JPH04149065A - High strength precision parts - Google Patents

High strength precision parts

Info

Publication number
JPH04149065A
JPH04149065A JP2272432A JP27243290A JPH04149065A JP H04149065 A JPH04149065 A JP H04149065A JP 2272432 A JP2272432 A JP 2272432A JP 27243290 A JP27243290 A JP 27243290A JP H04149065 A JPH04149065 A JP H04149065A
Authority
JP
Japan
Prior art keywords
capillary
oxide
precision parts
tip
strength
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2272432A
Other languages
Japanese (ja)
Other versions
JPH0672050B2 (en
Inventor
Akio Sayano
顕生 佐谷野
Takeshi Shioda
塩田 武
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP2272432A priority Critical patent/JPH0672050B2/en
Publication of JPH04149065A publication Critical patent/JPH04149065A/en
Publication of JPH0672050B2 publication Critical patent/JPH0672050B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00—Interconnections or connectors in packages
    • H10W72/071—Connecting or disconnecting
    • H10W72/0711—Apparatus therefor
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00—Interconnections or connectors in packages
    • H10W72/071—Connecting or disconnecting
    • H10W72/0711—Apparatus therefor
    • H10W72/07141—Means for applying energy, e.g. ovens or lasers

Landscapes

  • Mechanical Coupling Of Light Guides (AREA)
  • Compositions Of Oxide Ceramics (AREA)
  • Wire Bonding (AREA)

Abstract

PURPOSE:To form precision parts having high mechanical strength and toughness, superior heat resistance, thermal stability and thermal shock resistance by adopting a compsn. consisting of yttrium oxide, aluminum oxide and zirconium oxide as a base. CONSTITUTION:Each of the title precision parts is composed of 0.5-5wt.% yttrium oxide, 10-40wt.% aluminum oxide and the balance essentially of zirconium oxide. The precision parts can be tapered and are suitably utilizable as wire bonding capillaries enabling high density wire bonding.

Description

【発明の詳細な説明】 〔発明の目的〕 (産業上の利用分野) 本発明はLSIやICなどの半導体製造装置のワイヤボ
ンディングに使用するボンディングキャピラリ、光ファ
イバを接続する光コネクタ用部品、さらには各種ワイヤ
ガイド用部材として使用される高強度精密部品に係り、
特に耐熱性、熱安定性および耐熱衝撃性が優れ過酷な使
用環境にも充分耐え、寿命の長い高強度精密部品に関す
る。
[Detailed Description of the Invention] [Object of the Invention] (Industrial Application Field) The present invention relates to bonding capillaries used for wire bonding of semiconductor manufacturing equipment such as LSI and IC, optical connector components for connecting optical fibers, and relates to high-strength precision parts used as various wire guide members,
In particular, it relates to high-strength precision parts that have excellent heat resistance, thermal stability, and thermal shock resistance, can withstand harsh operating environments, and have a long life.

(従来の技術) 半導体製造装置のホンディングキャピラリや光コネクタ
用材料なと、繰り返して荷重や熱を受ける精密部品には
、特に機械的強度および耐熱性が優れた材料か使用され
ている。以下半導体製造装置のボンディングキャピラリ
を例にとって説明する。
(Prior Art) Materials with particularly excellent mechanical strength and heat resistance are used in precision parts that are repeatedly subjected to load and heat, such as materials for bonding capillaries in semiconductor manufacturing equipment and optical connectors. A bonding capillary of a semiconductor manufacturing device will be explained below as an example.

電子部品として多用されているICは、通常、リードフ
レーム、ICチップ、パッケージから構成されており、
ICチップとリードフレームとは直径が0.015mm
〜0.1mm程度の細い金(AU)ワイヤによってボン
ディングされている。このワイヤボンディング工程は、
Auワイヤをキャピラリ (細管)の先端から送出しな
がら、キャピラリをリードフレームとICの所定位置に
交互に圧着させ、ワイヤをリードフレームやICチップ
上に融着させることにより行なわれる。このキャピラリ
の圧着は機械的かつ高速に行なわれるため、キャピラリ
はリードフレーム等に強く打ちつけられる。またキャピ
ラリはリードフレームに打ちつけられて瞬間的に100
0°Cを超える高温度に達する場合がある。したがって
、キャピラリの所要特性として耐衝撃性および耐熱性が
要求される。
ICs, which are widely used as electronic components, usually consist of a lead frame, an IC chip, and a package.
The diameter of the IC chip and lead frame is 0.015mm.
Bonding is performed using a thin gold (AU) wire of approximately 0.1 mm. This wire bonding process is
This is done by feeding out the Au wire from the tip of the capillary (thin tube), alternately crimping the capillary to predetermined positions on the lead frame and IC, and fusing the wire onto the lead frame and IC chip. Since the capillary is crimped mechanically and at high speed, the capillary is strongly hit against a lead frame or the like. Also, the capillary is hit against the lead frame and momentarily becomes 100
High temperatures above 0°C may be reached. Therefore, impact resistance and heat resistance are required characteristics of the capillary.

このキャピラリの材質としては、従来、ガラスや超硬質
材を用いていたか、耐摩耗性等の点から、最近はアルミ
ナ(、i、、03)多結晶セラミック製のものや、アル
ミナを原料にし、単結晶としたルビー、サファイアなと
て形成したものか広く用いられてきた。
Conventionally, the material of this capillary has been glass or ultra-hard material, but from the viewpoint of wear resistance, it has recently been made of alumina (,i,,03) polycrystalline ceramic, or made of alumina as a raw material. It has been widely used as a single crystal ruby or sapphire.

特に低コストで経済的なアルミナ多結晶セラミック製キ
ャピラリか最も多く使用されている。そのキャピラリ1
の先端部付近の外形は、第2図に示す如く、先端1aに
向って漸次先細りするような形状をなし、A u線2を
先端に送出する直径0゜025闘〜0. 1mm程度の
細孔3を備えている。
In particular, capillaries made of alumina polycrystalline ceramic are the most commonly used because they are low cost and economical. The capillary 1
As shown in FIG. 2, the outer shape of the vicinity of the tip is gradually tapered toward the tip 1a, and has a diameter of 0.025 to 0.025 to send out the Au wire 2 to the tip. It has pores 3 of about 1 mm.

(発明が解決しようとする課題) しかしながら、近年、ICチップの高集積化および小型
化に伴い、ワイヤ自体を細くして高密度でワイヤボンデ
ィングすることか求められている。したがって、キャピ
ラリ自体も、先端部付近の外径および孔径の小さなもの
が必要とされている。従来、キャピラリの先端外径は2
00μm位であったが、現在では高集積部品用として5
0μm程度の微細なキャピラリが求められている。
(Problems to be Solved by the Invention) However, in recent years, as IC chips have become more highly integrated and smaller, there has been a demand for thinner wires and wire bonding at a higher density. Therefore, the capillary itself is required to have a small outer diameter near the tip and a small hole diameter. Conventionally, the outer diameter of the capillary tip was 2
It used to be about 0.00μm, but now it is used for highly integrated parts.
A fine capillary of about 0 μm is required.

この要求に応えるため、従来キャピラリ材として用いら
れていたAI!203系セラミックスを用いて、形状は
従来と同様の形状にし、キャピラリ先端外径を50μm
としたキャピラリを製造した場合、次のような問題点が
生ずる。つまり、たしかに従来より外径の小さなキャピ
ラリが得られるものの、A I! 203の強度不足に
基づきキャピラリにクラックが発生したりして短期間内
に使用に耐え得なくなり、寿命が短いという問題点があ
る。
In order to meet this demand, AI!, which was conventionally used as a capillary material! Using 203 series ceramics, the shape is the same as the conventional one, and the outer diameter of the capillary tip is 50 μm.
When manufacturing a capillary with such a capillary, the following problems arise. In other words, although it is true that a capillary with a smaller outer diameter than the conventional one can be obtained, AI! Due to the lack of strength of the capillary 203, cracks may occur in the capillary and the capillary becomes unusable within a short period of time, resulting in a short lifespan.

一方、ルビーやサファイアはアルミナ多結晶セラミック
に比へて製造コストが高くなるという欠点かある。
On the other hand, ruby and sapphire have the disadvantage that they are more expensive to manufacture than alumina polycrystalline ceramics.

さらにより高い精度でのワイヤボンディングを行なうた
めにキャピラリの先端部の形状については、第2図に示
す円錐台形状のものから第1図に示すようなボトルネッ
ク形状のものか採用されつつある。すなわち、第1図に
示すキャピラリ4の先端部は加工歪を低減し、クラック
の発生を防止するために外表面を内側に湾曲させて形成
される。
In order to perform wire bonding with even higher precision, the shape of the tip of the capillary is changing from the truncated cone shape shown in FIG. 2 to the bottleneck shape shown in FIG. 1. That is, the tip of the capillary 4 shown in FIG. 1 is formed with its outer surface curved inward in order to reduce processing strain and prevent the occurrence of cracks.

そのため先端部の外径は第2図に示す従来のものより大
幅に小さくなり、従来と同一の強度を確保するためには
、より靭性の高い材料で構成する必要がある。その要請
に対応するものとして、部分安定化ジルコニア(Z r
 02 )で形成したキャピラリも試用されている。し
かしながら部分安定化ジルコニアでボトルネック状に形
成したものは成形加工時または使用時にその先端部に欠
けを生じ易く、寿命が短いという欠点がある。
Therefore, the outer diameter of the tip is much smaller than the conventional one shown in FIG. 2, and in order to maintain the same strength as the conventional one, it must be made of a material with higher toughness. Partially stabilized zirconia (Z r
Capillaries formed using 02) have also been used on a trial basis. However, partially stabilized zirconia formed into a bottleneck shape tends to chip at its tip during molding or use, and has the disadvantage of short life.

またキャピラリ先端部は、常に3008C程度に加熱さ
れており、さらに前述の通り1秒間に14回程度の高速
でAu線を電極リードフレーム等に圧着する際に電極に
打ちつけられるため、瞬間的に約1000°C以上の高
温度に達する場合もある。
In addition, the tip of the capillary is always heated to about 3008C, and as mentioned above, it is struck against the electrode at a high speed of about 14 times per second when crimping the Au wire to the electrode lead frame, etc. Temperatures can reach temperatures as high as 1000°C or more.

しかし、従来の通常の部分安定化ジルコニアでは耐熱性
および強度か比較的低く、長寿命のキャピラリが得られ
ないという問題点があった。
However, conventional partially stabilized zirconia has relatively low heat resistance and strength, and has a problem in that a long-life capillary cannot be obtained.

本発明は上記の問題点を解決するためになされたもので
あり、機械的強度および靭性が大きく、かつ耐熱性、熱
安定性および耐熱衝撃性が優れており、したかって先端
を細径にすることが可能であり、高密度のワイヤボンデ
ィングを可能とするワイヤボンディングキャピラリ等に
使用される高強度精密部品を提供することを目的とする
。
The present invention has been made to solve the above problems, and has high mechanical strength and toughness, as well as excellent heat resistance, thermal stability, and thermal shock resistance, so that the tip can have a small diameter. The purpose of the present invention is to provide high-strength precision parts used in wire bonding capillaries and the like that enable high-density wire bonding.

〔発明の構成〕[Structure of the invention]

(課題を解決するための手段と作用) 本願発明者等は上記目的を達成するため、種々のセラミ
ックス材に関し、調査研究を重ねた結果、重量%て酸化
イツトリウム(Y 20 a )を0゜5〜5%、酸化
アルミニウム(1!203’)を1−0〜40%含有し
、残部が実質的に酸化ジルコニウムから成る部品を形成
したときに、高い靭性および耐熱性を有し、細径形状に
形成したとしても優れた強度を有する精密部品が得られ
た知見に基づいて本発明を完成するに至った。
(Means and Effects for Solving the Problem) In order to achieve the above object, the inventors of the present application have repeatedly investigated and researched various ceramic materials, and found that yttrium oxide (Y 20 a ) was 0.5% by weight. ~5%, aluminum oxide (1!203') from 1-0 to 40%, with high toughness and heat resistance when forming a part containing substantially zirconium oxide, and a narrow diameter shape. The present invention has been completed based on the knowledge that a precision part having excellent strength can be obtained even when formed.

本発明の対象となる高強度精密部品に使用する酸化イツ
トリウム、酸化アルミニウムおよび酸化ジルコニウムは
粉末として一般に市販されているものを利用することが
できる。また酸化イツトリウムは0. 5〜5重量%含
有される。この酸化イツトリウムは、酸化ジルコニウム
を部分的に安定化させる安定化剤として機能し、精密部
品の靭性および強度を高める作用を有する。しかし酸化
イツトリウムの含有量が0.5%未満では靭性および強
度が不充分となる一方、含有量が5%を超えると焼結か
困難となるため、含有量は0.5〜5%の範囲内に設定
される。
Yttrium oxide, aluminum oxide, and zirconium oxide used in the high-strength precision parts that are the object of the present invention can be those that are generally commercially available as powders. Moreover, yttrium oxide is 0. It is contained in an amount of 5 to 5% by weight. This yttrium oxide functions as a stabilizer that partially stabilizes zirconium oxide, and has the effect of increasing the toughness and strength of precision parts. However, if the content of yttrium oxide is less than 0.5%, the toughness and strength will be insufficient, while if the content exceeds 5%, it will be difficult to sinter, so the content should be in the range of 0.5 to 5%. is set within.

また酸化アルミニウムか10〜40重量%含有される。It also contains 10 to 40% by weight of aluminum oxide.

この酸化アルミニウムは耐熱性および熱安定性を高める
ために添加されるものである。しかし酸化アルミニウム
の含有量か10%未満では耐熱安定性が不充分となる一
方、含有量が40%を超えると、酸化イツトリウムと同
様に焼結性が低下するため、含有量は10〜40%の範
囲内に設定される。
This aluminum oxide is added to improve heat resistance and thermal stability. However, if the content of aluminum oxide is less than 10%, the heat resistance stability will be insufficient, while if the content exceeds 40%, the sinterability will decrease like yttrium oxide, so the content should be 10 to 40%. Set within the range.

次に本発明の目的とする特性を有する精密部品の製造工
程について、前記のボンディングキャピラリを例にとり
説明する。
Next, the manufacturing process of a precision component having the characteristics targeted by the present invention will be explained using the bonding capillary as an example.

すなわち、まず酸化イツトリウム、酸化アルミニウムお
よび酸化ジルコニウムの各原料粉を上記組成となるよう
に秤量しボールミル等で混合する。
That is, first, raw material powders of yttrium oxide, aluminum oxide, and zirconium oxide are weighed so as to have the above composition and mixed in a ball mill or the like.

原料粉は、いずれもその平均粒径か20〜200人のも
のを用いると燃焼後に得られるセラミックスは緻密で高
硬度となるので好ましい。
It is preferable to use raw material powders having an average particle size of 20 to 200 particles because the ceramics obtained after combustion will be dense and have high hardness.

得られた混合粉は室温下でプレス成形してグリーン成形
体に加工する。このグリーン成形体にとって加工上重要
なことは、この成形体には第1図に示すようにストレー
トな細孔5およびチーツク孔6を形成する粗加工を施す
ので、この穿孔加工時にキャピラリ本体を研削盤等にチ
ャ・ソキングできる程度の強度を備えていることである
。通常、この強度を確保するためには成形体の嵩密度を
25〜3.8g/ctdに設定すればよい。このために
は加圧成形時のプレス圧を700〜1000kg/dの
範囲に設定することが好ましい。
The obtained mixed powder is press-molded at room temperature and processed into a green molded body. What is important in processing this green molded body is that it is rough-machined to form straight pores 5 and cheek holes 6 as shown in Figure 1, so the capillary body is ground during this drilling process. It must be strong enough to be played on a board, etc. Normally, in order to ensure this strength, the bulk density of the molded body may be set to 25 to 3.8 g/ctd. For this purpose, it is preferable to set the press pressure during pressure molding to a range of 700 to 1000 kg/d.

穿孔加工を終了した後、この成形体を所定条件下で焼結
する。このときの焼結条件によって、得られた焼結体の
機械的強度、硬度などの特性は大きく左右される。前述
した特性範囲を発現せしめるためには、例えば焼結温度
1400〜1600℃、焼結時間0.5〜4時間であれ
ばよい。
After completing the perforation process, this molded body is sintered under predetermined conditions. The properties of the obtained sintered body, such as mechanical strength and hardness, are greatly influenced by the sintering conditions at this time. In order to exhibit the above-mentioned characteristic range, the sintering temperature may be 1400 to 1600° C. and the sintering time may be 0.5 to 4 hours, for example.

また焼結して形成されたキャピラリは、第2図に示す如
き従来のキャピラリ1のように先端に向って外径が漸次
縮径するような形状ではなく、第1図に示すようにキャ
ピラリ4の外径か所定位置から急激に小さくなるような
形状、いわゆるボトルネック形状を有している。そのた
め、先端部の加工歪の発生が少なく、Au線の高精度な
圧着か可能となる。
Furthermore, the capillary formed by sintering does not have a shape in which the outer diameter gradually decreases toward the tip like the conventional capillary 1 shown in FIG. 2, but the capillary 4 shown in FIG. It has a so-called bottleneck shape, in which the outer diameter of the tube suddenly decreases from a predetermined position. Therefore, there is less processing strain at the tip, making it possible to crimp the Au wire with high precision.

また酸化イツトリウムの添加により、高靭性を有するセ
ラミックス材が形成されるため、先端部をボトルネック
形状に微細に形成した場合においても、キャピラリにク
ラックか発生することは少なく、長期間にわたって安定
したボンディング性能を保持することができる。
In addition, the addition of yttrium oxide forms a ceramic material with high toughness, so even if the tip is formed into a fine bottleneck shape, cracks are unlikely to occur in the capillary and stable bonding can be achieved over a long period of time. performance can be maintained.

さらに酸化アルミニウムを添加し、耐熱性が著しく向上
したセラミックス材が形成されるため、ヒートショック
によるキャピラリの先端部の欠けや摩耗が少なく、長期
間にわたって安定したホンディング機能を維持すること
か可能であり、IC等の半導体製品の品質を安定させる
ことができ、品質のばらつきを小さくできる。
Furthermore, aluminum oxide is added to form a ceramic material with significantly improved heat resistance, which reduces chipping and abrasion of the capillary tip due to heat shock, making it possible to maintain stable honding function over a long period of time. This makes it possible to stabilize the quality of semiconductor products such as ICs and reduce variations in quality.

また、このキャピラリ4が高強度のセラミックスで構成
されるため、同一強度を得る場合には相対的に先端4a
の孔径および外径をさらに小さくすることが可能であり
、最終製品のより高密度化、小型化に充分対応すること
ができる。
In addition, since this capillary 4 is made of high-strength ceramics, in order to obtain the same strength, the tip 4a is relatively
It is possible to further reduce the pore diameter and outer diameter of the pore size, and it is possible to sufficiently respond to higher density and smaller size of the final product.

本発明に係る高靭性精密部品は、上記のようにワイヤボ
ンディングキャピラリの他に、光コネクタ用部材や各種
ワイヤガイドなど耐熱性および高靭性を必要とする部品
材料に適用される。しかしながらその適用範囲は上記の
部品に限らず、複雑な形状を有し肉薄で欠けやクラック
が発生し易い全ての精密部品に対して応用することがで
きる。
The high-toughness precision component according to the present invention is applied to component materials that require heat resistance and high toughness, such as optical connector members and various wire guides, in addition to wire bonding capillaries as described above. However, its scope of application is not limited to the above-mentioned parts, but can be applied to all precision parts that have complex shapes, are thin, and are prone to chipping or cracking.

(実施例) 次に本発明の実施例についてより具体的に説明する。(Example) Next, examples of the present invention will be described in more detail.

実施例1〜6 第1図に示すような形状を有し、キャピラリ先端の外径
か70μm1キヤピラリ先端の孔径が25μm1外径が
急激小さくなる前のキャピラリ本体の外径が300μm
1ボトルネツクの先端からの位置が400μm1テーパ
孔6の開度θ が18度、全長11市のサイズを有する
キャピラリを第1表左欄に示すセラミックス組成のよう
に酸化イツトリウムの含有量を0.7〜・4.0%、酸
化アルミニウムの含有量を12〜38%の範囲で変化さ
せ、残部が酸化ジルコニウム(Zr02)から成る焼結
体で形成し実施例1〜6とした。
Examples 1 to 6 The capillary has a shape as shown in Fig. 1, and the outer diameter of the capillary tip is 70 μm1 The hole diameter of the capillary tip is 25 μm1 The outer diameter of the capillary body before the outer diameter suddenly decreases is 300 μm
1. The position from the tip of the bottle neck is 400 μm, 1. The opening degree θ of the taper hole 6 is 18 degrees, and the capillary has a total length of 11 cm. The yttrium oxide content is 0.7 as shown in the ceramic composition shown in the left column of Table 1. -4.0%, the content of aluminum oxide was varied in the range of 12 to 38%, and the remainder was formed of a sintered body consisting of zirconium oxide (Zr02) to form Examples 1 to 6.

得られたキャピラリの機械的強度を評価するため、曲げ
強さと破壊靭性を測定した。また、キャピラリ自体の耐
熱性、強度および寿命を調べるため、実際にキャピラリ
内にワイヤを入れて、ワイヤボンディングを行なって、
ホンディングの可能な回数を測定した。以上の結果を第
1表に示した。
In order to evaluate the mechanical strength of the obtained capillary, bending strength and fracture toughness were measured. In addition, in order to investigate the heat resistance, strength, and lifespan of the capillary itself, we actually inserted a wire into the capillary and performed wire bonding.
The possible number of hondings was measured. The above results are shown in Table 1.

また、本発明のキャピラリを用いてワイヤボンディング
を行なって接合されたICチップとリードフレームの接
合性を調べたところ両者は良好に接合されていた。
Further, when the bonding properties of an IC chip and a lead frame bonded by wire bonding using the capillary of the present invention were examined, it was found that both were bonded well.

比較例1〜4 一方、比較例1,2として、酸化イツトリウム含有量を
それぞれ0.3%、7%とし、酸化アルミニウム含有量
を20%、残部を酸化ジルコニウムで調製した粉末混合
体を実施例1〜6と同一形状でかつ同一条件でキャピラ
リ焼結体を形成し、同様に機械的特性およびホンディン
グ回数を測定した。
Comparative Examples 1 to 4 On the other hand, as Comparative Examples 1 and 2, powder mixtures were prepared in which the yttrium oxide content was 0.3% and 7%, respectively, the aluminum oxide content was 20%, and the balance was zirconium oxide. A capillary sintered body was formed in the same shape and under the same conditions as in Examples 1 to 6, and the mechanical properties and the number of hondings were measured in the same manner.

また比較例3,4として、酸化イツトリウムを4%含有
し、酸化アルミニウム含有量をそれぞれ6%、50%と
し、残部を酸化ジルコニウムで調製した粉末混合体を実
施例1〜6と同一条件で処理し、キャピラリ焼結体を形
成し、同様に特性値を測定した。
In addition, as Comparative Examples 3 and 4, powder mixtures containing 4% yttrium oxide, 6% and 50% aluminum oxide, and the remainder zirconium oxide were treated under the same conditions as Examples 1 to 6. Then, a capillary sintered body was formed and the characteristic values were measured in the same manner.

比較例5 また比較例5として、酸化イツトリウム(Y2O2)3
重量%、残部が酸化ジルコニウム(ZrO3)から成る
焼結体で実施例1〜6と同一形状および大きさを有する
キャピラリを製作し、同様に機械的特性およびワイヤボ
ンディング回数を測定した。
Comparative Example 5 Also, as Comparative Example 5, yttrium oxide (Y2O2) 3
Capillaries having the same shape and size as those in Examples 1 to 6 were manufactured using sintered bodies in which the balance by weight was zirconium oxide (ZrO3), and the mechanical properties and the number of wire bondings were measured in the same manner.

比較例6 さらに比較例6として酸化マグネシウム(Mgo)0.
2重量%、酸化珪素(S 102 ) 0゜2重量%、
残部か酸化アルミニウム(A1203)から成るAl2
O3系セラミックスを使用し、実施例1〜6と同一形状
および大きさを有するキャピラリを製作し、同様に特性
値を測定した。
Comparative Example 6 Furthermore, as Comparative Example 6, magnesium oxide (Mgo) 0.
2% by weight, silicon oxide (S 102 ) 0°2% by weight,
Al2 with the remainder consisting of aluminum oxide (A1203)
Capillaries having the same shape and size as those in Examples 1 to 6 were manufactured using O3 ceramics, and their characteristic values were measured in the same manner.

以上実施例12〜6および比較例1〜6の測定結果を下
記第1表に示す。
The measurement results of Examples 12 to 6 and Comparative Examples 1 to 6 are shown in Table 1 below.

〔以下余白〕[Margin below]

第1表の結果から明らかなように、本実施例1〜6に示
す酸化イツトIJ ’7ム(Y203)含有量および酸
化アルミニウム(A1203)含有量の範囲においては
比較例6に示すM gおよびS + 02を添加した酸
化アルミニウム系のセラミックスで形成した従来のキャ
ピラリと比べていずれも高い破壊靭性値が得られ、ボン
ディング回数も飛躍的に増大する。
As is clear from the results in Table 1, within the range of the IJ'7 oxide (Y203) content and the aluminum oxide (A1203) content shown in Examples 1 to 6, the Mg and Compared to conventional capillaries made of aluminum oxide-based ceramics doped with S+02, higher fracture toughness values are obtained in all cases, and the number of bonding operations is also dramatically increased.

一方比較例1,2て示すように酸化イツトリウムが過少
のものは曲げ強さおよび破壊靭性値が比較的低くボンデ
ィング回数も低くなり、過多のものは焼結性が悪いため
強度も小さくAuワイヤの接続不良が多発した。
On the other hand, as shown in Comparative Examples 1 and 2, those with too little yttrium oxide have comparatively low bending strength and fracture toughness values, and the number of bondings is also low. Connection failures occurred frequently.

また比較例3,4で示すように酸化アルミニウム含有量
が過少のものは、耐熱性が低く、ヒートショックによる
割れや折損を生じ易く、ボンディング回数も低くなり、
過多のものは焼結性が低く、寿命が短い。
Furthermore, as shown in Comparative Examples 3 and 4, those with too little aluminum oxide content have low heat resistance, are prone to cracking and breakage due to heat shock, and have a low bonding frequency.
If there is too much, the sinterability will be low and the life will be short.

さらに比較例5で示すように酸化イツトリウムを適量含
有するものであっても、酸化アルミニウムを含まないも
のは、やはり耐熱性か低くヒートショックにより割れを
生じ易く、ホンディング回数も低下する。
Furthermore, as shown in Comparative Example 5, even if a material contains an appropriate amount of yttrium oxide, a material that does not contain aluminum oxide still has low heat resistance and is prone to cracking due to heat shock, and the number of hondings is also reduced.

〔発明の効果〕〔Effect of the invention〕

以上説明の通り、本発明に係る高強度精密部品によれば
、破壊靭性値および耐熱性が従来品より大幅に向上する
ため、微細形状に加工した場合においても、使用時のヒ
ートショックによる欠けやクラックを発生せず、高精度
な加工か可能となる。
As explained above, according to the high-strength precision parts according to the present invention, the fracture toughness value and heat resistance are significantly improved compared to conventional products, so even when processed into fine shapes, there is no possibility of chipping due to heat shock during use. High-precision processing is possible without cracking.

特にこの高強度精密部品をワイヤボンディングキャピラ
リとして使用した場合には、先端部へのAu導線やリー
ドフレーム粉の付着が少な(、また高温強度、耐熱衝撃
性が大きいためヒートショックによる欠け、摩耗か少な
く、長寿命化を図ることかできるだけでなく、安定した
ワイヤボンディングを行なうことかでき、IC等の半導
体部品の品質を安定させることができる。さらにルビー
サファイアに比へてコストを低(できるなど多くの特徴
を有したキャピラリを提供することができる。
In particular, when this high-strength precision component is used as a wire bonding capillary, there is little adhesion of Au conductor or lead frame powder to the tip (also, it has high high-temperature strength and thermal shock resistance, so it is less likely to chip or wear due to heat shock). Not only can wire bonding be performed stably and the quality of semiconductor components such as ICs can be stabilized, but the cost can be lower than that of ruby sapphire. Capillaries with many features can be provided.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明に係る高強度精密部品としてのキャピラ
リの一実施例を示す部分断面図、第2図は従来のキャピ
ラリの構造例を示す部分断面図である。 1、・・キャピラリ、1a・・・先端、2・・・Au線
、3・・・細孔、4・・・キャピラリ、4a・・・先端
、5・・・細孔、6・・・テーパ孔、θ ・・・テーパ
孔の開度。 出願人代理人   波 多 野   久第1 図 館211
FIG. 1 is a partial sectional view showing an embodiment of a capillary as a high-strength precision component according to the present invention, and FIG. 2 is a partial sectional view showing an example of the structure of a conventional capillary. 1... Capillary, 1a... Tip, 2... Au wire, 3... Pore, 4... Capillary, 4a... Tip, 5... Pore, 6... Taper Hole, θ...Opening degree of the tapered hole. Applicant's agent Hisashi Hatano 1 Museum 211

Claims (1)

【特許請求の範囲】[Claims]  重量パーセントで酸化イットリウムを0.5%以上5
%以下、酸化アルミニウムを10%以上40%以下含有
し、残部が実質的に酸化ジルコニウムから成ることを特
徴とする高強度精密部品。
Yttrium oxide in weight percentage of 0.5% or more5
% or less, and contains 10% or more and 40% or less of aluminum oxide, and the remainder substantially consists of zirconium oxide.
JP2272432A 1990-10-12 1990-10-12 Bonding capillaries and optical connector parts Expired - Lifetime JPH0672050B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2272432A JPH0672050B2 (en) 1990-10-12 1990-10-12 Bonding capillaries and optical connector parts

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2272432A JPH0672050B2 (en) 1990-10-12 1990-10-12 Bonding capillaries and optical connector parts

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP7242985A Division JP2774783B2 (en) 1995-09-21 1995-09-21 Optical connector parts

Publications (2)

Publication Number Publication Date
JPH04149065A true JPH04149065A (en) 1992-05-22
JPH0672050B2 JPH0672050B2 (en) 1994-09-14

Family

ID=17513834

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
JP (1) JPH0672050B2 (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6651864B2 (en) * 1999-02-25 2003-11-25 Steven Frederick Reiber Dissipative ceramic bonding tool tip
US6715658B2 (en) * 2001-07-17 2004-04-06 Kulicke & Soffa Investments, Inc. Ultra fine pitch capillary
US6910612B2 (en) 2001-07-17 2005-06-28 Kulicke & Soffa Investments, Inc. Capillary with contained inner chamfer
US7032802B2 (en) 1999-02-25 2006-04-25 Reiber Steven F Bonding tool with resistance
US7124927B2 (en) 1999-02-25 2006-10-24 Reiber Steven F Flip chip bonding tool and ball placement capillary
US7389905B2 (en) 1999-02-25 2008-06-24 Reiber Steven F Flip chip bonding tool tip
WO2013126204A3 (en) * 2012-02-20 2013-10-17 Branson Ultrasonics Corporation Method of welding parts with vibratory welder having low thermal conductivity tool and high mechanical caracteristics; corresponding vibratory welder
CN114361054A (en) * 2021-12-29 2022-04-15 深圳市盛元半导体有限公司 Production process of a rivet for free-cleaning aluminum wire bonding and a rivet obtained by production

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56134564A (en) * 1980-03-26 1981-10-21 Ngk Insulators Ltd Zirconia ceramics
JPS5836976A (en) * 1981-08-25 1983-03-04 日本特殊陶業株式会社 High tenacity zirconia sintered body
JPS6276527A (en) * 1985-09-30 1987-04-08 Toshiba Corp Wire bonding capillary

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56134564A (en) * 1980-03-26 1981-10-21 Ngk Insulators Ltd Zirconia ceramics
JPS5836976A (en) * 1981-08-25 1983-03-04 日本特殊陶業株式会社 High tenacity zirconia sintered body
JPS6276527A (en) * 1985-09-30 1987-04-08 Toshiba Corp Wire bonding capillary

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6651864B2 (en) * 1999-02-25 2003-11-25 Steven Frederick Reiber Dissipative ceramic bonding tool tip
US6935548B2 (en) 1999-02-25 2005-08-30 Steven-Frederick Reiber Dissipative ceramic bonding tool tip
US7032802B2 (en) 1999-02-25 2006-04-25 Reiber Steven F Bonding tool with resistance
US7124927B2 (en) 1999-02-25 2006-10-24 Reiber Steven F Flip chip bonding tool and ball placement capillary
US7389905B2 (en) 1999-02-25 2008-06-24 Reiber Steven F Flip chip bonding tool tip
US6715658B2 (en) * 2001-07-17 2004-04-06 Kulicke & Soffa Investments, Inc. Ultra fine pitch capillary
US6910612B2 (en) 2001-07-17 2005-06-28 Kulicke & Soffa Investments, Inc. Capillary with contained inner chamfer
US7004369B2 (en) 2001-07-17 2006-02-28 Kulicke & Soffa Investments, Inc. Capillary with contained inner chamfer
WO2013126204A3 (en) * 2012-02-20 2013-10-17 Branson Ultrasonics Corporation Method of welding parts with vibratory welder having low thermal conductivity tool and high mechanical caracteristics; corresponding vibratory welder
CN114361054A (en) * 2021-12-29 2022-04-15 深圳市盛元半导体有限公司 Production process of a rivet for free-cleaning aluminum wire bonding and a rivet obtained by production

Also Published As

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