JPH0365909U - - Google Patents

Info

Publication number
JPH0365909U
JPH0365909U JP12730589U JP12730589U JPH0365909U JP H0365909 U JPH0365909 U JP H0365909U JP 12730589 U JP12730589 U JP 12730589U JP 12730589 U JP12730589 U JP 12730589U JP H0365909 U JPH0365909 U JP H0365909U
Authority
JP
Japan
Prior art keywords
photodiodes
light
measured
displacement measuring
optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12730589U
Other languages
Japanese (ja)
Other versions
JPH084564Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP12730589U priority Critical patent/JPH084564Y2/en
Publication of JPH0365909U publication Critical patent/JPH0365909U/ja
Application granted granted Critical
Publication of JPH084564Y2 publication Critical patent/JPH084564Y2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本考案に係わる光学式変位測定器の信
号処理の一実施例を示す構成図、第2図は第1図
の信号処理を構成するゲイン調整回路の出力信号
を示す図、第3図は第1図の信号処理から得られ
るフオーカスエラー信号を示す図、第4図は本考
案に係わる光学式変位測定器の他の実施例を示す
構成図、第5図は第4図の装置を用いた際のスポ
ツト径と被測定物の変位量の関係を示すシユミレ
ーシヨン図、第6図は第4図の装置から得られる
フオトダイオードの出力信号を示す図、第7図は
第4図の装置から得られるフオーカスエラー信号
を示す図、第8図は従来例の構成図、第9図は第
8図の従来装置から得られるフオトダイオードの
出力信号を示す図、第10図は第8図の従来装置
から得られるフオーカスエラー信号を示す図であ
る。 1……レーザダイオード、2……コリメータレ
ンズ、3……偏光ビームスプリツタ、4……1/4
波長板、5……対物レンズ、6……被測定物、7
……ハーフミラー、10,11……フオトダイオ
ード、12,13……ゲイン調整回路、14……
演算回路、15,16……集光レンズ。
FIG. 1 is a block diagram showing an example of signal processing of an optical displacement measuring instrument according to the present invention, FIG. 2 is a diagram showing an output signal of a gain adjustment circuit that constitutes the signal processing of FIG. 1, and FIG. The figure shows a focus error signal obtained from the signal processing shown in Fig. 1, Fig. 4 is a block diagram showing another embodiment of the optical displacement measuring instrument according to the present invention, and Fig. 5 shows the focus error signal obtained from the signal processing shown in Fig. 4. A simulation diagram showing the relationship between the spot diameter and the amount of displacement of the object to be measured when using the device, FIG. 6 is a diagram showing the output signal of the photodiode obtained from the device in FIG. 4, and FIG. 7 is the diagram shown in FIG. 4. 8 is a diagram showing the configuration of a conventional example, FIG. 9 is a diagram showing a photodiode output signal obtained from the conventional device of FIG. 8, and FIG. FIG. 9 is a diagram showing a focus error signal obtained from the conventional device shown in FIG. 8; 1... Laser diode, 2... Collimator lens, 3... Polarizing beam splitter, 4... 1/4
Wave plate, 5... Objective lens, 6... Measured object, 7
... Half mirror, 10, 11 ... Photodiode, 12, 13 ... Gain adjustment circuit, 14 ...
Arithmetic circuit, 15, 16... condensing lens.

Claims (1)

【実用新案登録請求の範囲】 (1) 対物レンズをフオーカス方向に駆動し被測
定物上に光スポツトを集光しその反射光の光強度
パターンを光検出器で測定し演算処理することに
より被測定物の微小変位を測定する光学式変位測
定器において、 被測定物からの反射光を2方向に分岐する光学
要素と、前記光学要素により分岐された2つの光
をそれぞれ集光する2つの集光レンズと、前記2
つの集光レンズの焦点前後同距離に配置され前記
集光レンズにより集光された光がそれぞれ入射さ
れる2つのフオトダイオードと、前記2つのフオ
トダイオードの検出信号がそれぞれ入力されこの
検出信号の変化の割合を等しくするための2つの
ゲイン調整回路とを設けた構成とし、この2つの
ゲイン調整回路の出力信号の差からフオーカスエ
ラー信号を得るようにしたことを特徴とする光学
式変位測定器。 (2) 前記2つの集光レンズを検出信号の変化の
割合を等しくするための焦点距離の異なる集光レ
ンズとし、この集光レンズにより集光された光が
それぞれ入射される2つのフオトダイオードを前
記2つの集光レンズの焦点前後かつ前記フオトダ
イオードの直径とフオトダイオード上のスポツト
径が等しくなる距離に配置した構成とし、この2
つのフオトダイオードの検出信号の差からフオー
カスエラー信号を得るようにしたことを特徴とす
る光学式変位測定器。
[Claims for Utility Model Registration] (1) The objective lens is driven in the focus direction to focus a light spot on the object to be measured, and the light intensity pattern of the reflected light is measured with a photodetector and processed by calculation. An optical displacement measuring instrument that measures minute displacements of a measured object includes an optical element that branches reflected light from the measured object into two directions, and two condensers that respectively collect the two lights split by the optical element. optical lens, and the above-mentioned 2
Two photodiodes are arranged at the same distance before and after the focal point of one condensing lens, and the light condensed by the condensing lens is incident on the two photodiodes, and the detection signals of the two photodiodes are respectively inputted, and the change in the detection signal is performed. An optical displacement measuring device characterized in that it has a configuration in which two gain adjustment circuits are provided to equalize the ratio of . (2) The two condensing lenses have different focal lengths to equalize the rate of change in the detection signal, and the two photodiodes each receive the light condensed by the condensing lenses. The two condenser lenses are arranged at a distance before and after the focal point and at a distance where the diameter of the photodiode and the spot diameter on the photodiode are equal.
An optical displacement measuring device characterized in that a focus error signal is obtained from the difference between detection signals of two photodiodes.
JP12730589U 1989-10-31 1989-10-31 Optical displacement measuring instrument Expired - Fee Related JPH084564Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12730589U JPH084564Y2 (en) 1989-10-31 1989-10-31 Optical displacement measuring instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12730589U JPH084564Y2 (en) 1989-10-31 1989-10-31 Optical displacement measuring instrument

Publications (2)

Publication Number Publication Date
JPH0365909U true JPH0365909U (en) 1991-06-26
JPH084564Y2 JPH084564Y2 (en) 1996-02-07

Family

ID=31675065

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12730589U Expired - Fee Related JPH084564Y2 (en) 1989-10-31 1989-10-31 Optical displacement measuring instrument

Country Status (1)

Country Link
JP (1) JPH084564Y2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06194125A (en) * 1992-10-05 1994-07-15 Carl Zeiss:Fa Method and apparatus for detecting displacement or position change of object from focus of objective lens

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06194125A (en) * 1992-10-05 1994-07-15 Carl Zeiss:Fa Method and apparatus for detecting displacement or position change of object from focus of objective lens

Also Published As

Publication number Publication date
JPH084564Y2 (en) 1996-02-07

Similar Documents

Publication Publication Date Title
JPH05256647A (en) Inclination measuring device
EP0458354B1 (en) A compact reticle/wafer alignment system
CN100405016C (en) Hartmann Wavefront Sensor for Human Eye Aberration Based on Microprism Array
SU1382410A3 (en) Optical sensor with objective lens automatic control system
JPH0365909U (en)
JPH02110813U (en)
JPS6153510A (en) position sensing device
JPS6370110A (en) distance measuring device
JP2544447B2 (en) Depth measuring method and device
JP3112095B2 (en) Eye axis length measuring device
JP2507394B2 (en) Ranging device
JP3204726B2 (en) Edge sensor
JP2593727Y2 (en) Displacement detector
JPH02110814U (en)
JPH07182665A (en) Optical pickup system
SU1241062A1 (en) Laser meter of linear shifts of surface
JP2593726Y2 (en) Displacement detector
JPH0610327Y2 (en) Laser light fiber input device
JPS6236502A (en) Microcsope for measuring minute displacement
JPS63172905A (en) Method and device for separating diffracted light
JPH11264928A (en) Focusing device
JPS57113342A (en) Eccentricity measurement
SU1157349A2 (en) Device for checking optical cat's eyes
JPH0634319A (en) Optical displacement detecting method and apparatus
JPH0486514A (en) Optical displacement meter

Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees