JPH041283B2 - - Google Patents

Info

Publication number
JPH041283B2
JPH041283B2 JP58122853A JP12285383A JPH041283B2 JP H041283 B2 JPH041283 B2 JP H041283B2 JP 58122853 A JP58122853 A JP 58122853A JP 12285383 A JP12285383 A JP 12285383A JP H041283 B2 JPH041283 B2 JP H041283B2
Authority
JP
Japan
Prior art keywords
gap
rotating body
opposing
light
optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58122853A
Other languages
Japanese (ja)
Other versions
JPS6014107A (en
Inventor
Yasukazu Fujimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koyo Seiko Co Ltd
Original Assignee
Koyo Seiko Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koyo Seiko Co Ltd filed Critical Koyo Seiko Co Ltd
Priority to JP12285383A priority Critical patent/JPS6014107A/en
Publication of JPS6014107A publication Critical patent/JPS6014107A/en
Publication of JPH041283B2 publication Critical patent/JPH041283B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/028Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring lateral position of a boundary of the object
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/14Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Description

【発明の詳細な説明】 この発明は光学的回転精度測定装置、殊に真円
度のよい回転体のダイナミツクなふれ回り回転精
度の測定装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an optical rotational accuracy measuring device, and more particularly to a measuring device for measuring the dynamic whirling rotational accuracy of a rotating body with good roundness.

従来、金属加工物等の精密加工部品を用いた回
転系において、ダイナミツクな回転精度の測定に
は、渦電流方式、或は静電容量方式の非接触プロ
ーブが使用されてきた。また回転体が非金属で作
られている場合には、前記タイプのプローブが使
用できないために、種々の方法が提案されてき
た。例えば、光プローブによる微小距離測定原理
を応用したもの等が考えられるが、これらの方法
は、いずれも金属面等、回転体の材質、形状等に
より影響を受け、また光プローブでは、回転体の
反射率の影響をまともに受けるために、較正が大
変患わしくなるという不便がある。
BACKGROUND ART Conventionally, non-contact probes of eddy current type or capacitance type have been used to measure dynamic rotation accuracy in rotating systems using precision machined parts such as metal workpieces. Furthermore, when the rotating body is made of non-metal, the above-mentioned type of probe cannot be used, so various methods have been proposed. For example, it is possible to apply the principle of minute distance measurement using an optical probe, but all of these methods are affected by the material and shape of the rotating body, such as metal surfaces, and optical probes are affected by the material and shape of the rotating body. There is an inconvenience that calibration becomes very difficult because it is directly influenced by reflectance.

一方、接触型プローブでダイナミツクな回転精
度を測定しようとすると、プローブの摩耗、或は
測定圧によつては測定系への影響が大きくなる等
により測定値が不安定で信頼性が低下するという
重大な欠点がある。
On the other hand, when trying to measure dynamic rotational accuracy with a contact probe, the measurement values become unstable and reliability decreases due to probe wear or the measurement pressure having a greater effect on the measurement system. There are serious drawbacks.

この発明は以上のような従来技術の諸欠点を解
消し、回転体の材質、表面の反射率、加工状態等
による影響がきわめて少ない非接触型の光学的ふ
れ回り回転精度測定装置を提供することを目的と
するものである。
The present invention eliminates the various drawbacks of the prior art as described above, and provides a non-contact type optical whirling rotation accuracy measuring device that is extremely little affected by the material of the rotating body, surface reflectance, processing conditions, etc. The purpose is to

この発明は、回転体の外周に測定部材を近接さ
せて、例えば0.1mm〜1μmの適正な対向スキマを
形成させ、その対向スキマに一定強度の光を発す
るスポツト光を当て所定周期でスキマの幅方向に
走査せしめてその透過光を光電変換し、透過光に
より生ずるパルス信号のピーク値とパルス巾が、
前記対向スキマ幅と密接な関係を有することを利
用し、走査光の走査周期と同調した周波数sのn
次高調波のフーリエ成分の振巾大きさをもつて前
記スキマ幅を関係づけ、その量をもつてスキマ幅
を測定しふれ回り回転精度を測定することを特徴
とする。
In this invention, a measurement member is brought close to the outer periphery of a rotating body to form an appropriate opposing gap of, for example, 0.1 mm to 1 μm, and a spot light emitting light of a constant intensity is applied to the opposing gap to increase the width of the gap at a predetermined period. The peak value and pulse width of the pulse signal generated by the transmitted light are
Taking advantage of the fact that it has a close relationship with the opposing gap width, n of the frequency s synchronized with the scanning period of the scanning light is
The present invention is characterized in that the gap width is related to the amplitude of the Fourier component of the harmonic, and the gap width is measured using the amount to measure the whirling rotation accuracy.

以下この発明を図示の実施例に従つて詳細に説
明する。図において、矢符方向に回転する回転体
1の外周に、例えばナイフエツジを形成した測定
部材2の先端を近接させ、移動機構3等の設定手
段によりナイフエツジ先端と回転体1外周面との
間に例えば0.1mm〜1μmの対向スキマ幅λを有す
る対向スキマを形成させる。
The present invention will be described in detail below with reference to illustrated embodiments. In the figure, the tip of a measuring member 2 on which a knife edge is formed, for example, is brought close to the outer periphery of a rotating body 1 rotating in the direction of the arrow, and a setting means such as a moving mechanism 3 is used to place the tip of the knife edge and the outer circumferential surface of the rotating body 1. For example, opposing gaps having opposing gap width λ of 0.1 mm to 1 μm are formed.

4はHe−Neレーザー発振管等の投光手段であ
つて、該発振管4を出たレーザー光を、ピンホー
ル5により適度のビームスポツト径に細め、ビー
ムスプリツター6により二方向に分光する。
4 is a light projecting means such as a He-Ne laser oscillation tube, and the laser beam emitted from the oscillation tube 4 is narrowed to an appropriate beam spot diameter by a pinhole 5, and split into two directions by a beam splitter 6. .

ビームスプリツター6により直角に向きを変え
られたレーザー光は、Si太陽電池7にて光電変換
され、後述するレーザー光の強度ゆらぎに対する
補正に供される。
The laser beam whose direction is changed at right angles by the beam splitter 6 is photoelectrically converted by the Si solar cell 7, and is used for correction of intensity fluctuations of the laser beam, which will be described later.

ビームスプリツター6を直進するスポツト光
は、反射ミラー8を介して振動ミラー9に入射さ
せる。振動ミラー9は、発振器ドライバ10と振
動ミラー9に付属のタコジエネレーター(図示せ
ず)で構成される発振回路の一部となり、振動ミ
ラー9の自己共振周波数sで発振を行う光走査手
段となる。振動ミラー9から反射されるスポツト
光は、前記周波数sに対応する扇状の走査ビーム
となるが、該光路に配置した対物レンズ11にて
平行に進む走査光となるようにしてある。すなわ
ち対物レンズ11の位置を、振動ミラー9上の反
射点に対し対物レンズ11自体の焦点距離と等し
くなる位置に設定する。
The spot light traveling straight through the beam splitter 6 is made to enter a vibrating mirror 9 via a reflecting mirror 8. The vibrating mirror 9 is part of an oscillation circuit composed of an oscillator driver 10 and a tachometer generator (not shown) attached to the vibrating mirror 9, and is an optical scanning means that oscillates at the self-resonant frequency s of the vibrating mirror 9. becomes. The spot light reflected from the vibrating mirror 9 becomes a fan-shaped scanning beam corresponding to the frequency s , and is turned into a scanning light traveling in parallel by an objective lens 11 disposed in the optical path. That is, the position of the objective lens 11 is set to be equal to the focal length of the objective lens 11 itself with respect to the reflection point on the vibrating mirror 9.

而して対物レンズ11を通つた平行走査光(ス
ポツト光)により前記回転体1と測定部材2との
間の対向スキマを照射し、対向スキマ幅の走査を
行う。前記スポツト光は、回転体1の軸線に平行
に前記対向スキマを照射する。
Then, the opposing gap between the rotating body 1 and the measuring member 2 is irradiated with parallel scanning light (spot light) passing through the objective lens 11, and the width of the opposing gap is scanned. The spot light irradiates the opposing gap parallel to the axis of the rotating body 1.

前記対向スキマを透過した走査光を、集光レン
ズ12a,12b、外光の影響を少なくするため
に設けた干渉フイルタ13、光電子増倍管14等
の受光光学系15にて集収し、光電子増倍管14
にて光電変換する。光電子増倍管14からの電気
信号は、前置増巾器16で増巾後、オート・フエ
ーズ機能付ロツクインアンプ17に入力する。該
アンプ17の参照信号として、振動ミラー9の発
振ドライバ10の出力信号を入力し、その出力
を、前記太陽電池7の増巾器18で増巾した出力
と共にレーザー光強度ゆらぎ補正部19に入力
し、該補正部19より後述するように対向スキマ
幅λとある関係をもつた電圧V を出力する。
The scanning light transmitted through the opposing gap is collected by a light receiving optical system 15 including condenser lenses 12a and 12b, an interference filter 13 provided to reduce the influence of external light, and a photomultiplier tube 14, and is photoelectron multiplied. Double tube 14
Photoelectric conversion is performed. The electrical signal from the photomultiplier tube 14 is amplified by a preamplifier 16 and then input to a lock-in amplifier 17 with an auto-phase function. The output signal of the oscillation driver 10 of the vibrating mirror 9 is input as a reference signal of the amplifier 17, and the output is input to the laser light intensity fluctuation correction unit 19 together with the output amplified by the amplifier 18 of the solar cell 7. Then, the correction section 19 outputs a voltage V that has a certain relationship with the facing gap width λ, as will be described later.

レーザー光強度ゆらぎ補正部19は、レーザー
光強度の温度、その他に起因するゆらぎによる影
響を極力小さく抑えるために用いる。
The laser light intensity fluctuation correction unit 19 is used to minimize the influence of fluctuations in laser light intensity caused by temperature and other factors.

以上において、 V =F(λ)、又はλ=F-1(V ) λ:対向スキマ幅 で表わされる関係により出力電圧V を測定し、
間接的に対向スキマ幅λを測定することができ
る。具体的な関数F(λ)の形は、後に決定され
る。
In the above, the output voltage V is measured according to the relationship expressed by V = F (λ) or λ = F -1 (V) λ: opposing gap width,
The facing gap width λ can be measured indirectly. The specific form of the function F(λ) will be determined later.

以上のような対向スキマ幅測定において、回転
体1を回転させることにより、回転中のスキマ変
化、或は回転体1の真円度が十分に良ければ、回
転中のふれ回りによるスキマ変化を正確に測定す
ることができる。なお実施例では、振動ミラー9
の振動周波数は約2kHzであつた。従つて回転数
に換算してほぼ12000R.P.Mまで使用可能であつ
た。
In the above opposed gap width measurement, by rotating the rotating body 1, the gap change during rotation, or if the circularity of the rotating body 1 is sufficiently good, the gap change due to whirling during rotation can be accurately measured. can be measured. In the embodiment, the vibrating mirror 9
The vibration frequency was approximately 2kHz. Therefore, it could be used up to approximately 12,000 R.PM in terms of rotational speed.

第3図は、実際に得られた光電子増倍管出力後
の信号波形Vであるが、対向スキマ幅に比べて、
レーザー光のスポツト径をかなり大きく設定する
ことにより、Vpeakが対向スキマ幅λにほぼ比
例する。またパルスの持続時間Twidthも対向ス
キマ幅λの関数となつている。
Figure 3 shows the actually obtained signal waveform V after the photomultiplier tube output, but compared to the opposing gap width,
By setting the spot diameter of the laser beam to be considerably large, Vpeak becomes approximately proportional to the facing gap width λ. Further, the pulse duration Twidth is also a function of the facing gap width λ.

出力電圧V と対向スキマ幅λの関係は、第3
図のようなパルス列にフーリエ解析を行うことに
より、 V =Kp/πΔZSin2πΔZ ここで ΔZ=λ/Xo Xo:レーザー光走査幅 Ko:適当な比例定数 なる関係にあることが導かれる。通常の使用では
λ≪xoであることから、V と対向スキマ幅λ
は、簡単な2次の関係 V =k1(Δz)2k1:適当な比例定数 にあることが判る。
The relationship between the output voltage V and the facing gap width λ is expressed by the third
By performing Fourier analysis on the pulse train as shown in the figure, it is derived that the following relationship exists: V = K p /πΔZSin2πΔZ where ΔZ = λ/Xo Xo: laser beam scanning width Ko: appropriate proportionality constant. In normal use, since λ≪xo, V and opposing clearance width λ
It can be seen that there is a simple quadratic relationship: V = k 1 (Δz) 2 k 1 : an appropriate constant of proportionality.

以上は、光電子増倍管14、前置増巾器16の
応答速度が、パルスの立上り、或は1/Twidth
に比べて十分に速い場合の議論であつたが、光電
子増倍管14、前置増巾器16の応答速度が比較
的遅い場合(系の応答周波数をRとする。)、すな
わちTwidth≪1/Rが成立するような場合には、
Twidthはもはや対向スキマ幅λの関数ではなく、
系の応答速度によつて決定される一定幅のパルス
となる。この場合には、出力電圧V と対向スキ
マ幅λの関係は線形となり、 V =K2ΔZ K2:適当な比例定数 と表わせる。
In the above, the response speed of the photomultiplier tube 14 and preamplifier 16 depends on the pulse rise or 1/Twidth.
The discussion was about the case where the response speed of the photomultiplier tube 14 and the preamplifier 16 is relatively slow (the response frequency of the system is R ), that is, Twidth≪1. / If R holds, then
Twidth is no longer a function of the opposing gap width λ,
This results in a pulse with a constant width determined by the response speed of the system. In this case, the relationship between the output voltage V and the facing gap width λ is linear, and can be expressed as V = K 2 ΔZ K 2 : an appropriate proportionality constant.

以上のような測定原理を応用して回転精度の測
定を行うものであるが、これはさらに第4図に示
す如く、X、Y2方向から測定を行えば、さらに
具体的なふれ回り回転精度測定を行うことができ
る。
The rotational accuracy is measured by applying the above measurement principle, but if you measure from the X and Y directions as shown in Figure 4, you can measure the rotational accuracy in a more specific way. It can be performed.

すなわち、前記の光走査手段をX軸とY軸の2
方向から90°の位相差をもつて配置し、各測定部
からの出力電圧をオツシロスコープのX、Y入力
部に入力し、リサージユ図形を描かせることによ
り、真円からのひずみ量をもつてふれ回り回転精
度を測定する。9′は反射ミラーである。
In other words, the optical scanning means is
The output voltage from each measuring section is input to the X and Y input sections of the oscilloscope, and a Lissage figure is drawn to obtain the amount of distortion from a perfect circle. Measure rotation accuracy. 9' is a reflecting mirror.

この発明は以上のように、レーザー光、或は他
の適当な光学的プローブを用いた非接触方式であ
るために、従来のようなプローブの摩耗、測定圧
のバラツキ、変化等の問題が全くなく、測定にお
いて、回転体外周と測定部材との間の対向スキマ
からの光の透過量を利用するものであるから、回
転体の材質(但し透明物体は除外する。)による
影響はなく、表面の反射率、加工状態による影響
が非常に少ないといつた種々の利点を有し、高精
度の測定を可能とする。
As described above, since this invention is a non-contact method using a laser beam or other suitable optical probe, there are no problems such as wear of the probe and variations and changes in measurement pressure as in the past. In measurement, the amount of light transmitted from the opposing gap between the outer periphery of the rotating body and the measuring member is used, so there is no effect of the material of the rotating body (however, transparent objects are excluded), and the surface It has various advantages such as very little influence on the reflectance and processing conditions, making it possible to measure with high precision.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明の一実施例の系統図、第2図
は要部の側面図、第3図は光電変換して得られる
電気信号の波形図、第4図a,bは他の実施例要
部の正面図と側面図である。 1……回転体、2……測定部材、3……移動機
構(設定手段)、4……投光手段、9……振動ミ
ラー(光走査手段)、14……光電子増倍管、1
5……受光光学系、17……ロツクインアンプ、
19……光強度ゆらぎ補正部、λ……対向スキマ
幅。
Fig. 1 is a system diagram of one embodiment of this invention, Fig. 2 is a side view of the main part, Fig. 3 is a waveform diagram of an electric signal obtained by photoelectric conversion, and Fig. 4 a and b are other embodiments. They are a front view and a side view of the main part of the example. DESCRIPTION OF SYMBOLS 1... Rotating body, 2... Measuring member, 3... Moving mechanism (setting means), 4... Light projecting means, 9... Vibrating mirror (light scanning means), 14... Photomultiplier tube, 1
5... Light receiving optical system, 17... Lock-in amplifier,
19... Light intensity fluctuation correction section, λ... Opposing gap width.

Claims (1)

【特許請求の範囲】 1 回転体の外周に対向スキマを形成するための
測定部材と、該測定部材を移動させて前記対向ス
キマ幅を適正に設定する設定手段と、スポツト光
を照射する投光手段と、前記対向スキマに一定強
度の光を発するスポツト光を照射し所定周期で該
対向スキマをスキマの幅方向に走査する光走査手
段と、前記対向スキマを透過した光を受光して光
電変換する光電変換手段と、光電変換手段の出力
パルス信号を受け、そのフーリエ級数成分のうち
光走査手段の走査周期と同調した周波数sのn次
高調波成分を検波して出力するロツクインアンプ
とを備え、回転体と測定部材との間の前記対向ス
キマ幅の変化に対応するロツクインアンプの出力
電圧により回転体のふれ回り回転精度を測定する
ことを特徴とする光学的ふれ回り回転精度測定装
置。 2 回転体の外周に90°の位相差をもつて2個の
測定部材を配置し、各測定部材を個々に移動させ
てそれぞれに前記対向スキマを形成させる2組の
設定手段と、各対向スキマをそれぞれのスポツト
光で各スキマの幅方向に走査する2組の光走査手
段と、各対向スキマを透過した光を個々に受光す
る2組の光電変換手段と、各光電変換手段の出力
パルス信号を受け、それぞれのフーリエ級数成分
のうち光走査手段の走査周期と同調した周波数s
のn次高調波成分を検波してそれぞれに対応した
電圧を出力するロツクインアンプとを特許請求の
範囲1記載の光学的ふれ回り回転精度測定装置。
[Scope of Claims] 1. A measuring member for forming a facing gap on the outer periphery of a rotating body, a setting means for moving the measuring member to appropriately set the width of the facing gap, and a light projector for irradiating spot light. means, a light scanning means for irradiating the opposing gap with a spot light emitting light of a constant intensity and scanning the opposing gap in the width direction of the gap at a predetermined period; and receiving the light transmitted through the opposing gap for photoelectric conversion. and a lock-in amplifier that receives the output pulse signal of the photoelectric conversion means, detects and outputs an n-th harmonic component of a frequency s synchronized with the scanning period of the optical scanning means among its Fourier series components. An optical whirling rotational accuracy measuring device, characterized in that the whirling rotational accuracy of the rotating body is measured by the output voltage of a lock-in amplifier corresponding to the change in the opposing gap width between the rotating body and the measuring member. . 2. Two sets of setting means for arranging two measuring members with a phase difference of 90° around the outer periphery of the rotating body and moving each measuring member individually to form the opposing gaps, and each opposing gap. two sets of optical scanning means that scan each gap in the width direction with respective spot lights, two sets of photoelectric conversion means that individually receive the light transmitted through each opposing gap, and an output pulse signal of each photoelectric conversion means. of each Fourier series component, the frequency s is tuned to the scanning period of the optical scanning means.
2. The optical whirling rotation accuracy measuring device according to claim 1, further comprising a lock-in amplifier that detects n-th harmonic components of and outputs voltages corresponding to the respective n-th harmonic components.
JP12285383A 1983-07-05 1983-07-05 Optical measuring device of rotation precision Granted JPS6014107A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12285383A JPS6014107A (en) 1983-07-05 1983-07-05 Optical measuring device of rotation precision

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12285383A JPS6014107A (en) 1983-07-05 1983-07-05 Optical measuring device of rotation precision

Publications (2)

Publication Number Publication Date
JPS6014107A JPS6014107A (en) 1985-01-24
JPH041283B2 true JPH041283B2 (en) 1992-01-10

Family

ID=14846256

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12285383A Granted JPS6014107A (en) 1983-07-05 1983-07-05 Optical measuring device of rotation precision

Country Status (1)

Country Link
JP (1) JPS6014107A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04152203A (en) * 1990-10-16 1992-05-26 Mitsutoyo Corp Scanning type optical dimension measuring device

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5585207A (en) * 1978-12-22 1980-06-27 Toshiba Corp Projection location measuring device

Also Published As

Publication number Publication date
JPS6014107A (en) 1985-01-24

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