JPH0411183Y2 - - Google Patents

Description

[Detailed description of the invention] [Industrial application field] This invention involves mounting an IC to be tested on a socket board, inserting this socket board into the tester body, and connecting the connector part of the socket board to the connector of the tester body. The present invention relates to a socket board attaching/detaching device for an IC tester for attaching/detaching the socket board to/from the tester body in an IC tester having a fitting structure.

[Industrial Application Field] As a mechanism for removably attaching a socket board with an IC mounted thereon to an IC tester, the configuration shown in FIGS. 5 and 6 has been known.

That is, in FIG. 5, reference numeral 1 indicates an IC tester main body, and a plurality of socket boards 2, for example, five socket boards 2, can be attached to this IC tester main body 1.
An IC (not shown) is installed in advance. The IC tester main body 1 is provided with a guide rail 3 for guiding the socket board 2 up and down, and the socket board 2 is guided along the guide rail 3 in the direction shown by the arrow A-B. It's getting old.

The IC tester main body 1 is provided with a connector 4, and when the socket board 2 is inserted in the direction of arrow A, the connector portion 2a of the socket board 2 is fitted into the connector 4. Moreover, socket board 2 is connected to connector 4.
In order to ensure reliable insertion into the connector, an L-shaped lever 2b is rotatably supported at the rear end of the socket board 2, that is, at a vertical position opposite to the side where the connector section 2a is provided. The IC tester main body 1 is provided with a lever engaging portion 1a that is engaged with this lever 2b.

Therefore, as is clear from FIG. 6, which is an enlarged view of section C in FIG. Move forward and turn in the direction of arrow E to connect connector 4 of this socket board 2.
The mating state of the IC tester is released, and the IC tester can be moved back in the direction of being detached from the IC tester.

[Problems to be Solved by the Invention] By the way, as described above, each socket board 2 is provided with a pair of L-shaped levers 2b, and each L-shaped lever 2b is operated each time each socket board 2 is attached to or removed from an IC tester. The disadvantage is that the operation is very troublesome and requires a lot of time and effort. In addition, since the L-shaped lever 2b is directly provided on the socket board 2, this L-shaped lever 2b
There is also the problem that b cannot be made very large, and therefore the lever ratio cannot be made large, so a considerably large operating force is required to perform the rotational operation. Furthermore, when operating this L-shaped lever 2b, it is necessary to apply an operating force parallel to the board surface of the connector board 2, and when force is applied in the board thickness direction or bending direction, the connector board 2 There is also the inconvenience of damage.

The present invention was developed in view of the above points, and its purpose is to provide an IC that allows multiple socket boards to be easily attached to and detached from an IC tester by an extremely simple operation. An object of the present invention is to provide a tester socket board attachment/detachment device.

[Means for solving the problem] In order to achieve the above-mentioned purpose, the present invention has the following features:
A guide frame body is provided on the tester body of the IC tester so as to surround the connector, and a slide frame on which a plurality of socket boards are attached in parallel is attached to the guide frame so as to be slidable by a back and forth drive means. , the slide frame is characterized in that regulating members are provided at both ends of the slide frame to regulate the front and rear positions of the socket board in the direction in which it is fitted to the connector, and at least the rear regulating member is removable from the slide frame. It is something to do.

[Function] By adopting the above-mentioned configuration, by attaching a plurality of socket boards to the slide frame and operating the forward and backward movement drive means, it becomes possible to attach and detach all the socket boards to and from the tester body at once. , Moreover, at the time of attachment and detachment,
The slide frame slides along the guide frame and is designed so that no operating force is applied directly to the socket board, so no force is applied in the thickness direction or bending direction of the socket board. Inconveniences that could damage the socket board are reliably prevented. In addition, when a lever or the like is used as the longitudinal movement drive means, the lever ratio of this lever can be increased.
The socket board can be easily attached and detached with a light operating force.

[Embodiment] An embodiment of the present invention will be described below with reference to FIGS. 1 to 4.

Although this embodiment will be described as having five socket boards 2 that can be attached to and detached from the IC tester main body 1, the number of socket boards is not limited to this, as in the prior art described above. Needless to say.

In FIG. 1, numeral 10 indicates a guide frame, and the guide frame 10 is made of a rectangular cylindrical frame.
It is provided so as to surround the socket 4 in the IC tester main body 1 and protrude from the wall surface thereof. A slide frame 5 is attached to this guide frame 10, and as is clear from FIG. It is inserted and fitted so that it can be slid in the direction.

The socket board 2 is attached to this slide frame 5.
A guide groove 5a for guiding each socket board 2 is provided at the top and bottom of the board.
are provided, and each socket board 2 is mounted parallel to the guide groove 5a. In order to position and fix each socket board 2 in the direction of the guide groove 5a, a regulating member 8 is integrally attached to the slide frame 5 on the side facing the socket 4, that is, on the front end. Further, a regulating member 7 is provided on the other side of the slide frame 5, that is, at the rear end.
are removably attached to hooks 9 fixed to the left and right walls of the slide frame 5. Therefore, when the regulating member 7 is attached to the hook 9, the socket board 2 does not deviate from the slide frame 5, but when the regulating member 7 is removed from the hook 9, the socket board 2 cannot be attached to the slide frame 5 or removed from the slide frame 5. It is designed so that it can be removed.

Further, reference numeral 6 indicates a manually operated lever as a reciprocating drive means for slidingly displacing the slide frame 5 in the directions of arrows A and B in FIG. As is clear from the figure, it is formed into a substantially U-shape, and both ends thereof are rotatable on a shaft 11 protruding from the outer surface of the guide frame 10, as is clear from FIGS. 3 and 4. is supported by. And the lever 6 is the link 1
Slider 1 that constitutes linear mechanism 13 via 2
3a, and the slider 13a can slide along a guide 13b attached to the guide frame 10. Further, a connecting pin 13c is inserted through the slider 13a.
c is pivotally connected to the link 12 at one end and connected to the slide frame 5 at the other end. Therefore, when the lever 6 is rotated in the direction of arrow E in FIG. 3, the slider 13a moves forward via the link 12, and the slide frame 5 is slid in the direction of arrow A in FIG. 4, and vice versa. When the lever 6 is rotated in the direction of arrow F in FIG. 3, the slider 13a moves backward, and the slide frame 5 is slidably displaced in the direction of arrow B in FIG.

This embodiment is constructed as described above, and its operation will be explained next.

First, the lever 6 is rotated in the direction of arrow F to displace the slide frame 5 in the direction of arrow B relative to the guide frame 10, and the socket 4 of the IC tester main body 1 is opened.
4', and remove the regulating member 7 from the hook 9. Then, the socket board 2 is inserted along each guide groove 5a of the slide frame 5.
Insert from direction D in Figure 3. When this work is completed, the regulating member 7 is attached to the hook 9. As a result, each socket board 2 is fixed by the guide groove 5a and the regulating members 7, 8, and will not be unnecessarily misaligned.

Therefore, when the lever 6 is rotated in the direction of arrow E, the slider 13a forming the linear mechanism 13 moves forward along the guide 13b, that is, it is displaced in the direction of arrow A. A connecting pin 13c is attached to this slider 13a, and this connecting pin 1
3c is connected to the slide frame 5, so the slide frame 5 is displaced along the guide frame 10 in the direction of arrow A, that is, in the direction approaching the sockets 4, 4'. Here, since each socket board 2 is fixed to the slide frame 5, the connector portions 2a, 2a' of each socket board 2 are fitted into the connectors 4, 4'. At the time of this fitting, a reaction force acts to push back the socket board 2 in the direction of arrow B, but this reaction force is applied to the regulating member 7.
Therefore, each socket board 2 can be smoothly attached to the connectors 4, 4'. Moreover, the operating force of the lever 6 acts on the slide frame 5, and the slide frame 5
moves straight along the guide frame 10, and no operating force is directly applied to the socket board 2, so forces in the bending direction or the thickness direction may act on the socket board 2 and damage it. There's no fear.

Next, once the inspection measurement by the IC tester is completed,
Rotate the lever 6 in the direction of arrow F. As a result, the slider 13a is displaced along the guide 13b, the slide frame 5 is slid in the direction of arrow B along the guide frame 10, and the connector parts 2a and 2a' of the socket board 2 are connected to the IC tester. It is then removed from the sockets 4, 4' of the main body 1.
Since the slide frame 5 is provided with a regulating member 8, the sockets 4 of this socket board 2,
4' can be smoothly removed.
After that, when the regulating member 7 is removed from the hook 9, the socket board 2 can be replaced.

As mentioned above, multiple socket boards 2 can be attached to and detached from the sockets 4 and 4' of the IC tester main body 1 by simply rotating the lever 6, which greatly simplifies the operation. will be done. Moreover, the lever ratio of this lever 6 can be made extremely large, for example, 8 times in the case of the one shown in the figure, and since the force is doubled by the linear mechanism 13, it can be operated reliably with a light operating force. The socket board 2 can now be attached and detached.

In the above-mentioned embodiment, the longitudinal movement drive means for moving the slide frame back and forth is as follows:
Although lever 6 was used, instead of this,
For example, a hydraulic actuator, an electric motor, or the like may be used.

[Effects of the invention] As explained above, the present invention is capable of slidingly displacing a slide frame on which a plurality of socket boards are attached along a guide frame body using a back-and-forth movement driving means that moves a slide frame mounted with a plurality of socket boards back and forth, thereby attaching the slide frame to the connector of an IC tester. Since it is constructed so that it can be attached and detached, this attachment and detachment operation is extremely simple and easy, and since no operating force is applied directly to the socket board,
Inconveniences such as damage caused by excessive bending force acting on the socket board can be reliably prevented.

[Brief explanation of drawings]

1 to 4 show an embodiment of the present invention, in which FIG. 1 is a sectional view of the socket board attachment/detachment device, FIG. 2 is a rear view of FIG. 1, and FIG. 3 is a side view.
Figure 4 is an external view of the IC tester, Figures 5 and 6 show the conventional technology, Figure 5 is a partially cutaway view of the socket board attachment/detaching device, and Figure 6 is an enlarged view of section C in Figure 5. be. 1...IC tester body, 2...socket board,
2a, 2a'...Connector part, 4, 4'...Connector, 5...Slide frame, 6...Manual operation lever, 7, 8...Regulation member, 9...Hook, 10
... Guide frame body, 12 ... Link, 13 ... Linear mechanism, 13a ... Slider, 13b ... Guide,
13c...Connecting pin.

Claims (1)

[Scope of utility model registration request] In an IC tester in which an IC to be tested is mounted on a socket board, the socket board is inserted into a tester body, and a connector portion of the socket board is fitted to a connector on the tester body, the tester body is guided so as to surround the connector. A frame body is provided, and a slide frame on which a plurality of socket boards are mounted in parallel is slidably mounted on the guide frame by a back-and-forth movement drive means, and at both ends of the slide frame, a plurality of socket boards are connected to the connectors of the socket boards. An IC characterized in that a regulating member is provided for regulating the front and rear positions in the mating direction of the IC, and at least the rear regulating member is removable from the slide frame.
Tester socket board attachment/detachment device.