JPH04100830U - Gate resin remaining detection device - Google Patents
Gate resin remaining detection deviceInfo
- Publication number
- JPH04100830U JPH04100830U JP5680290U JP5680290U JPH04100830U JP H04100830 U JPH04100830 U JP H04100830U JP 5680290 U JP5680290 U JP 5680290U JP 5680290 U JP5680290 U JP 5680290U JP H04100830 U JPH04100830 U JP H04100830U
- Authority
- JP
- Japan
- Prior art keywords
- resin
- gate
- gate resin
- semiconductor device
- end surface
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000011347 resin Substances 0.000 title claims description 89
- 229920005989 resin Polymers 0.000 title claims description 89
- 238000001514 detection method Methods 0.000 title claims description 10
- 239000004065 semiconductor Substances 0.000 description 44
- 238000003384 imaging method Methods 0.000 description 14
- 238000000465 moulding Methods 0.000 description 5
- 238000012545 processing Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 4
- 238000012937 correction Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
Landscapes
- Moulds For Moulding Plastics Or The Like (AREA)
- Injection Moulding Of Plastics Or The Like (AREA)
Description
【考案の詳細な説明】
[産業上の利用分野]
本考案は、樹脂成形物、例えば、樹脂モールド
型半導体装置のゲート樹脂残りの状態を検出する
装置に関する。[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a device for detecting the state of remaining gate resin of a resin molded product, for example, a resin molded semiconductor device.
[従来技術]
トランスファーモールドされた樹脂モールド型
の半導体装置は、樹脂モールド後、上下金型を開
いて取り出すと、第2図に示すように、金型の樹
脂注入用ゲート部分のゲート樹脂3と該ゲート樹
脂3につながる樹脂流路で硬化したランナー部の
樹脂4とがそれぞれ一体となって取り出される。[Prior Art] When a transfer molded resin mold type semiconductor device is resin-molded, when the upper and lower molds are opened and taken out, as shown in FIG. The resin 4 of the runner portion hardened in the resin flow path connected to the gate resin 3 is taken out as one piece.
上記ゲート樹脂3はランナーより半導体装置1の
外装部2に向つて縮径しており、ランナー部の樹
脂4につながる部分での断面積が最大になってお
り、製品としての半導体装置には上記ゲート樹脂
3及びランナー部の樹脂4は何れも不要なもので
ある。従って、次の工程では半導体装置1が連接
されたリードフレーム5とランナー部の樹脂4と
をそれぞれ支持し、図において半導体装置1の端
面2を基点とし、ランナー部の樹脂4には下側方
向、リードフレーム5には上側方向にそれぞれ力
を加え、半導体装置1の端面2にゲート樹脂3の
折端面が形成されるように各ゲート樹脂3を折り
取っている。The diameter of the gate resin 3 is reduced from the runner toward the exterior part 2 of the semiconductor device 1, and the cross-sectional area of the runner part connected to the resin 4 is maximum. Both the gate resin 3 and the runner resin 4 are unnecessary. Therefore, in the next step, the lead frame 5 to which the semiconductor device 1 is connected and the resin 4 of the runner part are supported respectively, and the end face 2 of the semiconductor device 1 is the base point in the figure, and the resin 4 of the runner part is supported in the downward direction. , a force is applied upwardly to each lead frame 5, and each gate resin 3 is broken off so that a folded end surface of the gate resin 3 is formed on the end surface 2 of the semiconductor device 1.
しかし、上記したゲート樹脂3を半導体装置1
の端面2から折り取る作業は、一般に作業者の手
作業によって行われている。そのため、作業者の
熟練度等によっては、ゲート樹脂3を完全に除去
できず、第3図に示すように、折端面6が半導体
装置1の端面2より突出する、所謂、ゲート樹脂
残り7を形成することがあった。However, the above-mentioned gate resin 3 is not used in the semiconductor device 1.
The work of breaking off from the end face 2 of is generally performed manually by an operator. Therefore, depending on the skill level of the operator, it may not be possible to completely remove the gate resin 3, and as shown in FIG. It was possible to form.
このように、半導体装置1の端面2にゲート樹
脂残り7が突出していると、リードフレーム5か
ら個々の半導体装置1を切り離して製品として使
用する場合、外観が悪化するばかりか、半導体装
置を自動供給機等によってプリント基板に実装す
るときに、ゲート樹脂残り7によって寸法等に誤
差を生じて正確に位置決めできなくなったり、省
スペースを強いられるプリント基板等に実装した
ときに、該ゲート樹脂残り7に近接して実装され
る他の部品等が接触して実装不能になってしまう
等の種々の問題がある。そのため、ゲート樹脂残
り7が突出する半導体装置を確実に検出する必要
があった。In this way, if the remaining gate resin 7 protrudes from the end surface 2 of the semiconductor device 1, when the individual semiconductor devices 1 are separated from the lead frame 5 and used as a product, not only will the appearance deteriorate, but also the semiconductor device When mounting on a printed circuit board using a feeder, etc., the remaining gate resin 7 may cause errors in dimensions, etc., making accurate positioning impossible, or when mounting on a printed circuit board, etc., which requires space saving, the remaining gate resin 7 may There are various problems such as other components mounted in close proximity to each other coming into contact with each other, making it impossible to mount them. Therefore, it was necessary to reliably detect a semiconductor device in which the remaining gate resin 7 protrudes.
[考案が解決しようとする課題]
しかしながら、上記ゲート樹脂残り7を検出す
る方法としては、一般にテレビカメラ等で半導体
装置1の端面2を映し出してゲート樹脂残り7を
視認したり、直接目視によってゲート樹脂残り7
を見つけだすといった検査が一般的であった。そ
のため、目視で検査するとゲート樹脂残り7の折
端面6と半導体装置1の端面2とが同色であるた
め、コントラストが得られ難いためゲート樹脂残
り7を見落とし易いといつた問題があった。また、
テレビカメラ等を使用しても目視で判断すると半
導体装置1の生産個数が極めて多数であるから、
どうしてもゲート樹脂残りを有する半導体装置を
見落とし易かった。[Problem to be solved by the invention] However, as a method for detecting the remaining gate resin 7, generally, the end surface 2 of the semiconductor device 1 is shown with a television camera or the like to visually recognize the remaining gate resin 7, or the remaining gate resin 7 is detected by direct visual inspection. Resin remaining 7
Tests to find out were common. Therefore, when inspected visually, the folded end surface 6 of the remaining gate resin 7 and the end surface 2 of the semiconductor device 1 are of the same color, making it difficult to obtain a contrast, resulting in the problem that the remaining gate resin 7 is easily overlooked. Further, even if a television camera or the like is used, the number of semiconductor devices 1 produced is extremely large, so it is easy to overlook semiconductor devices with gate resin residue.
[課題を解決するための手段]
上記課題を達成するために、本考案のゲート樹
脂残り検出装置は、金型キャビティ内にゲートを
介して樹脂を注入して得られた樹脂成形物のゲー
ト部分の樹脂残りを検出するためのゲート樹脂残
り検出装置であって、上記樹脂成型物のゲート樹
脂端面に光を照射する光源と、上記端面を撮像す
るテレビカメラと、該テレビカメラによる画像信
号を所定の信号パターンと比較良否判別する比較
判別部とを具備したことを特徴とする。[Means for Solving the Problems] In order to achieve the above problems, the gate resin remaining detection device of the present invention detects the gate portion of a resin molded product obtained by injecting resin into a mold cavity through a gate. A gate resin remaining detection device for detecting resin remaining in the resin molding, the device comprising: a light source that irradiates light onto an end face of the gate resin of the resin molding; a television camera that images the end face; and an image signal from the television camera that receives a predetermined image signal. The present invention is characterized by comprising a comparison/determination unit that compares the signal pattern and determines whether it is good or bad.
[作用]
上記構成のゲート残り検出装置では、樹脂成型
物のゲート樹脂端面に光源から光を照射し、テレ
ビカメラで上記端面を撮像すると、ゲート樹脂を
折り取った折端面が凹凸粗面となるので、該折端
面に照射された光は乱反射し、テレビカメラには
樹脂成型物の端面が明るく映し出され、実際のゲ
ート樹脂の折端面は周囲より薄暗く映し出される
ようになる。この場合、ゲート樹脂は樹脂成型物
の端面から遠ざかるにつれて先太になっているの
で、端面に沿って折り取られた正規のゲート樹脂
の折端面が最も狭い状態で薄暗く映し出され、こ
の画像を基準とすれば、ゲート樹脂残りが生じた
場合の実際の折端面は、上記正規のゲート樹脂の
折端面より広く映し出されるようになる。従って、
比較良否判別部において、例えば、薄暗く映し出
された実際の折端面の画像に画像処理等を施して
その折端面の撮像面積を算出し、予め算出された
正規のゲート樹脂残りの折端面の撮像面積と比較
し、その撮像面積が広ければゲート樹脂残りが半
導体装置の端面より突出して存在していると判断
できる。[Function] In the gate remaining detection device having the above configuration, when light is irradiated from the light source to the gate resin end face of the resin molded product and the end face is imaged with a television camera, the folded end face where the gate resin is broken off becomes an uneven and rough surface. Therefore, the light irradiated on the folded end face is diffusely reflected, and the end face of the resin molded product appears bright on the TV camera, while the actual folded end face of the gate resin appears darker than its surroundings. In this case, the gate resin becomes thicker as it goes away from the end face of the resin molding, so the folded end face of the regular gate resin that is broken along the end face is displayed dimly in its narrowest state, and this image is used as the reference. If this is the case, the actual folded end surface when there is gate resin residue will be projected wider than the folded end surface of the above-mentioned regular gate resin. Therefore, in the comparison quality determination section, for example, the image of the actual folded edge surface that is displayed dimly is subjected to image processing, etc., the imaging area of the folded edge surface is calculated, and the area of the folded edge surface with the remaining regular gate resin calculated in advance is calculated. When compared with the imaging area, if the imaging area is large, it can be determined that the remaining gate resin exists protruding from the end surface of the semiconductor device.
[実施例]
以下、図面を参照して本考案の一実施例を説明
する。[Example] Hereinafter, an example of the present invention will be described with reference to the drawings.
第1図は本考案の一実施例に係るゲート樹脂残
り検出装置である。被検物となる樹脂成型物とし
ては、例えば、トランスファーモールドされたト
ランジスタ等の半導体装置1等が用いられるもの
で、該半導体装置1は実質的に従来例で示した物
と同一であるので、同一部材に同一符号を付して
半導体装置1の説明はここでは省略する。FIG. 1 shows a gate resin remaining detection device according to an embodiment of the present invention. The resin molded object to be tested is, for example, a semiconductor device 1 such as a transfer-molded transistor, and since the semiconductor device 1 is substantially the same as that shown in the conventional example, The same members are given the same reference numerals, and a description of the semiconductor device 1 will be omitted here.
図に示す本考案のゲート樹脂残り検出装置は、
樹脂モールド後に上記半導体装置1の端面2から
遠ざかるにつれて断面積が広くなって変化するゲ
ート樹脂を、従来例で示したような方法によって
折り取ったときに、その折端面6が端面2より突
出してゲート樹脂残り7を生じているか否かを検
出するための装置である。即ち、被検物となる上
記半導体装置1は、支持板8上に載置されて順次
移動されており、半導体装置1の端面2に光を照
射する光源10と、半導体装置1の端面の画像を
映し出すテレビカメラ20と、ゲート樹脂残りの
有無を比較良否判別するための比較判別部30よ
り構成される。The device for detecting remaining gate resin of the present invention shown in the figure breaks off the gate resin, which changes in cross-sectional area as it moves away from the end surface 2 of the semiconductor device 1 after resin molding, by the method shown in the conventional example. This is a device for detecting whether or not the folded end surface 6 protrudes from the end surface 2 to form a gate resin residue 7. That is, the semiconductor device 1 to be tested is placed on a support plate 8 and sequentially moved, and a light source 10 that irradiates light onto the end surface 2 of the semiconductor device 1 and an image of the end surface of the semiconductor device 1 are used. The present invention is comprised of a television camera 20 that displays the image, and a comparison and determination section 30 that compares and determines the quality of the remaining gate resin.
上記光源10は、例えば、ハロゲンランプ等の
高照度の電球であり、上記支持板8上に載置され
てゲート樹脂の実際の折端面6を含む半導体装置
1の端面2に光を照射するものである。該光源1
0の光路途中にはハーフミラー11が設けられて
おり、該ハーフミラー11によって光源10から
照射される光を半導体装置1に反射して照射でき
るようになっている。The light source 10 is, for example, a high-intensity light bulb such as a halogen lamp, and is placed on the support plate 8 and irradiates light onto the end surface 2 of the semiconductor device 1 including the actual folded end surface 6 of the gate resin. It is. The light source 1
A half mirror 11 is provided in the middle of the optical path of 0, and the half mirror 11 can reflect and irradiate the light emitted from the light source 10 onto the semiconductor device 1.
上記テレビカメラ20は、半導体装置1のゲー
ト樹脂を折り取った折端面6を含む端面2を水平
状態でに真横から撮像するものであり、モニター
21のほぼ中央には上記半導体装置1の端面2の
画像が映し出されるようになっている。該テレビ
カメラ20によって撮像される半導体装置1の端
面2の画像は、光源10からハーフミラー11に
よつて上記端面2に照射された光の該端面2にお
ける実質的な反射光が映し出されるもので、その
反射光の大部分がテレビカメラ20にとらえられ
るため、全体的に比較的明るく映し出される。ま
た、ゲート樹脂を折り取った折端面6に照射され
た光は、該折端面6が凹凸粗面となるために乱反
射し、テレビカメラ20ではその反射光が殆どと
らえられなくなり、従って、実際の折端面6が薄
暗い状態で明るい端面2内に映し出されるように
なる。The television camera 20 takes an image of the end face 2 of the semiconductor device 1 including the folded end face 6 obtained by breaking off the gate resin in a horizontal state from the side. The image is now displayed. The image of the end surface 2 of the semiconductor device 1 captured by the television camera 20 is an image of the substantial reflected light on the end surface 2 of the light irradiated from the light source 10 to the end surface 2 by the half mirror 11. Since most of the reflected light is captured by the television camera 20, the overall image appears relatively bright. In addition, the light irradiated on the folded end surface 6 obtained by breaking off the gate resin is diffusely reflected because the folded end surface 6 has an uneven rough surface, and the television camera 20 hardly captures the reflected light. The folded end surface 6 comes to be reflected in the bright end surface 2 in a dim state.
上記比較判別部30は、上記テレビカメラ20
で撮像された半導体装置1の端面2の画像からゲ
ート樹脂残り7の有無を比較良否判別するところ
であり、マイクロコンピュータ等の演算装置で構
成されている。該比較判別部30では、テレビカ
メラ20によって撮像された半導体装置1の明る
い端面2内に含まれて薄暗く映るゲート樹脂の実
際の折端面6の画像に画像処理等に施し、例えば、
その撮像面積S′を算出し、基準の撮像面積Sと
比較し、その差異を判別している。The comparison and determination section 30 includes the television camera 20
This section compares and determines the quality of the remaining gate resin 7 from the image of the end surface 2 of the semiconductor device 1 taken in the step 1, and is comprised of an arithmetic device such as a microcomputer. The comparison/discrimination section 30 performs image processing on the image of the actual folded end surface 6 of the gate resin, which is included in the bright end surface 2 of the semiconductor device 1 and appears dimly, captured by the television camera 20, and calculates, for example, its imaging area. S' is calculated and compared with the standard imaging area S to determine the difference.
ここで、基準となる撮像面積Sは、次のように
して算出される。即ち、ゲート樹脂が半導体装置
1の端面2から遠ざかるにつれて先太になって形
成されているので、ゲート樹脂残り7を全く生じ
ることなく半導体装置1の端面2に沿った正規の
折端面でゲート樹脂を折り取ると、その折端面の
断面積が最小となる。そのため、テレビカメラ2
0で上記同様に撮像した場合、モニター22に映
し出されるように、薄暗い折端面6′の画像が小
さく映し出される。ゲート樹脂残り7を生じた折
端面6はその断面積が順次広くなるので、モニタ
ー22に映し出される正規の折端面6′の画像に
画像処理等を施して撮像面積Sを算出して基準値
とする。Here, the reference imaging area S is calculated as follows. That is, since the gate resin is formed so as to become thicker as it goes away from the end surface 2 of the semiconductor device 1, the gate resin is formed on a regular folded end surface along the end surface 2 of the semiconductor device 1 without producing any remaining gate resin 7. When it is broken off, the cross-sectional area of the folded end surface becomes the minimum. Therefore, TV camera 2
When an image is taken in the same manner as described above at 0, a dim image of the folded end surface 6' is displayed in a small size as shown on the monitor 22. Since the cross-sectional area of the folded edge surface 6 that has generated the remaining gate resin 7 gradually increases, image processing is performed on the image of the regular folded edge surface 6' displayed on the monitor 22 to calculate the imaging area S, which is used as a reference value. do.
従って、この比較判別部30では、モニター2
2に映し出されて予め設定される正規の折端面6
′の撮像面積Sと、モニター21に映し出される
実際の折端面6の撮像面積S′とを比較し、両者
に差異、即ち、S′>Sであれば半導体装置1の
端面2からゲート樹脂残り7が突出していると判
断でき、ゲート樹脂残り7を有する半導体装置1
として検出することができる。反対に両者に差異
なくS′=Sであれば半導体装置1は正規の折端
面6′で折り取られ、ゲート樹脂残り7が形成さ
れていないと判断できる。Therefore, in this comparison/discrimination section 30, the monitor 2
2 and is set in advance.
Compare the imaging area S' of ' and the imaging area S' of the actual folded end surface 6 displayed on the monitor 21, and if there is a difference between the two, that is, S'>S, the gate resin remains from the end surface 2 of the semiconductor device 1. 7 is determined to be protruding, and the semiconductor device 1 has gate resin remaining 7
can be detected as On the other hand, if S'=S with no difference between the two, it can be determined that the semiconductor device 1 has been broken off at the normal folding end surface 6' and that the remaining gate resin 7 is not formed.
上記構成のゲート樹脂残り検出装置では、半導
体装置1のゲート樹脂を折り取った実際の折端面
6を含む端面をテレビカメラ20で映し出し、比
較判別部30において、映し出された折端面6の
撮像面積S′を算出すると共に、予め設定される
ゲート樹脂残りを生じていない折端面6′の撮像
面積Sと比較し、少しでも両者に差異が生じれば、
半導体装置1の端面2に折れ残ったゲート樹脂残
り7が突出していると判断でき、機械的でしかも
正確にゲート樹脂残り7を含む半導体装置1を検
出することができる。従つて、機械的に比較良否
判別されて正確にゲート樹脂残り7を有する半導
体装置1を検出でき、その自動化も実現できる。In the gate resin remaining detection device having the above configuration, the end face including the actual folded edge surface 6 obtained by breaking off the gate resin of the semiconductor device 1 is imaged by the television camera 20, and the imaging area of the projected folded edge surface 6 is imaged in the comparison determination unit 30. S' is calculated and compared with the preset imaging area S of the folded end face 6' where no gate resin remains, and if there is even a slight difference between the two, it is determined that the folded end face 2 of the semiconductor device 1 is left unbroken. It can be determined that the remaining gate resin 7 is protruding, and the semiconductor device 1 including the remaining gate resin 7 can be mechanically and accurately detected. Therefore, the semiconductor device 1 having the remaining gate resin 7 can be accurately detected through mechanical comparison and determination of quality, and automation thereof can also be realized.
尚、上記実施例において、ハーフミラー11を
用いることなく直接半導体装置1のゲート樹脂の
折端面を含む端面を照射し、その反射光をテレビ
カメラ20で撮像してもよい。また、テレビカメ
ラ20の撮像中心は、電気的な制御によって容易
に変更、調整が可能であるので、半導体装置の種
類が変った場合でも、その撮像中心を適当に変更、
調節して実にの折端面6の撮像面積を画像処理等
によって算出すればよい。In the above embodiment, the end face including the folded end face of the gate resin of the semiconductor device 1 may be directly irradiated without using the half mirror 11, and the reflected light may be imaged by the television camera 20. In addition, the imaging center of the television camera 20 can be easily changed and adjusted by electrical control, so even if the type of semiconductor device changes, the imaging center can be appropriately changed or adjusted to make it easier to use over time. The imaging area of the end face 6 may be calculated by image processing or the like.
さらに、上記比較判別部30では、撮像された
実際の折端面の画像の撮像面積を算出して、予め
設定される基準の撮像面積と比較良否判別したが、
撮像された実際の折端面の画像の対角線や一辺の
長さを画像処理等によって算出し、予め設定され
る基準の対角線や一辺の長さと比較良否判別して
もよく、その比較判断方法については種々の手段
で対応させることが可能である。Further, the comparison and determination section 30 calculates the imaging area of the image of the actual folded end surface and compares it with a preset reference imaging area to determine the quality of the captured image of the actual folded end surface. The length of the diagonal line and one side of the image may be calculated by image processing, etc., and compared with the diagonal line and length of one side of a preset standard to determine the quality. Various methods can be used for the comparison and judgment method. It is.
そして、本考案は、半導体装置に限らず、樹脂
成型物一般に適用できる。The present invention is applicable not only to semiconductor devices but also to resin molded products in general.
[考案の効果]
以上の説明から明かなように、本考案のゲート
樹脂残り検出装置では、ゲート樹脂残りを機械的
に比較良否判別して確実に検出できるといった効
果を奏する。[Effects of the Invention] As is clear from the above description, the remaining gate resin detection device of the present invention has the advantage of being able to mechanically compare and determine whether the remaining gate resin is good or bad and thereby reliably detect it.
第1図は本考案の一実施例に係るゲート樹脂残
り検出装置の概略を示す概略説明図、第2図は樹
脂モールド後の半導体装置を示す一部破断斜視
図、第3図はゲート樹脂を折り取つた状態の半導
体装置を示す一部破断斜視図である。
1……樹脂成型物(半導体装置)、2……端面、
3……ゲート樹脂、7……ゲート樹脂残り、10
……光源、20……テレビカメラ、30……比較
良否判別部。FIG. 1 is a schematic explanatory diagram showing the outline of a gate resin remaining detection device according to an embodiment of the present invention, FIG. 2 is a partially cutaway perspective view showing a semiconductor device after resin molding, and FIG. FIG. 2 is a partially cutaway perspective view showing the semiconductor device in a folded state. 1...Resin molded product (semiconductor device), 2...End face, 3...Gate resin, 7...Remaining gate resin, 10
. . . Light source, 20 . . . Television camera, 30 . . . Comparison quality determination unit.
補正 平4・3・19
図面を次のように補正する。
Correction: 3/19/1999
Correct the drawing as follows.
Claims (1)
して得られた樹脂成形物のゲート部分の樹脂残り
を検出するためのゲート樹脂残り検出装置であつ
て、 上記樹脂成型物のゲート樹脂端面に光を照射す
る光源と、上記端面を撮像するテレビカメラと、 該テレビカメラによる画像信号を所定の信号パタ
ーンと比較良否判別する比較判別部とを具備した
ことを特徴とするゲート樹脂残り検出装置。[Scope of Claim for Utility Model Registration] A gate resin remaining detection device for detecting resin remaining at the gate portion of a resin molded product obtained by injecting resin into a mold cavity through a gate, which comprises: It is characterized by comprising a light source that irradiates light onto the end face of the gate resin of the molded product, a television camera that images the end face, and a comparison and determination unit that compares the image signal from the television camera with a predetermined signal pattern and determines the quality. gate resin remaining detection device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5680290U JPH04100830U (en) | 1990-05-29 | 1990-05-29 | Gate resin remaining detection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5680290U JPH04100830U (en) | 1990-05-29 | 1990-05-29 | Gate resin remaining detection device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH04100830U true JPH04100830U (en) | 1992-09-01 |
Family
ID=31790549
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5680290U Pending JPH04100830U (en) | 1990-05-29 | 1990-05-29 | Gate resin remaining detection device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH04100830U (en) |
-
1990
- 1990-05-29 JP JP5680290U patent/JPH04100830U/en active Pending
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