JPH0361877A - Testing circuit for insulation recovery of switching apparatus - Google Patents

Testing circuit for insulation recovery of switching apparatus

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Publication number
JPH0361877A
JPH0361877A JP2034483A JP3448390A JPH0361877A JP H0361877 A JPH0361877 A JP H0361877A JP 2034483 A JP2034483 A JP 2034483A JP 3448390 A JP3448390 A JP 3448390A JP H0361877 A JPH0361877 A JP H0361877A
Authority
JP
Japan
Prior art keywords
series
circuit
capacitor
voltage
current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2034483A
Other languages
Japanese (ja)
Other versions
JP2787050B2 (en
Inventor
Hiromi Iwai
岩井 弘美
Yasuhiko Kanetaka
金高 康彦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
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Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP2034483A priority Critical patent/JP2787050B2/en
Publication of JPH0361877A publication Critical patent/JPH0361877A/en
Application granted granted Critical
Publication of JP2787050B2 publication Critical patent/JP2787050B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Arc-Extinguishing Devices That Are Switches (AREA)
  • Keying Circuit Devices (AREA)

Abstract

PURPOSE:To achieve a compact configuration and low cost for a power source capacitor by constituting a circuit so that a parallel capacitor is directly charged with the electric charge from the power source capacitor through a series capacitor. CONSTITUTION:The resistance value of a series resistor (Rg) 11 is selected beforehand so that the electric charge which is charged in a series capacitor (Cg) 10 is discharged and made to disappear until a cutoff time t3. Then, the terminal voltage Eo of the series capacitor becomes approximately zero as shown in a voltage waveform 205 at the time t3. At this time, insulation between the electrodes of a breaker under test 1 is recovering. A current flowing through a starting gap 9 is only what flows across the capacity Co (including the capacitance C3 of a breaker under test 1) of a parallel capacitor (Co) 15 through a limiting resistor (Rv) 13 having the resistance Rv and a parallel resistor (Ro) 14 having the resistance Ro. Since the current is remarkably reduced, the discharging of the starting gap 9 is stopped. Then, the charging of the parallel capacitor 15 is performed through the series capacitor 10 and the series resistor 11.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は、遮断器や開閉器などの開閉機器の電流遮断
において、アーク消滅直後からの極間の絶縁回復特性を
検証するための絶縁回復試験回路に関する。
[Detailed Description of the Invention] [Field of Industrial Application] This invention is an insulation recovery method for verifying the insulation recovery characteristics between poles immediately after arc extinguishment in current interruption of switching equipment such as circuit breakers and switches. Regarding test circuits.

〔従来の技術〕[Conventional technology]

開閉機器の電流遮断直後は、アークによって加熱された
高温ガスやプラズマが極間に残留している。したがって
、を流零点で7−りが消滅した直後、極間の絶縁耐力は
非常に低い状態にある。しかし、時間経過と共に極間距
離が増大し、ガスも冷却され、プラズマも再結合するの
で、極間の絶縁耐力は次第に回復してくる。このときの
極間の絶縁耐力は絶縁回復電圧と称されている。一方、
遮断後の極間には、電力系統で発生する過渡回復電圧が
かかる。この過渡回復電圧が常に極間の絶縁回復電圧以
下であれば遮断は成功するが、それより高くなると絶縁
破壊によって極間に再びアークが発生し遮断不能となる
。したがって、絶縁回復特性は、開閉機器の遮断性能を
示す重要な特性の一つであり、開閉機器の性能向上や性
能確認のために絶縁回復試験が実施される。
Immediately after the current is cut off in switching equipment, high-temperature gas and plasma heated by the arc remain between the poles. Therefore, the dielectric strength between the electrodes is in a very low state immediately after the 7-ring disappears at the zero flow point. However, as time passes, the distance between the electrodes increases, the gas cools, and the plasma recombines, so the dielectric strength between the electrodes gradually recovers. The dielectric strength between the electrodes at this time is called dielectric recovery voltage. on the other hand,
A transient recovery voltage generated in the power system is applied between the poles after the interruption. If this transient recovery voltage is always less than the insulation recovery voltage between the electrodes, the interruption will be successful, but if it becomes higher than that, an arc will occur again between the electrodes due to insulation breakdown, and the interruption will become impossible. Therefore, insulation recovery characteristics are one of the important characteristics that indicate the breaking performance of switching equipment, and insulation recovery tests are performed to improve and confirm the performance of switching equipment.

絶縁回復試験は、遮断電流、過渡回復電圧を実用線路と
同じように同一の電源から供給する回路による直接短絡
試験が望ましいが、試験設備の規模が大がかりとなるた
め実施が困難である。これに代わる有力な手段として、
遮断電流と過渡回復電圧とをそれぞれ別個の電源から供
給する回路による合成短絡試験法が用いられている。
Direct short-circuit testing using a circuit that supplies the breaking current and transient recovery voltage from the same power source as in a practical line is preferable for insulation recovery testing, but this is difficult because the scale of the testing equipment is large. As an alternative means,
A synthetic short-circuit test method is used in which circuits supply the interrupting current and transient recovery voltage from separate power supplies.

第3図は、従来の合成短絡試験法による絶縁回復試験回
路図(中用他「パンファ式ガス遮断器の電流遮断後の極
間過渡絶縁回復特性」電学論B。
Figure 3 is an insulation recovery test circuit diagram using the conventional synthetic short-circuit test method.

108巻11号昭63. P541)であり、第4図は
第3図の回路において発生する電圧および電流の経時変
化を示す波形図である。
Volume 108, No. 11, 1986. P541), and FIG. 4 is a waveform diagram showing temporal changes in voltage and current generated in the circuit of FIG. 3.

第3図において、短絡発t81等の大電流電源2より直
列遮断器である保l!遮断器3と電流源遮断器5.直列
リアクトル4を介して供試遮断器1に遮断電流26を供
給する電流源回路6と、直流電源7により所定の電圧に
充電される電源コンデンサ8とこれにiI!響接続され
る始動ギャップ9よりなる電圧源回路12と、始動ギャ
ップ9に接続された共振りアクドル2L整流器22.減
衰抵抗器23.および共振コンデンサ24の直列回路よ
りなる直列共振回路25と、この直列共振回路25と供
試遮断器1とを結ぶ制限抵抗器13および供試遮断器1
に並列接続された並列抵抗器14および並列コンデンサ
15の直列回路からなる回復電圧波形調整回路16とで
試験回路が構成されている。
In FIG. 3, a series circuit breaker is connected to a high current power source 2 such as a short circuit t81. Circuit breaker 3 and current source circuit breaker 5. A current source circuit 6 supplies a breaking current 26 to the test circuit breaker 1 via a series reactor 4, a power supply capacitor 8 charged to a predetermined voltage by a DC power supply 7, and iI! a voltage source circuit 12 consisting of a starting gap 9 connected to the starting gap 9; and a resonant accelerator 2L rectifier 22 connected to the starting gap 9. Damping resistor 23. and a series resonant circuit 25 consisting of a series circuit of a resonant capacitor 24, a limiting resistor 13 connecting this series resonant circuit 25 and the circuit breaker under test 1, and the circuit breaker under test 1
A test circuit is constituted by a recovery voltage waveform adjustment circuit 16 consisting of a series circuit of a parallel resistor 14 and a parallel capacitor 15 connected in parallel.

従来例による試験方法を第3図の回路図と第4彼衿 図の       図とに基づいて説明する。試験開始
前にあらかじめ、供試遮断器1と1i流源遮断器5は投
入状態としておくとともに、電源コンデンサ8にも所定
の電圧を充電しておく、保vl遮断器3を投入し交流の
遮断電流26を電流源回路6に流した状態で、供試遮断
器1と電流源遮断器5に開極指令を出す、供試遮断器l
と電流源遮断器5の開極時刻(すなわち、アークが発生
し始める時刻)をt、遮断時刻(すなわち、アークが消
滅する最終の電流零点)をt、とすると、遮断電流26
はたとえば第4図における電流波形201のようになる
。2、ツチングされた部分がアーク発生XJI 間ニ対
応し、時刻t、以降は電流源回路6がらの電流供給はな
くなるので零となる。
The conventional test method will be explained based on the circuit diagram shown in FIG. 3 and the circuit diagram shown in FIG. 4. Before starting the test, the test circuit breaker 1 and 1i current source circuit breaker 5 are turned on, and the power supply capacitor 8 is also charged with a predetermined voltage.The voltage protection circuit breaker 3 is turned on to cut off the AC. The circuit breaker under test 1 issues an opening command to the circuit breaker under test 1 and the current source circuit breaker 5 while the current 26 is flowing through the current source circuit 6.
If the opening time of the current source circuit breaker 5 (i.e., the time when the arc starts to occur) is t, and the breaking time (i.e., the final current zero point at which the arc disappears) is t, then the breaking current 26
For example, the current waveform is as shown in the current waveform 201 in FIG. 2. The pinched portion corresponds to the arc occurrence period XJI, and after time t, the current supply from the current source circuit 6 is stopped, so the current becomes zero.

遮断電流26の零点t、の直前の時刻t2において、始
動パルス発生器19より始動パルス信号2oを発生させ
始動ギャップ9を放電させると、電流コンデンサ8に充
電された!荷が直列共振回路25を振動電流となって流
れ、共振コンデンサ24を充電する。
At time t2 immediately before the zero point t of the interrupting current 26, the starting pulse signal 2o is generated from the starting pulse generator 19 to discharge the starting gap 9, and the current capacitor 8 is charged! The load flows through the series resonant circuit 25 as an oscillating current, charging the resonant capacitor 24.

共振コンデンサ24の端子電圧は、第4図の電圧波形2
02のように振動電圧の第1波高値まで充電されると、
整流器22が逆極性の振動電流を阻止するので共振コン
デンサ24への充電は中断される。
The terminal voltage of the resonant capacitor 24 is voltage waveform 2 in FIG.
When charged to the first peak value of the oscillating voltage as shown in 02,
The charging of the resonant capacitor 24 is interrupted because the rectifier 22 blocks the oscillating current of opposite polarity.

一方、電源コンデンサ8に充電された電荷の一部は、回
復電圧波形調整回路16および供試遮断器1にも流れる
。供試遮断器1の極間にかかる電圧は、第4図における
電圧波形203のように時刻t。
On the other hand, a part of the electric charge charged in the power supply capacitor 8 also flows to the recovery voltage waveform adjustment circuit 16 and the test circuit breaker 1. The voltage applied between the poles of the test circuit breaker 1 is as shown in the voltage waveform 203 in FIG. 4 at time t.

までは極間のアークによって短絡されているので零であ
るが、時刻t3以降にアークが消滅するので極間の絶縁
が回復し、回復電圧波形調整回路16のもつ時定数τ。
Until then, the voltage is zero because the arc between the electrodes causes a short circuit, but after time t3, the arc disappears, so the insulation between the electrodes is restored, and the time constant τ of the recovery voltage waveform adjustment circuit 16 increases.

によって立ち上がる。しかし、供試遮断器lの端子間に
かかる電圧は、それ自体のもつ極間の絶縁回復電圧まで
上昇すると絶縁破壊によって一旦零となり、その後、再
び時定数τ。
stand up by However, when the voltage applied between the terminals of the test circuit breaker I rises to its own insulation recovery voltage between poles, it becomes zero due to dielectric breakdown, and then returns to the time constant τ.

で上昇し、以後同様の経過を繰り返し電圧波形203と
なる。したがって第4図において電圧波形203の絶縁
破壊点を結んだ特性曲線204が供試遮断器lの絶縁回
復電圧の経時変化を示す。
After that, the same process repeats to form a voltage waveform 203. Therefore, in FIG. 4, a characteristic curve 204 connecting the dielectric breakdown points of the voltage waveform 203 shows the change over time in the dielectric recovery voltage of the test circuit breaker l.

〔発明が解決しようとする課題〕 第3図における電圧源回路12では、′rIIBコンデ
ンサ8に充電された電荷を整流器22を介して一旦共振
コンデンサ24に移し、共振コンデンサ24に充電され
た電荷を制限抵抗器13を介して供試遮断器1に再度放
電する回路となっている。電源コンデンサ8にEvなる
電圧を充電したとき、共振コンデンサ24に発生する電
圧E、の最大値E0は、E *−/ E v = K−
A  −−−−−−−−−−(1)となる、ここで、 K −Cw /  (Cv  + C,)  −・・・
−−−−−・(2+Cv+Caはそれぞれ電源コンデン
サ8.共振コンデンサ24の静電容量・Lv暎共振りア
クドル21のインダクタンス、Roは減衰抵抗器23の
抵抗コンデンサ24の電圧E、が低下するが、n回絶縁
破壊し、n個の絶縁回復電圧のデータが得られた後の電
圧E、をE、つとすると次の関係式が成立する。
[Problems to be Solved by the Invention] In the voltage source circuit 12 in FIG. The circuit is configured to discharge electricity again to the test circuit breaker 1 via the limiting resistor 13. When the power supply capacitor 8 is charged with a voltage Ev, the maximum value E0 of the voltage E generated in the resonance capacitor 24 is E*-/Ev = K-
A −−−−−−−−−−(1), where K −Cw / (Cv + C,) −・・・
-------・(2+Cv+Ca is the capacitance of the power supply capacitor 8, the resonant capacitor 24, Lv is the inductance of the resonant axle 21, and Ro is the voltage E of the resistance capacitor 24 of the attenuation resistor 23. However, If E is the voltage E after dielectric breakdown occurs n times and data on n dielectric recovery voltages are obtained, the following relational expression holds true.

C1 E、、/E、、−<           ”)−・−
・−・−・−・−(4)C@  + Cm  + Ce となる、ここで、C0は並列コンデンサ15の静電容量
、C3は漂遊容量17も含めた供試遮断器1の静電容量
である。したがって、供試遮断器lに充電される電圧E
、と電源コンデンサ8に充電される電圧Evとの関係は
、+1)式と(4)式よりC1 Ha−/ By = K−A ・()”−−・(51C
m  ” Cs  ” C。
C1 E,, /E,, -< ”)--
・−・−・−・−(4) C@ + Cm + Ce, where C0 is the capacitance of the parallel capacitor 15, and C3 is the capacitance of the test circuit breaker 1 including the stray capacitance 17. It is. Therefore, the voltage E charged to the test circuit breaker l
, and the voltage Ev charged in the power supply capacitor 8, from equations +1) and (4), C1 Ha-/By = K-A ・()''--(51C
m ” Cs ” C.

となる、絶縁回復試験を実施する場合、供試遮断器lの
定格電圧が高くなるにつれてE。も高い電圧が必要とな
る。(5)式のE−/ E Vをできるだけ大きくする
には、Aをできるだけ2に近づけると共に、Cv )C
m )Cs +Go とする必要がある。
When conducting an insulation recovery test, E as the rated voltage of the test circuit breaker I increases. also requires high voltage. In order to make E-/EV in equation (5) as large as possible, make A as close to 2 as possible and Cv )C
m) It is necessary to set Cs + Go.

たとえば、R11=IOとすればl A ” 2となる
ので、Cv −too Cm lC,−100(Cs 
 +Co Ln−5の場合、(5)式より、 101       101 となり、電圧E、九源コンデンサ8の充電電圧Evのほ
ぼ2倍となる。しかし、電源コンデンサー8の容量とし
てはCW −10’  −(cs +CO) となり、
供試遮断器lのn1!容量より4桁以上も大きい設備が
必要となる欠点がある。
For example, if R11=IO, it becomes l A ” 2, so Cv -too Cm lC, -100(Cs
In the case of +Co Ln-5, from equation (5), it becomes 101 101 , and the voltage E is approximately twice the charging voltage Ev of the Kugen capacitor 8. However, the capacity of the power supply capacitor 8 is CW -10' -(cs +CO),
n1 of test circuit breaker l! The drawback is that it requires equipment that is four orders of magnitude larger than the capacity.

さらに、振動波形の第1波高値の値を維持し、後続の振
動分をカットするために整流器22が必要である。この
整流器22としては、供試遮断器1の定格電圧が高くな
るにつれて、高電圧および高周波電流の仕様に耐えるも
のとする必要があり、大型ノ整流器22を設備しなけれ
ばならないという欠点がある。また・電圧を直列共振さ
せるために共振りアクドル21も必要であり、試験回路
の構成が複雑化すると共に、多額の設備費を必要とする
欠点がある。
Furthermore, a rectifier 22 is required to maintain the first peak value of the vibration waveform and cut subsequent vibrations. This rectifier 22 needs to withstand high voltage and high frequency current specifications as the rated voltage of the test circuit breaker 1 becomes higher, and there is a drawback that a large rectifier 22 must be installed. In addition, a resonant axle 21 is also required to cause the voltage to resonate in series, which has the drawback of complicating the configuration of the test circuit and requiring a large amount of equipment cost.

この発明の目的は絶縁回復試験回路の回路構成を簡素化
し、設備費を低減することにある。
An object of the present invention is to simplify the circuit configuration of an insulation recovery test circuit and reduce equipment costs.

〔課題を解決するための手段〕[Means to solve the problem]

上記課題を解決するために、この発明によれば、直列遮
断器、リアクトルを介してアーク時間があらかじめ定ま
る供試開閉機器に遮断電流を供給する電流源回路と、直
流電源により所定電圧に充電される電源コンデンサおよ
びこれに直列接続され供試開閉機器がアーク遮断する電
流の零点直前に始動パルス信号により放電する始動ギャ
ップを含む電圧源回路と、この電圧源回路と供試開閉機
器とを結ぶ制限抵抗器および供試開閉機器の極間に並列
接続された並列抵抗器および並列コンデンサの直列回路
からなる回復電圧波形調整回路とからなり、供試開閉機
器の電流遮断後の絶縁回復電圧の経時変化を試験する回
路において、前記電圧源回路が、前記始動ギャップに対
して並列接続され前記電源コンデンサと前記制限抵抗器
との間に直列接続された直列抵抗器と直列コンデンサと
の直列回路を備えたものとする。
In order to solve the above problems, the present invention includes a current source circuit that supplies a breaking current to a test switchgear whose arc time is predetermined via a series circuit breaker and a reactor, and a current source circuit that is charged to a predetermined voltage by a DC power supply. A voltage source circuit that includes a power supply capacitor that is connected in series with this and a starting gap that is discharged by a starting pulse signal just before the zero point of the current that interrupts the arc of the switchgear under test, and a restriction that connects this voltage source circuit and the switchgear under test. It consists of a resistor and a recovery voltage waveform adjustment circuit consisting of a series circuit of a parallel resistor and a parallel capacitor connected in parallel between the poles of the switchgear under test, and the change over time in the insulation recovery voltage after current interruption of the switchgear under test. In the circuit for testing, the voltage source circuit includes a series circuit of a series resistor and a series capacitor connected in parallel to the starting gap and connected in series between the power supply capacitor and the limiting resistor. shall be taken as a thing.

〔作用〕[Effect]

上記手段において、漂遊容量を含めた供試開閉機器と並
列コンデンサに直列コンデンサを介して電源コンデンサ
の充電電荷を直接給電するように構成したことにより、
従来充電電圧の2倍の電圧を得るために必要とした直列
共振回路、とくに共振コンデンサが不要となり、電源コ
ンデンサの容量を数10分の1に低減できると共に、共
振りアクドルや整流器、減衰抵抗器が不要となり、電圧
源回路を簡素化することができる。また、共振コンデン
サを排除したことによって始動ギャップの放it流が減
少し始動ギャップはその並列コンデンサへの充電電流を
持続して供給できなくなるが、始動ギャップに並列に直
列コンデンサと直列抵抗器との直列回路を設けたことに
より、これを介して並列コンデンサへの充電が継続的に
行われ・電源:I7デ′すおよび直列コンデンサの静電
容量を漂遊容量を含めた供試開閉機器と並列コンデンサ
との静電容量の和より充分に大きくしておくことにより
、電源コンデンサに充電した電圧をほとんど低下させず
に供試開閉機器側に移すことができる。
In the above-mentioned means, by configuring so that the charged charge of the power supply capacitor is directly supplied to the test switchgear including stray capacitance and the parallel capacitor via the series capacitor,
The series resonant circuit, especially the resonant capacitor, which was conventionally required to obtain twice the charging voltage, is no longer required, and the capacity of the power supply capacitor can be reduced to several tens of times. is not necessary, and the voltage source circuit can be simplified. Also, by eliminating the resonant capacitor, the discharge current in the starting gap is reduced and the starting gap cannot sustainably supply charging current to its parallel capacitor. By providing a series circuit, the parallel capacitor is continuously charged via this. Power supply: I7 device and the capacitance of the series capacitor are connected to the test switchgear including stray capacitance and the parallel capacitor. By making the capacitance sufficiently larger than the sum of the capacitance and the capacitance, the voltage charged in the power supply capacitor can be transferred to the switchgear under test with almost no drop.

〔実施例〕〔Example〕

以下この発明を実施例に基づいて説明する。第1図はこ
の発明の実施例を示す絶縁回復試験回路図であり、第2
図は第1図の回路において発生する電圧および電流の経
時変化を示す波形図である。
The present invention will be explained below based on examples. FIG. 1 is an insulation recovery test circuit diagram showing an embodiment of the present invention, and FIG.
The figure is a waveform diagram showing changes over time in the voltage and current generated in the circuit of FIG.

第1図における試験回路は、大電流電源2より直列遮断
器である保護遮断器3と電流源遮断器5゜直列リアクト
ル4を介して供試遮断器1に遮断電流26を供給する電
流源回路6と直流電源7により所定の電圧Evに充電さ
れる電源コンデンサ8と、これに直列接続される始動ギ
ャップ9と、始動ギヤ、プ9に並列接続された直列コン
デンサ10と直列抵抗器11との直列回路とからなる電
圧源回路12と、この電圧源回路12と供試遮断器1と
を結ぶ制限抵抗器】3および供試遮断器1に並列接続さ
れた並列抵抗器14および並列コンデンサ15の直列回
路からなる回復電圧波形調整回路16とで構成されてい
る。
The test circuit in FIG. 1 is a current source circuit that supplies a breaking current 26 from a large current power source 2 to a test circuit breaker 1 via a protective circuit breaker 3 which is a series circuit breaker, a current source circuit breaker 5, and a series reactor 4. 6, a power supply capacitor 8 charged to a predetermined voltage Ev by a DC power supply 7, a starting gap 9 connected in series to this, a series capacitor 10 and a series resistor 11 connected in parallel to the starting gear and gap 9. A voltage source circuit 12 consisting of a series circuit, a limiting resistor [3] connecting this voltage source circuit 12 and the circuit breaker under test 1, and a parallel resistor 14 and a parallel capacitor 15 connected in parallel to the circuit breaker under test 1. The recovery voltage waveform adjustment circuit 16 is composed of a series circuit.

実施例による試験方法を第1図と第2図とに基づいて説
明する。試験開始前にあらかじめ供試遮断器1と電流源
遮断器5とを投入すると共に直流電#7により電源コン
デンサ8もEvに充電する。
The test method according to the example will be explained based on FIGS. 1 and 2. Before starting the test, the test circuit breaker 1 and the current source circuit breaker 5 are turned on in advance, and the power supply capacitor 8 is also charged to Ev by DC power #7.

このとき、供試遮断器1が閉じているので、直列抵抗器
11.制限抵抗器13を介して直列コンデンサ10もE
vに充電される。保護遮断器3を投入して交流の遮断電
流26を電流源回路6に流した状態で、供試遮断器1と
電流源遮断器5に開極指令を出す。
At this time, since the test circuit breaker 1 is closed, the series resistor 11. The series capacitor 10 is also connected to E via the limiting resistor 13.
It is charged to v. With the protective circuit breaker 3 turned on and the AC breaking current 26 flowing through the current source circuit 6, an opening command is issued to the test circuit breaker 1 and the current source circuit breaker 5.

供試遮断器1と電流B遮断器5の開極時刻をt。The opening time of the test circuit breaker 1 and the current B circuit breaker 5 is t.

遮断時刻を1.とすると、遮断電流26はたとえば第2
図における電流波形201のようになる。ハンチングさ
れた部分がアーク発生期間に対応し、時刻1、以降は電
流源回路6からの電流供給はなくなり供試遮断器1の絶
縁が回復しはじめる。
Set the cutoff time to 1. Then, the breaking current 26 is, for example, the second
The current waveform becomes like the current waveform 201 in the figure. The hunted portion corresponds to the arc generation period, and from time 1 onward, the current supply from the current source circuit 6 ceases and the insulation of the test circuit breaker 1 begins to recover.

遮断電流26の零点tsの直前の時刻11においてへ始
動パルス発生器19より始動パルス信号20を発生させ
始動ギャップ9を放電させると、直列コンデンサ10に
充電されている電荷が直列抵抗器11と始動ギャップ9
との直列回路で構成される閉回路に流れ、遮断時刻t、
までに直列コンデンサ10に充電されている電荷が放電
して消滅するように直列抵抗器11の抵抗値をあらかじ
め選んでおくと、時刻t、で直列コンデンサの端子電圧
E、は第2図の電圧波形205のようにほぼ零となる。
When the starting pulse signal 20 is generated from the starting pulse generator 19 at time 11 immediately before the zero point ts of the breaking current 26 and the starting gap 9 is discharged, the electric charge stored in the series capacitor 10 is transferred to the series resistor 11 and the starting pulse signal 20 is discharged. gap 9
The current flows through a closed circuit consisting of a series circuit with
If the resistance value of the series resistor 11 is selected in advance so that the electric charge stored in the series capacitor 10 is discharged and disappears, the terminal voltage E of the series capacitor at time t becomes the voltage shown in Fig. 2. As shown by waveform 205, it becomes almost zero.

このとき、供試遮断器1は極間の絶縁が回復しつつあり
、始動ギャップ9を流れる電流は制限抵抗器13の抵抗
Rv、並列抵抗器14の抵抗R0を介して並列コンデン
サ15の静電容量C,(含む供試遮断器1の静電容量c
l のみとなり、電流が著しく減少するので、始動ギャ
ップ9の放電は停止し、その後は直列コンデンサ10お
よび直列抵抗器11を介して並列コンデンサ15の充電
が行われることになる。
At this time, the insulation between the poles of the test circuit breaker 1 is being restored, and the current flowing through the starting gap 9 passes through the resistance Rv of the limiting resistor 13 and the resistance R0 of the parallel resistor 14, and the electrostatic charge of the parallel capacitor 15 Capacity C, (including capacitance c of test circuit breaker 1
1 and the current decreases significantly, so that the starting gap 9 stops discharging and the parallel capacitor 15 is then charged via the series capacitor 10 and the series resistor 11.

供試遮断器1の極間絶縁が回復してくると、極間にかか
る電圧は回路時定数τ。で上昇し、絶縁回復特性を得る
ことができる。第2図の電圧波形203は供試遮断器1
の極間にかかる電圧E0の時間変化を示し、特性曲&1
1204が供試遮断器1の絶縁回復特性を示す、なお直
列コンデンサ10が電圧をあまり負担しないように、直
列コンデンサ10の静電容NC1は、供試遮断器1およ
び並列コンデンサ15の静電容量の和(CS+C,)よ
り充分に大きな値を選ぶ。
When the insulation between the poles of the test circuit breaker 1 is restored, the voltage applied between the poles is equal to the circuit time constant τ. It is possible to obtain dielectric recovery characteristics. The voltage waveform 203 in FIG.
It shows the time change of the voltage E0 applied between the poles, and the characteristic curve &1
1204 indicates the insulation recovery characteristics of the test circuit breaker 1. In order to prevent the series capacitor 10 from bearing too much voltage, the capacitance NC1 of the series capacitor 10 is equal to the capacitance of the test circuit breaker 1 and the parallel capacitor 15. Choose a value that is sufficiently larger than the sum (CS+C,).

電源コンデンサ8にEvの電圧が充電された場合、n@
絶縁破壊したのちの電源コンデンサ8の電圧をElとす
ると、次式の関係が成立する。
When the power supply capacitor 8 is charged with the voltage Ev, n@
If the voltage of the power supply capacitor 8 after dielectric breakdown is El, the following relationship holds true.

C。C.

Ev、l/Ev  −()″ −−−−−f7+Cv 
 + Cm  + C。
Ev, l/Ev −()″ −−−−−f7+Cv
+ Cm + C.

たとえば、Cv ”100 (Cs +Co )+n−
5とすると、(7)式は 01 となる、従来法の場合と同じように供試遮断器1に2倍
の電圧を印加するために、T1.Bコンデンサ8の充1
を電圧を2倍にすると、0.951 X 2−1.90
となり・(6)式における従来法の場合の発生電圧と同
シトする。しかし、この発明における電源コンデンサ8
の静電容ICVは、従来法のそれより2桁小さくてすむ
ので、コンデンサの容量としては、4/100 =1/
25となり従来法より小さくて済む。
For example, Cv"100 (Cs +Co)+n-
5, equation (7) becomes 01. In order to apply twice the voltage to the test circuit breaker 1 as in the case of the conventional method, T1. Charging of B capacitor 8 1
If we double the voltage, we get 0.951 x 2-1.90
The voltage generated in the conventional method in equation (6) is the same. However, the power supply capacitor 8 in this invention
Since the capacitance ICV of is two orders of magnitude smaller than that of the conventional method, the capacitance of the capacitor is 4/100 = 1/
25, which is smaller than the conventional method.

〔発明の効果〕〔Effect of the invention〕

この発明は前述のよ)に電圧源回路として始動ギャップ
に対して並列接続され1i:aコンデンサと制@抵抗器
との間に直列接続された直列抵抗器と直列コンデンサと
を備え、並列コンデンサが直列コンデンサを介して電源
コンデンサの充電電荷により直接充電されるように回路
を!a或した。
This invention comprises a series resistor and a series capacitor which are connected in parallel to the starting gap as a voltage source circuit (as described above) and which are connected in series between the 1i:a capacitor and the control resistor. Circuit so that it is directly charged by the charging charge of the power supply capacitor through the series capacitor! a.

その結果、従来法と11:、べて電導コンアンサの静t
′!¥量が100分の1.その電圧は2倍となるので、
容量としては25分の】となり、1[コンデンサが小型
かつ低価格となる効果が得られる。
As a result, the static t of the conventional method and 11.
′! The amount of ¥ is 1/100th. The voltage will be doubled, so
The capacitance is 25 minutes], and 1[the effect of making the capacitor smaller and lower in price can be obtained.

また、従来法で必要であった大型の整流器や共振りアク
ドルも共振回路を使わないので不要となり、簡素化され
た絶縁回復試験回路となるという効果も得られ、結果的
に開閉機器の絶縁回復試験回路の設備費が低減されると
いう効果が得られる。
In addition, the large rectifier and resonant axle that were required in the conventional method are no longer necessary because they do not use a resonant circuit, resulting in a simplified insulation recovery test circuit, resulting in the insulation recovery of switching equipment. The effect is that the equipment cost of the test circuit is reduced.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明の実施例を示す遮断器の絶縁回復試験
回路図、第2図は第1図の回路において発生する電圧、
it流等の経時変化を示す波形図、第3図は従来例を示
す遮断器の絶縁回復試験回路図、第4図は第3図の回路
において発生する電圧。 3:保護遮断器、4:直列リアクトル、5:電流1lI
l遮断器、6:電流源回路、7:直流電源、8:TsB
コンデンサ、9:始動ギャップ、IO=直列コンデンサ
、11:I[列抵抗器、12:電圧源回路、13:制限
抵抗器、14:並列抵抗器、15:並列コンデンサ、1
6:回復電圧波形調整回路、17:漂遊容器、18:接
地1.19:始動パルス発生器、20:始動パルス信号
、21:共振りアクドル、22:整流器、23:減衰抵
抗器、24:共振コンデンサ、25:直列名 ■ 図 窩 図
FIG. 1 is a circuit diagram for an insulation recovery test of a circuit breaker showing an embodiment of the present invention, and FIG. 2 shows the voltage generated in the circuit of FIG.
FIG. 3 is a waveform diagram showing changes over time in IT current, etc., FIG. 3 is an insulation recovery test circuit diagram of a circuit breaker showing a conventional example, and FIG. 4 is a voltage generated in the circuit of FIG. 3. 3: Protective circuit breaker, 4: Series reactor, 5: Current 1lI
l Breaker, 6: Current source circuit, 7: DC power supply, 8: TsB
capacitor, 9: starting gap, IO = series capacitor, 11: I [column resistor, 12: voltage source circuit, 13: limiting resistor, 14: parallel resistor, 15: parallel capacitor, 1
6: Recovery voltage waveform adjustment circuit, 17: Stray vessel, 18: Grounding 1.19: Starting pulse generator, 20: Starting pulse signal, 21: Resonant axle, 22: Rectifier, 23: Damping resistor, 24: Resonance Capacitor, 25: Series name ■ Diagram

Claims (1)

【特許請求の範囲】[Claims] 1)直列遮断器、リアクトルを介してアーク時間があら
かじめ定まる供試開閉機器に遮断電流を供給する電流源
回路と、直流電源により所定電圧に充電される電源コン
デンサおよびこれに直列接続され供試開閉機器がアーク
遮断する電流の零点直前に始動パルス信号により放電す
る始動ギャップを含む電圧源回路と、この電圧源回路と
供試開閉機器とを結ぶ制限抵抗器および供試開閉機器の
極間に並列接続された並列抵抗器および並列コンデンサ
の直列回路からなる回復電圧波形調整回路とからなり、
供試開閉機器の電流遮断後の絶縁回復電圧の経時変化を
試験する回路において、前記電圧源回路が、前記始動ギ
ャップに対して並列接続され前記電源コンデンサと前記
制限抵抗器との間に直列接続された直列抵抗器と直列コ
ンデンサとの直列回路を備えたことを特徴とする開閉機
器の絶縁回復試験回路。
1) A current source circuit that supplies a breaking current to the switching equipment under test whose arc time is predetermined via a series circuit breaker and reactor, a power supply capacitor that is charged to a predetermined voltage by a DC power source, and the switching equipment under test that is connected in series with this. A voltage source circuit that includes a starting gap that is discharged by a starting pulse signal just before the zero point of the current at which the equipment interrupts the arc, a limiting resistor that connects this voltage source circuit and the switching equipment under test, and a parallel circuit between the poles of the switching equipment under test. It consists of a recovery voltage waveform adjustment circuit consisting of a series circuit of connected parallel resistors and parallel capacitors,
In a circuit for testing changes over time in insulation recovery voltage after current interruption of a test switchgear, the voltage source circuit is connected in parallel to the starting gap and connected in series between the power supply capacitor and the limiting resistor. An insulation recovery test circuit for switching equipment characterized by comprising a series circuit of a series resistor and a series capacitor.
JP2034483A 1989-03-08 1990-02-15 Insulation recovery test circuit for switchgear Expired - Lifetime JP2787050B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2034483A JP2787050B2 (en) 1989-03-08 1990-02-15 Insulation recovery test circuit for switchgear

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP1-55957 1989-03-08
JP5595789 1989-03-08
JP2034483A JP2787050B2 (en) 1989-03-08 1990-02-15 Insulation recovery test circuit for switchgear

Publications (2)

Publication Number Publication Date
JPH0361877A true JPH0361877A (en) 1991-03-18
JP2787050B2 JP2787050B2 (en) 1998-08-13

Family

ID=26373302

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2034483A Expired - Lifetime JP2787050B2 (en) 1989-03-08 1990-02-15 Insulation recovery test circuit for switchgear

Country Status (1)

Country Link
JP (1) JP2787050B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110346712A (en) * 2019-07-15 2019-10-18 南方电网科学研究院有限责任公司 An Equivalent Dielectric Recovery Test Circuit
CN112382777A (en) * 2020-11-03 2021-02-19 盐城国投中科新能源科技有限公司 Method for improving insulating property of hydrogen fuel cell system

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110346712A (en) * 2019-07-15 2019-10-18 南方电网科学研究院有限责任公司 An Equivalent Dielectric Recovery Test Circuit
CN112382777A (en) * 2020-11-03 2021-02-19 盐城国投中科新能源科技有限公司 Method for improving insulating property of hydrogen fuel cell system
CN112382777B (en) * 2020-11-03 2023-12-29 盐城国投中科新能源科技有限公司 Method for improving insulation performance of hydrogen fuel cell system

Also Published As

Publication number Publication date
JP2787050B2 (en) 1998-08-13

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