JPH036357A - Dip soldering bath - Google Patents

Dip soldering bath

Info

Publication number
JPH036357A
JPH036357A JP14187489A JP14187489A JPH036357A JP H036357 A JPH036357 A JP H036357A JP 14187489 A JP14187489 A JP 14187489A JP 14187489 A JP14187489 A JP 14187489A JP H036357 A JPH036357 A JP H036357A
Authority
JP
Japan
Prior art keywords
thiourea
tin
lead
plating
plating bath
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14187489A
Other languages
Japanese (ja)
Other versions
JP2815401B2 (en
Inventor
Shigefumi Nishimura
茂文 西村
Masao Fukuda
服田 正雄
Yoshiji Kiyohito
清人 芳次
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimizu Co Ltd
Original Assignee
Shimizu Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimizu Co Ltd filed Critical Shimizu Co Ltd
Priority to JP1141874A priority Critical patent/JP2815401B2/en
Priority to US07/530,169 priority patent/US5160422A/en
Publication of JPH036357A publication Critical patent/JPH036357A/en
Application granted granted Critical
Publication of JP2815401B2 publication Critical patent/JP2815401B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Manufacturing Of Printed Wiring (AREA)

Abstract

PURPOSE:To stably obtain a uniform and high-quality tin-lead soldering film by using the soldering bath contg. bivalent tin ion, bivalent lead ion, an org. sulfo group and the thiourea and thiourea derivative as a complexing agent. CONSTITUTION:A soldering film is formed on a material to be treated using the soldering bath. The soldering bath contg. bivalent tin ion, bivalent lead ion, an org. sulfo group and the thiourea and thiourea derivative as a complexing agent is used. The contents of the tin ion and lead ion are respectively controlled to about 3-50g/l, and the ions are preferably supplied as their phenosulfonates. The content of the org. sulfo group such as an aromatic sulfonic acid is appropriately adjusted to about 6-400g/l. The content of the thiourea is controlled to about 3-150g/l, and the thiourea derivative such as dimethylol thiourea is used in a smaller amt. The soldering bath is stable, has a long service life and is able to form a sufficiently fine soldering film having uniform thickness.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は、各種電子回路部品などの電極などとして用い
られる銅および銅合金上に、錫−鉛めつき被膜を形成す
る際に好適に用いられる浸漬はんだめっき浴に関する。
DETAILED DESCRIPTION OF THE INVENTION Field of Industrial Application The present invention is directed to a dipping method suitable for forming a tin-lead plating film on copper and copper alloys used as electrodes of various electronic circuit components. Regarding solder plating baths.

従来の技術 各種電子回路部品を実装した印刷配線基板の各種電極や
回路配線の素材として、銅および銅合金が広く用いられ
ている。このような電極や回路配線上に、錫めっきを施
す技術が知られている。しかし比較例1および第6図に
示すように錫め−)きはその経時変化でウィスカーを発
生することが知られており、電気的短絡が発生し易くな
るという問題がある。
2. Description of the Related Art Copper and copper alloys are widely used as materials for various electrodes and circuit wiring of printed wiring boards on which various electronic circuit components are mounted. Techniques for applying tin plating on such electrodes and circuit wiring are known. However, as shown in Comparative Example 1 and FIG. 6, tin plating is known to generate whiskers due to changes over time, and there is a problem that electrical short circuits are more likely to occur.

一方、錫−鉛めつきはウィスカーの発生を抑制し、とり
わけ鉛の含有率が5%を越えるとウィスカーはほとんど
解消される。また曇−鉛め−)き被膜は耐食性やはんだ
付は性に優れるため、上記各種電極や回路配線上に形成
され、これらめ品質上の信頼性の向上や作業工程の容易
化に寄与している。
On the other hand, tin-lead plating suppresses the generation of whiskers, and especially when the lead content exceeds 5%, whiskers are almost eliminated. In addition, the cloudy (lead-plated) coating has excellent corrosion resistance and soldering properties, so it is formed on the various electrodes and circuit wiring mentioned above, contributing to improving quality reliability and simplifying the work process. There is.

従来では、このような錫−鉛めつきく以下、はんだめっ
きと称する)は電気めっき処理として行われている。す
なわち、被処理物を負極とし、他に正極となる電極を設
け、これらを錫イオンや鉛イオンを含有する電解液中に
浸漬し、通電してめっき被膜を形成するようにしている
。
Conventionally, such tin-lead plating (hereinafter referred to as solder plating) has been performed as an electroplating process. That is, the object to be treated is used as a negative electrode, and another electrode is provided as a positive electrode, and these are immersed in an electrolytic solution containing tin ions and lead ions, and then energized to form a plating film.

しかしながらこのような電気はんだめっきの技術では、
被処理物の部位により電流密度が変化するため、はんだ
めっき被膜の層厚が均一とならないという問題がある。
However, with this type of electric solder plating technology,
Since the current density changes depending on the part of the object to be processed, there is a problem that the layer thickness of the solder plating film is not uniform.

また電気絶縁性基板上には、このようなめつき被膜を形
成することができないのは勿論である。
Moreover, it goes without saying that such a plating film cannot be formed on an electrically insulating substrate.

エレクトロニクス技術ルよ、電気製品の軽薄短小化およ
び多機能化および高性能化が著しく、高度な技術が要求
されているため回路技術、半導体技術において本発明の
ような浸漬はんだめっき浴が望まれている。
In electronics technology, electric products are becoming lighter, thinner, shorter, more multi-functional, and have higher performance, and advanced technology is required. Therefore, an immersion solder plating bath like the one of the present invention is desired in circuit technology and semiconductor technology. There is.

発明が解決しようとする課題 このような課題を解決するために、いわゆる無電解めっ
き技術が採用されている。このような無電解めっき技術
では、被処理物と電極との間に通電を行う必要がなく、
したがって被処理物の電気的導通性の有無を問わず、ま
たその形状に何等、制約がないことになる。
Problems to be Solved by the Invention In order to solve these problems, so-called electroless plating technology has been adopted. With this type of electroless plating technology, there is no need to conduct electricity between the object to be processed and the electrode.
Therefore, there are no restrictions on the shape of the object, regardless of whether it has electrical conductivity or not.

このような無電解はんだめっきを行うためのはんだめっ
き浴として従来では塩化錫、酢酸鉛、ホウフッ化錫、ホ
ウフッ化鉛などにチオ尿素、ホウフッ化水素酸、キレー
ト剤、塩酸などを加え、酸性浸漬めっき浴を調製してい
た。このような従来例のめつき浴では比較例2に示すよ
うに、含有される塩素イオンの濃度が比較的高い場6、
常温で難溶性の塩化鉛−チオ尿素銘体の沈澱が発生して
めっきが停止してしまうため、めっき浴を比較的高い温
度で保持する必要がある。低温になると、めっき浴が前
記錯体の発生により混濁してしまう。
Conventionally, the solder plating bath for performing such electroless solder plating is made by adding thiourea, hydrofluoroboric acid, a chelating agent, hydrochloric acid, etc. to tin chloride, lead acetate, tin fluoroboride, lead fluoroboride, etc., and then immersing it in an acidic bath. A plating bath was being prepared. In such conventional plating baths, as shown in Comparative Example 2, when the concentration of chlorine ions contained is relatively high6,
Since precipitation of poorly soluble lead chloride-thiourea constituents occurs at room temperature and plating stops, it is necessary to maintain the plating bath at a relatively high temperature. At low temperatures, the plating bath becomes cloudy due to the generation of the complexes.

また、めっき浴の寿命も短くなってしまう。Furthermore, the life of the plating bath is also shortened.

また被めっき物が水濡れしている場き、付着した水滴に
よってめっき浴の浴温が部分的に低下してしまい、前記
錯体が発生し、めつきむらとな−)てしまうなどの問題
があった。また錫に比べて鈴の方が析出の程度が大きく
、所望の組成のはんだめっき被膜が得られないという問
題があった。
In addition, when the object to be plated is wet, the adhering water droplets may partially lower the temperature of the plating bath, resulting in the generation of the complexes and uneven plating. there were. Further, there was a problem in that tin precipitated to a greater extent than tin, making it impossible to obtain a solder plating film with a desired composition.

本発明の目的は、上述の技術的課題を解消し、めっき品
質が格段に向上される浸漬はんだめっき浴を提供するこ
とである。
An object of the present invention is to provide an immersion solder plating bath that solves the above-mentioned technical problems and significantly improves plating quality.

課題を解決するための手段 本発明は、被処理物上にはんだめっき被膜を形成するに
当たって用いられる浸漬はんだめっき浴において、2価
の錫イオンと、2価の鉛イオンと、有機スルホ基と、銘
化剤としてチオ尿素とチオ尿素誘導体とを含むことを特
徴とする浸漬はんだめっき浴である。
Means for Solving the Problems The present invention provides an immersion solder plating bath used for forming a solder plating film on a workpiece, in which divalent tin ions, divalent lead ions, organic sulfo groups, This is an immersion solder plating bath characterized by containing thiourea and a thiourea derivative as a marking agent.

本発明に用いられる2価の錫イオンおよび鉛イオンを与
える材料としては、たとえばフェノールスルホン酸錫お
よびフェノールスルホン酸鉛や、錫や鉛を含む水溶性無
機化合物などが用いられる。
Examples of materials that provide divalent tin ions and lead ions used in the present invention include tin phenolsulfonate, lead phenolsulfonate, and water-soluble inorganic compounds containing tin and lead.

本発明においてチオ尿素と共に用いられるチオ尿素誘導
体は下式 のような構造を有する化会物であり、各原子団R1〜R
4が全て水素原子Hである揚重がチオ尿素である。チオ
尿素誘導体は上記原子団R1〜R4のうち少なくとも1
つが水素H以外の原子団であるたとえば炭素数1〜2の
アルキル基、スルホ基またはメチロール基などの官能基
で置換されている。このようなチオ尿素誘導体の例とし
て、たとえばジメチロールチオ尿素、1−アセチル−2
チオ尿素、モノメチルチオ尿素、ジメチルチオ尿素、ト
リメチルチオ尿素、モノエチルチオ尿素、1.3−ジエ
チルチオ尿素などが示される。
The thiourea derivative used together with thiourea in the present invention is a chemical compound having the structure shown below, and each atomic group R1 to R
A thiourea in which all 4 are hydrogen atoms H is thiourea. The thiourea derivative has at least one of the above atomic groups R1 to R4.
is substituted with a functional group other than hydrogen H, such as an alkyl group having 1 to 2 carbon atoms, a sulfo group, or a methylol group. Examples of such thiourea derivatives include, for example, dimethylolthiourea, 1-acetyl-2
Examples include thiourea, monomethylthiourea, dimethylthiourea, trimethylthiourea, monoethylthiourea, 1,3-diethylthiourea, and the like.

このようなチオ尿素誘導体の中には水に対する溶解度が
小さい種類もあるが、チオ尿素の配合量より少ない配合
量でチオ尿素誘導体を添加し、さらに酒石酸、コハク酸
またはクエン酸などのような有機酸、さらにノニオン系
界面活性剤などを添加することによって、本発明におけ
る効力が発揮される量まで、チオ尿素およびチオ尿素誘
導体を溶解することが可能となる。
Some of these thiourea derivatives have low solubility in water, but it is possible to add thiourea derivatives in an amount smaller than that of thiourea, and to add organic compounds such as tartaric acid, succinic acid, or citric acid. By adding an acid and further a nonionic surfactant, it becomes possible to dissolve thiourea and thiourea derivatives to the extent that the effectiveness of the present invention is exhibited.

本発明における有機スルホ基を提供する化6物としては
次の一般式(2)で表される構造を有する芳香族スルホ
ン酸およびアルカンスルホン酸、ヒドキシアルカンスル
ホン酸などがあげられる。
Examples of compounds providing an organic sulfo group in the present invention include aromatic sulfonic acids, alkanesulfonic acids, and hydroxyalkanesulfonic acids having a structure represented by the following general formula (2).

 2 (式中R1およびR2は、同一または相異なって、水素
原子、ヒドロキシ基、カルボキシル基、炭素数1〜3の
低級アルキル基を示す)アルカンスルホン酸としては、
5メタンスルホン酸やエタンスルポン酸などを用いるこ
とができ、ヒドロキシアルカンスルホン酸としてはヒド
ロキシエチルスルホン酸やヒドロキシプロピルスルホン
酸などを用いることができる。この他に遊離してスルホ
基を提供する化合物を用いることができる。
2 (In the formula, R1 and R2 are the same or different and represent a hydrogen atom, a hydroxy group, a carboxyl group, or a lower alkyl group having 1 to 3 carbon atoms) as an alkanesulfonic acid,
5Methanesulfonic acid, ethanesulfonic acid, etc. can be used, and as the hydroxyalkanesulfonic acid, hydroxyethylsulfonic acid, hydroxypropylsulfonic acid, etc. can be used. In addition, compounds that provide a sulfo group in a free manner can be used.

本発明の浸漬はんだめっき浴は好ましくは3・〜50 
g/lの2価の錫と、3〜50g/lの2価の鉛と3〜
150g/lのチオ尿素と、前述したようにチオ尿素よ
りも少ない配合量のチオ尿素誘導体と6〜400g/l
の有機スルホ基からなる。
The immersion solder plating bath of the present invention preferably has a
g/l of divalent tin, 3 to 50 g/l of divalent lead, and 3 to 50 g/l of divalent lead.
150 g/l of thiourea and, as mentioned above, a smaller amount of thiourea derivative than thiourea and 6 to 400 g/l.
It consists of an organic sulfo group.

この組成において、他に塩素イオン源、ホウフッ化イオ
ン源を含むこともできる。塩素イオン源としては、(a
)塩酸、(b)塩化亜鉛、塩化アルミニウム、塩化リチ
ウムまたは塩化すl・リウムなどの無機塩化物、(C)
モノトリエタノールアミン塩酸塩またはトリエタノール
アミン塩酸塩などのアミン類の塩酸塩ならびに(d)カ
チオン型界面活性剤の塩酸塩などが使用される。
In this composition, a chloride ion source and a borofluoride ion source can also be included. As a chlorine ion source, (a
) hydrochloric acid, (b) inorganic chlorides such as zinc chloride, aluminum chloride, lithium chloride or sulfur/lium chloride, (C)
Hydrochlorides of amines such as monotriethanolamine hydrochloride or triethanolamine hydrochloride, and (d) hydrochlorides of cationic surfactants are used.

後述する本発明の実施例2および4では塩素イオン源と
して従来例の塩酸などとは異なり、塩化アルミニラノー
を添加した。塩化アルミニウムの添加は、浸漬はんだめ
っき浴のPHを調製する手段として用いられる。塩化ア
ルミニウムは有機物に溶解する性質を有しているため、
チオ尿素およびチオ尿素誘導体の溶液に溶解しやすく、
沈澱の生成が格段に抑制される。また塩化アルミニウム
を少量添加することにより、錫−鉛の析出速度が向上さ
れ、めっき被膜の粒子径を微細にする作用が見られる。
In Examples 2 and 4 of the present invention, which will be described later, aluminum chloride was added as a chloride ion source, unlike hydrochloric acid in the conventional example. Addition of aluminum chloride is used as a means to adjust the PH of the immersion solder plating bath. Since aluminum chloride has the property of dissolving in organic matter,
Easily soluble in solutions of thiourea and thiourea derivatives;
Precipitate formation is significantly suppressed. Further, by adding a small amount of aluminum chloride, the precipitation rate of tin-lead is improved, and the effect of making the particle size of the plating film finer can be seen.

また塩化アルミニウムのアルミニウムイオンAI”は、
めっき被膜を構成する鉛や錫よりも析出電位が卑な金属
であり、アルミニウムイオンが本発明によるめっき被膜
中に混入する事態は防がれる。この塩化アルミニウムは
0.01〜0.2mol/1の濃度で添加することが望
ましい。
In addition, aluminum ion AI” of aluminum chloride is
It is a metal with a deposition potential lower than that of lead and tin that constitute the plating film, and it is possible to prevent aluminum ions from being mixed into the plating film according to the present invention. This aluminum chloride is preferably added at a concentration of 0.01 to 0.2 mol/1.

ホウフッ化イオン源としては、ホウフッ化水素、ホウフ
ッ化鉛、ホウフッ化錫などが使用される。
As the borofluoride ion source, hydrogen borofluoride, lead borofluoride, tin borofluoride, etc. are used.

ホウフッ化イオンは過剰となると例えばプリント配線板
等の絶縁板を腐食する場合がある。また、人体に有毒性
があり、その廃棄にあたって厳密な廃棄処理施設を設置
しなければならないのでこれらを考慮して上限が決めら
れる。
If excessive, borofluoride ions may corrode insulating plates such as printed wiring boards. In addition, since it is toxic to the human body and strict disposal facilities must be installed when disposing of it, the upper limit is determined with these considerations in mind.

ただし、後述する実施例1に示すように、本発明の無電
解はんだめっきは、塩素イオン、ホウフッ化イオンを含
まない組成であっても良好な外観のはんだめっき面を形
成することができる。
However, as shown in Example 1 described below, the electroless solder plating of the present invention can form a solder plated surface with a good appearance even if the composition does not contain chlorine ions or borofluoride ions.

この他に本発明の浸漬はんだめっき浴には、ベブl−ン
、にかわ、ゼラチンなどの光沢剤を添加することができ
る。
In addition, the immersion solder plating bath of the present invention may contain a brightening agent such as veneer, glue, or gelatin.

また本発明では、被処理物表面の電荷の移動はなく、還
元剤は不要である。ただし、空気中の酸素による酸化を
防止するために次亜リン酸ナトリウムや塩酸ヒドラジン
などの還元剤を添加することができる。
Further, in the present invention, there is no charge transfer on the surface of the object to be processed, and no reducing agent is required. However, a reducing agent such as sodium hypophosphite or hydrazine hydrochloride may be added to prevent oxidation due to oxygen in the air.

作  用 本発明に従う浸漬はんだめ−)き浴では、無電解はんだ
めっきを行う際に、チオ尿素およびチオ尿素誘導体が被
処理物表面の金属と錯化し、錫および鉛の析出電位が上
記表面金属より貴となり、置換めっき現象が発生するも
のである。
Function: In the immersion solder bath according to the present invention, when electroless solder plating is performed, thiourea and thiourea derivatives are complexed with the metal on the surface of the workpiece, and the deposition potential of tin and lead is lower than that of the surface. It is more noble than metals and a displacement plating phenomenon occurs.

本発明では、浸漬はんだめっき洛中にチオ尿素誘導体と
チオ尿素とを合わせて溶解させることにより、有機酸中
における錫および鉛の析出速度と、得られためつき被膜
中における鉛の含有率とを制御することができる。また
チオ尿素誘導体を添加することにより、錫および鉛が析
出する際に鉛が樹枝状に析出することを抑制することが
でき、表面が十分に平滑なはんだめっき表面を形成する
ことができる。
In the present invention, by dissolving a thiourea derivative and thiourea together during immersion solder plating, the precipitation rate of tin and lead in an organic acid and the content of lead in the resulting dimming film are controlled. can do. Furthermore, by adding a thiourea derivative, it is possible to suppress the precipitation of lead in a dendritic shape when tin and lead are precipitated, and it is possible to form a solder plating surface with a sufficiently smooth surface.

本発明のめつき浴は、たとえばめっき液の撹拌、および
被処理物の揺動によって、めっき液に機械的エネルギー
を加えたり、または超音波発生装置でめっき液を激しく
運動させたりして置換反応を促進させる作用を有する。
The plating bath of the present invention performs a substitution reaction by applying mechanical energy to the plating solution by stirring the plating solution and shaking the object to be treated, or by moving the plating solution vigorously using an ultrasonic generator. It has the effect of promoting.

これらの方法を利用して、めっき液に物理的エネルギー
を加えることが望ましく、外観、物性とも良好なはんだ
皮膜を得ることができる。後述の具体例では、モーター
による機械撹拌を行っている。
It is desirable to apply physical energy to the plating solution using these methods, and a solder film with good appearance and physical properties can be obtained. In the specific example described below, mechanical stirring is performed using a motor.

また、本発明に従う浸漬はんだめっき浴では、無電解は
んだめっきを行う際に、有機スルホ基を含有させること
で、難溶姓のチオ尿素錯体を液中に安定に溶解させてお
くことができて、従来の無電解はんだめっきに比べめっ
き浴を高温で保持する必要もなく安定なめつき浴を提供
することができる。まためっき浴の寿命も長くなる。
In addition, in the immersion solder plating bath according to the present invention, by containing an organic sulfo group, the poorly soluble thiourea complex can be stably dissolved in the liquid during electroless solder plating. Compared to conventional electroless solder plating, it is not necessary to maintain the plating bath at a high temperature, and a stable plating bath can be provided. The life of the plating bath is also extended.

テープキャリア方式による半導体チップの実装は、無電
解錫めっきが多用されている。本発明の浸漬はんだめ−
)き浴を使用すると5この錫めっきより信頼性のあるは
んだめっきが得られ、本発明は微細パターンを有する回
路基板l\の使用にも好適である。
Electroless tin plating is often used for mounting semiconductor chips using the tape carrier method. Immersion solder of the present invention
) If a solder plating bath is used, a more reliable solder plating than this tin plating can be obtained, and the present invention is also suitable for use in circuit boards having fine patterns.

また、サブトラクティブ法における銅スルーホール基板
製造工程ではんだ剥離法が使用されている。このはんだ
剥離法で電気はんだめっきのかわりに本発明の無電解は
んだめっきが使用できる。
Furthermore, a solder stripping method is used in the copper through-hole board manufacturing process in the subtractive method. With this solder stripping method, the electroless solder plating of the present invention can be used instead of electric solder plating.

特に小径のスルーホールに対して有効であり、本発明は
1リント基板の製造工程てメタルレジス1へを形成する
なめにも使用てきる。
It is particularly effective for small-diameter through holes, and the present invention can also be used to form metal resists 1 in the manufacturing process of one-lint substrates.

実施例 1 下記第1表に示す組成で無電解けんため−)き浴を調整
した。
Example 1 An electroless saponification bath was prepared with the composition shown in Table 1 below.

このようにして得られた無電解はんだめっき浴を液温6
0℃に加熱し、銅板(5X 5 c rn )を電解脱
脂、酸中和、水洗の前処理を行った後、15分間浸漬し
た。得られためっき被膜は表面が平滑であり、0.9μ
rnの均一な膜厚であることが確認された。またその組
成は錫77%、鉛23%であることが確認された。
The electroless solder plating bath thus obtained was heated to a liquid temperature of 6.
It was heated to 0° C., and the copper plate (5×5 crn) was pretreated by electrolytic degreasing, acid neutralization, and water washing, and then immersed for 15 minutes. The plated film obtained had a smooth surface and a thickness of 0.9μ.
It was confirmed that the film had a uniform thickness of rn. It was also confirmed that its composition was 77% tin and 23% lead.

1一 実施例 2 下記第2表に示す組成で無電解はんだめっき浴を調整し
た。
11 Example 2 An electroless solder plating bath was prepared with the composition shown in Table 2 below.

2 あることが確認された。2 It was confirmed that there is.

実施例 3 下記第3表に示す組成で無電解はんだめっき浴を調整し
た。
Example 3 An electroless solder plating bath was prepared with the composition shown in Table 3 below.

第  3  表 このようにして得られた無電解はんだめっき浴を液温6
0℃に加熱し、銅板(5X 5 c m )を電解脱脂
、酸中和、水洗の前処理を行った後、15分間浸漬した
。得られためっき被膜は表面性状が平滑であり、結晶粒
子も微細であって、膜厚2.3μmの均一なめっき被膜
が得られていることが確認、された。またその組成は錫
89%、鉛11%でこのようにして得られた無電解はん
だめっき浴を液温60℃に加熱し、銅板(5X 5 c
 m )を電解脱脂、酸中和、水洗の前処理を行った後
、15分間浸漬した。得られためつき被膜は表面が平滑
であり、1.7μmの均一な膜厚であることが確認され
た。またその組成は錫59%、鉛41%であることか確
認された。
Table 3 The electroless solder plating bath thus obtained was heated to a temperature of 6.
It was heated to 0° C., and a copper plate (5×5 cm) was pretreated by electrolytic degreasing, acid neutralization, and water washing, and then immersed for 15 minutes. It was confirmed that the obtained plating film had a smooth surface, fine crystal grains, and a uniform plating film with a thickness of 2.3 μm. The composition was 89% tin and 11% lead. The electroless solder plating bath thus obtained was heated to a liquid temperature of 60°C, and a copper plate (5
m) was subjected to pretreatment of electrolytic degreasing, acid neutralization, and water washing, and then immersed for 15 minutes. It was confirmed that the surface of the obtained frosted coating was smooth and had a uniform thickness of 1.7 μm. It was also confirmed that its composition was 59% tin and 41% lead.

実施例 4 下記第4表に示す組成て無電解はんだめっき浴を調整し
た。
Example 4 An electroless solder plating bath was prepared with the composition shown in Table 4 below.

第  4  表 実施例 5 下記第5表に示す組成で無電解はんなめつき浴を調整し
た。
Table 4 Example 5 Electroless solder plating baths were prepared with the compositions shown in Table 5 below.

このようにして得られた無電解はんだめっき浴を液温6
0゛Cに加熱し、銅板(5x 5 c m )を電解脱
脂、酸中和、水洗の前処理を行った後、15分間浸漬し
た。得られためつき被膜は表面が平滑であり、1.8μ
fflの均一な膜厚であることが確認された。またその
組成は錫55%、鉛45%であることが確認された。
The electroless solder plating bath thus obtained was heated to a liquid temperature of 6.
After heating to 0°C, a copper plate (5 x 5 cm) was pretreated by electrolytic degreasing, acid neutralization, and water washing, and then immersed for 15 minutes. The resulting frosted coating had a smooth surface and a thickness of 1.8μ.
It was confirmed that the film had a uniform thickness of ffl. It was also confirmed that its composition was 55% tin and 45% lead.

このようにして得られた′無電解はんだめっき浴を液温
70℃に加熱し、銅板(5X 5 c m )を電解脱
脂、酸中和、水洗の前処理を行った後、15分間浸漬し
た。得られためつき被膜は表面が平滑であり、0.8μ
mの均一な膜厚であることが確認された。またその組成
はIIIJ76%、鉛24%であることが確認された。
The electroless solder plating bath thus obtained was heated to a liquid temperature of 70°C, and a copper plate (5 x 5 cm) was pretreated by electrolytic degreasing, acid neutralization, and water washing, and then immersed for 15 minutes. . The surface of the obtained frosted film was smooth and the thickness was 0.8μ.
It was confirmed that the film had a uniform thickness of m. It was also confirmed that its composition was 76% IIIJ and 24% lead.

次に本発明の浸漬はんだめっき浴を用いた渇き5 のめつきの試験の結果を示す。Next, 5 The results of the eyesight test are shown.

第1図は、本発明の浸漬はんだめっき浴を用いて銅素材
をめっきした場合の処理時間とめっきの膜厚との関係を
示すグラフである。比較的低温のめつき浴でも実用上十
分の膜厚を得ることができた。
FIG. 1 is a graph showing the relationship between processing time and plating film thickness when a copper material is plated using the immersion solder plating bath of the present invention. Even with a relatively low temperature plating bath, a film thickness sufficient for practical use could be obtained.

第2図は、銅素材を5分間浸漬した場きのめつき浴の液
温と析出する被膜の合金組成変化の関係を示すグラフで
ある。比較的低温のめつき浴でも鉛が偏析することはな
く所望の組成のはんだめっき被膜が得られた。
FIG. 2 is a graph showing the relationship between the liquid temperature of the plating bath and the change in alloy composition of the deposited film when the copper material is immersed for 5 minutes. Even in a relatively low temperature plating bath, lead did not segregate and a solder plating film with the desired composition was obtained.

第3図は、めっき直後にフラックスを使用せずにはんだ
付性評価を行った際のメニスコグラフを示し、第6表に
その結果を示す。測定条件は、235℃の錫60%、鉛
40%のはんだ浸漬槽を用い、浸漬速度 25 m r
口/秒、浸漬深さ 4 m m 。
FIG. 3 shows a meniscograph when solderability was evaluated immediately after plating without using flux, and Table 6 shows the results. The measurement conditions were a solder dipping bath of 60% tin and 40% lead at 235°C, and a dipping speed of 25 m r.
mouth/s, immersion depth 4 mm.

試験片としては、50X5X0.3mmの銅板を用いて
評価した。第6表中、被処理物がめつき浴に浸漬され、
浸漬される体積が増えるにつれ浮力が増加し、その浮力
が最大になる時間を参照符丁6 1で示し、その時の浮力を参照符F1で示す。また、そ
の浮力が減少し、めっき浴と被処理物の接触角が約90
°となってはんだが完全に濡れた状態で浮力が0となっ
たときの時間を参照符T2で示す。T2以後めっき浴が
被処理物表面を上昇し負の浮力がかかり、このときの最
大の・負の浮力を参照符F2で示す。なお、第3図およ
び第6表に比較のための従来の電気はんだの例をあわせ
て示した。
A copper plate of 50 x 5 x 0.3 mm was used as a test piece for evaluation. In Table 6, the object to be treated is immersed in a plating bath,
The buoyancy increases as the immersed volume increases, and the time at which the buoyancy reaches its maximum is indicated by reference numeral 61, and the buoyancy at that time is indicated by reference numeral F1. In addition, the buoyancy is reduced, and the contact angle between the plating bath and the workpiece is approximately 90.
The time when the solder becomes completely wet and the buoyancy becomes 0 is indicated by reference mark T2. After T2, the plating bath rises above the surface of the object to be treated and is subjected to negative buoyancy, and the maximum negative buoyancy at this time is indicated by reference symbol F2. Incidentally, examples of conventional electric solder are also shown in FIG. 3 and Table 6 for comparison.

第  6  表 第6表に示されるように、本発明の浸漬はんだめつき浴
ではFlが小さくF2が大きい。T2も電気はんだ浴と
比較して短い。すなわちぬれ性がよく処理時間がはやく
て、はんだ付性が良好であることがわかる。このように
はんだ付性が良いことから析出しためつきも安定して強
い。
Table 6 As shown in Table 6, in the immersion soldering bath of the present invention, Fl is small and F2 is large. T2 is also shorter compared to an electric solder bath. In other words, it can be seen that the wettability is good, the processing time is quick, and the solderability is good. Because of this good solderability, precipitation buildup is also stable and strong.

第7表に本発明の浸漬はんだめっき浴を用いて電気回路
配線などの微細なパターンを有する銅素材をめっきした
場合の評価結果を示す。
Table 7 shows the evaluation results when copper materials having fine patterns such as electrical circuit wiring were plated using the immersion solder plating bath of the present invention.

比較例1 下記第8表に示す組成で、錫めっき浴を調整した。Comparative example 1 A tin plating bath was prepared with the composition shown in Table 8 below.

また第4図に示すようにウィスカーの発生もなく、光学
顕微鏡写真(1000倍)の第5図に示すように、従来
の無電解錫めつき(第7図)や無電解はんだめつき(第
8図)と比較して錫や鉛粒子が小さく分散されることで
緻密なめつき表面を得ることができた。
Furthermore, as shown in Fig. 4, no whiskers were generated, and as shown in Fig. 5, an optical micrograph (1000x magnification), conventional electroless tinning (Fig. 7) and electroless soldering (Fig. Compared to Fig. 8), the tin and lead particles were dispersed in a smaller size, making it possible to obtain a densely plated surface.

鍋めつきであるためはんだ付性がはんだめっきに比べ悪
く、また電子回路部品等に使用した場合、第6図に示す
ように信頼性に悪影響がでる程度のウィスカー1の発生
があった。
Since it is pot-plated, the solderability is poorer than that of solder plating, and when used for electronic circuit parts, etc., whiskers 1 were generated to the extent that reliability was adversely affected, as shown in FIG.

比較例2 下記第9表に示す組成で、はんだめっき浴を調整した。Comparative example 2 A solder plating bath was prepared with the composition shown in Table 9 below.

(以下余白) 9 fs72%、鉛28%の組成のめつき被膜が得られた。(Margin below) 9 A plated film having a composition of 72% fs and 28% lead was obtained.

この被膜はめつきむらが多く、また、めっき浴冷却時に
チオ尿素錯体の沈澱が非常に多く発生し、めっき浴の野
命も短かった。
This coating had a lot of uneven plating, and a large amount of thiourea complex precipitated when the plating bath was cooled, so the life of the plating bath was short-lived.

発明の効果 以上のように本発明に従えば、表面は平滑であって結晶
粒子は充分に微細であり、膜厚が均一なはんだめっき被
膜を得ることができた。
Effects of the Invention As described above, according to the present invention, a solder plating film with a smooth surface, sufficiently fine crystal grains, and a uniform thickness could be obtained.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の浸漬はんだめっき浴を用いた場合の処
理時間とめっきの膜厚との関係を示す1第2図はめつき
浴の液温と析出する白金組成変化20− の関係を示す図、第3図はメニスコグラフ、第4図は本
発明のめつき浴を用いた場合のウィスカーの発生を示す
図、第5図は本発明のめつき浴を用いた場合のめつき表
面の光学顕微鏡写真、第6図は従来の錫めっきのウィス
カーの発生を示す図、第7図は無電解錫めっきのめつき
表面の光学顕微鏡写真、第8図は先行技術の無電解はん
だめっきのめつき表面の光学顕微鏡写真である。 1・・・ウィスカー
Figure 1 shows the relationship between processing time and plating film thickness when using the immersion solder plating bath of the present invention. Figure 2 shows the relationship between the liquid temperature of the plating bath and the change in the composition of precipitated platinum. Figure 3 is a meniscograph, Figure 4 is a diagram showing the generation of whiskers when the plating bath of the present invention is used, and Figure 5 is the optics of the plated surface when the plating bath of the present invention is used. Micrographs, Figure 6 is a diagram showing the generation of whiskers in conventional tin plating, Figure 7 is an optical micrograph of the plated surface of electroless tin plating, and Figure 8 is a plating of electroless solder plating in the prior art. This is an optical micrograph of the surface. 1... whisker

Claims (1)

【特許請求の範囲】[Claims]  被処理物上にはんだめつき被膜を形成するに当たつて
用いられる浸漬はんだめつき浴において、2価の錫イオ
ンと、2価の鉛イオンと、有機スルホ基と、錯化剤とし
てチオ尿素とチオ尿素誘導体とを含むことを特徴とする
浸漬はんだめつき浴。
In the immersion soldering bath used to form a solder coating on the workpiece, divalent tin ions, divalent lead ions, organic sulfo groups, and complexing agents are used. An immersion soldering bath characterized by containing thiourea and a thiourea derivative.
JP1141874A 1989-05-29 1989-06-02 Immersion solder plating bath Expired - Lifetime JP2815401B2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP1141874A JP2815401B2 (en) 1989-06-02 1989-06-02 Immersion solder plating bath
US07/530,169 US5160422A (en) 1989-05-29 1990-05-29 Bath for immersion plating tin-lead alloys

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1141874A JP2815401B2 (en) 1989-06-02 1989-06-02 Immersion solder plating bath

Publications (2)

Publication Number Publication Date
JPH036357A true JPH036357A (en) 1991-01-11
JP2815401B2 JP2815401B2 (en) 1998-10-27

Family

ID=15302171

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1141874A Expired - Lifetime JP2815401B2 (en) 1989-05-29 1989-06-02 Immersion solder plating bath

Country Status (1)

Country Link
JP (1) JP2815401B2 (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51134334A (en) * 1975-05-06 1976-11-20 Amp Inc Hot dip coating method for tinnlead alloy
JPS5339857A (en) * 1976-09-22 1978-04-12 Siemens Ag Method of making injected domin in substrate

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51134334A (en) * 1975-05-06 1976-11-20 Amp Inc Hot dip coating method for tinnlead alloy
JPS5339857A (en) * 1976-09-22 1978-04-12 Siemens Ag Method of making injected domin in substrate

Also Published As

Publication number Publication date
JP2815401B2 (en) 1998-10-27

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