JPH04145699A - Collection structure of ic device housing magazine - Google Patents

Abstract

PURPOSE:To prevent the flow out of untested devices by detecting the presence of remaining IC devices and discriminately housing empty magazines, and defective magazines for device discharge. CONSTITUTION:After a housed device D is discharged by tilting a magazine 10 at a loader section 1, the remainder is confirmed by a residual device detection means 23. If the magazine is found empty, a cylinder 27 houses the magazine 10 into an empty magazine housing section 25, keeping its vertical state. On the other hand, when it is detected that the device still remains in the magazine, the cylinder 27 operates where a shutter 26 is tilted so that the magazine may be housed into a defective discharge magazine housing section 24. After the residual device D is removed, it is housed and set to the loader section again. This construction makes it possible to confirm the presence of residual devices and prevent untested devices from flowing out as a non-defective products.

Description

DETAILED DESCRIPTION OF THE INVENTION (Industrial Application Field 1) The present invention is an apparatus for testing and measuring the electrical characteristics of IC devices (integrated circuit elements), in which IC devices are dispensed from a magazine containing the IC devices. The present invention relates to a collecting mechanism for a magazine for storing IC devices for collecting the magazine after the IC device is stored therein.

[Prior Art I] As is well known, an IC device testing/measuring device includes an IC tester that tests and measures devices, a loader section that supplies devices to the IC tester, and a device that is supplied from the loader section. The IC handler includes a device contact mechanism mounted on the test head of the IC tester and an unloader section for classifying devices after testing based on test results. Here, normally, the devices are stored in a magazine in a row, this magazine is loaded on the loader section, the devices are taken out from this magazine and supplied to the device contact mechanism,
Further, in the unloader section, the devices are stored in a magazine and recovered.

Here, in an IC handler, as a method for transporting a device from a loader section to a device contact mechanism and from a device contact mechanism to an unloader section, a self-weight sliding method is used in order to simplify the structure.

For this purpose, a loader section is installed at a high location, and the magazine is tilted in the loader section, and the devices stored inside the magazine are slid down by their own weight into an inclined chute connected to the device outlet of this magazine. It is fed in and allowed to slide down the sloping chute under its own weight. The device contact mechanism is constructed by providing a device clamping means and a contact means for bringing the device clamped by the device clamping means toward and away from the test head in the middle of this inclined chute or on a vertical chute whose direction is changed from the inclined chute. configured. Further, the unloader section includes a classification mechanism connected to the inclined chute and a device recovery section in which a number of magazines corresponding to the number of classifications are installed.

The loader section is loaded with actual magazines containing devices to be tested and measured, and the unloader section is loaded with empty magazines. The unloader section is provided with a magazine stock section in which a large number of magazines are set, and the magazines are taken out one by one from this magazine stock section.
I try to send it to the required area.

Therefore, in the loader section, the magazine is tilted,
When devices stored inside the magazine are ejected, the devices may become jammed in the magazine and cannot be ejected. Conventionally, even in such a case, the device was not forcibly ejected from the magazine, the magazine was collected from the loader section, and when the worker aligned the magazines after collection, I was checking to see if there were any devices left in the magazine.

(Problem to be Solved by the Invention 1) By the way, as mentioned above, the work of checking whether there are any devices remaining in the magazine after collecting the magazine from the loader section is not only extremely troublesome, but also the work of checking is not always complete. However, in recent years, the magazine collected in the loader section has been set in the unloader section and used to store the device after testing. If there are devices remaining in a magazine set to store good devices in the loader section without being ejected from the loader section, this will pose an extremely serious problem in terms of quality control.

The present invention has been made in view of the above-mentioned points, and its purpose is to automatically detect a magazine in which a device remains after an IC device is ejected in a loader section. Therefore, it is an object of the present invention to provide a collection mechanism for a magazine for storing IC devices, which allows a magazine in which an IC device remains to be collected separately from a completely empty magazine.

[Means for Solving the Problem] In order to achieve the above-mentioned object, the present invention detects whether the IC device is completely ejected from the magazine after the IC device is dispensed or whether the IC device remains. a device remaining in the magazine detection means; a magazine accommodating section for accommodating an empty magazine; and a defective ejection magazine accommodating section for accommodating a magazine in which a device remains;
The magazine is characterized by comprising a magazine sorting means for sorting and storing magazines in the empty magazine storage section and the ejected defective magazine storage section based on the detection result of the residual device detection means in the magazine. It is something.

[Effect 1. By tilting the magazine in the 0-1 position,
Take out the IC device stored inside. When the IC device is completely dispensed, the remaining device in the magazine detecting means detects whether or not any device remains in the magazine.

Here, the completion of dispensing of the IC device is detected by, for example, providing a sensor at the exit portion of the magazine to detect the passage of the device, and the sensor detects that a predetermined period of time has passed after the last magazine has passed. This can also be achieved by a method in which it is determined that the dispensing of devices in the magazine has been completed when the passage of a device is not detected.

When it is confirmed that the magazine is empty by the above-mentioned residual device detection means in the magazine, the magazine is sent to the empty magazine accommodating section. Further, when it is detected that a device remains in the magazine, the magazine sorting means is activated and the magazine is accommodated in the defective ejection magazine accommodating section.

Therefore, the magazines collected in the empty magazine accommodating section are set as they are in the unloader section, and the magazines in the defective magazine accommodating section are forcibly ejected and emptied of the remaining devices, and then they are placed in the unloader section. Just set it. Note that the device that has been forcibly ejected in this way is stored again in another magazine and set in the loader section.

[Example] Hereinafter, an example of the present invention will be described in detail based on the drawings.

First, FIG. 3 shows the overall configuration of an IC device testing/measuring apparatus.

In the figure, 1 indicates a loader section, and 2 indicates an unloader section. A loader side inclined chute 3 is connected to the loader section 1, and a direction changing member 4 is connected to the end of this loader side inclined chute 3. It is provided. This direction changing member 4 causes the IC device D sliding down the inclined chute 3 to orient its transport direction in the vertical direction.

The device contact mechanism 5 includes a stopper 5a that positions and stops the device D on the vertical slide path of the IC device D, and a clamp member 5 that clamps the device D.
b, and a drive means (not shown) for displacing the device D clamped by the clamp member 5b in a direction perpendicular to the vertical slide, and the drive means (not shown) displaces the device D clamped by the clamp member 5b. It can be brought into contact with and separated from the test head 6a of the machine C tester 6, which is arranged to face each other.

Further, the unloader section 2 includes a device contact mechanism 5.
After this direction change, the device D passes through the unloader side chute 8, and the classified portion connected to the unloader side chute 8 is 9, and the device D after the test is classified and stored by the section 9 according to quality.

The IC device D is connected to the magazine I as shown in FIG.
They are housed in a line in a single row. Here, as the IC device D, for example, D I P (Du
In the type of magazine 10, the bottom wall of the magazine 10 is made to protrude upward to provide a saddle 10a, and the package P of the device D is brought into contact with the saddle 10a. Lead bins L provided on both sides of the saddle 10a are housed so as to extend downward within gaps formed on both sides of the saddle 10a. Further, one end of the magazine 10 is an open device entrance/exit 10b, and the other end is closed.

Magazine 1 containing device D to be tested and measured
0 are set in large numbers in the magazine stock section 11, separated and taken out one by one by an appropriate conveying means, and then transferred to the pitch feeding means 12 which moves in a rectangular manner as shown in FIG.
The magazine is fed and drawn into the magazine tilting means 13 by. As shown in FIG. 2, the magazine tilting means 13 includes a magazine clamp part 14 that clamps the entrance/exit 10b of the magazine 10 from above and below, and a cross section that engages with the other end of the magazine 10 to lift this other end. Tilting portion 15 formed in a U-shape
It consists of The tilting portion 15 is configured to be rotated upward by a predetermined angle from a horizontal state, as indicated by an arrow in FIG. 2, by a drive means (not shown).

The magazine clamp section 14 includes a base plate 16 and a clamp plate 1.
7, and the clamp plate 17 has a pair of connecting rods 18.
has been erected. The connecting rod 18 is connected to a support bracket 19
A spring 20 is elastically loaded at a portion of the connecting rod 18 between the clamp plate 17 and the support bracket 19. Furthermore, this support bracket 19 is attached to a rotation bearing 21, so that when the magazine 1O is tilted, the clamp plate 17 follows this tilting movement. In addition, the base plate 16 and the clamp plate 17
There is a drawing part 16a for smoothly introducing the magazine 10 therebetween.

17a is formed.

Therefore, the magazine 10 is moved 1 by the pitch feeding means 12.
The books are fed into the magazine tilting means 13 one by one.

That is, the entrance/exit portion 10b of the magazine 10 is held between the plywood 16 and the clamp plate 17, and the other end engages with the tilting portion 15. Therefore, when the tilting part 15 is rotated upward, the magazine 10 is tilted, and the saddle part 1
0a is connected to the loader side inclined chute 3, and the device D is paid out from the magazine 10. This device D
The magazine 10 and loader side inclined chute 3 are used for discharging the
It is monitored by a sensor 22 provided between the When the next device does not pass even after a predetermined period of time has elapsed after the sensor 22 detects that the last device has passed, it is determined that all the devices D have been ejected from the magazine 10, and the magazine IO is It is forced to return to the horizontal state.

At this position, there is a residual device detection means 2 in the magazine that detects whether a device remains in the magazine 10 or not.
3 is provided. This magazine residual device detection means 23 is composed of a light emitting element 23a and a light receiving element 23b, and the optical path from the light emitting element 23a to the light receiving element 23b is located at a position slightly higher than the saddle 10b of the magazine 10.
It passes through a through hole 15a provided in the tilting portion 15 and is directed in the axial direction of the magazine IO. Therefore, since the devices are ejected by sliding down the magazine 10 by its own weight, it may not be possible to reliably eject all the devices D from inside the magazine 10. For this reason, after the magazine IO returns to the horizontal state, the residual device detection means 23 detects whether any device remains in the magazine 10 or not.

In this manner, after the dispensing of devices from the magazine 10 is completed and it is detected whether or not any devices remain in the magazine 10, the allocated portion of the magazine 10 is collected. Therefore, when the pitch feeding means 12 feeds the next magazine to the magazine tilting means 13, the magazine after dispensing the device is moved by the pitch feeding means 12.
The device D is pushed out by the end wall, falls downward, and is collected.This collection part is divided into an empty magazine storage part 24 that stores an empty magazine from which the device D has been completely ejected, and an empty magazine storage part 24 that stores the empty magazine from which the device D has been completely discharged. and a defective ejection magazine accommodating section 25 for accommodating a defective ejection magazine that is in a state of failure.

The empty magazine accommodating portion 24 is provided at a lower position where the magazine 10 ejected from the magazine tilting means 13 falls under its own weight. On the other hand, the defective ejection magazine storage section 25
is provided at a position in front of the fall area of the magazine 10. A sorting shutter 26 is provided to sort and accommodate the magazines 10 into the empty magazine storage section 24 and the defective magazine storage section 25.

This distribution shutter 26 is made to swing around an axis 28 by a cylinder 27, and is normally in the vertical state shown by the solid line in FIG. This allows the magazine to be dropped into the empty magazine accommodating section 24. On the other hand, when the cylinder 27 is actuated to displace the sorting shack 26 into an inclined state as shown by the imaginary line in the figure, the magazine IO falling from the magazine tilting means 13 is guided by the sorting shutter 26. Then, the magazine is sent into the defective ejection magazine accommodating section 25.

With the above configuration, after the magazine 10 is tilted by the magazine tilting means 13 and the devices D stored therein are dispensed, the residual device detection means 23 detects the magazine 10 after the dispensing is completed. When the detection means 23 determines that the magazine is empty, the cylinder 27 is maintained in a vertical position, and the magazine that falls from the magazine tilting means 13 is checked. 10 is housed in the empty magazine housing section 24.

On the other hand, when the remaining device in the magazine detection means 23 detects that the device D remains,
The cylinder 27 is actuated, the distribution shutter 26 is displaced to an inclined state, and the magazine 10 falling from the magazine tilting means 13 is accommodated in the defective ejection magazine accommodating section 25.

In this way, magazine 10 after discharging device D
By detecting whether or not the device D is actually completely ejected, and sorting and storing empty magazines and magazines with devices that have failed to be ejected, The loaded magazine 10 can be set as is in the unloading section 2, and the magazine 10 accommodated in the defective magazine accommodating section 25 can be set as is.
0 may be set in the unload section 2 after removing the remaining device D, or may be recovered as is. Therefore, there is no need for the operator to check all collection magazines to see if there are any remaining devices.

Therefore, the magazines are arranged in a predetermined jig to be stored in the empty magazine storage section 24, and this jig is automatically taken out from the empty magazine storage section 24 and set in the unloader section 2. If configured so that it is possible to do this, after unloading the magazine device D in the loader section 1, the empty magazine can be returned to the unloader section 2 to automate the setting work, and the handling of the magazine IO by the IC handler can be automated. Automation will be achieved.

[Effect of the Invention 1 As explained above, the present invention detects whether or not an IC device remains in the magazine after a device is ejected from the magazine, and then replaces the empty magazine with the device. Since magazines with ejection defects are stored separately, there is no need to manually check whether there are any devices left in the collected magazines, and magazines stored in the empty magazine storage area can be stored separately. Even if the device is supplied as is to the unloading section, there is no risk that uninspected devices will be rejected as non-defective devices.

[Brief explanation of the drawing]

The drawings show one embodiment of the present invention, in which FIG. 1 is an explanatory diagram of the configuration of a magazine collection mechanism, FIG. 2 is a side view of the magazine tilting means, and FIG. 3 is a schematic configuration diagram of the IC handler. FIG. 4 is an external view of the magazine shown together with the IC device. 1: Loader section, 2: Unloader section, 5: Device contact mechanism, 6: IC tester, 6a: Test head, 12
: pitch feeding means, 13: magazine tilting means, 22: sensor, 23: residual device detection means in magazine, 23a
: Light emitting element, 23b: Light receiving element, 24: Empty magazine accommodating part, 25: Ejection defective magazine accommodating part, 26: Sorting shutter, 27: Cylinder, 28: Axis.

Claims (1)

[Claims] After discharging an IC device from a magazine containing an IC device, the IC device is completely removed from the magazine after discharging the IC device.
A residual device detection means for detecting whether a C device is ejected or an IC device remains; a magazine accommodating section for accommodating an empty magazine; and a magazine accommodating section for accommodating a magazine in which a device remains. It is constituted by a faulty ejection magazine accommodating section, and a magazine sorting means for sorting and accommodating magazines in the empty magazine accommodating section and the faulty ejection magazine accommodating section based on the detection result of the residual device detection means in the magazine. A collection mechanism for a magazine for storing IC devices.