JPH0385584U - - Google Patents

Info

Publication number
JPH0385584U
JPH0385584U JP14671289U JP14671289U JPH0385584U JP H0385584 U JPH0385584 U JP H0385584U JP 14671289 U JP14671289 U JP 14671289U JP 14671289 U JP14671289 U JP 14671289U JP H0385584 U JPH0385584 U JP H0385584U
Authority
JP
Japan
Prior art keywords
supply
elements
testing device
supplied
rows
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14671289U
Other languages
English (en)
Other versions
JPH0717026Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP14671289U priority Critical patent/JPH0717026Y2/ja
Publication of JPH0385584U publication Critical patent/JPH0385584U/ja
Application granted granted Critical
Publication of JPH0717026Y2 publication Critical patent/JPH0717026Y2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Description

【図面の簡単な説明】
第1図はこの考案の実施例の一部を示す平面図
、第2図はその一部の拡大側面図、第3図は従来
の装置を示す平面図、第4図は第3図の側面図で
ある。

Claims (1)

  1. 【実用新案登録請求の範囲】 並列に設けられた複数のIC供給列から、それ
    ぞれIC素子が複数のコンタクトレールへ供給さ
    れ、これら各コンタクトレールには、直列に複数
    の測定部が設けられ、これら各測定部にそれぞれ
    1個のIC素子が供給された状態でこれらIC素
    子に対して同時に試験を行うIC試験装置におい
    て、 上記各IC供給列ごとに設けられ、各別に制御
    可能であり、対応するコンタクトレールへのIC
    素子の供給を停止することができる複数のストツ
    パを具備することを特徴とするIC試験装置。
JP14671289U 1989-12-20 1989-12-20 Ic試験装置 Expired - Fee Related JPH0717026Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14671289U JPH0717026Y2 (ja) 1989-12-20 1989-12-20 Ic試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14671289U JPH0717026Y2 (ja) 1989-12-20 1989-12-20 Ic試験装置

Publications (2)

Publication Number Publication Date
JPH0385584U true JPH0385584U (ja) 1991-08-29
JPH0717026Y2 JPH0717026Y2 (ja) 1995-04-19

Family

ID=31693259

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14671289U Expired - Fee Related JPH0717026Y2 (ja) 1989-12-20 1989-12-20 Ic試験装置

Country Status (1)

Country Link
JP (1) JPH0717026Y2 (ja)

Also Published As

Publication number Publication date
JPH0717026Y2 (ja) 1995-04-19

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees