JPH0380305B2 - - Google Patents
Info
- Publication number
- JPH0380305B2 JPH0380305B2 JP56119603A JP11960381A JPH0380305B2 JP H0380305 B2 JPH0380305 B2 JP H0380305B2 JP 56119603 A JP56119603 A JP 56119603A JP 11960381 A JP11960381 A JP 11960381A JP H0380305 B2 JPH0380305 B2 JP H0380305B2
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- amorphous silicon
- substrate
- glow discharge
- silicon layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
- G03G5/00—Recording-members for original recording by exposure, e.g. to light, to heat or to electrons; Manufacture thereof; Selection of materials therefor
- G03G5/02—Charge-receiving layers
- G03G5/04—Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor
- G03G5/08—Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor characterised by the photoconductive material being inorganic
- G03G5/082—Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor characterised by the photoconductive material being inorganic and not being incorporated in a bonding material, e.g. vacuum deposited
- G03G5/08214—Silicon-based
Landscapes
- Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Photoreceptors In Electrophotography (AREA)
- Light Receiving Elements (AREA)
Description
本発明は広範囲の波長の光に感度がある電子写
真感光体に関する。
従来より電子写真感光体に於ける光導電層材料
としては既に様々な形態のものが提案され実用化
されている。光導電層としては、高感度、高抵抗
であり、さらに耐熱性、耐摩耗性、無公害性、視
感度に近いスペクトル特性を有することが重要で
あるが、従来の光導電層に用いられているセレン
またはセレン合金、酸化亜鉛や硫化カドミウム等
は、上記の諸条件の総てを水準以上に必ずしも満
足はしていない。
例えば、分光感度領域を広げる為にテルルやヒ
素を加えたセレン系光導電層を有する電子写真用
像形成部材は、温度や湿度による電気的特性の変
化が大きく、又光疲労が大きくなる為に複写画像
の均一性や安定性等の欠ける欠点を有している。
而も、セレン、殊にヒ素、テルルは人体に対し
て極めて有害であり、強度的にも弱いことから、
複写画像中に混入したり、複写機内に飛散したり
して、人体に接触する原因となる。
又セレン系光導電層は、光導電層として高暗抵
抗を保有する為にアモルフアス状態に形成される
がセレンの結晶化が65℃と極めて低い温度で起る
為に使用中に於ける画像形成プロセス中の他の部
材との摩擦熱の影響を受けて結晶化を起し、暗抵
抗の低下を招き易いという耐熱性上にも欠点があ
る。
一方、酸化亜鉛、硫化カドミウム等を光導電層
構成材料として所謂バインダー系光導電層を有す
る像形成部材は、光導電層の電気的及び光導電的
特性や物理的化学的特性を決定するパラメーター
が多く再現性が悪く歩留りの低下を招き、又湿度
依存性が著しく、電気的特性の劣化を来たし、ク
リーニング性も良くない。
本発明は以上の事実に基ずいて、従来の光導電
層が欠如していた無公害性、耐熱性、耐摩耗性に
対し理想的な特性を有し、光感度領域の広いグロ
ー放電分解法により生成されるアモルフアスシリ
コン(以下a−Siと略す)を光導電層とする電子
写真感光体を提供することを目的とする。
a−Siはグロー放電分解法により基板上に膜形
成される。グロー放電分解法とは、シランガスを
グロー放電中で分解して成膜する方法で、誘導結
合法と容量結合法の2つのプラズマ発生方法があ
るが、不純物を含有しない純粋なa−Si膜は通常
N型半導体として作用し、その体積抵抗が低く暗
減衰速度が速すぎて良好な画像が得にくい。とこ
ろがシランガスにジボランガスを混入してグロー
放電分解することで、a−Siに硼素が添加され真
性半導体さらにはP型半導体となり、夫々の添加
量に応じてa−Siの体積抵抗値が変化する。更に
a−Siの体積抵抗は膜形成時の基板設定温度によ
つても変化する。したがつて硼素の添加量及び基
板設定温度を適度に設定すれば高抵抗のa−Si膜
が得られ、単層構造の感光体としてカールソン方
式に充分使用できる。一方、a−Si膜の光感度領
域を広げる為に光学禁止帯幅を狭くすることが考
えられ、基板設定温度を上げることで達成され
る。しかしながら基板設定温度を上げることは、
a−Si膜の体積抵抗を下げることになる。
これらの事実より、本発明においては、体積抵
抗の高いa−Si膜が得られるように硼素の添加量
を適度に設定し、同一膜形成時に基板温度を変化
させることで電子写真感光体の光導電体層として
光感度領域の広いものを作成した。
ここでa−Si膜の作成方法としては、第1図に
示すグロー放電分解装置を用い、シボランガスを
混合したシランガスを分解、清浄アルミニウム基
板表面にa−Si膜を形成した。代表的作成条件は
13.56MHzでRFパワー100〜3000Wattsの電力を加
え、ガス圧は0.5〜2.0Torr、ガス流量は毎分50〜
300CC、膜形成速度は毎分150〜500A、基板温度
は室温〜400℃、膜厚は7〜20μmである。
以下、実施例に従つて説明する。
実施例 1
清浄アルミニウム基板上に上述した装置でシラ
ンガスに100ppmのジボランガスを混合して6時
間グロー放電分解継続、厚さ10μmの膜を得た。
基板温度は350℃に加熱後放電を開始し、放電中
に毎分、各々0.5、1.0、1.5、2.0℃の速さで冷却
して120℃となつた時点で後は一定とした。これ
らのa−Si膜の暗減衰速度及び光吸収係数の試験
結果を第1表に示す。
The present invention relates to an electrophotographic photoreceptor that is sensitive to light of a wide range of wavelengths. Conventionally, various types of photoconductive layer materials for electrophotographic photoreceptors have already been proposed and put into practical use. As a photoconductive layer, it is important to have high sensitivity and high resistance, as well as heat resistance, abrasion resistance, non-pollution, and spectral characteristics close to visual sensitivity. Selenium or selenium alloys, zinc oxide, cadmium sulfide, etc., do not necessarily satisfy all of the above-mentioned conditions to a higher level. For example, electrophotographic image forming members that have a selenium-based photoconductive layer containing tellurium or arsenic in order to widen the spectral sensitivity range have large changes in electrical properties due to temperature and humidity, and also suffer from increased optical fatigue. It has drawbacks such as lack of uniformity and stability of copied images. However, selenium, especially arsenic, and tellurium are extremely harmful to the human body and are weak in strength.
It may get mixed into the copied image or be scattered inside the copying machine, causing it to come into contact with the human body. Furthermore, the selenium-based photoconductive layer is formed in an amorphous state in order to have high dark resistance as a photoconductive layer, but since selenium crystallization occurs at an extremely low temperature of 65°C, image formation during use is difficult. It also has a drawback in terms of heat resistance, in that it tends to crystallize under the influence of frictional heat with other members during the process, resulting in a decrease in dark resistance. On the other hand, an image forming member having a so-called binder-based photoconductive layer using zinc oxide, cadmium sulfide, etc. as a constituent material of the photoconductive layer has parameters that determine the electrical and photoconductive properties and physical and chemical properties of the photoconductive layer. In many cases, the reproducibility is poor, leading to a decrease in yield, and the humidity dependence is significant, resulting in deterioration of electrical characteristics and poor cleaning performance. Based on the above facts, the present invention has developed a glow discharge decomposition method that has ideal properties in terms of non-pollution, heat resistance, and abrasion resistance that conventional photoconductive layers lack, and has a wide photosensitivity range. An object of the present invention is to provide an electrophotographic photoreceptor whose photoconductive layer is amorphous silicon (hereinafter abbreviated as a-Si) produced by the present invention. The a-Si film is formed on the substrate by glow discharge decomposition method. The glow discharge decomposition method is a method of forming a film by decomposing silane gas in a glow discharge.There are two plasma generation methods: inductive coupling method and capacitive coupling method, but pure a-Si film containing no impurities is Normally, it acts as an N-type semiconductor, and its volume resistance is low and its dark decay rate is too fast, making it difficult to obtain good images. However, by mixing diborane gas into silane gas and decomposing it by glow discharge, boron is added to a-Si, making it an intrinsic semiconductor and even a P-type semiconductor, and the volume resistivity of a-Si changes depending on the amount of each addition. Furthermore, the volume resistance of a-Si also changes depending on the temperature set on the substrate during film formation. Therefore, if the amount of boron added and the substrate temperature are appropriately set, a high-resistance a-Si film can be obtained and can be used satisfactorily as a photoreceptor with a single layer structure in the Carlson system. On the other hand, in order to widen the photosensitivity region of the a-Si film, it is possible to narrow the optical forbidden band width, and this can be achieved by increasing the substrate temperature setting. However, increasing the board temperature setting
This lowers the volume resistance of the a-Si film. Based on these facts, in the present invention, the amount of boron added is set appropriately so as to obtain an a-Si film with high volume resistivity, and by changing the substrate temperature during the formation of the same film, the light of the electrophotographic photoreceptor is improved. A conductive layer with a wide photosensitivity region was created. Here, as a method for forming the a-Si film, a glow discharge decomposition apparatus shown in FIG. 1 was used to decompose silane gas mixed with ciborane gas to form an a-Si film on the surface of a clean aluminum substrate. Typical creation conditions are
Apply RF power 100~3000Watts at 13.56MHz, gas pressure 0.5~2.0Torr, gas flow rate 50~3000W/min
300 CC, film formation rate is 150 to 500 A per minute, substrate temperature is room temperature to 400°C, and film thickness is 7 to 20 μm. Examples will be explained below. Example 1 A film with a thickness of 10 μm was obtained on a clean aluminum substrate by mixing 100 ppm of diborane gas with silane gas and continuing glow discharge decomposition for 6 hours using the above-mentioned apparatus.
After heating the substrate temperature to 350°C, discharge was started, and during the discharge, the temperature was cooled at a rate of 0.5, 1.0, 1.5, and 2.0°C per minute, respectively, and when the temperature reached 120°C, the temperature remained constant. Table 1 shows the test results for the dark decay rate and light absorption coefficient of these a-Si films.
【表】
応する付近の波長で判断し、いずれも良
好なものに○を付けてある。
この結果より、体積抵抗の高い(1011Ω・cm以
上)の領域が膜厚の1/3〜1/2あることが望まし
い。
実施例 2
実施例1で冷却後の基板温度を200℃としたも
のの結果を第2表に示す。[Table] Judging from the corresponding nearby wavelengths, all good results are marked with a circle.
From this result, it is desirable that the region with high volume resistance (10 11 Ω·cm or more) be 1/3 to 1/2 of the film thickness. Example 2 Table 2 shows the results of Example 1 in which the substrate temperature after cooling was set to 200°C.
【表】
第1表と同様な判断を施してあり、最終基板温
度200℃の場合は体積抵抗の高い領域が膜厚の1/2
あることが望ましい。
実施例1で基板温度350℃で3〜4時間放電分
解後、基板温度を120℃にして3〜2時間放電分
解を施したもの、また実施例2では基板温度350
℃で3時間、200℃で3時間放電分解したものも
同様に良好な結果をもたらす。
a−Si層の体積抵抗及び光電利得制御のために
酸素、窒素、炭素などを加えたものでも良好であ
る。
以上の如く、本発明の電子写真感光体の製造方
法は、基板上に、微量のジボランガスを混合した
シランガスをグロー放電分解法により分解し生成
されたアモルフアスシリコン光導電層が形成され
てなる電子写真感光体の製造方法において、微量
のジボランガスを混合した基板温度を400℃以下
350℃以上の温度に加熱し、グロー放電の開始と
同時に基板温度が一定の冷却速度で冷却され続け
て第1のアモルフアスシリコン層を形成する工
程、該第1のアモルフアスシリコン層の形成に引
き続いて、基板温度の冷却の停止と同時に基板温
度が120℃〜200℃の温度範囲の一定の温度に固定
されて第2のアモルフアスシリコン層を形成する
工程からなるようにしたから、第1のアモルフア
スシリコン層は、膜形成時に基板温度は400℃以
下350℃以上の温度に加熱されてなり、グロー放
電の開始と同時に基板温度が一定の冷却温度で、
少なくとも200℃までは冷却され続けて形成され
たものであるので、水素イオン濃度が広い範囲で
制御でき、光学禁止帯幅が低い方から高い方ま
で、かつ抵抗率が小さい方から大きい方まで広範
囲にわたつてカバーでき、波長の短い光から長い
波長までの広範囲の光に対して光電効果が優れた
ものになる。このことは、一般には電子写真感光
体を用いた装置に用いられる光源は赤色の長波長
側の発光ダイオードであるので、赤色の長波長側
の発光ダイオードとは良くマツチングし、第2の
アモルフアスシリコン層は基板温度が120℃〜200
℃の温度範囲の一定の温度に固定され形成された
ものであるので、抵抗率が一定で非常に大きいも
のが得られ(比抵抗が、1011Ω・cm以上)、チヤ
ージされた電荷の減衰が小さく電荷の保持特性の
優れたものが得られ、光電効果特性と電荷の保持
特性の両方の特性が同時に満足するようにし、非
常に高性能の電子写真感光体を提供するものであ
る。
更に、第1のアモルフアスシリコン層と第2の
アモルフアスシリコン層は同一のバツジ内で連続
して形成できるので、膜形成が簡単にできるとい
うメリツトを有する。[Table] The same judgment as in Table 1 is made, and when the final substrate temperature is 200℃, the area with high volume resistance is 1/2 of the film thickness.
It is desirable that there be. In Example 1, after discharge decomposition at a substrate temperature of 350°C for 3 to 4 hours, the substrate temperature was increased to 120°C and subjected to discharge decomposition for 3 to 2 hours, and in Example 2, the substrate temperature was 350°C.
℃ for 3 hours and 200℃ for 3 hours give similarly good results. It is also good to add oxygen, nitrogen, carbon, etc. to control the volume resistance and photoelectric gain of the a-Si layer. As described above, the method for manufacturing an electrophotographic photoreceptor of the present invention includes forming an amorphous silicon photoconductive layer produced by decomposing silane gas mixed with a trace amount of diborane gas by a glow discharge decomposition method on a substrate. In the manufacturing method of photographic photoreceptors, the temperature of the substrate mixed with a trace amount of diborane gas is kept below 400℃.
A step of forming a first amorphous silicon layer by heating the substrate to a temperature of 350° C. or higher and continuing to cool the substrate temperature at a constant cooling rate at the same time as glow discharge starts, for forming the first amorphous silicon layer. Subsequently, the second amorphous silicon layer is formed by fixing the substrate temperature at a constant temperature in the range of 120°C to 200°C at the same time as the cooling of the substrate temperature is stopped. During film formation, the amorphous silicon layer is heated to a temperature of 400°C or higher and 350°C or higher, and at the same time as glow discharge begins, the substrate temperature is cooled to a constant temperature.
Since it is formed by continuous cooling to at least 200℃, the hydrogen ion concentration can be controlled over a wide range, and the optical forbidden band width can be controlled over a wide range from low to high, and resistivity can be varied over a wide range from low to high. The photoelectric effect is excellent for a wide range of light from short wavelengths to long wavelengths. Generally, the light source used in an apparatus using an electrophotographic photoreceptor is a red light-emitting diode on the long wavelength side, so it is well matched with the red light-emitting diode on the long wavelength side, and the second amorphous The silicon layer has a substrate temperature of 120°C to 200°C.
Since it is formed at a fixed temperature in the temperature range of °C, it has a constant and very high resistivity (specific resistance of 10 11 Ω cm or more), and the decay of the charged electric charge. The present invention provides an electrophotographic photoreceptor with very high performance, which has a small charge retention property and a low charge retention property, and satisfies both the photoelectric effect property and the charge retention property at the same time. Furthermore, since the first amorphous silicon layer and the second amorphous silicon layer can be formed successively within the same batch, there is an advantage that film formation can be made easily.
第1図はアモルフアスシリコンを作成するため
の概略図である。
1……配管、2……バルブ、3……反応管、4
……高周波コイル、5……基板、6……基板ホル
ダー、7……圧力計、8……基板ホルダー支持
棒、9……高周波電源。
FIG. 1 is a schematic diagram for producing amorphous silicon. 1...Piping, 2...Valve, 3...Reaction tube, 4
... High frequency coil, 5 ... Board, 6 ... Board holder, 7 ... Pressure gauge, 8 ... Board holder support rod, 9 ... High frequency power supply.
Claims (1)
ランガスをグロー放電分解法により分解し生成さ
れたアモルフアスシリコン光導電層が形成されて
なる電子写真感光体の製造方法において、微量の
ジボランガスを混合した基板温度を400℃以下350
℃以上の温度に加熱し、グロー放電の開始と同時
に基板温度が一定の冷却速度で冷却され続けて第
1のアモルフアスシリコン層を形成する工程、該
第1のアモルフアスシリコン層の形成に引き続い
て、基板温度の冷却の停止と同時に基板温度が
120℃〜200℃の温度範囲の一定の温度に固定され
て第2のアモルフアスシリコン層を形成する工程
からなることを特徴とする電子写真感光体の製造
方法。1. In a method for manufacturing an electrophotographic photoreceptor in which an amorphous silicon photoconductive layer is formed on a substrate by decomposing silane gas mixed with a trace amount of diborane gas by a glow discharge decomposition method, a substrate mixed with a trace amount of diborane gas is used. Temperature below 400℃350
℃ or higher, and at the same time as the start of glow discharge, the substrate temperature continues to be cooled at a constant cooling rate to form a first amorphous silicon layer, subsequent to the formation of the first amorphous silicon layer. As a result, the board temperature increases at the same time as cooling of the board temperature stops.
A method for manufacturing an electrophotographic photoreceptor, comprising the step of forming a second amorphous silicon layer at a constant temperature in the temperature range of 120°C to 200°C.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56119603A JPS5821257A (en) | 1981-07-30 | 1981-07-30 | Manufacturing method of electrophotographic photoreceptor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56119603A JPS5821257A (en) | 1981-07-30 | 1981-07-30 | Manufacturing method of electrophotographic photoreceptor |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5821257A JPS5821257A (en) | 1983-02-08 |
| JPH0380305B2 true JPH0380305B2 (en) | 1991-12-24 |
Family
ID=14765475
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56119603A Granted JPS5821257A (en) | 1981-07-30 | 1981-07-30 | Manufacturing method of electrophotographic photoreceptor |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5821257A (en) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS616654A (en) * | 1984-06-21 | 1986-01-13 | Stanley Electric Co Ltd | Electrophotographic photoreceptor and its manufacturing method |
| JPS6123158A (en) * | 1984-07-11 | 1986-01-31 | Stanley Electric Co Ltd | Photosensitive body for electrophotography |
| JP3368109B2 (en) * | 1995-08-23 | 2003-01-20 | キヤノン株式会社 | Light receiving member for electrophotography |
| JP3754751B2 (en) * | 1996-05-23 | 2006-03-15 | キヤノン株式会社 | Light receiving member |
| JP3559655B2 (en) * | 1996-08-29 | 2004-09-02 | キヤノン株式会社 | Light receiving member for electrophotography |
| JPH1090929A (en) | 1996-09-11 | 1998-04-10 | Canon Inc | Light receiving member for electrophotography |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS56146142A (en) * | 1980-04-16 | 1981-11-13 | Hitachi Ltd | Electrophotographic sensitive film |
-
1981
- 1981-07-30 JP JP56119603A patent/JPS5821257A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5821257A (en) | 1983-02-08 |
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