JPH0367455U - - Google Patents

Info

Publication number
JPH0367455U
JPH0367455U JP12963789U JP12963789U JPH0367455U JP H0367455 U JPH0367455 U JP H0367455U JP 12963789 U JP12963789 U JP 12963789U JP 12963789 U JP12963789 U JP 12963789U JP H0367455 U JPH0367455 U JP H0367455U
Authority
JP
Japan
Prior art keywords
thin film
film resistor
integrated circuit
thickness
semiconductor integrated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12963789U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP12963789U priority Critical patent/JPH0367455U/ja
Publication of JPH0367455U publication Critical patent/JPH0367455U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Bipolar Integrated Circuits (AREA)
  • Bipolar Transistors (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の一実施例としての処理工程の
説明図、第2図は第1図に対応する従来の説明図
である。 1……バイポーラ集積回路、2……シリコン酸
化膜、3……高抵抗薄膜、4……誘電体膜、5…
…アルミ配線膜。
FIG. 1 is an explanatory diagram of the processing steps as an embodiment of the present invention, and FIG. 2 is a conventional explanatory diagram corresponding to FIG. 1. 1...Bipolar integrated circuit, 2...Silicon oxide film, 3...High resistance thin film, 4...Dielectric film, 5...
...Aluminum wiring film.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] シリンコン半導体集積回路上に高抵抗の薄膜抵
抗を備え、この薄膜抵抗の表面がこの薄膜抵抗の
厚さの5倍以下の誘電体の薄膜により保護され、
この保護の次の工程でアルミ配線薄膜が付加され
ることを特徴とする半導体集積回路装置。
A high-resistance thin film resistor is provided on a silicon semiconductor integrated circuit, and the surface of the thin film resistor is protected by a dielectric thin film having a thickness of five times or less than the thickness of the thin film resistor,
A semiconductor integrated circuit device characterized in that an aluminum wiring thin film is added in the next step of this protection.
JP12963789U 1989-11-06 1989-11-06 Pending JPH0367455U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12963789U JPH0367455U (en) 1989-11-06 1989-11-06

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12963789U JPH0367455U (en) 1989-11-06 1989-11-06

Publications (1)

Publication Number Publication Date
JPH0367455U true JPH0367455U (en) 1991-07-01

Family

ID=31677253

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12963789U Pending JPH0367455U (en) 1989-11-06 1989-11-06

Country Status (1)

Country Link
JP (1) JPH0367455U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011119780A (en) * 2011-03-25 2011-06-16 Mitsumi Electric Co Ltd Semiconductor device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011119780A (en) * 2011-03-25 2011-06-16 Mitsumi Electric Co Ltd Semiconductor device

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