JPH0374368U - - Google Patents

Info

Publication number
JPH0374368U
JPH0374368U JP13615889U JP13615889U JPH0374368U JP H0374368 U JPH0374368 U JP H0374368U JP 13615889 U JP13615889 U JP 13615889U JP 13615889 U JP13615889 U JP 13615889U JP H0374368 U JPH0374368 U JP H0374368U
Authority
JP
Japan
Prior art keywords
semiconductor device
optical semiconductor
holder
terminal
contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13615889U
Other languages
English (en)
Other versions
JPH086303Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP13615889U priority Critical patent/JPH086303Y2/ja
Publication of JPH0374368U publication Critical patent/JPH0374368U/ja
Application granted granted Critical
Publication of JPH086303Y2 publication Critical patent/JPH086303Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Description

【図面の簡単な説明】
第１図は本考案光半導体装置測定装置の一つの
実施例を示す断面図、第２図は第１の従来例を示
す断面図、第３図は第２の従来例を示す断面図で
ある。 符号の説明、５……測子、６……測定回路、８
……光フアイバー、９……光半導体装置ホルダ、
１０……光半導体装置、１２……端子。

Claims (1)

  1. 【実用新案登録請求の範囲】 被測定光半導体装置をホールドするホルダが該
    光半導体装置と光結合した光フアイバーと一体に
    移動するようにされ、 上記ホルダによつて上記光半導体装置が移動せ
    しめられた時その端子がコンタクトピンと接触せ
    しめられて測定回路系に電気的に接続されるよう
    にしてなる ことを特徴とする光半導体装置測定装置。
JP13615889U 1989-11-22 1989-11-22 光半導体装置測定装置 Expired - Lifetime JPH086303Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13615889U JPH086303Y2 (ja) 1989-11-22 1989-11-22 光半導体装置測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13615889U JPH086303Y2 (ja) 1989-11-22 1989-11-22 光半導体装置測定装置

Publications (2)

Publication Number Publication Date
JPH0374368U true JPH0374368U (ja) 1991-07-25
JPH086303Y2 JPH086303Y2 (ja) 1996-02-21

Family

ID=31683382

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13615889U Expired - Lifetime JPH086303Y2 (ja) 1989-11-22 1989-11-22 光半導体装置測定装置

Country Status (1)

Country Link
JP (1) JPH086303Y2 (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012037350A (ja) * 2010-08-06 2012-02-23 Advantest Corp デバイスインターフェイス装置および試験装置
WO2016072264A1 (ja) * 2014-11-06 2016-05-12 オムロン株式会社 端子固定装置および端子固定方法
JP2021096217A (ja) * 2019-12-18 2021-06-24 余芳▲くん▼ 光センサー性能測定器

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012037350A (ja) * 2010-08-06 2012-02-23 Advantest Corp デバイスインターフェイス装置および試験装置
WO2016072264A1 (ja) * 2014-11-06 2016-05-12 オムロン株式会社 端子固定装置および端子固定方法
JP2016090423A (ja) * 2014-11-06 2016-05-23 オムロン株式会社 端子固定装置および端子固定方法
JP2021096217A (ja) * 2019-12-18 2021-06-24 余芳▲くん▼ 光センサー性能測定器

Also Published As

Publication number Publication date
JPH086303Y2 (ja) 1996-02-21

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term