JPH036204A - Method for forming plasma polymerization film - Google Patents

Method for forming plasma polymerization film

Info

Publication number
JPH036204A
JPH036204A JP13975189A JP13975189A JPH036204A JP H036204 A JPH036204 A JP H036204A JP 13975189 A JP13975189 A JP 13975189A JP 13975189 A JP13975189 A JP 13975189A JP H036204 A JPH036204 A JP H036204A
Authority
JP
Japan
Prior art keywords
plasma
gas
discharge
raw material
material gas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13975189A
Other languages
Japanese (ja)
Inventor
Yoshihito Suzuki
鈴木 悦人
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Furukawa Electric Co Ltd
Original Assignee
Furukawa Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Furukawa Electric Co Ltd filed Critical Furukawa Electric Co Ltd
Priority to JP13975189A priority Critical patent/JPH036204A/en
Publication of JPH036204A publication Critical patent/JPH036204A/en
Pending legal-status Critical Current

Links

Landscapes

  • Chemical Vapour Deposition (AREA)
  • Polymerisation Methods In General (AREA)

Abstract

PURPOSE:To obtain the subject film wherein the skeleton of a starting gas is kept intact by decomposing the starting gas with a plasma which has been transferred from the site of electric discharge to the site of starting gas decomposition and depositing the decomposition product on a base. CONSTITUTION:A vacuum chamber 1 is evacuated and a base heater 10 is energized by a heating power supply 17 to heat a base 2 placed on a support 8. While keeping this state, an electric discharge gas (a) is introduced into the chamber 1 from an electric discharge gas source 4 and an electric discharge voltage is applied to an electric discharge induction coil 6 from an RF power supply 3 to generate a plasma. The plasma is transferred from the site of electric discharge to the site of starting gas (b) decomposition in a period of time which is longer than the time taken for the afterglow of the plasma to disappear and mixed with the gas (b) supplied from a monomer source 5 to decompose the gas (b), and the decomposition product is deposited on the base 2 to give the subject film.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は原材料ガスの骨格が保持されたプラズマ重合膜
を作成する方法に関するものである。
DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a method for producing a plasma polymerized film in which the skeleton of a raw material gas is retained.

(技術技術) 従来のプラズマ重合膜の製膜方法は、第4図のように真
空チャンバーA内を真空にし、同チャンバーAにM!ガ
スTMBから放電ガスaを導入し、その後、RF電源り
から放電用誘導コイルE1.1:放電電圧を印加してプ
ラズマを発生させ、この真空チャンバーA内にモノマー
供給源Fから原材料ガスbを導入して、この原材料ガス
bと前記プラズマとをプラズマ放電場所から離れた場所
Gで混合して同原材料ガスを分解させ、その分解生成物
を真空チャンバーA内の支持台Hの上に設置され且つヒ
ーターIにより加熱されている基体J上に堆積させて開
基体J上にプラズマ重合膜を生成するようにしていた。
(Technical Technology) The conventional method for forming a plasma polymerized film is to evacuate the vacuum chamber A as shown in Fig. 4, and place M! A discharge gas a is introduced from the gas TMB, and then a discharge voltage is applied to the discharge induction coil E1.1 from the RF power source to generate plasma, and a raw material gas b is introduced into the vacuum chamber A from the monomer supply source F. The raw material gas b and the plasma are mixed at a location G away from the plasma discharge location to decompose the raw material gas, and the decomposition products are placed on a support H in the vacuum chamber A. Further, the plasma polymerized film was deposited on the substrate J heated by the heater I to form a plasma polymerized film on the open substrate J.

なおKはヒーター用電源、Lは真空排気系である。Note that K is a power supply for the heater, and L is a vacuum exhaust system.

(発明が解決しようとする課題) 従来のプラズマ重合膜の製膜方法では、原材料ガスをプ
ラズマで分解する際に、プラズマ内の電子のエネルギー
及びプラズマ内の励起種を制御する工夫が不十分である
か、或は全くなされていないため、プラズマによる原材
料ガスの分解制御用が不十分であり、原材料ガスの骨格
がプラズマで滋しく破壊され、得られたプラズマ重合膜
は原材料ガスの骨格が保持されていない、という聞届が
あった。
(Problems to be Solved by the Invention) In the conventional plasma polymerization film forming method, when raw material gas is decomposed by plasma, there is insufficient effort to control the energy of electrons in the plasma and the excited species in the plasma. As a result, the decomposition control of the raw material gas by plasma is insufficient, and the skeleton of the raw material gas is gently destroyed by the plasma, and the resulting plasma polymerized film retains the skeleton of the raw material gas. I was told that it had not been done.

原材料ガスの骨格が破壊されると、例えば、導電膜を作
る場合は、骨格が破壊されている箇所で導電性が途切れ
るので導電膜とならない。
If the skeleton of the raw material gas is destroyed, for example, when making a conductive film, the conductivity will be interrupted at the location where the skeleton is destroyed, so the film will not become conductive.

また5例えば、光素子に製膜するばあいは、骨格がM壊
されている箇所で光が敗乱し、光伝送効率が悪くなる。
For example, when forming a film on an optical device, light is disrupted at locations where the skeleton is broken, resulting in poor optical transmission efficiency.

このため、従来は、プラズマ重合による製膜方法は、原
材料ガスの骨格が破壊されない膜を作る方法としては適
しないとされていた。
For this reason, it has conventionally been thought that film forming methods using plasma polymerization are not suitable as a method for producing films in which the skeleton of the raw material gas is not destroyed.

(発明の目的) 本発明の目的は、プラズマ重合により、原材料ガスの骨
格が破壊されない膜を作ることができるようにしだ製膜
方法を提供することにある。
(Object of the Invention) An object of the present invention is to provide a method for forming a shiso film by plasma polymerization, which enables the production of a film in which the skeleton of the raw material gas is not destroyed.

(聞届点を解決するための手段) 本発明のプラズマ重合膜の製膜方法は、第1図の真空チ
ャンバー1内で放電プラズマを発生させ、該プラズマと
真空チャンバー1内に供給された原材料ガスとを放電場
所から離れた場所で混合して同原材料ガスを分解させ、
その分解生成物を前記真空チャンバー1内に設置された
基体2上に堆積させて同基体2上にプラズマ重合膜を生
成するプラズマ重合膜の製膜方法において、プラズマが
放電場所から原材料ガスの分解場所へ移動するのに要す
る時間を、放電プラズマの残光が消えるのに要する時間
よりも長くして、プラズマ放電場所から分解場所に移動
する間にプラズマ内に存在する原材料ガス分子の骨格を
著しく破壊する高エネルギー励起種及び高エネルギー電
子を緩和させ、このエネルギー緩和されたプラズマを原
材料ガスと混合させることにより、原材料ガス分子の骨
格が保持されプラズマ重合膜を製膜することを特徴とす
るものである。
(Means for solving the problem) The method for forming a plasma polymerized film of the present invention involves generating discharge plasma in the vacuum chamber 1 shown in FIG. The raw material gas is decomposed by mixing it with gas at a location away from the discharge location,
In a method for forming a plasma polymerized film in which the decomposition products are deposited on a substrate 2 installed in the vacuum chamber 1 to generate a plasma polymerized film on the substrate 2, plasma decomposes raw material gas from a discharge location. The time required for the discharge plasma to travel from the discharge location to the decomposition location is made longer than the time required for the afterglow of the discharge plasma to dissipate, thereby significantly destroying the skeleton of raw gas molecules present in the plasma while traveling from the plasma discharge location to the decomposition location. A method characterized by relaxing high-energy excited species and high-energy electrons to be destroyed and mixing this energy-relaxed plasma with raw material gas to form a plasma-polymerized film in which the skeleton of raw material gas molecules is maintained. It is.

第1図は本発明のプラズマ重合膜の製膜方法に使用され
る製膜装置の一例である。
FIG. 1 shows an example of a film forming apparatus used in the plasma polymerized film forming method of the present invention.

同図においてlは真空チャンバー、2は基体。In the figure, l is a vacuum chamber and 2 is a substrate.

3はRF電源、4は放電ガス源、5はモノマー供給源、
6は放電用誘導コイル、7は真空排気系。
3 is an RF power source, 4 is a discharge gas source, 5 is a monomer supply source,
6 is an induction coil for discharge, and 7 is a vacuum exhaust system.

8は基体支持台、9はRF電場遮繭板、lOは基体加熱
用ヒーター、llはガス流量計、12は圧力計、13は
容量式真空計、14は放電ガス導入管、15は放電ガス
導入管の支持部、16はリーク止めの0リング、17は
ヒーター用電源である。
8 is a substrate support stand, 9 is an RF electric field shielding plate, 10 is a heater for heating the substrate, 11 is a gas flow meter, 12 is a pressure gauge, 13 is a capacitive vacuum gauge, 14 is a discharge gas introduction tube, 15 is a discharge gas A support part for the introduction pipe, 16 is an O-ring for preventing leakage, and 17 is a heater power source.

前記RF電場遮蔽板9はRF電場が基体2の付近遺漏れ
て基体2付近でグロー放電等が起こり、基体2付近で原
材料ガス分子の骨格を破壊する高エネルギー励起種及び
高エネルギー電子が新たに生成することを防ぐためのも
のである。
The RF electric field shielding plate 9 prevents the RF electric field from leaking near the substrate 2, causing glow discharge, etc. near the substrate 2, and generating new high-energy excited species and high-energy electrons that destroy the skeleton of raw material gas molecules near the substrate 2. This is to prevent it from being generated.

支持部15で放電ガス導入管14の高さを調整して、a
電場所と原材料ガス供給位置の分解場所との距離を調節
できるようにしである。
Adjust the height of the discharge gas introduction tube 14 with the support part 15, and
The distance between the electric power station and the decomposition site at the raw material gas supply position can be adjusted.

第1図の製膜装置により重合膜を製膜するには、基体2
を真空チャンバー1内の基体支持台8の上に設置し、同
チャンバー1内を真空に引き、ヒーター用電源17から
基体加熱用ヒーター10に電源を供給して基体2を加熱
する。基体2の温度は通常室温から400℃の間にする
のが望ましいや この状態で放電ガス源4から真空チャンバー1内に放電
ガスaを導入し、真空チャンバー1の内圧が0.1to
rr以下になるようにガス流量を調節する。放電ガスa
にはArなどの希ガス、水素、窒素等のそれ自体では膜
を形成出来ない不活性ガスを用いる。
In order to form a polymer film using the film forming apparatus shown in FIG.
is placed on the substrate support stand 8 in the vacuum chamber 1, the chamber 1 is evacuated, and power is supplied from the heater power source 17 to the substrate heating heater 10 to heat the substrate 2. It is desirable that the temperature of the substrate 2 is normally between room temperature and 400°C. In this state, discharge gas a is introduced into the vacuum chamber 1 from the discharge gas source 4, and the internal pressure of the vacuum chamber 1 is set to 0.1 to
Adjust the gas flow rate so that it is below rr. discharge gas a
For this purpose, a rare gas such as Ar, or an inert gas such as hydrogen or nitrogen which cannot form a film by itself is used.

放電ガス導入後、前記RF電源3かも放電用誘導コイル
6に放電電圧を印加してプラズマを発生させる。第1図
の製膜装置では誘導型RF放電によりプラズマを発生さ
せているが、プラズマ発生方法はこれに限定されるもの
ではなく1例えば平行平板型RF放電でもよく、またD
Cからマイクロ波までのどの周波数で放電させてもよい
After introducing the discharge gas, the RF power source 3 applies a discharge voltage to the discharge induction coil 6 to generate plasma. In the film forming apparatus shown in FIG. 1, plasma is generated by an induced RF discharge, but the plasma generation method is not limited to this; for example, a parallel plate type RF discharge may be used.
The discharge may be performed at any frequency from C to microwave.

このとき、真空チャンバー1内には7a電ガスaとは別
の原材料ガスbをモノマー供給源5から導入する。原材
料ガスbは有機物、無機物のいずれでもよい。
At this time, a raw material gas b different from the electric gas a 7a is introduced into the vacuum chamber 1 from the monomer supply source 5. The raw material gas b may be either organic or inorganic.

そして本発明ではプラズマがプラズマ放電場所から分解
場所に移動する間に、プラズマ内に仔在する原材料ガス
分子の骨格をii!壊する高エネルギー励起種及び高エ
ネルギー電子を緩和させる。プラズマ内で高エネルギー
励起種及び高エネルギー電子が緩和されるのに要する時
間は、放電プラズマの残光が消えるのに要する時間りで
評価出来るので、プラズマが放電場所から原材料ガスの
分解場所へ移動するのに要する時間を、/ffl電プラ
ズマの残光が消えるのに要する時間よりも長くする。
In the present invention, while the plasma moves from the plasma discharge location to the decomposition location, the skeleton of the raw material gas molecules present in the plasma is destroyed. It relaxes high-energy excited species and high-energy electrons that break down. The time required for high-energy excited species and high-energy electrons to relax in the plasma can be evaluated by the time required for the afterglow of the discharge plasma to disappear, so the plasma moves from the discharge location to the decomposition location of the raw material gas. The time required for this to occur is longer than the time required for the afterglow of the /ffl electric plasma to disappear.

そのため本発明ではプラズマ放電場所と原材料ガスの分
解場所との距離りを、放電プラズマが放電場所から原材
料ガスの分解場所迄移動するのに要する時間がてよりも
長くなるように調節する。
Therefore, in the present invention, the distance between the plasma discharge location and the raw material gas decomposition location is adjusted so that the time required for the discharge plasma to travel from the discharge location to the raw material gas decomposition location is longer than the distance.

このときLの取り得る値は、内圧100mt。At this time, the possible value of L is the internal pressure of 100 mt.

rr以下の圧力範囲では次式で与えられる。In the pressure range below rr, it is given by the following equation.

L 、。+ = 1f760 + Pot F) / 
f60・P・sl X v <LF 放電ガス流量(S
CCM) I〕、真空チャンバーの内圧(torr)S:放電ガス
導入管の断面積(cm”)て、放電プラズマの残光が消
えるのに要する時間(sec) Po:放電ガス供給源のガス内圧(torr)距mLの
値はL infの値より大きくなければならないが、極
端に大きく取るとプラズマが拡散したり、エネルギーが
極端に低くなったりして、プラズマ重合の効率が著しく
低下するので、距離りは大きくてもL infの100
倍以下であることが望ましい。
L. + = 1f760 + Pot F) /
f60・P・sl X v <LF Discharge gas flow rate (S
CCM) I], the internal pressure of the vacuum chamber (torr) S: the cross-sectional area of the discharge gas introduction tube (cm"), the time required for the afterglow of the discharge plasma to disappear (sec) Po: the gas internal pressure of the discharge gas supply source The value of the (torr) distance mL must be larger than the value of L inf, but if it is too large, the plasma will diffuse or the energy will become extremely low, which will significantly reduce the efficiency of plasma polymerization. Even if the distance is large, L inf is 100
It is desirable that it be less than twice that.

(作用) 本発明のプラズマ重合膜の製膜方法は、プラズマが放電
場所から原材料ガスの分解場所へ移動するのに要する時
間を、放電プラズマの残光が消えるのに要する時間より
も長くしたので、プラズマがその放電場所から分解場所
に移動する時間が長くなり、その間にプラズマ内に存在
する原材料ガス分子の骨格を破壊する高エネルギー励起
種及び高エネルギー電子が除去或は消滅して緩和される
。このためそれらの励起種及び高エネルギー電子による
原材料ガス分子の骨格破壊が抑えられ。
(Function) The plasma polymerized film forming method of the present invention makes the time required for the plasma to move from the discharge location to the decomposition location of the raw material gas longer than the time required for the afterglow of the discharge plasma to disappear. , the time it takes for the plasma to move from its discharge location to its decomposition location is increased, and during that time, high-energy excited species and high-energy electrons that destroy the skeleton of raw gas molecules present in the plasma are removed or annihilated and relaxed. . For this reason, the destruction of the skeleton of raw material gas molecules by these excited species and high-energy electrons is suppressed.

原材料ガスの骨格が保持されたプラズマ重合膜が生成さ
れる。
A plasma polymerized film is produced that retains the skeleton of the raw material gas.

(実施例1) 第1図のプラズマ重合膜の製膜装置により、原料ガスに
トルエンを用い、放電ガスaにアルゴンを用い、放電ガ
ス流量11005CC,放電ガス分圧20m t o 
r r、真空チャンバー1の内圧21mtorr、 r
ll電ガス導入管14の断面積0.2cm2.放電ガス
供給源1!のガス圧力1140torrでプラズマ重合
膜を製膜した。
(Example 1) Using the plasma polymerized film forming apparatus shown in FIG. 1, toluene was used as the raw material gas, argon was used as the discharge gas a, the discharge gas flow rate was 11005 cc, and the discharge gas partial pressure was 20 m t o.
r r, internal pressure of vacuum chamber 1 21 mtorr, r
ll The cross-sectional area of the electric gas introduction pipe 14 is 0.2 cm2. Discharge gas supply source 1! A plasma polymerized film was formed at a gas pressure of 1140 torr.

この条件において放電プラズマの残光が消えるのに要す
る時間は5usec、Lint’の値は2.4cmであ
る。距離りを5cmにとって製膜を行なった。製膜時間
は60分、基体2の温度は150℃である。基体2には
スライドガラス表面に金を蒸着したものを用いた。
Under these conditions, the time required for the afterglow of the discharge plasma to disappear is 5 usec, and the value of Lint' is 2.4 cm. Film formation was performed with a distance of 5 cm. The film forming time was 60 minutes, and the temperature of the substrate 2 was 150°C. The substrate 2 used was a glass slide with gold vapor-deposited on its surface.

この実施例で得られた重合膜の赤外吸収スペクトルを測
定したところ第2図のスペクトルが得られた。このスペ
クトルはポリスチレンのものとよく一致している。この
ことがらトルエンのメチル基が部分的かつ選択的に分割
され重合していること、及びそれによってトルエンの骨
格がプラズマ重合膜中でも保持されていることがわかる
When the infrared absorption spectrum of the polymer film obtained in this example was measured, the spectrum shown in FIG. 2 was obtained. This spectrum is in good agreement with that of polystyrene. This shows that the methyl groups of toluene are partially and selectively split and polymerized, and that the toluene skeleton is thereby retained even in the plasma polymerized film.

(比較例1) 実施例Iとの比較のため、距m+−を1cmにして実験
を行なった。それ以外の条件は実施例1と同じにした。
(Comparative Example 1) For comparison with Example I, an experiment was conducted with the distance m+- being 1 cm. Other conditions were the same as in Example 1.

この比較例1により得られた重合膜の赤外吸収スペクト
ルを測定したところ第3図のスペクトルが得られた。こ
のスペクトルはポリスチレンのものと大きく異なり、原
材料ガスの骨格がプラズマ重合膜中では保持されていな
いことがわかる。
When the infrared absorption spectrum of the polymer film obtained in Comparative Example 1 was measured, the spectrum shown in FIG. 3 was obtained. This spectrum is significantly different from that of polystyrene, indicating that the skeleton of the raw material gas is not retained in the plasma polymerized film.

(比較例2) 実施例1との比較のため、距fiLを20cmにして実
験を行なった。それ以外の条件は実施例1のときと同じ
である。この比較例2により得られた重合膜の赤外吸収
スペクトルを測定した。そのスペクトルはポリスチレン
のものと似ているが途中でプラズマが分散したためスペ
クトル強度が弱くなっていることがわかる。
(Comparative Example 2) For comparison with Example 1, an experiment was conducted with the distance fiL set to 20 cm. Other conditions are the same as in Example 1. The infrared absorption spectrum of the polymer film obtained in Comparative Example 2 was measured. The spectrum is similar to that of polystyrene, but it can be seen that the spectral intensity has weakened due to the plasma dispersion along the way.

(実施例2) 実施例1でL infの値を変えるため、放電ガス流量
の値を次のように変えて実験を行なった。
(Example 2) In order to change the value of L inf in Example 1, an experiment was conducted by changing the value of the discharge gas flow rate as follows.

放電ガス流ffi: 200SCCM、放電ガス分圧1
0mtorr、真空チャンバー1の内圧=21mtor
r、H電ガス導入管の断面積 10m2 この条件において放電プラズマの残光が消えるのに要す
る時間は5μsec 、 Linfの値は01cmであ
る。距離りを5cmにとり製膜を行なった。この実施例
により得られた膜の赤外吸収スペクトルは実施例1で得
られた膿のものと一致しており、原材料ガスの骨格がプ
ラズマ重合膜中でも保持されていることがわかる。
Discharge gas flow ffi: 200SCCM, discharge gas partial pressure 1
0 mtorr, internal pressure of vacuum chamber 1 = 21 mtorr
The cross-sectional area of the r, H electric gas introduction tube is 10 m2. Under these conditions, the time required for the afterglow of the discharge plasma to disappear is 5 μsec, and the value of Linf is 0.1 cm. Film formation was performed with a distance of 5 cm. The infrared absorption spectrum of the film obtained in this example is consistent with that of pus obtained in Example 1, indicating that the skeleton of the raw material gas is retained even in the plasma polymerized film.

(比較例3) 実施例2で距離りを15cmに変えて製膜を行なった。(Comparative example 3) Film formation was carried out in Example 2 except that the distance was changed to 15 cm.

この場合は基体2上にプラズマ重合膜が得られなかった
In this case, no plasma polymerized film was obtained on the substrate 2.

(実施例3) 実施例1で原材料ガスにアニリンを用いてプラズマ重合
膜を製膜した。これにより得られた重合膜の赤外吸収ス
ペクトルを一11定した結果、膜の中にアニリン骨格の
部分が多く存在し、原材料ガスの骨格がプラズマ重合膜
中でも保持されていることがわかった。
(Example 3) In Example 1, a plasma polymerized film was formed using aniline as the raw material gas. As a result of constant infrared absorption spectra of the polymerized film thus obtained, it was found that there was a large amount of aniline skeleton in the film, and that the skeleton of the raw material gas was retained in the plasma polymerized film.

(実施例4) 実施例1で原材料ガスにPNA (パラニトロアニリン
)を用いてプラズマ1合膜を製膜した。これにより得ら
れた重合膜の赤外吸収スペクトルを測定した結果、膜の
中にPNA骨格の部分が多く存在し、原材料ガスの骨格
がプラズマ重合膜中でも]采持されていることがわかっ
た。
(Example 4) In Example 1, a plasma 1 composite film was formed using PNA (paranitroaniline) as the raw material gas. As a result of measuring the infrared absorption spectrum of the polymerized film thus obtained, it was found that a large amount of PNA skeleton was present in the film, and that the skeleton of the raw material gas was retained even in the plasma polymerized film.

(実施例5) 実施例1で原材料ガスにエチルアミンを用いてプラズマ
重合膜を製膜した。これにより得られた重合膜の赤外吸
収スペクトルを測定した結果、膜にはC−H,C−N、
N−H結合は多く存在するが、C=C,C=N、C=N
結合はほとんど存在せず、エチルアミンのプラズマによ
る破壊が非常に少ないことがわかった。
(Example 5) In Example 1, a plasma polymerized film was formed using ethylamine as the raw material gas. As a result of measuring the infrared absorption spectrum of the polymer film thus obtained, it was found that the film contained C-H, C-N,
There are many N-H bonds, but C=C, C=N, C=N
It was found that there were almost no bonds and that the destruction of ethylamine by the plasma was very low.

(実施例6) 実施例1で原材料ガスにヘキサメチルジシロキサン、S
 i  (CH313−0=S i  ((j1313
を用いてプラズマ重合膜を製膜した。これにより得られ
た重合膜の赤外吸収スペクトルを測定した結果、膜には
5i−0−5i、5i−C,5i−CF13結合が多く
存在することがわかり、プラズマによるヘキサメチルジ
シロキサンの破壊が非常に少ないことがわかった。
(Example 6) In Example 1, hexamethyldisiloxane, S
i (CH313-0=S i ((j1313
A plasma polymerized film was formed using the following method. As a result of measuring the infrared absorption spectrum of the resulting polymer film, it was found that there were many 5i-0-5i, 5i-C, and 5i-CF13 bonds in the film, and the destruction of hexamethyldisiloxane by plasma It was found that there were very few.

(発明の効果) 本発明のプラズマ重合膜の製膜方法によれば次のような
効果がある。
(Effects of the Invention) The method for forming a plasma polymerized film of the present invention has the following effects.

■、これまでのプラズマ重合では困難とされていた。原
材料ガスの骨格が保持された重合膜を作ることができる
(2) This has been considered difficult with conventional plasma polymerization. It is possible to create a polymer film that retains the skeleton of the raw material gas.

■、原材料ガスの骨格が破壊されないので、例えば導電
性の良い導電膜とか、伝送効率のよい光素子用膜等を作
ることができる。
(2) Since the skeleton of the raw material gas is not destroyed, it is possible to produce, for example, conductive films with good conductivity or films for optical devices with good transmission efficiency.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明のプラズマ重合膜の製膜方法に使用され
る製膜装置の一例を示す説明図、第2図は実施例1によ
り得られた重合膜の赤外吸収スペクトル図、第3図は比
較例1で得られたプラズマ重合膜の赤外吸収スペクトル
図、第4図は従来のプラズマ1合膜の製膜方法に使用さ
れる製膜装置の説明図である。 1は真空チャンバー 2は基体
FIG. 1 is an explanatory diagram showing an example of a film forming apparatus used in the plasma polymerized film forming method of the present invention, FIG. 2 is an infrared absorption spectrum diagram of the polymerized film obtained in Example 1, and FIG. The figure is an infrared absorption spectrum diagram of the plasma polymerized film obtained in Comparative Example 1, and FIG. 4 is an explanatory diagram of a film forming apparatus used in the conventional method for forming a plasma polymerized film. 1 is a vacuum chamber 2 is a base

Claims (1)

【特許請求の範囲】[Claims]  真空チャンバー1内で放電プラズマを発生させ、該プ
ラズマと真空チャンバー1内に供給された原材料ガスと
を放電場所から離れた場所で混合して同原材料ガスを分
解させ、その分解生成物を前記真空チャンバー1内に設
置された基体2上に堆積させて同基体2上にプラズマ重
合膜を生成するプラズマ重合膜の製膜方法において、プ
ラズマが放電場所から原材料ガスの分解場所へ移動する
のに要する時間を、放電プラズマの残光が消えるのに要
する時間よりも長くして、プラズマ放電場所から分解場
所に移動する間にプラズマ内に存在する原材料ガス分子
の骨格を破壊する高エネルギー励起種及び高エネルギー
電子を緩和させ、このエネルギー緩和されたプラズマを
原材料ガスと混合させることを特徴とするプラズマ重合
膜の製膜方法。
A discharge plasma is generated in the vacuum chamber 1, and the plasma and the raw material gas supplied into the vacuum chamber 1 are mixed at a place away from the discharge location to decompose the raw material gas, and the decomposition products are removed from the vacuum chamber 1. In a method for forming a plasma polymerized film in which the plasma polymerized film is deposited on a substrate 2 installed in a chamber 1 to generate a plasma polymerized film on the substrate 2, the time required for the plasma to move from the discharge location to the decomposition location of the raw material gas is The time is longer than the time required for the afterglow of the discharge plasma to dissipate, and the high energy excited species and high A method for forming a plasma polymerized film, characterized by relaxing energetic electrons and mixing this energy-relaxed plasma with a raw material gas.
JP13975189A 1989-06-01 1989-06-01 Method for forming plasma polymerization film Pending JPH036204A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13975189A JPH036204A (en) 1989-06-01 1989-06-01 Method for forming plasma polymerization film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13975189A JPH036204A (en) 1989-06-01 1989-06-01 Method for forming plasma polymerization film

Publications (1)

Publication Number Publication Date
JPH036204A true JPH036204A (en) 1991-01-11

Family

ID=15252543

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13975189A Pending JPH036204A (en) 1989-06-01 1989-06-01 Method for forming plasma polymerization film

Country Status (1)

Country Link
JP (1) JPH036204A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0985741A1 (en) * 1998-09-07 2000-03-15 The Procter & Gamble Company Modulated plasma glow discharge treatments for making super hydrophobic substrates
US6649222B1 (en) 1998-09-07 2003-11-18 The Procter & Gamble Company Modulated plasma glow discharge treatments for making superhydrophobic substrates
KR100715070B1 (en) * 1999-04-22 2007-05-07 어플라이드 머티어리얼스, 인코포레이티드 A novel rf plasma source for material processing

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0985741A1 (en) * 1998-09-07 2000-03-15 The Procter & Gamble Company Modulated plasma glow discharge treatments for making super hydrophobic substrates
WO2000014297A1 (en) * 1998-09-07 2000-03-16 The Procter & Gamble Company Modulated plasma glow discharge treatments for making superhydrophobic substrates
US6649222B1 (en) 1998-09-07 2003-11-18 The Procter & Gamble Company Modulated plasma glow discharge treatments for making superhydrophobic substrates
KR100715070B1 (en) * 1999-04-22 2007-05-07 어플라이드 머티어리얼스, 인코포레이티드 A novel rf plasma source for material processing

Similar Documents

Publication Publication Date Title
US4491496A (en) Enclosure for the treatment, and particularly for the etching of substrates by the reactive plasma method
US5185132A (en) Atomspheric plasma reaction method and apparatus therefor
JP4116454B2 (en) Apparatus for plasma treatment of dielectric objects
JPS61502403A (en) Method for forming diamond-like carbon film
JPH0471575B2 (en)
JPH036204A (en) Method for forming plasma polymerization film
JPH0685391B2 (en) Deposited film formation method
JPS60117712A (en) Forming method of thin film
JPH036203A (en) Method for forming plasma polymerization film
JPS61238962A (en) Method and apparatus for forming film
JP2608456B2 (en) Thin film forming equipment
JPS62177168A (en) Production of thin carbon film
JPS63109162A (en) Ion plating method and its device
JPS58161764A (en) Vacuum deposition process of boron
JPH0448757B2 (en)
JPH02248038A (en) Manufacture of polycrystalline semiconductor substance layer
JPH01203297A (en) Diamond synthesis method using combustion flame
JPS61163280A (en) Plasma reactor
JPS6177697A (en) Process and apparatus for synthesizing diamond in vapor phase
SU901352A1 (en) Coating device
JPS6312377B2 (en)
JPH0361372A (en) Thin film forming device
RU2000851C1 (en) Device for depositing poly-p-xylylene coatings
JPH02213481A (en) Thin film forming device
JPH0361371A (en) Thin film forming device