JPH037621B2 - - Google Patents
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- Publication number
- JPH037621B2 JPH037621B2 JP57105919A JP10591982A JPH037621B2 JP H037621 B2 JPH037621 B2 JP H037621B2 JP 57105919 A JP57105919 A JP 57105919A JP 10591982 A JP10591982 A JP 10591982A JP H037621 B2 JPH037621 B2 JP H037621B2
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- Prior art keywords
- dielectric constant
- sample
- ceramic
- parts
- high dielectric
- Prior art date
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Description
本発明はチタン酸バリウム(BaTiO3)を主体
とする高誘電率で静電容量の温度特性が良好で、
かつ緻密なセラミツク構造を有する高誘電率磁器
組成物に関するものである。
従来より磁器コンデンサの組成物とし、チタン
酸バリウムを主体とするものが数多く知られてい
る。チタン酸バリウムは周知のように強誘電性を
有する特異な物質で、高温では立方晶系のペロブ
スカイド型の構造を有し、120℃以下ではC軸が
僅かに伸びて正方晶となり、さらに0℃付近で斜
方晶、−80℃付近で菱面体晶へと変化する。上記
12℃付近の相転移点をキユーリー点というが、こ
の点を境にそれより高温で常誘電性を示し、低温
では強誘電性を示す。そして、このキユーリー点
において、誘電率が6000〜7000と極めて高い値を
示す。ここで、チタン酸バリウムだけでは常温で
高誘電率とはなり得ない。チタン酸バリウムのキ
ユーリー点付近の高誘電率を低温側に移動させる
ことにより、常温付近で適当な静電容量を有する
コンデンサを実用化することは従来より数多く行
われている。そして、誘電率のピーク値のあらわ
れる温度を移動させる誘加剤はシフターと呼ば
れ、BaSnO3,CaZrO3,BaZrO3,CaSnO3が一
般的に知られ、これらシフターを利用しチタン酸
バリウム系磁器コンデンサは単板型リード線付き
タイプのものとして利用されてきた。しかしなが
ら、最近積層チツプ技術が進歩し、30〜100μm程
度の誘電体シートが容易に得られ、この薄膜を挾
持する形で幾層も積層したいわゆる積層セラミツ
クチツプコンデンサが種々のエレクトロニクス業
界に進出してきおり、従来の誘電体磁器組成物を
このような積層用薄膜誘電体とし利用されること
が多くなつてきた。しかしながら、従来の単板型
コンデンサでは誘電体の厚みが100〜10000μmと
厚いが、積層セラミツクチツプコンデンサでは20
〜50μmと薄いため5〜10倍以上の電界強度を受
ける。したがつて、従来の単板型コンデンサに比
較して電圧依存性の小さい組物が要求されてい
る。また、誘電体層が薄くなるにしがつてセラミ
ツクの構造的な欠陥が特性に出やすくなるので、
結晶粒子が均一でかつ微細であることと、空孔が
少なくかつ小さいことが要求される。
本発明はこの目的を達成するために種々の実験
を重ねた結果、BaTiO3に対してBaZrO3、CeO2,
TiO2を添加させてなる高誘電率磁器組成物を提
供するに至つたものである。さらに、好適な実施
態様としてMn,Cr,Fe,Ni,Coの酸化物のう
ち少なくとも1種を主成分に対して0.01〜0.5wt
%含有してなる高誘電率磁器組成物を提供するも
のである。
以下、本発明を実施例とともに説明する。
実施例
BaTiO3(純度98%)100モル重量部に対して、
各種添加物(但し、CeO2及びTiO2を〔Ce〕/
〔Ti〕2/3の割合)を加えてボールミルにて十分
に混合し、30メツシユのふるいを通過させ造粒す
る。この造粒粉を13mmの内径の金型で圧力1ton/
cm2をかけ直径13mm、厚さ0.5mmの形状の成型体を
作製する。これらの成型体を1250〜1400℃で1〜
2時間焼成する。この後、円板の焼結体の両面に
銀電極を設ける。下記の第1表及び第2表は各種
添加物組成に対して得られた焼結体の特性を示
す。表中のGはグレインサイズ、Pはポアサイ
ズ、ε25は25℃で1KHz、AC1Vにて測定した静電
容量より求めた誘電率,tanδはこのときの誘電損
失を示す。また、1RはDC50Vで測定した時の体
積固有抵抗、BDVは昇圧破壊電圧、TCは25℃を
基準とし静電容量の10℃及び85℃における変化率
を示す。AC−Tは30V/mm当りAC電圧下1KHz
に測定したtanδの値を示す。
The present invention is mainly made of barium titanate (BaTiO 3 ), which has a high dielectric constant and good temperature characteristics of capacitance.
The present invention also relates to a high dielectric constant ceramic composition having a dense ceramic structure. Many ceramic capacitor compositions based on barium titanate have been known. As is well known, barium titanate is a unique substance with ferroelectric properties.At high temperatures, it has a cubic perovskite structure.At temperatures below 120°C, the C-axis slightly stretches to become a tetragonal structure, and further below 120°C, it becomes a tetragonal structure. It changes to orthorhombic crystal at around -80℃ and to rhombohedral crystal at around -80℃. the above
The phase transition point around 12°C is called the Curie point, and beyond this point it exhibits paraelectricity at higher temperatures and ferroelectricity at lower temperatures. At this Curie point, the dielectric constant exhibits an extremely high value of 6000 to 7000. Here, barium titanate alone cannot provide a high dielectric constant at room temperature. Conventionally, many attempts have been made to commercialize capacitors that have an appropriate capacitance near room temperature by moving the high dielectric constant of barium titanate near the Curie point to a lower temperature side. The dielectric agent that shifts the temperature at which the peak value of the dielectric constant appears is called a shifter, and BaSnO 3 , CaZrO 3 , BaZrO 3 , and CaSnO 3 are commonly known. Capacitors have been used as single-plate type with lead wires. However, with the recent advances in laminated chip technology, dielectric sheets of about 30 to 100 μm can be easily obtained, and so-called laminated ceramic chip capacitors, which are made by laminating many layers with these thin films sandwiched between them, have entered various electronics industries. Increasingly, conventional dielectric ceramic compositions are being used as such laminated thin film dielectrics. However, in conventional single-plate capacitors, the dielectric thickness is as thick as 100 to 10,000 μm, while in multilayer ceramic chip capacitors, the thickness is 20 to 10,000 μm.
Because it is thin at ~50 μm, it receives an electric field strength of 5 to 10 times more. Therefore, there is a need for a composite that has less voltage dependence than conventional single-plate capacitors. Additionally, as the dielectric layer becomes thinner, structural defects in the ceramic become more likely to appear in the characteristics.
It is required that the crystal grains be uniform and fine, and that the pores be small and small. As a result of repeated various experiments to achieve this objective, the present invention has developed a combination of BaZrO 3 , CeO 2 , BaZrO 3 and BaTiO 3 .
The present invention has led to the provision of a high dielectric constant ceramic composition to which TiO 2 is added. Furthermore, in a preferred embodiment, at least one of oxides of Mn, Cr, Fe, Ni, and Co is added in an amount of 0.01 to 0.5 wt based on the main component.
% of the high dielectric constant ceramic composition. The present invention will be explained below along with examples. Example For 100 molar parts of BaTiO 3 (purity 98%),
Various additives (however, CeO 2 and TiO 2 [Ce]/
Add [Ti] (2/3 ratio), mix thoroughly in a ball mill, and pass through a 30-mesh sieve to granulate. This granulated powder is placed in a mold with an inner diameter of 13 mm at a pressure of 1 ton/
Multiply cm 2 to produce a molded body with a diameter of 13 mm and a thickness of 0.5 mm. These molded bodies are heated at 1250 to 1400℃ for 1~
Bake for 2 hours. After this, silver electrodes are provided on both sides of the sintered body of the disk. Tables 1 and 2 below show the properties of the sintered bodies obtained for various additive compositions. In the table, G is the grain size, P is the pore size, ε 25 is the dielectric constant determined from the capacitance measured at 25° C., 1 KHz, and AC 1 V, and tan δ is the dielectric loss at this time. In addition, 1R is the volume resistivity when measured at DC50V, BDV is the boost breakdown voltage, and TC is the rate of change in capacitance at 10°C and 85°C with 25°C as the reference. AC-T is 1KHz under AC voltage per 30V/mm
The value of tanδ measured in is shown.
【表】【table】
【表】【table】
【表】
上記表から明らかなように、本発明の高誘電率
磁器組成物はEIA規格のZ5U特性(+1℃〜+85
℃の温度範囲で+22%〜−56%の規格内の静電容
量の変化)として利用できることがわかる。ま
た、誘電率が大きく、AC電圧特性30V/mm下の
tanδが小さく、かつセラミツクの微細構造が小さ
く均一であることが認められる。従来のBaTiO3
−BaSnO3−CaTiO3−MnO3系等の磁器組成物と
比較して、セラミツクの物理的特性及び電気的特
性において良好なセラミツク磁器組物が得られ
た。
しかしながら、第1表に示すごとく
BaTiO3100モル部に対してxを6以上とすると、
試料No.1、試料No.2のようにTcすなわち静電容
量の温度変化率が大きくなりすぎてしまい、前述
のEIA規格のZ5U特性を満足できなくなり、xが
3未満ではキユリー点が常温付近までシフトされ
ず、試料No.12、試料No.13のように常温における誘
電率(ε25)が小さくtanδが大きくなつてしまう。
また、BaZrO3が1モル部より小さくてもキユリ
ー点のシフトが不充分となり、室温における誘電
率(ε25)が小さくtanδが大きいものとなつてし
まい(試料No.8、試料No.11)、4モル部より多い
と焼成体の焼結性が悪くなる(試料No.5、試料No.
9)。
さらに、第2表より、Mn,Cr,Fe,Ni,Co
の酸化物のうちの少なくとも一種を主成分に対し
0.01wt%以上微量添加することにより、添加しな
い試料No.14に比べ、30V/mm当りAC電圧下1KHz
におけるtanδ値を示すAC電圧特性(AC−T)を
向上させる、すなわちtanδを小さくする効果があ
ることがわかるが、上記酸化物の添加量が0.5wt
%を超えると、室温における誘電率(ε25)が大
幅に低下してしまう(試料No.17、試料No.29)、グ
レインサイズG、ポアサイズPが大きくなりすぎ
る(試料No.20、試料No.23)、静電容量の温度変化
率TCが大きくなつてしまう(試料No.26)等、コ
ンデンサとして適さないものとなる。
従つて、以上のことから、BaTiO3100モル部
に対し、CeO2およびTiO2それぞれが2/3xモル
部およびxモル部(ただし3≦x<6)、
BaZrO34〜1モル部とすることが適当であり、
さらに好ましくは、Mn,Cr,Fe,Ni,Coの酸
化物のうち少なくとも一種を主成分に対し0.01〜
0.5wt%微量添加することで、物理的特性および
電気的特性に良好な高誘電率磁器組成物を得るこ
とができるものである。
第1表の試料No.6の組成物を使用し図のような
積層セラミツクコンデンサを試作し、特性を調べ
た結果を下記の第3表に示す。第3表は
BaTiO3100重量部に対して、CaZrO311重量部、
BaSnO36重量部、CaTiO38重量部、MnO20.2重
量部添加してなる従来の代表的な組成物を用いて
試作したコンデンサの特性を合せて示している。
この場合の素体形状は3.07×1.56×0.56mmであ
る。尚、図において、1は試料No.6の組成物から
なる磁器誘電体、2はパラジウム電極、3は端子
電極(Ag電極)である。また、第3表でC及び
tanδは1KHz、AC1Vで測定した値である。IReは
DC50Vで測定し絶縁抵抗値、BDVeは昇圧破壊
電圧値である。また、抵抗力は2.5mmのスパンで
素体を支持し、素体中央部を0.5mm巾のナイフで
押えたときの素子破壊直前の圧力である。[Table] As is clear from the above table, the high dielectric constant ceramic composition of the present invention has the EIA standard Z5U characteristics (+1℃~+85℃
It can be seen that it can be used as a capacitance change within the standard of +22% to -56% in the temperature range of °C. In addition, it has a large dielectric constant and has an AC voltage characteristic of 30V/mm or less.
It is observed that tan δ is small and the fine structure of the ceramic is small and uniform. Conventional BaTiO3
A ceramic porcelain assembly with better physical and electrical properties than ceramic compositions such as -BaSnO 3 -CaTiO 3 -MnO 3 was obtained. However, as shown in Table 1,
When x is 6 or more for 100 mol parts of BaTiO 3 ,
As in Sample No. 1 and Sample No. 2, the temperature change rate of Tc, that is, the capacitance, becomes too large, making it impossible to satisfy the Z5U characteristics of the EIA standard mentioned above, and when x is less than 3, the Curie point is near room temperature. However, as in Sample No. 12 and Sample No. 13, the dielectric constant (ε 25 ) at room temperature is small and tan δ becomes large.
Furthermore, even if BaZrO 3 is less than 1 mole part, the shift of the Curie point is insufficient, resulting in a small dielectric constant (ε 25 ) and a large tan δ at room temperature (Sample No. 8, Sample No. 11). If the amount exceeds 4 mole parts, the sinterability of the fired body will deteriorate (Sample No. 5, Sample No.
9). Furthermore, from Table 2, Mn, Cr, Fe, Ni, Co
at least one of the oxides of
By adding a trace amount of 0.01wt% or more, the AC voltage at 1KHz per 30V/mm was lower than that of sample No. 14 without addition.
It can be seen that there is an effect of improving the AC voltage characteristic (AC-T) indicating the tan δ value at
%, the dielectric constant (ε 25 ) at room temperature will decrease significantly (Sample No. 17, Sample No. 29), and the grain size G and pore size P will become too large (Sample No. 20, Sample No. .23), the temperature change rate TC of capacitance becomes large (Sample No. 26), making it unsuitable as a capacitor. Therefore, from the above, for 100 mol parts of BaTiO 3 , CeO 2 and TiO 2 are respectively 2/3x mol parts and x mol parts (3≦x<6),
It is appropriate to set BaZrO 3 to 4 to 1 mole part,
More preferably, at least one of the oxides of Mn, Cr, Fe, Ni, and Co is added to the main component by 0.01 to
By adding a trace amount of 0.5 wt%, a high dielectric constant ceramic composition with good physical and electrical properties can be obtained. A multilayer ceramic capacitor as shown in the figure was prototyped using the composition of sample No. 6 in Table 1, and the characteristics were investigated. The results are shown in Table 3 below. Table 3 is
11 parts by weight of CaZrO 3 for 100 parts by weight of BaTiO 3 ;
It also shows the characteristics of a capacitor prototyped using a typical conventional composition containing 6 parts by weight of BaSnO 3 , 8 parts by weight of CaTiO 3 , and 0.2 parts by weight of MnO 2 . The element shape in this case is 3.07 x 1.56 x 0.56 mm. In the figure, 1 is a ceramic dielectric made of the composition of sample No. 6, 2 is a palladium electrode, and 3 is a terminal electrode (Ag electrode). Also, in Table 3, C and
tanδ is a value measured at 1KHz and AC1V. IRe is
The insulation resistance value is measured at DC50V, and BDVe is the boost breakdown voltage value. The resistance force is the pressure just before the element breaks when the element is supported with a span of 2.5 mm and the center of the element is pressed with a 0.5 mm wide knife.
【表】
上記第3表からも明らかなように本発明の試料
No.6で試作したコンデンサは、従来よりtanδ、破
壊電圧、抗折力がはるかに優れていることが判明
した。
以上述べたことから本発明の組物は、グレイン
が細かくポアが少なく、小さい緻密なセラミツク
が得られ高誘電率であり、静電容量の温度特性が
EIA規格Z5U特性を満足する磁器コンデンサとし
て、とりわけ積層セラミツクコンデンサとしての
用途に供することができる。そして、従来の約2
倍の破壊電圧値を有するため、積層セラミツクコ
ンデンサでは誘電体厚みを従来の1/3程度まで薄
くすることが可能であり、静電容量の取得範囲を
従来と同じ厚みでその3倍まで拡大することがで
きるといつた特徴を有している特、産業的価値は
極めて高い。[Table] As is clear from Table 3 above, the samples of the present invention
It was found that the prototype capacitor No. 6 had much better tan δ, breakdown voltage, and transverse rupture strength than the conventional capacitor. From the above, the braid of the present invention has fine grains, few pores, small, dense ceramics, high dielectric constant, and temperature characteristics of capacitance.
It can be used as a ceramic capacitor that satisfies EIA standard Z5U characteristics, especially as a multilayer ceramic capacitor. And about 2
Because it has twice the breakdown voltage value, the dielectric thickness of multilayer ceramic capacitors can be reduced to about 1/3 of that of conventional capacitors, expanding the range of capacitance acquisition to three times that of conventional capacitors. It has extremely high industrial value as it has the characteristics of being able to
図は本発明の組成物を用いて試作した積層セラ
ミツクコンデンサを示す一部断面正面図である。
1……磁器誘電体、2……パラジウム電極、3
……端子電極。
The figure is a partially sectional front view showing a multilayer ceramic capacitor prototyped using the composition of the present invention. 1...Porcelain dielectric, 2...Palladium electrode, 3
...Terminal electrode.
Claims (1)
酸化セリウム(CeO2)および酸化チタン
(TiO2)それぞれが2/3xモル部およびxモル部
(ただし3≦x<6)、ジルコン酸バリウム
(BaZrO3)1〜4モル部からなる高誘電率磁器
組成物。 2 Mn,Cr,Fe,Ni,Coの酸化物のうち少な
くとも一種を主成分に対して0.01〜0.5wt%含有
させてなる特許請求の範囲第1項記載の高誘電率
磁器組成物。[Claims] 1 100 mol parts of barium titanate (BaTiO 3 ),
High dielectric constant consisting of 2/3x molar parts and x molar parts (3≦x<6) of cerium oxide (CeO 2 ) and titanium oxide (TiO 2 ), respectively, and 1 to 4 molar parts of barium zirconate (BaZrO 3 ). Porcelain composition. 2. The high dielectric constant ceramic composition according to claim 1, which contains at least one of oxides of Mn, Cr, Fe, Ni, and Co in an amount of 0.01 to 0.5 wt% based on the main component.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57105919A JPS58223669A (en) | 1982-06-18 | 1982-06-18 | High dielectric constant ceramic composition |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57105919A JPS58223669A (en) | 1982-06-18 | 1982-06-18 | High dielectric constant ceramic composition |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58223669A JPS58223669A (en) | 1983-12-26 |
| JPH037621B2 true JPH037621B2 (en) | 1991-02-04 |
Family
ID=14420267
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57105919A Granted JPS58223669A (en) | 1982-06-18 | 1982-06-18 | High dielectric constant ceramic composition |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58223669A (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0534378B1 (en) * | 1991-09-25 | 1996-03-27 | Murata Manufacturing Co., Ltd. | Non-reducible dielectric ceramic composition |
| JP6091881B2 (en) * | 2012-03-19 | 2017-03-08 | セイコーインスツル株式会社 | Method for producing BaTi2O5 composite oxide |
-
1982
- 1982-06-18 JP JP57105919A patent/JPS58223669A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS58223669A (en) | 1983-12-26 |
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