JPH0377347A - Method for aligning facet of wafer - Google Patents

Method for aligning facet of wafer

Info

Publication number
JPH0377347A
JPH0377347A JP1213648A JP21364889A JPH0377347A JP H0377347 A JPH0377347 A JP H0377347A JP 1213648 A JP1213648 A JP 1213648A JP 21364889 A JP21364889 A JP 21364889A JP H0377347 A JPH0377347 A JP H0377347A
Authority
JP
Japan
Prior art keywords
roller
wafer
facets
facet
wafer cassette
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1213648A
Other languages
Japanese (ja)
Inventor
Masaaki Sadamori
貞森 将昭
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP1213648A priority Critical patent/JPH0377347A/en
Publication of JPH0377347A publication Critical patent/JPH0377347A/en
Pending legal-status Critical Current

Links

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  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

PURPOSE:To execute a whole cleaning operation by using a cleaning chemical, to be of a solid structure and to enhance a production efficiency by a method wherein a first roller and a second roller are arranged in the same casing and the second roller is situated in a position which is somewhat higher than that of the first roller. CONSTITUTION:A first roller 21 and a second roller 22 are attached detachably in a casing 10; a bearing 10a for the first roller 21 is situated in a casing position which is somewhat lower than that of a bearing 10b for the second roller 22. When a wafer cassette 5 whose facets 6a are irregular is placed on the side of the first roller 21 and the roller 21 is turned, individual wafers 6 are turned inside comb-shaped thin sheets 5a and 5b. When the facets 6a come to the first roller, they are arranged downward. When the facets 6a are arranged, the wafer cassette 5 is moved to the side of the second roller 22 and the second roller 22 is turned. When the facets 6a have reached a desired position, their turning operation is stopped. In this manner, the facets can be aligned freely.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は半導体ウェハに設けられたファセットを揃える
為の方法に関する。
DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a method for aligning facets provided on a semiconductor wafer.

〔従来の技術〕[Conventional technology]

第3−A図及び第313図は従来のファセットアライメ
ント方法を示す断面図で、(1)はファセットアライナ
筐体、(2)は円柱状のローラで筐体(1)中央の軸受
け(Ia)lこはめられて手又はモータにより回転する
様になっている。(3)はフロート板でコイルバネ(4
a)、(4b)、(4C)及び(4d)と本図面の裏側
方向に同様に(4e)、(4,f)−(4g)及び(4
h)があって、これら1こ支えられている。
Figures 3-A and 313 are cross-sectional views showing the conventional facet alignment method, in which (1) is the facet aligner housing, (2) is a cylindrical roller that connects the housing (1) to the central bearing (Ia). It is fitted and rotated by hand or by a motor. (3) is a float plate with a coil spring (4
a), (4b), (4C) and (4d) and (4e), (4,f)-(4g) and (4g) in the same way towards the back side of this drawing.
h), and one of these is supported.

(5)はウェハカセットで、半導体ウェハ(6)を等間
隔(ご設けた櫛形溝板(5a)及び(5b)Iご多数枚
保持する様1こなっており、それぞれバー(5C)で一
定間隔に固定されている。
(5) is a wafer cassette, which holds a large number of semiconductor wafers (6) at equal intervals (provided with comb-shaped groove plates (5a) and (5b) I), each of which is fixed by a bar (5C). The interval is fixed.

さて、半導体デバイスを製造する上で半導体ウェハ1こ
所定回路パターンを焼きっけたり、個々のテハイスにウ
ェハを分断するためには半導体ウェハに何らかの位置決
め部分が不可欠であり、通常は半導体ウェハの結晶方位
を考慮した位置fこ切り欠き部、即ちノアセット(6a
)を1乃至2箇所設けるが、製造工程の凡ゆる所でこの
ファセット・を一定方向に揃える必要がある。
Now, in manufacturing semiconductor devices, in order to burn a predetermined circuit pattern on a semiconductor wafer or to divide the wafer into individual chips, some sort of positioning part is essential for the semiconductor wafer, and usually the semiconductor wafer is crystallized. The notch at the position f in consideration of the direction, that is, the Noah set (6a
) are provided at one or two locations, but it is necessary to align these facets in a certain direction throughout the manufacturing process.

従来のファセットアライナはまず第3−A図ω如くフロ
ート板(3)を上限の位置に保ってウェハカセット(5
)を載置し、ローラー(2)を任意の方向に回転する。
The conventional facet aligner first maintains the float plate (3) at the upper limit position as shown in Figure 3-A, and then moves the wafer cassette (5).
) and rotate the roller (2) in any direction.

すると7γセツト(6a)が下限に来た位置で今よハ(
6)はローラー(2)との摩擦力を失ない櫛形溝の下端
に引っ掛って所謂下向きのファセットアライメントが出
来る。
Then, at the position where 7γ set (6a) has reached the lower limit, now
6) is caught on the lower end of the comb-shaped groove that does not lose its frictional force with the roller (2), thereby achieving so-called downward facet alignment.

次にウェハカセット(5)を下方に押し下げるとフリー
ト板(3)が下降し、ファセット(6a)とローラー(
2)との摩擦が回復し、この状態でローラーを回転する
とファセット(6a)は横又は上方に揃えることが出来
る。
Next, when the wafer cassette (5) is pushed down, the fleet plate (3) is lowered, and the facets (6a) and rollers (
When the friction with 2) is restored and the roller is rotated in this state, the facets (6a) can be aligned laterally or upwardly.

[発明が解決しようとする課題] 従来のファセットアライメント方法では特に横又は上方
にファセット(6a)を揃える際にはフロート板(3)
の保持(こついて金属性のバネ(4a)〜・(4h)を
用いたり、ウェハカセット(5)を押さえつけたりして
いる間の操作のわずられしさからローラー(2)の回転
にはモーター駆動が必要であつた。
[Problems to be Solved by the Invention] In the conventional facet alignment method, when aligning the facets (6a) horizontally or upwardly, the float plate (3)
Because it is difficult to hold the wafer cassette (5) using sticky metal springs (4a) to (4h) or to hold down the wafer cassette (5), a motor is used to rotate the roller (2). It needed a drive.

しかし乍ら半導体デバイスの製造工程中、特1ご不純物
の熱拡散では、拡散装置に投入する前のウェハ(6)に
は清浄性の確認された部品以外は当接させてはならない
。これはウェハ(6)に付着した物質がウェハ(6)の
中に同時に拡散したリウエハ(6)の表面を汚してパタ
ーン欠陥を起すからである。
However, during the manufacturing process of semiconductor devices, especially during the thermal diffusion of impurities, the wafer (6) must not be brought into contact with anything other than parts whose cleanliness has been confirmed before it is introduced into the diffusion apparatus. This is because the substance adhering to the wafer (6) contaminates the surface of the rewafer (6) which is simultaneously diffused into the wafer (6), causing pattern defects.

この為にファセットアライナは定期的に洗浄して洗浄度
が確認されるべきであり、洗浄にはNHsOH+HiO
* 、 Hcl +HNOs、等の強力な酸−アルカリ
が用いられる。
For this reason, the facet aligner should be cleaned regularly and its cleanliness should be checked, and NHsOH + HiO
A strong acid-alkali such as *, Hcl + HNOs, etc. is used.

しかし乍ら前述した金属成分を用いたファセットアライ
ナでは洗浄が十分に出来ない欠点がある。
However, the facet aligner using the metal component described above has the drawback that it cannot be cleaned sufficiently.

又、横又は下方合わせはフロート高さが狂いやすく、正
確さに欠けることが少なくない。
Furthermore, when horizontally or downwardly aligning, the float height tends to be incorrect, and accuracy is often lacking.

この発明はこの様な欠点を解決したもので、その目的と
する所は洗浄薬品で丸洗いが出来ること。
This invention solves these drawbacks, and its purpose is to enable complete washing with cleaning chemicals.

及び狂いが少ない堅牢な構造であること、更には生産効
率を向上出来るウェハのファセットアライメント方法を
得ることを目的とする。
Another object of the present invention is to obtain a wafer facet alignment method that has a robust structure with less deviation and can further improve production efficiency.

〔課題を解決するための手段〕[Means to solve the problem]

この発明に係るファセットアライメント方法は同一筐体
に第1と第2のローラーを配置し、第1のローラーに対
して@2のローラーを幾分高い位1どtにしたものであ
る。
In the facet alignment method according to the present invention, first and second rollers are arranged in the same housing, and the roller @2 is set at a position slightly higher than the first roller.

[作用] この発明に於ける第1と第2のローラーは役割りが分担
されていて第1のローラーの位置はファセットが下向き
になる所で固定され、第2のローラー■それはファセッ
トが横又は上向き(こなる所で固定されている。それ故
に構造が簡単で−オペレータはウェハカセットを第10
−ラーと第20−ラー間とを載せかえるだけで良い。
[Function] The roles of the first and second rollers in this invention are shared, and the position of the first roller is fixed where the facets are facing downward, and the position of the second roller is fixed where the facets are facing horizontally or downwardly. The wafer cassette is fixed in the upward direction (fixed at this point), so the structure is simple - the operator can place the wafer cassette in the 10th position.
All you have to do is replace the space between the -r and the 20th -r.

〔発明の実施例〕[Embodiments of the invention]

第1図は本発明の1実施例を示す正面断面図で筺体00
には第10−ラー01.)と第20−ラー122が着脱
自在に取り付けられており、第10−ラー(2D用の軸
受け(10a)は第20−ラー■用軸受け(10b)よ
り幾分低い位置になっている。この場合、まずファセッ
ト(6a)の不揃いのウェハカセット(5)を第10−
ラー(]、 Oa )側に載置して第10−ラーc!1
1を手で回転すると第10−ラーに当接した各ウェハ(
6)は櫛形溝板(5a)及び(5b)内を回転し−ファ
セット(6a)が第10−ラーの所に来ると摩擦力を失
ってファセット(6a)は下向きに揃えられる。
FIG. 1 is a front sectional view showing one embodiment of the present invention.
The 10th-Ra01. ) and the 20th roller 122 are detachably attached, and the bearing (10a) for the 10th roller (2D) is located at a somewhat lower position than the bearing (10b) for the 20th roller. In this case, the wafer cassette (5) with uneven facets (6a) is first placed in the 10th-
Place it on the Ra (], Oa) side and press the 10th Ra c! 1
When 1 is rotated by hand, each wafer (
6) rotates within the comb-shaped groove plates (5a) and (5b), and when the facet (6a) comes to the 10th roller, the frictional force is lost and the facet (6a) is aligned downward.

さて、ファセット(6a)を横域いは上向きに揃えると
きは、更にウェハカセット(5)を第20−ラーの側に
移動して、同様に第20−ラー□□□を手で回転する。
Now, when aligning the facets (6a) laterally or upwardly, move the wafer cassette (5) further to the 20th-larger side, and similarly rotate the 20th-larger □□□ by hand.

このときファセット(6a)が所望の位置に来た段階で
第20−ラー■の回転を止めれば良い。この様にしてフ
ァセットのアライメントが自在に出来る。尚、第20−
ラーの口径を第10−ラーより大径にしても良い。
At this time, the rotation of the 20th roller (2) may be stopped when the facet (6a) reaches the desired position. In this way, facet alignment can be performed freely. Furthermore, the 20th-
The diameter of the 10th lar may be made larger than that of the 10th lar.

第2図は本発明の他の実施例を示す要部の側面断面図で
あり、ウェハカセット(5)を2台底列に並べて同時に
ファセットアライメントするものである。この場合、(
200)は段付きのローラーでファセット(6a)を下
向にするときは比較的小口杼部(210)側で処理し、
−旦ファセツ)(6a)が下向きに揃ったらウエハカセ
ツl−f51ごと比較的大口径部(220)側のローラ
ーで処理すれば良い0本発明のデザインでは構成及び操
作が簡単であるから構成部品を耐薬品性の材料で作るこ
とが容易である。これについては全てテフロン等の弗素
樹脂やポリエーテルエーテルケトン、ポリ可ミド。
FIG. 2 is a side sectional view of a main part showing another embodiment of the present invention, in which two wafer cassettes (5) are arranged in a bottom row and facet alignment is performed simultaneously. in this case,(
200) is a stepped roller, and when the facet (6a) is directed downward, it is processed relatively on the side of the small mouth shuttle (210),
- Once the wafer cassettes (6a) are aligned downward, the entire wafer cassette l-f51 can be processed using the roller on the relatively large-diameter portion (220).The design of the present invention is simple in configuration and operation, so the component parts can be easily removed. Easy to make from chemical resistant materials. All of these are fluororesins such as Teflon, polyetheretherketone, and polyamide.

高密度ポリエチレン等のプラスチックで製作出来るので
定期的域いは臨時的にファセットアライナを丸洗い出来
、ウェハ(6)に対して汚染を及ぼさぬファセットアラ
イメントが出来る。
Since it can be manufactured from plastic such as high-density polyethylene, the facet aligner can be washed periodically or temporarily, and facet alignment can be performed without contaminating the wafer (6).

尚−上記実施例ではウェハカセットを直列においたとき
−の一う−を同軸にしたが、別々に独立させても効果は
同じである。
In the above embodiment, when the wafer cassettes are arranged in series, one of the cassettes is made coaxial, but the effect is the same even if the wafer cassettes are arranged independently.

ところで本明細書では半導体ウェハ用について述べ、た
が同様の形態を採るその他の基板、例えばサファイヤ基
板、ガラス基板、水晶基板でも利用出来るものである。
By the way, in this specification, a semiconductor wafer is described, but other substrates having a similar configuration, such as a sapphire substrate, a glass substrate, and a crystal substrate, can also be used.

[発明の効果] この発明は121上説明した通り同一筐体上にローラー
を2本置くと云う簡単堅牢な構造によりファセットアラ
イメントが簡単に出来しかも洗浄性が優れていると云う
効果がある。
[Effects of the Invention] As explained above, the present invention has the effect that facet alignment can be easily performed and the cleaning performance is excellent due to the simple and robust structure of placing two rollers on the same housing.

又、2本のローラーを同軸1こしてウェハカセットを直
列に並べると同時に2台のカセット内のファセットアラ
イメントが出来ると云う効果がある。
Furthermore, by using two rollers coaxially, it is possible to align the wafer cassettes in series and simultaneously perform facet alignment within the two cassettes.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例を示すファセットアライナの
正面断面図、第2図は本発明の他の実施例を示すファセ
ットアライナの主要部側面断面図。 第3−A図及び第3−B図は従来のファセットアライナ
の正面断面図である。 図中−(5)はウェハカセット、(5a)(5b)は櫛
形溝板、(6)はウェハ (6a)はファセット−(!
0は筐体、(2fl l−!第10−ラー、のは第20
−ラーである。 尚、図中、同一符号は同−又は相当部分を示す。
FIG. 1 is a front sectional view of a facet aligner showing one embodiment of the present invention, and FIG. 2 is a side sectional view of main parts of the facet aligner showing another embodiment of the present invention. 3-A and 3-B are front sectional views of a conventional facet aligner. In the figure - (5) is a wafer cassette, (5a) and (5b) are comb-shaped groove plates, (6) is a wafer (6a) is a facet (!
0 is the housing, (2fl l-!10th-ler, is the 20th
- It is ra. In the drawings, the same reference numerals indicate the same or corresponding parts.

Claims (1)

【特許請求の範囲】[Claims] 対向する櫛形溝を有するウェハカセット内のウェハのフ
ァセットを揃える際に、同一筐体上の第1の位置では上
記ウェハを回転させて上記ウェハのファセットを下向き
に揃える位置で回転ローラをセットし、次に第2の位置
では回転ローラを第1の位置における回転ローラよりも
幾分高い位置にセットしておいて上記ウェハカセットを
第2の位置に置いて上記ウェハのフアセツトアライナを
上向き又は横向きに揃えることを特徴とするウェハのフ
ァセットアライメント方法。
When aligning the facets of wafers in a wafer cassette having opposing comb-shaped grooves, a rotating roller is set at a first position on the same housing to rotate the wafer and align the facets of the wafer downward; Next, in the second position, the rotating roller is set at a position somewhat higher than the rotating roller in the first position, and the wafer cassette is placed in the second position, and the face aligner of the wafer is oriented upward or sideways. A wafer facet alignment method characterized by aligning wafers.
JP1213648A 1989-08-19 1989-08-19 Method for aligning facet of wafer Pending JPH0377347A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1213648A JPH0377347A (en) 1989-08-19 1989-08-19 Method for aligning facet of wafer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1213648A JPH0377347A (en) 1989-08-19 1989-08-19 Method for aligning facet of wafer

Publications (1)

Publication Number Publication Date
JPH0377347A true JPH0377347A (en) 1991-04-02

Family

ID=16642639

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1213648A Pending JPH0377347A (en) 1989-08-19 1989-08-19 Method for aligning facet of wafer

Country Status (1)

Country Link
JP (1) JPH0377347A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6337030B1 (en) 1997-02-04 2002-01-08 Canon Kabushiki Kaisha Wafer processing apparatus, wafer processing method, and SOI wafer fabrication method
US6391067B2 (en) 1997-02-04 2002-05-21 Canon Kabushiki Kaisha Wafer processing apparatus and method, wafer convey robot, semiconductor substrate fabrication method, and semiconductor fabrication apparatus
JP2020126918A (en) * 2019-02-04 2020-08-20 株式会社ディスコ Wafer imaging apparatus

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6337030B1 (en) 1997-02-04 2002-01-08 Canon Kabushiki Kaisha Wafer processing apparatus, wafer processing method, and SOI wafer fabrication method
US6391067B2 (en) 1997-02-04 2002-05-21 Canon Kabushiki Kaisha Wafer processing apparatus and method, wafer convey robot, semiconductor substrate fabrication method, and semiconductor fabrication apparatus
JP2020126918A (en) * 2019-02-04 2020-08-20 株式会社ディスコ Wafer imaging apparatus

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