JPH0385584U - - Google Patents
Info
- Publication number
- JPH0385584U JPH0385584U JP14671289U JP14671289U JPH0385584U JP H0385584 U JPH0385584 U JP H0385584U JP 14671289 U JP14671289 U JP 14671289U JP 14671289 U JP14671289 U JP 14671289U JP H0385584 U JPH0385584 U JP H0385584U
- Authority
- JP
- Japan
- Prior art keywords
- supply
- elements
- testing device
- supplied
- rows
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 claims 3
- 238000005259 measurement Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Description
第１図はこの考案の実施例の一部を示す平面図
、第２図はその一部の拡大側面図、第３図は従来
の装置を示す平面図、第４図は第３図の側面図で
ある。
Fig. 1 is a plan view showing a part of the embodiment of this invention, Fig. 2 is an enlarged side view of the part, Fig. 3 is a plan view showing a conventional device, and Fig. 4 is a side view of Fig. 3. It is a diagram.
Claims (1)
ぞれＩＣ素子が複数のコンタクトレールへ供給さ
れ、これら各コンタクトレールには、直列に複数
の測定部が設けられ、これら各測定部にそれぞれ
１個のＩＣ素子が供給された状態でこれらＩＣ素
子に対して同時に試験を行うＩＣ試験装置におい
て、 上記各ＩＣ供給列ごとに設けられ、各別に制御
可能であり、対応するコンタクトレールへのＩＣ
素子の供給を停止することができる複数のストツ
パを具備することを特徴とするＩＣ試験装置。[Claims for Utility Model Registration] IC elements are supplied from a plurality of IC supply rows provided in parallel to a plurality of contact rails, each of which is provided with a plurality of measurement units in series, and In an IC testing device that simultaneously tests one IC element with one IC element supplied to each measuring section, it is provided for each of the above-mentioned IC supply rows, can be controlled separately, and has a corresponding IC to contact rail
An IC testing device characterized by comprising a plurality of stoppers capable of stopping supply of elements.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14671289U JPH0717026Y2 (en) | 1989-12-20 | 1989-12-20 | IC test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14671289U JPH0717026Y2 (en) | 1989-12-20 | 1989-12-20 | IC test equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0385584U true JPH0385584U (en) | 1991-08-29 |
| JPH0717026Y2 JPH0717026Y2 (en) | 1995-04-19 |
Family
ID=31693259
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14671289U Expired - Fee Related JPH0717026Y2 (en) | 1989-12-20 | 1989-12-20 | IC test equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0717026Y2 (en) |
-
1989
- 1989-12-20 JP JP14671289U patent/JPH0717026Y2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0717026Y2 (en) | 1995-04-19 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |