JPH0363082B2 - - Google Patents

Info

Publication number
JPH0363082B2
JPH0363082B2 JP58216191A JP21619183A JPH0363082B2 JP H0363082 B2 JPH0363082 B2 JP H0363082B2 JP 58216191 A JP58216191 A JP 58216191A JP 21619183 A JP21619183 A JP 21619183A JP H0363082 B2 JPH0363082 B2 JP H0363082B2
Authority
JP
Japan
Prior art keywords
component
failure
time
propagation
range
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58216191A
Other languages
Japanese (ja)
Other versions
JPS59108115A (en
Inventor
Masazumi Furukawa
Mikihiko Oonari
Makoto Shiotani
Takashi Onodera
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP58216191A priority Critical patent/JPS59108115A/en
Publication of JPS59108115A publication Critical patent/JPS59108115A/en
Publication of JPH0363082B2 publication Critical patent/JPH0363082B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • G05B23/0205Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/0227Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions
    • G05B23/0235Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions based on a comparison with predetermined threshold or range, e.g. "classical methods", carried out during normal operation; threshold adaptation or choice; when or how to compare with the threshold
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • G05B23/0205Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0267Fault communication, e.g. human machine interface [HMI]
    • G05B23/0272Presentation of monitored results, e.g. selection of status reports to be displayed; Filtering information to the user

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • Human Computer Interaction (AREA)
  • Testing And Monitoring For Control Systems (AREA)
  • Alarm Systems (AREA)

Description

【発明の詳細な説明】 本発明は、プラント内の構成機器の1つに故障
が発生した場合、その故障が、一定時間後、プラ
ントのどの範囲の機器まで波及するかを予測し、
プラントの構成機器の結合関係を示すネツトワー
ク上に、予測された波及の状態を表示するプラン
トの故障波及範囲予測・表示装置に関する。この
装置は、原子力プラント、上下水道システム、化
学プラントなどの故障波及範囲の予測と表示に利
用できる。
DETAILED DESCRIPTION OF THE INVENTION When a failure occurs in one of the component equipment in a plant, the present invention predicts to which range of equipment in the plant the failure will spread after a certain period of time,
The present invention relates to a plant failure influence range prediction/display device that displays the predicted influence state on a network showing the coupling relationship of plant component equipment. This device can be used to predict and display the scope of failures in nuclear power plants, water and sewage systems, chemical plants, etc.

従来、故障波及範囲の予測を行うには、(a)
Fault Tree Analysis(FTAを略す)やEvent
Tree Analysis(ETAと略す)など、故障の因果
関係を樹木図上で認識する方法、(b)設計図を利用
するマニユアルシミユレーシヨン法、(c)実装置ま
たは模型装置を用いるハードウエアシミユレーシ
ヨン法が主として用いられてきた。
Conventionally, in order to predict the failure spread range, (a)
Fault Tree Analysis (abbreviated as FTA) and Event
Methods such as Tree Analysis (abbreviated as ETA) that recognize the cause-and-effect relationships of failures on tree diagrams, (b) manual simulation methods that use blueprints, and (c) hardware staining methods that use actual equipment or model equipment. Uration method has been mainly used.

しかし、前記(a)の認識方法は、故障の因果関係
を樹木図上で定性的に捉えることに主眼があり、
故障の波及範囲とその時間的変化を定量的に捉え
にくい。また、前記(b)のマニユアルシミユレーシ
ヨン法は、人手により設計図上を追うことによつ
て、t時間後の故障波及範囲を予測する手法であ
り、対象とするプラントが大きくなると、故障波
及経路が複雑になり、故障波及範囲を完全に知る
ことが難しくなる。前記(c)のハードウエアシミユ
レーシヨン法では、1/20縮小スケールの実装置や
模型装置を用いるため、装置製作が困難であるば
かりでなく、シミユレーシヨンを実際に行なう
際、危険も伴う。
However, the recognition method (a) above focuses on qualitatively capturing the cause-and-effect relationship of failures on a tree diagram.
It is difficult to quantitatively understand the scope of failure and its changes over time. In addition, the manual simulation method (b) above is a method that predicts the range of failure spread after t hours by manually following the design drawings. The propagation path becomes complex, making it difficult to completely know the extent of the failure's propagation. The hardware simulation method (c) uses an actual device or model device with a scale reduced to 1/20, which not only makes it difficult to manufacture the device, but also involves danger when actually performing the simulation.

故障波及範囲の表示手段として、前記(a)は樹木
図で表示するため、同一機器が複数個所に現わ
れ、故障波及範囲をシステム構成機器の結合関係
から捉えにくい。前記(b)、(c)は故障の波及関係を
経時変化を含めて、あらかじめすべて記憶装置に
記憶しなければならず、その波及関係を求める作
業時間および、その記憶容量が膨大となる欠点が
ある。
As a means of displaying the failure influence range, (a) above displays a tree diagram, so the same device appears in multiple locations, making it difficult to understand the failure influence range from the coupling relationships of system component devices. In (b) and (c) above, all the propagation relationships of failures, including changes over time, must be stored in the storage device in advance, which has the drawback of requiring a huge amount of time and storage capacity to determine the propagation relationships. be.

本発明は、上記従来技術の欠点を解決するため
になされたものであり、故障波及範囲を簡便に予
測でき、故障波及予測範囲を視覚的にとらえやす
くするためにネツトワーク上に表示する装置を提
供するものである。
The present invention has been made in order to solve the above-mentioned drawbacks of the prior art, and provides a device that can easily predict the failure influence range and display it on the network in order to make it easier to visually understand the failure influence prediction range. This is what we provide.

以下、本発明を実施例により詳細に説明する。 Hereinafter, the present invention will be explained in detail with reference to Examples.

第1図において、複数個の構成機器からなるプ
ラント101の各構成機器にそれぞれ検出器10
2が設けられている。これらの検出器102は各
構成機器の動作状態、たとえば、流量、温度、周
波数などを検出し、検出信号106を故障診断装
置103に出力する。故障診断装置103には、
あらかじめ、各構成機器が正常状態であるときの
各構成機器から得られる検出信号(以下、正常信
号と称す)が記憶されており、この正常信号と検
出信号106を比較し、その差が所定値以上であ
る機器、すなわち、故障機器を検出し、その故障
機器番号信号107を故障波及予測・表示制御装
置140に出力する。装置140には、現時刻か
ら予測すべき時刻までの時間を表わす指定時間信
号109が入力装置110によつて入力される。
装置140は、後で詳述するように、故障機器番
号信号107にもとづき、指定時間信号109で
指定される時間内に、状態が波及する範囲を予測
し、プラント構成機器の結合関係を示すネツトワ
ークとともに、予測した波及範囲を、表示装置1
05で表示する。
In FIG. 1, a detector 10 is attached to each component of a plant 101 consisting of a plurality of components.
2 is provided. These detectors 102 detect the operating state of each component, such as flow rate, temperature, frequency, etc., and output a detection signal 106 to the failure diagnosis device 103. The failure diagnosis device 103 includes:
A detection signal obtained from each component device when each component device is in a normal state (hereinafter referred to as a normal signal) is stored in advance, and this normal signal and the detection signal 106 are compared and the difference is determined as a predetermined value. The above equipment, that is, the faulty equipment is detected, and the faulty equipment number signal 107 is output to the fault spread prediction/display control device 140. A specified time signal 109 representing the time from the current time to the predicted time is input to the device 140 by the input device 110 .
As will be described in detail later, the device 140 predicts the range in which the condition will spread within the time specified by the specified time signal 109 based on the failed equipment number signal 107, and creates a network indicating the coupling relationship of the plant component equipment. Display device 1 displays the predicted spread range along with the workpiece.
Display as 05.

第2図は、故障波及予測・表示制御装置のブロ
ツク図である。メモリ143には、あらかじめ、
プラントの構成機器eiとejとの直接故障波及の有
無に対応させた故障波関連行列Aが記憶されてい
る。この行列Aは、第3図の遷移表201に示すよ
うな行列であり、行列Aのi行j列の要素aijは、
機器eiからejへの直接故障波及時間であり、実際
のシミユレーシヨン結果にもとづいて定められた
値である。たとえば、a1oは100であり、機器e1
ら機器eoへの故障波及時間は100secであることを
示す。なお、aij=0の場合は、機器eiから機器ej
へ故障波及がないことを示す。
FIG. 2 is a block diagram of a failure spread prediction/display control device. In the memory 143, in advance,
A fault wave related matrix A is stored that corresponds to the presence or absence of direct fault propagation between component devices e i and e j of the plant. This matrix A is a matrix as shown in the transition table 201 in FIG. 3, and the element a ij in the i row and j column of the matrix A is
This is the direct failure propagation time from equipment e i to e j , and is a value determined based on actual simulation results. For example, a 1o is 100, indicating that the failure propagation time from device e 1 to device e o is 100 seconds. Note that if a ij = 0, the device e i to device e j
This indicates that the failure does not spread to other areas.

遷移行列演算装置145は、メモリ143から
遷移表201を読み出し、他の機器へ故障の波及も
起さないし、他の機器からも故障の波及がおよば
ない機器を除き、直接波及、間接波及を含めた機
器間の故障波及時間を表わす遷移表206を演算し
て求め、メモリ144に出力する。この演算は次
のようにして行なう。遷移表201の行列Aの要素
aij≠0の値をすべて、1に変換して、遷移表202
の行列Bは(要素はbij)を算出する(遷移表202
は表示制御装置146に出力される。)。たとえ
ば、行列Aのa1oは100であるが、これを1に変換
し、行列Bのb1oを1とする。さらに、行列Bに
単位行列を加え、表203に示す遷移行列Cを算出
する。この行列CをCm=Cm+1となるまで(m+
1)乗算し、遷移表204に示す遷移行列Dを算出
する。行列Dの要素dijのうち、i行i列の要素
が、diiを除いてすべて0であるiを求める。たと
えば、遷移表204では、10行10列の要素がこれに
相当する。したがつて、遷移表201から、10行10
列を除いて、縮小した遷移表205に示す遷移行列
F(要素fpq)を求める。
The transition matrix arithmetic unit 145 reads the transition table 201 from the memory 143 and reads out the transition table 201 from the memory 143, excluding devices that do not cause a failure to spread to other devices and to which other devices do not have a failure, including direct and indirect spillovers. A transition table 206 representing the failure propagation time between devices is calculated and outputted to the memory 144. This calculation is performed as follows. Elements of matrix A of transition table 201
Convert all values of a ij ≠ 0 to 1 and create the transition table 202
The matrix B of (element is b ij ) is calculated (transition table 202
is output to the display control device 146. ). For example, a 1o of matrix A is 100, but this is converted to 1, and b 1o of matrix B is set to 1. Furthermore, an identity matrix is added to matrix B to calculate transition matrix C shown in Table 203. This matrix C is changed until C m =C m+1 (m+
1) Multiply to calculate the transition matrix D shown in the transition table 204. Among the elements d ij of the matrix D, i is determined in which the elements in the i-th row and the i-column are all 0 except for d ii . For example, in the transition table 204, this corresponds to elements in 10 rows and 10 columns. Therefore, from transition table 201, 10 rows 10
After removing the column, a transition matrix F (element f pq ) shown in the reduced transition table 205 is obtained.

次に、遷移表205に示す遷移行列F(要素fpq
より、遷移表206に示す遷移行列G(要素gpq)を
求める。このために、次の(1)〜(4)式の演算を行な
う。
Next, transition matrix F (element f pq ) shown in transition table 205
From this, the transition matrix G (element g pq ) shown in the transition table 206 is obtained. For this purpose, the following equations (1) to (4) are calculated.

gpq={fpq(1)、fpq(2)、…、fpq(L)} ……(1) fpq(1)=fpq ……(2) fpq(k)=− min r=1;2…,n{fpq(k-1)frq ……(3) fpr(k−1)frq= fpr(k−1)+frq (fpr(k−1)・frp≠0ならば) 0 (fpr(k−1) ・frp=0ならば) ……(4) ここで、(1)式は、fpq(1)、fpq(2)、…fpq(L)のうち

0を除く最小値を求める演算である。ただし、す
べての要素fpq(i)が、すべて零のとき、零である。
Lは、所定の正の整数であり、たとえば、3とし
て与えられる。fpq(i)は、(i−1)個の機器を介
して、故障が波及するときの時間を示す。従つて
i=1という特殊な場合を考えるとfpq(1)は故障
が直接波及するときの時間を示すことになる。(3)
式は、fp1(k−1)f1q、fp2(k−1)f2q、…
fpo(k−1)foqのうち、0を除く最小値を求め
る演算である。ただし、すべての要素fpr(k−
1)frqが、すべて零のとき零である。
g pq = {f pq (1), f pq (2), ..., f pq (L)} ...(1) f pq (1) = f pq ...(2) f pq (k) = - min r=1;2...,n{f pq (k-1)f rq ...(3) f pr (k-1)f rq = f pr (k-1)+f rq (f pr (k-1)・If f rp ≠ 0) 0 (f pr (k-1) ・If f rp = 0) ...(4) Here, equation (1) is f pq (1), f pq (2) ,...f pq (L),
This is an operation to find the minimum value excluding 0. However, when all elements f pq (i) are zero, it is zero.
L is a predetermined positive integer, and is given as 3, for example. f pq (i) indicates the time when a failure spreads through (i-1) devices. Therefore, considering the special case of i=1, f pq (1) indicates the time when the failure directly spreads. (3)
The formulas are f p1 (k-1) f 1q , f p2 (k-1) f 2q ,...
This is an operation to find the minimum value excluding 0 out of f po (k-1) f oq . However, all elements f pr (k−
1) It is zero when f rq is all zero.

従つて(1)式では故障がpからqへ波及すると
き、途中経由する機器の数がL以下の波及経路で
波及時間最小の経路を探索することを意味する。
Therefore, equation (1) means that when a failure propagates from p to q, a propagation route with the minimum propagation time and the number of devices passing through on the way is searched.

このようにして、遷移行列演算装置145によ
つて求められた遷移表206は、メモリ144に記
憶される。
The transition table 206 obtained by the transition matrix calculation device 145 in this manner is stored in the memory 144.

一方、メモリ142には、第4図に示す遷移確
率表207が記憶されている。第4図には遷移確率
の値として1.0しか例示されていないが、一般に
は遷移確率の値は0.0と1.0の間の任意の実数値で
ある。
On the other hand, the memory 142 stores a transition probability table 207 shown in FIG. Although only 1.0 is illustrated as the value of the transition probability in FIG. 4, the value of the transition probability is generally any real value between 0.0 and 1.0.

故障波及予測装置141は、故障機器番号信号
107によつて指定される故障機器eiから他の機
器ejに故障が波及する時間信号を、メモリ144
に記憶させている遷移表206から読み出す。この
読み出された時間信号T1が、零より大きく、か
つ指定時間信号109よりも小さいかどうか、判
定しこれがなり立つ場合は、指定時間信号109
で指定される時間内に故障が波及すると予測され
るので、それに対応する機器ek1を故障波及機器
と推定する。さらに、機器ek1から他の機器ej
故障が波及する時間信号メモリ144から読み出
し、機器eiからek1へ故障が波及する時間信号T1
をこれに加算して、時間信号T2を求める。この
ようにして求めた時間信号T2が、時間信号T1
り大きく、かつ指定時間信号109よりも小さく
なる機器ek2を求める。このようなことを、機器
eknが求まらなくなるまでm回くりかえす。そし
て、機器ek1、ek2、…eknとして得られた機器を故
障波及機器ekとして表示制御装置146に出力す
る。
The failure propagation prediction device 141 stores in the memory 144 a time signal for the failure to spread from the failed device e i specified by the failed device number signal 107 to other devices e j .
Read from the transition table 206 stored in . It is determined whether the read time signal T1 is greater than zero and smaller than the designated time signal 109, and if this is true, the designated time signal 109 is determined.
Since it is predicted that the failure will spread within the time specified by , the corresponding device e k1 is estimated to be the failure spreading device. Further, a time signal T 1 at which a failure spreads from device e k1 to other devices e j is read from the memory 144, and a time signal T 1 at which a failure spreads from device e i to e k1 is read out from the memory 144.
is added to this to obtain the time signal T2 . A device e k2 for which the time signal T 2 obtained in this way is larger than the time signal T 1 and smaller than the designated time signal 109 is found. Do something like this with the equipment
Repeat m times until e kn cannot be found. Then, the devices obtained as devices e k1 , e k2 , . . . e kn are outputted to the display control device 146 as failure propagation devices e k .

故障波及予測装置141は、メモリ142よ
り、故障機器eiから指定時間信号109に対応す
る時間内に、故障が波及すると予測される機器
ek1への故障遷移確率P(ei、ek1)を読み出す。機
器eknの遷移確率P(ei、ekm)は P(ei、ekn)=P(ei、ek(n-1)) ・P(ek(n-1)、ekn) ……(5) の演算により求める。このようにして得られた遷
移確率は、表示制御装置146に故障波及機器ek
とともに出力される。
The failure propagation prediction device 141 determines from the memory 142 the devices whose failure is predicted to spread from the failed device e i within the time corresponding to the specified time signal 109.
The failure transition probability P(e i , e k1 ) to e k1 is read. The transition probability P(e i , ekm) of equipment e kn is P(e i , e kn )=P(e i , e k(n-1) ) ・P(e k(n-1) , e kn ) ...Determined by calculation (5). The transition probability obtained in this way is determined by the failure propagation equipment e k in the display control device 146.
is output with

表示制御装置146は、第5図aのプラントの
各構成機器に対応する電源1、ポンプ2、モータ
3、電磁弁4、真空ポンプ5および減速機6の故
障波及関係図を、遷移表202から、周知の
Interpretive Structural Modeling法により求
め、これを表示装置105に出力する。故障が波
及する機器群及びこれら機器間を線分で結合して
なり、機器間の故障波及関係を表わすネツトワー
クは第5図bに示すように表示装置105に表示
される。また、表示制御装置146は、故障機器
番号信号107にもとづき、故障機器e4を赤で表
示するように表示装置105を制御する。また、
故障波及予測装置141の出力にもとづき、故障
波及機器e6および機器e4からe6への故障波及線を
黄で表示するように、かつ、故障波及確率1.0も
併せて表示するように、表示装置105を制御
し、表示装置105上に第5図cに示す図を表示
させる。なお、遷移方向も併せて表示させてもよ
い。
The display control device 146 displays a failure ripple relationship diagram of the power supply 1, pump 2, motor 3, solenoid valve 4, vacuum pump 5, and speed reducer 6 corresponding to each component of the plant shown in FIG. 5a from the transition table 202. , well-known
It is determined by the Interpretive Structural Modeling method and output to the display device 105. A group of devices to which a failure propagates and a network formed by connecting these devices with line segments and representing the failure propagation relationship between the devices are displayed on the display device 105 as shown in FIG. 5B. Further, the display control device 146 controls the display device 105 to display the failed device e 4 in red based on the failed device number signal 107. Also,
Based on the output of the failure propagation prediction device 141, the failure propagation line from failure propagation device e 6 and device e 4 to e 6 is displayed in yellow, and the failure propagation probability of 1.0 is also displayed. The device 105 is controlled to display the diagram shown in FIG. 5c on the display device 105. Note that the transition direction may also be displayed.

以上説明したように、本発明によれば、指定時
間後の故障波及予測範囲と波及する確率を計算で
きる。さらに、この結果をネツトワーク上に表示
することにより、故障波及予測範囲をわかりやす
い形で捉えることができ、故障対策が容易にな
る。
As described above, according to the present invention, it is possible to calculate the predicted range of failure influence after a specified time and the probability of failure influence. Furthermore, by displaying these results on the network, the predicted range of failure spread can be grasped in an easy-to-understand manner, making it easier to take measures against failures.

【図面の簡単な説明】[Brief explanation of drawings]

第1図から第5図は、本発明の説明図である。 1 to 5 are explanatory diagrams of the present invention.

Claims (1)

【特許請求の範囲】 1 プラントの各構成機器にそれぞれ設けられ、
各構成機器の動作状態を検出する複数の検出器
と、該複数の検出器に結合され、あらかじめ、各
構成機器が正常に動作しているとき上記複数個の
検出器から得られる正常信号を記憶し、この正常
信号と上記複数の検出器の検出信号とを比較し、
故障機器を検出する故障診断装置と、現時点から
故障波及を予想すべき時刻までの指定時間を入力
する入力装置と、プラントの動作状態及び上記指
定時間までの故障波及範囲を表わす情報を各構成
機器間の結合関係を表わすネツトワーク上に加え
て表示する表示装置と、上記故障診断装置と入力
装置と表示装置に結合された故障波及予測・表示
制御装置とからなり、かつ該故障波及予測・表示
制御装置は、あらかじめ、各構成機器間の故障の
直接波及時間を記憶する第1の記憶装置と、各構
成機器間の故障波及時間を直接波及、間接波及を
含めて上記第1の記憶装置にあらかじめ記憶され
た直接波及時間から演算する遷移行列演算装置
と、求められた遷移行列の要素である故障波及時
間を記憶する第2の記憶装置と、上記故障機器か
ら他の機器への故障波及時間を上記第2の記憶装
置に記憶された各構成機器間の故障波及時間から
予測し、予想された故障波及時間と上記指定時間
とを比較し、上記指定時間以下のものに対応する
構成機器を、上記指定時間内に故障の波及する範
囲にある構成機器として検出する故障波及予測装
置と、検出された故障の波及する範囲にある構成
機器および上記検出された故障の波及する範囲に
ある構成機器への故障波及線を各構成機器間の結
合関係を表わすネツトワーク上に加えて上記表示
装置に表示させる表示制御信号を発生する表示制
御装置とからなることを特徴とするプラントの故
障波及範囲予測・表示装置。 2 プラントの各構成機器にそれぞれ設けられ、
各構成機器の動作状態を検出する複数の検出器
と、該複数の検出器に結合され、あらかじめ、各
構成機器が正常に動作しているとき上記複数の検
出器から得られる正常信号を記憶し、この正常信
号と上記複数の検出器の検出信号とを比較し、故
障機器を検出する故障診断装置と、現時点から故
障波及を予測すべき時刻までの指定時間を入力す
る入力装置と、プラントの動作状態及び上記指定
時間までの故障波及範囲を表わす情報を各構成機
器間の結合関係を表わすネツトワーク上に加えて
表示する表示装置と、上記故障診断装置と入力装
置と表示装置に結合された故障波及予測・表示制
御装置とからなり、かつ該故障波及予測・表示制
御装置は、あらかじめ、各構成機器間の故障の直
接波及時間を記憶する第1の記憶装置と、各構成
機器間の故障波及時間を直接波及、間接波及を含
めて上記第1の記憶装置にあらかじめ記憶された
直接波及時間から演算する遷移行列演算装置と、
求められた遷移行列の要素である故障波及時間を
記憶する第2の記憶装置と、各構成機器間の故障
遷移確率を記憶する第3の記憶装置と、上記故障
機器から他の機器への故障波及時間を上記第2の
記憶装置に記憶された各構成機器間の故障波及時
間から予測し、予測された故障波及時間と上記指
定時間とを比較し、上記指定時間以下のものに対
応する構成機器を、上記指定時間内に故障の波及
する範囲にある構成機器として検出するとともに
検出された故障の波及する範囲にある構成機器へ
の故障遷移確率を上記第3の記憶装置に記憶され
た各構成機器間の故障遷移確率から算出する故障
波及予測装置と、検出された故障の波及する範囲
にある構成機器とそれら構成機器への故障遷移確
率および上記検出された故障の波及する範囲にあ
る構成機器への故障波及線を各構成機器間の結合
関係を表わすネツトワーク上に加えて上記表示装
置に表示させる表示制御信号を発生する表示制御
装置とからなることを特徴とするプラントの故障
波及範囲予測・表示装置。
[Claims] 1. Provided in each component of the plant,
A plurality of detectors detecting the operating status of each component device, and are coupled to the plurality of detectors, and store normal signals obtained from the plurality of detectors when each component device is operating normally. Then, compare this normal signal with the detection signals of the plurality of detectors,
A fault diagnosis device that detects faulty equipment, an input device that inputs a specified time from the current moment to the time when the failure is expected to spread, and information representing the operating status of the plant and the range of fault spread up to the specified time for each component. a display device for displaying in addition on a network representing the connection relationship between The control device stores in advance a first storage device that stores the direct propagation time of a failure between each component device, and a first storage device that stores the direct propagation time of a failure between each component device, including direct propagation and indirect propagation. a transition matrix calculation device that calculates from pre-stored direct propagation times; a second storage device that stores failure propagation times that are elements of the determined transition matrix; and failure propagation times from the faulty device to other devices. is predicted from the failure propagation time between each component device stored in the second storage device, the predicted failure propagation time is compared with the specified time, and the component corresponding to the specified time or less is selected. , a failure propagation prediction device that detects the component equipment within the range where the fault spreads within the specified time, the component equipment that is within the range where the detected fault spreads, and the component equipment within the range where the detected fault spreads. Prediction of fault spread range of a plant, characterized in that the fault spread line is formed on a network representing the coupling relationship between each component, and a display control device generates a display control signal to be displayed on the display device.・Display device. 2. Provided for each component of the plant,
a plurality of detectors that detect the operating status of each component; , a fault diagnosis device that compares this normal signal with the detection signals of the plurality of detectors and detects a faulty device; an input device that inputs a specified time from the current moment to the time when the fault spread should be predicted; a display device that displays information representing the operating status and the range of failure spread up to the specified time in addition to the network representing the connection relationship between each component, and a display device that is connected to the fault diagnosis device, input device, and display device The failure propagation prediction/display control device includes a first storage device that stores the direct propagation time of a failure between each component device, and a failure propagation time between each component device. a transition matrix calculating device that calculates a ripple time including direct ripples and indirect ripples from the direct ripple times stored in advance in the first storage device;
a second storage device that stores failure propagation times that are elements of the determined transition matrix; a third storage device that stores failure transition probabilities between each component device; and a third storage device that stores failure propagation times that are elements of the determined transition matrix; A configuration in which the propagation time is predicted from the failure propagation time between each component device stored in the second storage device, the predicted failure propagation time is compared with the specified time, and the configuration corresponds to the failure propagation time that is less than or equal to the specified time. The device is detected as a component device within the range where the fault spreads within the specified time, and the probability of failure transition to the component device within the range where the detected fault spreads is determined for each device stored in the third storage device. A failure propagation prediction device that calculates from failure transition probabilities between component devices, component devices in the range where a detected fault spreads, failure transition probabilities to those component devices, and configurations in the range where the detected fault spreads. A fault spread range of a plant characterized by comprising a fault spread line to equipment on a network representing a coupling relationship between each component equipment, and a display control device that generates a display control signal to be displayed on the display device. Prediction/display device.
JP58216191A 1983-11-18 1983-11-18 Plant failure influence range prediction/display device Granted JPS59108115A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58216191A JPS59108115A (en) 1983-11-18 1983-11-18 Plant failure influence range prediction/display device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58216191A JPS59108115A (en) 1983-11-18 1983-11-18 Plant failure influence range prediction/display device

Publications (2)

Publication Number Publication Date
JPS59108115A JPS59108115A (en) 1984-06-22
JPH0363082B2 true JPH0363082B2 (en) 1991-09-30

Family

ID=16684708

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58216191A Granted JPS59108115A (en) 1983-11-18 1983-11-18 Plant failure influence range prediction/display device

Country Status (1)

Country Link
JP (1) JPS59108115A (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008175457A (en) * 2007-01-18 2008-07-31 Sanyo Electric Co Ltd Air conditioner installed on floor
JP5174956B2 (en) * 2009-04-20 2013-04-03 三菱電機株式会社 Plant operation support device

Also Published As

Publication number Publication date
JPS59108115A (en) 1984-06-22

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