JPH0372377U - - Google Patents

Info

Publication number
JPH0372377U
JPH0372377U JP13324589U JP13324589U JPH0372377U JP H0372377 U JPH0372377 U JP H0372377U JP 13324589 U JP13324589 U JP 13324589U JP 13324589 U JP13324589 U JP 13324589U JP H0372377 U JPH0372377 U JP H0372377U
Authority
JP
Japan
Prior art keywords
semiconductor device
pole
contactor
pedestal
ejector plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13324589U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP13324589U priority Critical patent/JPH0372377U/ja
Publication of JPH0372377U publication Critical patent/JPH0372377U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本考案の一実施例を示す半導体装置検
査用コンタクタの側面図、第2図は従来の一例を
示す半導体装置検査用コンタクタの平面図及び側
面図である。 1……IC、1a……リード、2,2a……台
座、3……位置決めこま、3a,5……コンタク
ト、4,4a……位置決めピン、6……ポール、
7……コイルスプリング、8……ヘツダ、9……
プツシユピン、10……コイルスプリング、11
……エジエクタ板。
FIG. 1 is a side view of a contactor for testing semiconductor devices showing an embodiment of the present invention, and FIG. 2 is a plan view and a side view of a contactor for testing semiconductor devices showing a conventional example. 1...IC, 1a...Lead, 2, 2a...Pedestal, 3...Positioning piece, 3a, 5...Contact, 4, 4a...Positioning pin, 6...Pole,
7... Coil spring, 8... Header, 9...
Push pin, 10...Coil spring, 11
...Ejiekta board.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 半導体装置のリードと接触する複数のコンタク
ト及び前記半導体装置を位置決めする位置決めピ
ンが取り付けられた台座と、この台座に埋め込ま
れたポールと、このポールの外周囲に挿入された
コイルスプリグと、このコイルスプリグを下敷き
にし、前記ポールに上下摺動するとともに前記半
導体装置を搭載するエジエクタ板と、このエジエ
クタ板の上に前記半導体装置を間において配置さ
れるとともに前記半導体装置の外郭体を押えるヘ
ツダと、このヘツダの下面に突出したり、引込ん
だりするようにスプリングを介して取り付けられ
る前記リードを前記コンタクトに押し付けるプツ
シユピンとを備えることを特徴とする半導体装置
検査用コンタクタ。
A pedestal to which a plurality of contacts contacting leads of a semiconductor device and positioning pins for positioning the semiconductor device are attached, a pole embedded in the pedestal, a coil sprig inserted around the outer periphery of the pole, and the coil sprig. an ejector plate that is placed under the semiconductor device and slides up and down on the pole and mounts the semiconductor device; a header that is placed on the ejector plate with the semiconductor device therebetween and presses down the outer body of the semiconductor device; A contactor for testing a semiconductor device, comprising: a push pin that is attached via a spring so as to protrude or retract from the lower surface of the contactor, and presses the lead against the contact.
JP13324589U 1989-11-15 1989-11-15 Pending JPH0372377U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13324589U JPH0372377U (en) 1989-11-15 1989-11-15

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13324589U JPH0372377U (en) 1989-11-15 1989-11-15

Publications (1)

Publication Number Publication Date
JPH0372377U true JPH0372377U (en) 1991-07-22

Family

ID=31680655

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13324589U Pending JPH0372377U (en) 1989-11-15 1989-11-15

Country Status (1)

Country Link
JP (1) JPH0372377U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012202843A (en) * 2011-03-25 2012-10-22 Renesas Electronics Corp Semiconductor device manufacturing method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012202843A (en) * 2011-03-25 2012-10-22 Renesas Electronics Corp Semiconductor device manufacturing method

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