回路基板として使用可能な薄銅箔張回路
基板を生産性よく製造する方法について鋭意検討した結
果、先に従来のエンチング法に比較して非常に遅い速度
で銅張回路基板の銅箔全面をエツチングして、もとの銅
箔の厚さの25〜90%を除去すること、並びにこの銅
エツチング液として特定の組成比を有する塩化第二銅/
塩酸水溶液を使用する方法によって厚み精度の高い薄銅
張回路基板が得られることを見出した。
As a result of intensive research into a method for manufacturing thin copper foil-clad circuit boards with high productivity that can be used as large circuit boards, the present invention was developed to produce copper-clad circuit boards at a much slower speed than the conventional etching method. Etching the entire surface of the copper foil to remove 25 to 90% of the original thickness of the copper foil, and using cupric chloride/cupric chloride having a specific composition ratio as the copper etching solution.
We have discovered that a thin copper-clad circuit board with high thickness accuracy can be obtained by a method using an aqueous hydrochloric acid solution.

しかし、この方法の場合の銅箔表面もやはり活性が大き
く防錆効果の点で問題があり、光沢性がないものであっ
た。この点を改良する方法について鋭意検討した結果、
本発明に到達した。
However, in this method, the surface of the copper foil was also highly active and had problems in terms of antirust effect, and lacked luster. After careful consideration of ways to improve this point, we found that
We have arrived at the present invention.

すなわち、本発明は、銅箔と電気絶縁体とより製造され
た銅箔張回路基板を銅エツチング液を用い、0.01〜
0.3−/秒の速度で銅箔全面をエツチングして、もと
の銅箔の厚さの25〜90%を除去し、所望厚みに対し
て残存銅箔の厚みのバラツキが±1.0−以内とする薄
銅箔張回路基板の製造法であって、該銅エツチング液と
して、まず、塩化第二銅/塩酸水溶液を用いて残存銅箔
厚みが所望厚みより1cm4μ厚くなるようにエツチン
グした後、過酸化水素/硫酸水溶液を用いて仕上げエツ
チング或いは化学研磨することからなる薄銅箔張回路基
板の製造法であり、このましくは該塩化第二銅/塩酸水
溶液によるエツチングが、塩化第二銅0、25 〜3m
o 1 / 、1、塩酸1 〜4mol / ji!の
範囲で、少なくとも塩酸濃度が所定濃度の±0.3mo
l/ 12以内に制御され、かつエツチング温度が25
〜55℃の範囲で所定温度±5℃以内に制御されてなる
ものであること、該仕上げエツチング或いは化学研磨し
た後、直ちに水溶性防錆剤で残存銅箔表面を処理するこ
とからなる薄銅箔張回路基板の製造法である。
That is, in the present invention, a copper foil-clad circuit board manufactured from copper foil and an electrical insulator is etched using a copper etching solution of 0.01 to
The entire surface of the copper foil is etched at a rate of 0.3-/sec to remove 25-90% of the original copper foil thickness, and the thickness variation of the remaining copper foil is ±1. A method for manufacturing a thin copper foil-clad circuit board with a thickness of 0- or less, wherein first, using a cupric chloride/hydrochloric acid aqueous solution as the copper etching solution, etching is performed so that the remaining copper foil thickness is 1 cm 4 μ thicker than the desired thickness. This is a manufacturing method for thin copper foil-clad circuit boards, which consists of final etching or chemical polishing using a hydrogen peroxide/sulfuric acid aqueous solution. Cupric 0.25 ~ 3m
o 1 / , 1, hydrochloric acid 1 to 4 mol / ji! Within the range of , the hydrochloric acid concentration is at least ±0.3 mo of the predetermined concentration.
The etching temperature is controlled within 1/12 and the etching temperature is 25
The thin copper foil is made by controlling the temperature to within ±5°C within a predetermined temperature range of ~55°C, and immediately after the final etching or chemical polishing, the remaining copper foil surface is treated with a water-soluble rust preventive agent. This is a method for manufacturing foil-clad circuit boards.

次に、本発明の構成について説明する。Next, the configuration of the present invention will be explained.

本発明の銅箔と電気絶縁体とより製造された銅箔張回路
基板は、平均厚さ12−以上で平均厚さに対する厚さの
バラツキが±1.0−以内の銅箔を使用したものであれ
ば特に限定はなく電子、電気材料用として用いられてい
る種々の市販品等いずれも使用可能である。特に■2−
以下の薄銅箔張積層板とする場合には公称厚み12〜1
8−〇銅箔積層板を用いることが好ましい。銅張積層板
としては片面或いは両面銅張のフィルム、シート、繊維
強化絶縁樹脂積層板、金属芯積層板、内層にプリント配
線網を形成した多層シールド板などである。電気絶縁体
層は、ポリイミド樹脂、ポリエステル樹脂等のフィルム
やシート、熱硬化性°樹脂や耐熱性の熱可塑性樹脂とガ
ラス(Eガラス、Dガラス、Sガラス、石英ガラス(ク
ォーツ)その他)、セラミックス類(アルミナ、窒化硼
素、その他)、全芳香族ポリアミド、ポリイミド、セミ
カーボン、フッ素樹脂、その他の耐熱性エンジニアリン
グプラスチックなどを一種或いは二種以上適宜併用して
なるm維、チョップなどを用いた多孔質フィルム或いは
シート状の補強基材とを組み合わせてなるプリプレグを
用いて製造されるもの、又は、鉄、アルミニウム板等に
絶縁性の接着剤や接着フィルムを被覆してなるものなど
である。なお、通常の銅張積層板は積層成形の圧力によ
り、銅箔表面が補強基材の凹凸を一部反映して、例えば
ガラス織布基材の場合約0゜4mmピッチで3〜4−程
度のうねりを持ったものとなるが、このうねりを機械的
に微細な凹凸等に代えたり、取り除いたりしたものを使
用することもできる。また、12〜16−〇薄銅箔を使
用した銅張積層板或いはシートの製造法としては、銅箔
と鏡面板との間に銅箔よりも熱膨張率の大きいアルミニ
ウム箔等の40〜10〇−程度のシートを挿入して積層
成形する方法が好適である。
The copper foil-clad circuit board manufactured from the copper foil and electrical insulator of the present invention uses a copper foil having an average thickness of 12 mm or more and a variation in thickness with respect to the average thickness of ±1.0 mm. If so, there is no particular limitation, and any of various commercially available products used for electronic and electrical materials can be used. Especially ■2-
In the case of the following thin copper foil clad laminates, the nominal thickness is 12 to 1
8-0 It is preferable to use a copper foil laminate. Examples of copper-clad laminates include single-sided or double-sided copper-clad films, sheets, fiber-reinforced insulating resin laminates, metal-core laminates, and multilayer shield plates with a printed wiring network formed on the inner layer. The electrical insulator layer can be made of polyimide resin, polyester resin film or sheet, thermosetting resin or heat-resistant thermoplastic resin, glass (E glass, D glass, S glass, quartz glass, etc.), ceramics. Porous materials using m-fibers, chops, etc. made of one or more types of heat-resistant engineering plastics (alumina, boron nitride, etc.), fully aromatic polyamides, polyimides, semi-carbons, fluorine resins, other heat-resistant engineering plastics, etc. These include those manufactured using prepreg in combination with a reinforced film or sheet-like reinforcing base material, and those manufactured by coating an iron, aluminum plate, etc. with an insulating adhesive or adhesive film. In addition, in the case of ordinary copper-clad laminates, due to the pressure of lamination molding, the copper foil surface partially reflects the unevenness of the reinforcing base material, for example, in the case of a glass woven base material, the pitch is about 3 to 4 mm at a pitch of about 0°4 mm. Although it has undulations, it is also possible to use a material in which the undulations are mechanically replaced with minute irregularities or removed. In addition, as a manufacturing method for copper-clad laminates or sheets using 12-16-0 thin copper foil, a 40-16-0 thin copper foil such as aluminum foil, which has a higher coefficient of thermal expansion than copper foil, is used between the copper foil and the mirror plate. A method of lamination molding by inserting a sheet of size 0- is suitable.

本発明の第1段階のエツチングに用いる塩化第二胴/塩
酸水溶液とは塩化第二銅と塩酸とを必須成分とし、必要
に応じてエツチングされた銅箔面の状態を制御するため
などの助剤を配合してなる水溶液であり、塩化第二銅(
CuC122H20)の濃度は通常0.25〜3mol
 / R、好ましくは0.25〜2mol/l、塩酸(
)Ice)の濃度はl、 Q 〜4mol / j2 
、好ましくは1〜3.6mol/ I!の範囲が、実用
範囲で高精度の全面エツチングを行うために用いられる
。助剤としてのアルコールとしてはメタノール、エタノ
ール、プロパツール、ブタノールなどの1価アルコール
;エチレングリコール、プロピレングリコール、ブタン
ジオール、ベンタンジオールなどの2価のアルコール;
グリセリン、ペンタエリスリトールなどの3価以上のア
ルコールが例示され、又その他の添加助剤としてポリエ
チレングリコールなどのグリコールエーテル類;アミノ
安息香酸、アミノテトラゾール、フェニル尿素などの含
窒素有機環状化合物類などが例示される。
The second chloride/hydrochloric acid aqueous solution used in the first step of etching of the present invention contains cupric chloride and hydrochloric acid as essential components, and is used as an aid to control the state of the etched copper foil surface as necessary. It is an aqueous solution containing copper chloride (
The concentration of CuC122H20) is usually 0.25 to 3 mol
/ R, preferably 0.25 to 2 mol/l, hydrochloric acid (
)Ice) concentration is l, Q ~4 mol/j2
, preferably 1 to 3.6 mol/I! This range is used to perform high-precision full-surface etching within a practical range. Alcohols as auxiliary agents include monohydric alcohols such as methanol, ethanol, propatool, and butanol; dihydric alcohols such as ethylene glycol, propylene glycol, butanediol, and bentanediol;
Examples include trivalent or higher alcohols such as glycerin and pentaerythritol, and other additives include glycol ethers such as polyethylene glycol; nitrogen-containing organic cyclic compounds such as aminobenzoic acid, aminotetrazole, and phenylurea. be done.

また、エツチングにより銅がエツチング液中に溶解して
くるが、この溶解してくる胴の濃度は5〜65g/j!
  (0,08〜1.0 mo!#り 、好ましくは5
0g/l以下の範囲で調整するのが好ましい。
Also, copper dissolves into the etching solution during etching, but the concentration of this dissolved copper is 5 to 65 g/j!
(0.08 to 1.0 mo! #ri, preferably 5
It is preferable to adjust it within the range of 0 g/l or less.

上記した塩化第二銅/塩酸水溶液を使用してエツチング
を行うが、このエツチング液は通常のパターン形成にお
いて行われるハードエツチングに比較して大幅にエツチ
ング速度を低下させ、かつ、エツチング薬剤濃度や温度
に対する依存性を低下させたものである。エツチング速
度は0.01〜0゜3IIn/秒の範囲、より好ましく
は0.03〜0.20−/秒の範囲を使用する。エツチ
ング速度が0.3−/秒より速いとエツチング条件の制
御可能な条件範囲より小さいエツチング処理時間、成分
濃度、温度などの差でエツチングの量の差が大きくなる
。
Etching is carried out using the cupric chloride/hydrochloric acid aqueous solution mentioned above, but this etching solution significantly reduces the etching speed compared to the hard etching used in normal pattern formation, and also This reduces the dependence on The etching rate used is in the range of 0.01-0.3 IIn/sec, more preferably in the range of 0.03-0.20-/sec. If the etching rate is faster than 0.3-/second, the difference in the amount of etching becomes large due to differences in etching processing time, component concentration, temperature, etc., which are smaller than the controllable range of etching conditions.

これは−枚の銅張板の場所によるバラツキ、多数枚処理
した場合の平均厚みのバラツキとして現れ、所望の銅箔
厚みに対する厚みの範囲を±1.0μ以内としてなる高
精度の薄銅張回路基板の製造が困難となって、品質管理
面等に余分の負荷を生み、不良品も多くなるので好まし
くない。また、エツチング速度が0,0IE11/秒よ
り遅いとエツチングに時間がかかり実用的ではない。
This appears as variations depending on the location of the copper clad plates, and variations in the average thickness when processing a large number of sheets, and a high-precision thin copper clad circuit whose thickness range is within ±1.0μ relative to the desired copper foil thickness. This is undesirable because it becomes difficult to manufacture the substrate, creates an extra burden on quality control, and increases the number of defective products. Furthermore, if the etching speed is slower than 0.0IE11/sec, etching takes a long time and is not practical.

次に、本発明の仕上げエツチング或いは化学研磨に用い
る過酸化水素/硫酸水溶液は、過酸化水素(H2O2)
の濃度0.3〜3 mol/ R、硫酸(HiSD<>
の濃度0.05〜1.5 mol/ j2で温度25〜
50℃、銅濃度10〜60g/ iの範囲が好ましい。
Next, the hydrogen peroxide/sulfuric acid aqueous solution used in the final etching or chemical polishing of the present invention is hydrogen peroxide (H2O2).
concentration 0.3-3 mol/R, sulfuric acid (HiSD<>
At a concentration of 0.05 to 1.5 mol/j2 and a temperature of 25 to
Preferably, the temperature is 50°C and the copper concentration is in the range of 10 to 60 g/i.

この過酸化水素/硫酸水溶液には、過酸化水素の安定剤
、銅の溶解促進剤や光沢付与剤などの助剤を加えたもの
が好適に用いられるものである。助剤としてはメタノー
ル、エタノール、プロパツール、ブタノールナトの1価
アルコール;エチレングリコール、プロピレングリコー
ル、フタンジオール、ベンタンジオールなどの2価のア
ルコール;グリセリン、ペンタエリスリトールなどの3
価以上のアルコール;ホリエチレングリコールなどのグ
リコールエーテル類;アミノ安息香酸、アミノテトラゾ
ール、フェニル尿素などの含窒素有機環状化合物類など
が例示され二通常0.1〜5%の範囲となるように適宜
添加されるものである。この過酸化水素/硫酸水溶液は
、モル比がH2SO4/H20□〉0.1の組成の場合
はエツチング液組成となり、この場合、光沢性を付与す
る助剤としてアルコール類、特にn−ブロビルアルコー
ルを用いることが好適であり、逆の過酸化水素大過剰系
のモル比が)12sO4/H2O2≦0.1では化学研
磨液組成となり、特に光沢性付与用の助剤は必要ではな
い。また、仕上げエツチング或いは化学研磨によって除
去する銅箔の厚さは、通常t〜4−の範囲、好適には2
〜3−の範囲とする。
The hydrogen peroxide/sulfuric acid aqueous solution preferably contains auxiliary agents such as a hydrogen peroxide stabilizer, a copper solubility promoter, and a brightening agent. Auxiliary agents include monohydric alcohols such as methanol, ethanol, propatool, and butanol; dihydric alcohols such as ethylene glycol, propylene glycol, phthanediol, and bentanediol; and trihydric alcohols such as glycerin and pentaerythritol.
Examples include alcohols having a higher alcohol content; glycol ethers such as polyethylene glycol; and nitrogen-containing organic cyclic compounds such as aminobenzoic acid, aminotetrazole, and phenylurea. It is added. This hydrogen peroxide/sulfuric acid aqueous solution has an etching solution composition when the molar ratio is H2SO4/H20□〉0.1. It is preferable to use a chemical polishing liquid composition, and when the molar ratio of a large excess hydrogen peroxide system is 12sO4/H2O2≦0.1, the composition becomes a chemical polishing liquid, and no auxiliary agent for imparting gloss is particularly required. Further, the thickness of the copper foil removed by final etching or chemical polishing is usually in the range of t to 4-, preferably 2.
-3- range.

以上のエツチング方法としては通常1.スプレーエラチ
ン2グを行うのが適当であり、水平乃至垂直にて行う。
The above etching methods are usually 1. It is appropriate to carry out spray erating 2, and it is carried out either horizontally or vertically.

特に、大面積の銅張板の両面を同時にエツチング処理す
る場合には垂直とすることが好ましい。また、エツチン
グ終了後、銅張積層板表面に付着したエツチング液は速
やかに除去するようにするのが好ましい。通常は、第1
段階のエツチング終了後、−旦、銅箔表面に水、希薄な
酸水溶液などを噴霧などして停止した後、第2段階のエ
ツチング或いは化学研磨を行う。特に化学研磨液組成の
ものを使用した場合には酸洗浄して酸化銅膜を溶解除去
した後、清浄化など行う。なお、第2段において化学研
磨液組成を使用する場合には浸漬法も好適に使用される
。
In particular, when etching both sides of a large-area copper clad plate at the same time, it is preferable to set it vertically. Further, after etching is completed, it is preferable that the etching solution adhering to the surface of the copper-clad laminate is quickly removed. Usually the first
After the first step of etching is completed, water or a dilute acid aqueous solution is sprayed onto the surface of the copper foil and stopped, followed by a second step of etching or chemical polishing. In particular, when a chemical polishing liquid composition is used, cleaning is performed after acid cleaning to dissolve and remove the copper oxide film. Note that when a chemical polishing liquid composition is used in the second stage, a dipping method is also suitably used.

エツチングにより所定厚みの銅箔を除去するためには、
所定のエツチング条件下におけるエツチング速度を測定
し、この速度を上記の範囲内の特定の値として、エツチ
ング時間を設定する方法を使用する。例えば、両面に同
一厚みの銅箔を張った両面銅張板を用い、これを水平で
両面を同時に同一の厚みにするには、上下両面のエツチ
ング速度が同一となるようにスプレー圧、必要によりス
プレー数等をコントロールしてエツチング速度を揃え、
所定時間エツチングする方法による。また、従来の水平
エツチングマシンは、数メートル7分以下の一定速度で
移動する積層板の銅箔面に対してノズルの噴射方向を出
来るだけ垂直とする方法が取られているが、本発明の場
合には銅張板の銅箔表面に均一にスプレーされればよく
、スプレーノズルの噴射角度を30°〜50°程度傾け
て使用することもできるものである。又、仕上げエツチ
ング或いは化学研磨は、第1段階のエツチングとの連続
処理の点からは上記スプレーエツチングと同様の方法を
用いるが、上記した化学研磨液組成を用いる場合には、
浸漬などの方法も好適に使用されるものである。なお、
本発明の方法においては極めて厳密に銅箔除去量を制御
する必要があるので、上記したエツチング液の組成等の
調節によるエツチング速度の一定化とともに、エツチン
グ液との有効接触時間なども当然により厳密に設定でき
るようにすることが好ましい。
To remove a specified thickness of copper foil by etching,
A method is used in which the etching rate under predetermined etching conditions is measured and the etching time is set using this rate as a specific value within the above range. For example, if you are using a double-sided copper-clad board with copper foil of the same thickness on both sides, and you want to make both sides horizontal and the same thickness at the same time, you need to adjust the spray pressure as necessary so that the etching speed on both the top and bottom is the same. Adjust the etching speed by controlling the number of sprays, etc.
Depends on the method of etching for a predetermined period of time. Furthermore, in conventional horizontal etching machines, a method is adopted in which the jetting direction of the nozzle is as perpendicular as possible to the copper foil surface of the laminated board, which moves at a constant speed of several meters or less. In such cases, it is sufficient to uniformly spray the surface of the copper foil of the copper clad plate, and the spray nozzle may be used with the spray angle tilted by about 30° to 50°. In addition, for finishing etching or chemical polishing, the same method as the above-mentioned spray etching is used in terms of continuous processing with the first stage etching, but when using the above-mentioned chemical polishing liquid composition,
Methods such as immersion are also preferably used. In addition,
In the method of the present invention, it is necessary to extremely strictly control the amount of copper foil removed, so in addition to keeping the etching speed constant by adjusting the composition of the etching solution as described above, the effective contact time with the etching solution must also be controlled more strictly. It is preferable to be able to set it to .

上記した二段階のエツチング或いは化学研磨剤で処理し
た積層板の銅箔面は清浄化した後、適宜乾燥し、銅箔面
の保護のために防錆剤の塗布を行う。
The copper foil surface of the laminate that has been treated with the above two-step etching or chemical polishing agent is cleaned, dried appropriately, and a rust preventive agent is applied to protect the copper foil surface.

ここに清浄化とは、中和、酸洗浄、水洗、湯洗などの公
知の不純物の除去法でよく、用いた塩化第二銅/塩酸水
溶液による銅エツチング液の安定剤その他の成分を考慮
して適宜選択するが、酸洗、水洗或いは湯洗後、炭酸ソ
ーダ1〜5 wt%の水溶液で20〜50℃で中和処理
した後、防錆剤としては公知の銅の防錆剤、例えば、ベ
ンゾトリアゾールなどのアゾール化合物を0,01〜1
wt%を含有し、適宜界面活性剤などを併用した水溶液
に20〜50℃で浸漬処理することが好適である。
Here, cleaning may be any known impurity removal method such as neutralization, acid washing, water washing, hot water washing, etc., taking into account the stabilizer and other components of the copper etching solution using cupric chloride/hydrochloric acid aqueous solution. After pickling, water washing, or hot water washing, neutralization treatment at 20 to 50°C with an aqueous solution of 1 to 5 wt% of sodium carbonate, the rust preventive agent may be a known copper rust preventive agent, such as a copper rust preventive agent. , azole compounds such as benzotriazole at 0.01 to 1
It is preferable to carry out the immersion treatment at 20 to 50° C. in an aqueous solution containing 20 to 50° C., containing a surfactant and the like as appropriate.

又、防錆処理後に、剥離可能な樹脂、例えばポリエチレ
ン、ポリプロピレン、エチレン−プロピレン樹脂、エチ
レン−酢酸ビニル樹脂、塩化ビニリデン、ポリアクリレ
ート共重合体、1.2−ポリブタジェン樹脂、ポリエス
テル樹脂、その他の熱可塑性樹脂製のフィルム類やフォ
トレジストフィルム;パラフィンワックス、ポリエチレ
ンワックス、ロジン、低分子量ポリスチレンなどの汎用
溶媒溶解性の樹脂類;フォトレジスト樹脂液などを圧着
などして胴箔面を被覆することも好ましい。
In addition, after the rust prevention treatment, heat-removable resins such as polyethylene, polypropylene, ethylene-propylene resin, ethylene-vinyl acetate resin, vinylidene chloride, polyacrylate copolymer, 1,2-polybutadiene resin, polyester resin, etc. Plastic resin films and photoresist films; general-purpose solvent-soluble resins such as paraffin wax, polyethylene wax, rosin, and low molecular weight polystyrene; photoresist resin liquid can also be applied to cover the body foil surface by pressure bonding, etc. preferable.

本発明の塩化第二銅/塩酸水溶液は、上記のように塩酸
濃度を従来のものに比較して大幅に低下させ、かつ主要
には塩酸濃度を制御することを特徴とするものである。
As described above, the cupric chloride/hydrochloric acid aqueous solution of the present invention is characterized by significantly lowering the hydrochloric acid concentration compared to conventional solutions, and mainly controlling the hydrochloric acid concentration.

この点について、添付図面により説明する。This point will be explained with reference to the attached drawings.

〔実施例〕〔Example〕

以下、実施例、比較例により本発明を具体的に説明する
。なお、エツチングした銅箔の厚みは、うず電流方式で
測定した。
Hereinafter, the present invention will be specifically explained with reference to Examples and Comparative Examples. The thickness of the etched copper foil was measured using an eddy current method.

実施例1 700X1020mmで板厚1.6mm、片面ロープロ
ファイル処理した平均厚さ15−の銅箔を両面に張った
ガラス布基材エポキシ樹脂積層板 10枚を用いて平均
銅箔厚さ9−の薄銅張回路基板を製造した。
Example 1 Using 10 glass cloth base epoxy resin laminates, each of which was 700 x 1020 mm, 1.6 mm thick, and coated on both sides with copper foil with an average thickness of 15 mm and treated with a low profile on one side, an average copper foil thickness of 9 mm was used. A thin copper-clad circuit board was manufactured.

用いた両面胴張板の銅箔厚さ範囲は、平均15.0μ、
最大15.!za+、最小14.5−、バラツキ ±0
.5uMでムリ、表面凹凸度針による銅箔の表面凹凸は
3.6〜4.3 tnhであった。
The copper foil thickness range of the double-sided trunk board used was 15.0μ on average,
Maximum 15. ! za+, minimum 14.5-, variation ±0
.. The surface unevenness of the copper foil measured by the needle was 3.6 to 4.3 tnh.

第1段階エツチングとして、水平エツチングマシンを用
い、銅エツチング液として下記の塩化第二銅エツチング
液、エツチング条件を使用して残存銅箔の厚みが12−
となるようにエツチングした。
In the first stage etching, a horizontal etching machine was used, the following copper chloride etching solution was used as the copper etching solution, and the remaining copper foil was etched to a thickness of 12-
It was etched so that

第2段階エツチング(仕上げエツチング)として下記の
過酸化水素/硫酸水溶液を用いてエツチングして平均厚
さ9−の両面洞張板とした。
As a second stage etching (finish etching), the following hydrogen peroxide/sulfuric acid aqueous solution was used to make a double-sided hollow board with an average thickness of 9 mm.

ついで、Na2Co、 5%水溶液に室温で30秒間浸
漬した後、濃度0.3%のベンゾトリアゾール水溶液に
40℃で30秒間浸漬し、100℃の熱風で30秒間乾
燥した。
Then, it was immersed in a 5% Na2Co aqueous solution at room temperature for 30 seconds, then immersed in a 0.3% concentration benzotriazole aqueous solution at 40°C for 30 seconds, and dried with hot air at 100°C for 30 seconds.

得られた薄銅張板10枚全てについて、銅箔の厚さをそ
れぞれ縦横3等分して得られる一枚当たり18個の長方
形内の任意の点に銅箔厚さを測定した結果、平均8.9
μ、最大9.5−1最小8.6−で平均厚さに対するバ
ラツキは±0.6−1所望の厚さに対するバラツキは±
0.5−であり、測定点の95%が8.6〜9.4JJ
0mの範囲にあり、表面凹凸は2.5〜3.5−1表面
光沢度は85であった。
For all 10 thin copper clad plates obtained, the copper foil thickness was measured at any point within 18 rectangles obtained by dividing the thickness of the copper foil into three equal parts vertically and horizontally, and the average 8.9
μ, Maximum 9.5-1 Minimum 8.6- The variation with respect to the average thickness is ±0.6-1 The variation with respect to the desired thickness is ±
0.5-, and 95% of the measurement points are 8.6-9.4JJ
The surface roughness was in the range of 0 m, the surface unevenness was 2.5 to 3.5-1, and the surface gloss was 85.

また、得られた薄銅張板を25℃、60%RHで30時
間保持したが、錆の発生は見られなかった。
Further, the obtained thin copper clad plate was held at 25° C. and 60% RH for 30 hours, but no rust was observed.

実施例2 実施例ト1において、第2段階エツチング(化学研磨)
を下記で行う他は同様とした。
Example 2 In Example T1, second stage etching (chemical polishing)
The procedure was the same except that it was performed as follows.

・エッナンク連反 U、U4EI+/秒。・Ennanku streak U, U4EI+/sec.

得られた薄銅張板について、実施例1と同様に測定した
結果、銅箔厚さは平均8,9.cm、最大9.4血、最
小8.6−で平均厚さに対するバラツキは±Q、5JI
n、所望の厚さに対するバラツキは±0.4−であり、
測定点の95%が8.8〜9.2−の範囲にあり、表面
凹凸は2.0〜3.0−1表面光沢度は211であった
。
The obtained thin copper clad plate was measured in the same manner as in Example 1, and the average copper foil thickness was 8.9. cm, maximum 9.4 blood, minimum 8.6-, variation in average thickness is ±Q, 5JI
n, the variation with respect to the desired thickness is ±0.4-,
95% of the measurement points were in the range of 8.8-9.2-, the surface unevenness was 2.0-3.0-1, and the surface gloss was 211.

また、得られた薄銅張板を25℃、60%RHで30時
間保持したが、錆の発生は見られなかった。
Further, the obtained thin copper clad plate was held at 25° C. and 60% RH for 30 hours, but no rust was observed.

比較例1 実施例1において、第1段階に用いた塩化第二銅エツチ
ング液で下記条件を用いて9−の薄銅箔回路基板を製造
した。
Comparative Example 1 In Example 1, a 9-thin copper foil circuit board was manufactured using the cupric chloride etching solution used in the first step under the following conditions.

ついで、0.01〜0.5%のHCIの水溶液、3%の
H,SO,の水溶液、5%のNa2Co3水溶液に順次
室温で30秒間づつ浸漬した後、濃度0.3%のベンゾ
トリアゾール水溶液に40℃で30秒間浸漬し、100
℃の熱風で30秒間乾燥した。
Next, it was immersed in a 0.01-0.5% HCI aqueous solution, a 3% H,SO, aqueous solution, and a 5% Na2Co3 aqueous solution for 30 seconds each at room temperature, followed by a benzotriazole aqueous solution with a concentration of 0.3%. 40℃ for 30 seconds and 100℃
It was dried with hot air at ℃ for 30 seconds.

得られた薄銅張板について、実施例1と同様に測定した
結果、銅箔厚さは平均8.9−1最大9.4−1最小8
.6−で平均厚さに対するバラツキは±0.5−1所望
の厚さに対するバラツキは±0.4−であり、表面凹凸
は3.6〜4.8−1表面光沢度は1O15であった。
The obtained thin copper clad plate was measured in the same manner as in Example 1, and the average copper foil thickness was 8.9-1, maximum 9.4-1, minimum 8.
.. 6-, the variation with respect to the average thickness was ±0.5-1, the variation with respect to the desired thickness was ±0.4-1, the surface unevenness was 3.6-4.8-1, and the surface gloss was 1O15. .

また、薄銅張板を25℃、60%RHで保持したところ
、24時間後に斑点状の錆が発生し、保存性はやや不充
分であった。
Furthermore, when the thin copper clad plate was maintained at 25° C. and 60% RH, spotty rust appeared after 24 hours, and the storage stability was somewhat insufficient.

〔発明の作用および効果〕[Operation and effects of the invention]

以上、発明の詳細な説明および実施例、比較例から明瞭
な如く、本発明は従来のエツチングに比較して極めて低
速で塩化第二銅/塩酸水溶液によるエツチングを行った
後、仕上げエツチング或いは化学研磨を行うことによっ
て、極めて高い厚み精度を有し、防錆効果に優れ、光沢
性のある商品価値の高い薄銅箔張回路基板とするもので
あり、その産業上の意義は極めて大きいものである。
As is clear from the detailed description of the invention, examples, and comparative examples, the present invention performs etching using a cupric chloride/hydrochloric acid aqueous solution at a much slower rate than conventional etching, followed by final etching or chemical polishing. By doing this, a thin copper foil-clad circuit board with extremely high thickness accuracy, excellent anti-corrosion effect, and high luster and high commercial value can be obtained, and its industrial significance is extremely large. .

Claims (1)

【特許請求の範囲】 1 銅箔と電気絶縁体とより製造された銅箔張回路基板
を銅エッチング液を用い、0.01〜0.3μm/秒の
速度で銅箔全面をエッチングして、もとの銅箔の厚さの
25〜90%を除去し、所望厚みに対して残存銅箔の厚
みのバラツキが±1.0μm以内とする薄銅箔張回路基
板の製造法であって、該銅エッチング液として、まず、
塩化第二銅/塩酸水溶液を用いて残存銅箔厚みが所望厚
みより1〜4μm厚くなるようにエッチングした後、過
酸化水素/硫酸水溶液を用いて仕上げエッチング或いは
化学研磨することからなる薄銅箔張回路基板の製造法。 2 該塩化第二銅/塩酸水溶液によるエッチングが、塩
化第二銅0.25〜3mol/l、塩酸1〜4mol/
lの範囲で、少なくとも塩酸濃度が所定濃度の±0.3
mol/l以内に制御され、かつエッチング温度が25
〜55℃の範囲で所定温度±5℃以内に制御されてなる
請求項1記載の薄銅箔張回路基板の製造法。 3 該仕上げエッチング或いは化学研磨後、水溶性防錆
剤で残存銅箔表面を処理する請求項1記載の薄銅箔張回
路基板の製造法。
[Claims] 1. A copper foil-clad circuit board made of copper foil and an electrical insulator is etched over the entire surface of the copper foil at a rate of 0.01 to 0.3 μm/sec using a copper etching solution. A method for producing a thin copper foil-clad circuit board in which 25 to 90% of the original copper foil thickness is removed and the thickness variation of the remaining copper foil is within ±1.0 μm with respect to the desired thickness, As the copper etching solution, first,
A thin copper foil made by etching using a cupric chloride/hydrochloric acid aqueous solution so that the remaining copper foil thickness is 1 to 4 μm thicker than the desired thickness, and then final etching or chemical polishing using a hydrogen peroxide/sulfuric acid aqueous solution. Manufacturing method for stretched circuit boards. 2 Etching with the cupric chloride/hydrochloric acid aqueous solution includes cupric chloride 0.25 to 3 mol/l and hydrochloric acid 1 to 4 mol/l.
l, the hydrochloric acid concentration is at least ±0.3 of the predetermined concentration.
The etching temperature is controlled within mol/l and the etching temperature is 25%.
2. The method for manufacturing a thin copper foil-clad circuit board according to claim 1, wherein the temperature is controlled within ±5°C within a range of 55°C. 3. The method for manufacturing a thin copper foil-clad circuit board according to claim 1, wherein the remaining copper foil surface is treated with a water-soluble rust preventive agent after the final etching or chemical polishing.
JP1196265A 1989-07-28 1989-07-28 Manufacturing method of thin copper foil-clad circuit board Expired - Fee Related JP2797488B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1196265A JP2797488B2 (en) 1989-07-28 1989-07-28 Manufacturing method of thin copper foil-clad circuit board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1196265A JP2797488B2 (en) 1989-07-28 1989-07-28 Manufacturing method of thin copper foil-clad circuit board

Publications (2)

Publication Number Publication Date
JPH0360183A true JPH0360183A (en) 1991-03-15
JP2797488B2 JP2797488B2 (en) 1998-09-17

Family

ID=16354932

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Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
JP (1) JP2797488B2 (en)

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000073021A1 (en) * 1999-05-28 2000-12-07 Lam Research Corporation Method and system for cleaning a chemical mechanical polishing pad
JP2003110223A (en) * 2001-09-28 2003-04-11 Denki Kagaku Kogyo Kk Circuit board manufacturing method
US6800020B1 (en) 2000-10-02 2004-10-05 Lam Research Corporation Web-style pad conditioning system and methods for implementing the same
JP2007081217A (en) * 2005-09-15 2007-03-29 Hitachi Metals Ltd Circuit board manufacturing method, circuit board, and semiconductor module
JP2007081214A (en) * 2005-09-15 2007-03-29 Mitsui Mining & Smelting Co Ltd Method for manufacturing printed wiring board
JP2008143032A (en) * 2006-12-11 2008-06-26 Nippon Steel Chem Co Ltd Method for producing flexible copper-clad laminate
JP2009233874A (en) * 2008-03-26 2009-10-15 Ube Ind Ltd Manufacturing method and transferring method of very thin copper foil laminated-film
JP2010232407A (en) * 2009-03-27 2010-10-14 Toppan Printing Co Ltd Printed wiring board and manufacturing method thereof
JPWO2018180988A1 (en) * 2017-03-31 2020-02-06 三菱瓦斯化学株式会社 Surface treatment solution for rolled copper foil, surface treatment method, and method for producing rolled copper foil
CN112234025A (en) * 2019-11-20 2021-01-15 江苏上达电子有限公司 A kind of manufacturing method suitable for thick copper foil precision circuit
CN114786365A (en) * 2022-04-14 2022-07-22 扬州华盟电子有限公司 Flexible circuit board for wireless charging and manufacturing method and application thereof

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0325995A (en) * 1989-06-23 1991-02-04 Mitsubishi Gas Chem Co Inc Manufacturing method of thin copper foil clad circuit board

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0325995A (en) * 1989-06-23 1991-02-04 Mitsubishi Gas Chem Co Inc Manufacturing method of thin copper foil clad circuit board

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000073021A1 (en) * 1999-05-28 2000-12-07 Lam Research Corporation Method and system for cleaning a chemical mechanical polishing pad
US6352595B1 (en) 1999-05-28 2002-03-05 Lam Research Corporation Method and system for cleaning a chemical mechanical polishing pad
US6800020B1 (en) 2000-10-02 2004-10-05 Lam Research Corporation Web-style pad conditioning system and methods for implementing the same
JP2003110223A (en) * 2001-09-28 2003-04-11 Denki Kagaku Kogyo Kk Circuit board manufacturing method
JP2007081217A (en) * 2005-09-15 2007-03-29 Hitachi Metals Ltd Circuit board manufacturing method, circuit board, and semiconductor module
JP2007081214A (en) * 2005-09-15 2007-03-29 Mitsui Mining & Smelting Co Ltd Method for manufacturing printed wiring board
JP2008143032A (en) * 2006-12-11 2008-06-26 Nippon Steel Chem Co Ltd Method for producing flexible copper-clad laminate
JP2009233874A (en) * 2008-03-26 2009-10-15 Ube Ind Ltd Manufacturing method and transferring method of very thin copper foil laminated-film
JP2010232407A (en) * 2009-03-27 2010-10-14 Toppan Printing Co Ltd Printed wiring board and manufacturing method thereof
JPWO2018180988A1 (en) * 2017-03-31 2020-02-06 三菱瓦斯化学株式会社 Surface treatment solution for rolled copper foil, surface treatment method, and method for producing rolled copper foil
CN112234025A (en) * 2019-11-20 2021-01-15 江苏上达电子有限公司 A kind of manufacturing method suitable for thick copper foil precision circuit
CN114786365A (en) * 2022-04-14 2022-07-22 扬州华盟电子有限公司 Flexible circuit board for wireless charging and manufacturing method and application thereof

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