JPH04158237A - Photopulse tester - Google Patents

Photopulse tester

Info

Publication number
JPH04158237A
JPH04158237A JP28400090A JP28400090A JPH04158237A JP H04158237 A JPH04158237 A JP H04158237A JP 28400090 A JP28400090 A JP 28400090A JP 28400090 A JP28400090 A JP 28400090A JP H04158237 A JPH04158237 A JP H04158237A
Authority
JP
Japan
Prior art keywords
ratio
data
set value
section
averaging
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP28400090A
Other languages
Japanese (ja)
Other versions
JP3014134B2 (en
Inventor
Masaaki Furuhashi
古橋 政明
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ando Electric Co Ltd
Original Assignee
Ando Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ando Electric Co Ltd filed Critical Ando Electric Co Ltd
Priority to JP2284000A priority Critical patent/JP3014134B2/en
Publication of JPH04158237A publication Critical patent/JPH04158237A/en
Application granted granted Critical
Publication of JP3014134B2 publication Critical patent/JP3014134B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

PURPOSE:To make the S/N ratio uniform by a method wherein an output of a logarithm converting part is stored when it is better than a set value of the S/N ratio, and a gain is raised or the averaging number of times is increased when it is worse than the set value, thereby to improve the S/N ratio. CONSTITUTION:Data of a logarithm converting part 8 is sent to an S/N ratio comparing means 11 and compared with a set value. The data better than the set value is sent to and stored by a data memory means 12. For the data worse than the set value, a gain of an amplifier part 6 is increased to raise the signal level and the average is added again. Logarithmic conversion of the data is conducted in the converting part 8, and the result is sent to the comparing means 11 to detect whether it is the set value of the S/N ratio. After repeating the above procedure, if the set value is not attained even when the gain of the amplifier part 6 becomes maximum, the averaging number of times of an adding/averaging part 7 is increased. Then, the data after the addition and averaging is coupled with the data stored in the means 12, thereby to form a data of the measuring waveform. Accordingly, the S/N ratio can be made uniform.

Description

【発明の詳細な説明】 [産業上の利用分野] この発明は、出力のSN比に応じて平均加算回数を増減
する光パルス試験器(以下、0TDRという。)につい
てのものである。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to an optical pulse tester (hereinafter referred to as 0TDR) that increases or decreases the number of averaging additions according to the SN ratio of the output.

[従来の技術] 0TDRは、光方向性結合器を通して光パルスを光ファ
イバに送出し、戻ってくる光を検出することによって光
ファイバの障害点の検出、損失、接続損失などを測定す
るものである。
[Prior art] 0TDR is a method that detects failure points in optical fibers and measures loss, splice loss, etc. by sending optical pulses to optical fibers through optical directional couplers and detecting the returning light. be.

次に、0TDRの構成を第7図により説明する。Next, the configuration of 0TDR will be explained with reference to FIG.

第7図の1はタイミング発生部、2は駆動回路、3はレ
ーザなどの光源、4は光方向性結合器、5は受光器、6
は増幅部、7は加算平均処理部、8は対数変換部、9は
表示部、10は測定される光ファイバである。
In FIG. 7, 1 is a timing generator, 2 is a drive circuit, 3 is a light source such as a laser, 4 is an optical directional coupler, 5 is a light receiver, 6
7 is an amplification section, 7 is an averaging processing section, 8 is a logarithmic conversion section, 9 is a display section, and 10 is an optical fiber to be measured.

第7図では、タイミング発生部1からの電気パルスによ
り、駆動回路2でパルス電流を作り、光源3を発光させ
る。光源3から出た光パルスは、光方向性結合器4を通
過し、光ファイバ10に入射される。光ファイバ10か
らの後方散乱光や反射光などの戻り光は光方向性結合器
4から受光器5へ送られる。受光器5では光を電気信号
に変換し、受光器5の出力は増幅部6で増幅され、平均
加算処理部7でディジタル信号に変換され、加算平均さ
れる。平均加算処理部7の出力は対数変換部8で対数変
換され、表示部9に表示される。
In FIG. 7, a pulse current is generated in a drive circuit 2 by an electric pulse from a timing generator 1, and a light source 3 is caused to emit light. The light pulses emitted from the light source 3 pass through the optical directional coupler 4 and enter the optical fiber 10 . Return light such as backscattered light and reflected light from the optical fiber 10 is sent from the optical directional coupler 4 to the light receiver 5. The light receiver 5 converts the light into an electrical signal, and the output of the light receiver 5 is amplified by the amplifier 6, converted into a digital signal by the averaging processor 7, and averaged. The output of the average addition processing section 7 is logarithmically converted by a logarithmic conversion section 8 and displayed on a display section 9.

第7図の光ファイバ10から戻ってくる後方散乱光は光
フアイバ10内で生じるレーリ散乱に起因するものであ
る。この後方散乱光のレベルは、光ファイバ10が通常
のシングルモード光ファイバで、入射される光パルス幅
がlXl0−6秒のとき、入射パルス光レベルよりも約
50dB低い値となる。このような微小な信号を扱うた
めに繰り返して測定し、その平均をとることによりSN
比を改善する。加算平均処理部は7はこのためのもので
、A/D変換器の量子化ビットが8のとき、−第8図の
ような平均回数と、SN比の関係がある。
The backscattered light returning from the optical fiber 10 in FIG. 7 is due to Rayleigh scattering occurring within the optical fiber 10. The level of this backscattered light is about 50 dB lower than the level of the incident pulsed light when the optical fiber 10 is a normal single mode optical fiber and the width of the incident optical pulse is 1X10-6 seconds. In order to handle such minute signals, the SN can be improved by repeatedly measuring and taking the average.
Improve the ratio. The averaging processing section 7 is for this purpose, and when the quantization bit of the A/D converter is 8, there is a relationship between the number of averaging times and the S/N ratio as shown in FIG.

第8図に類似したデータは岡田賢治、小林郁太部[電子
通信学会論文誌’80/2Vo1.83−BNo、2 
Jの図5にも記載されている。第8図では例えば、平均
回数が100回であり、SN比が一30dBのとき、1
02回平均をとるとSN比が一10dBになり、20d
B改善される。
Data similar to FIG.
It is also described in FIG. 5 of J. In Fig. 8, for example, when the average number of times is 100 and the S/N ratio is 30 dB, 1
If we take the average of 02 times, the S/N ratio will be 110dB, which is 20dB.
B.Improved.

次に、○TDRの測定波形を第9図により説明する。第
9図は、光ファイバIOA・IOBを接続して測定した
ものであり、横軸は光ファイバの距離を表わし、縦軸は
受信光レベルを表わす。受信光レベルは、第7図の対数
変換部8で対数変換をすることにより右下がりの直線と
して示され、接続部の損失は段差として表れ、破断点で
生じる反射光は上向きの不連続波形として表れる。受信
光レベルが小さくなるとSN比が悪くなり、測定波形に
はノイズが重畳し、幅をもった波形となり、正確な測定
をすることができなくなる。
Next, the measured waveform of ○TDR will be explained with reference to FIG. FIG. 9 shows measurements made by connecting optical fibers IOA and IOB, with the horizontal axis representing the distance of the optical fibers and the vertical axis representing the received light level. The received light level is logarithmically converted by the logarithmic converter 8 in FIG. 7, and is shown as a straight line sloping downward to the right. Loss at the connection section appears as a step, and reflected light generated at the break point is shown as an upward discontinuous waveform. appear. When the received light level decreases, the signal-to-noise ratio deteriorates, noise is superimposed on the measurement waveform, and the waveform becomes wide, making it impossible to perform accurate measurements.

加算平均の回数をさらに増やせば、SN比を改善できる
が、繰り返し測定による平均のために、測定時間が増え
る。例えば第8図によりSN比を20dB改善するため
には、さらに102回の平均回数が必要で、時間も10
2倍が必要になる。
Although the SN ratio can be improved by further increasing the number of times of averaging, the measurement time increases due to averaging through repeated measurements. For example, in order to improve the S/N ratio by 20 dB as shown in Figure 8, an additional 102 averaging times are required and the time is 10 dB.
You will need twice as much.

[発明が解決しようとする課題] 第8図かられかるように、SN比のよいところは平均回
数は少なくてもよく、SN比の悪いところの平均回数を
ふやせばよい。
[Problems to be Solved by the Invention] As can be seen from FIG. 8, the number of times of averaging may be reduced in areas where the SN ratio is good, and the number of times of averaging may be increased in areas where the SN ratio is poor.

この発明は、SN比検出手段と記憶手段を追加し、SN
比に応じて平均回数をかえて、測定波形上のSN比の均
一化を図る0TDRの提供を目的とする。
This invention adds an SN ratio detection means and a storage means, and
The purpose of this invention is to provide an 0TDR that attempts to equalize the S/N ratio on a measured waveform by changing the number of times of averaging according to the ratio.

[課題を解決するための手段] この目的を達成するため、この発明では、光源3から出
射される光パルスを光方向性結合器4から光ファイバ1
0に入射し、光ファイバ10からの戻り光を光方向性結
合器4から受光器5へ送り、受光器5の出力を増幅部6
で増幅し、平均加算処理部7でディジタル信号に変換し
て加算平均し、平均加算処理部7の出力を対数変換部8
で対数変換し、表示部9で表示する光パルス試験器にお
いて、SN比が設定され、対数変換部8の出力と設定さ
れたSN比とを比較するSN比較手段11と、平均加算
データを記憶するデータ記憶手段12とを備え、対数変
換部8の出力がSN比の設定値よりよいときは対数変換
部8の出力をデータ記憶手段12に詑憶し、対数変換部
8の出力がSN比の設定値より悪いときは増S部6の利
得を上げてSN比を改善するか、または平均加算処理部
7の平均回数を増やして対数変換部8の出力のSN比を
改善し、データ記憶手段12が記憶しているSN比のよ
いデータを結合して表示部9に表示する。
[Means for Solving the Problems] In order to achieve this object, in the present invention, the optical pulses emitted from the light source 3 are transferred from the optical directional coupler 4 to the optical fiber 1.
0, the return light from the optical fiber 10 is sent from the optical directional coupler 4 to the light receiver 5, and the output of the light receiver 5 is sent to the amplification section 6.
The average addition processing section 7 converts it into a digital signal and averages it, and the output of the average addition processing section 7 is converted into a logarithmic conversion section 8.
In the optical pulse tester, the SN ratio is set, and the output of the logarithmic converter 8 is compared with the set SN ratio, and the average addition data is stored in the optical pulse tester. When the output of the logarithmic conversion unit 8 is better than the set value of the S/N ratio, the output of the logarithm conversion unit 8 is stored in the data storage unit 12, and the output of the logarithm conversion unit 8 is set to the S/N ratio. If it is worse than the set value, increase the gain of the S increaser 6 to improve the S/N ratio, or increase the number of times of averaging in the average addition processor 7 to improve the S/N ratio of the output of the logarithmic converter 8. The data stored in the means 12 and having a good SN ratio are combined and displayed on the display section 9.

[作用] 次に、この発明による0TDRの構成を第1図により説
明する。第1図の11はSN比比較手段、12はデータ
記憶手段であり、その他は第1図と同じものである。
[Function] Next, the configuration of the 0TDR according to the present invention will be explained with reference to FIG. Reference numeral 11 in FIG. 1 is an SN ratio comparison means, 12 is a data storage means, and the other parts are the same as in FIG.

対数変換部8で対数変換されたデータをSN比比較手段
11に送り、SN比比較手段11の設定値と比較する。
The data logarithmically converted by the logarithmic converter 8 is sent to the SN ratio comparing means 11 and compared with the set value of the SN ratio comparing means 11.

設定値のSN比よりもよいデータは、データ記憶手段1
2に送って記憶し、設定値のSN比よりも悪いデータは
、さらに増幅部6の利得を上げて信号レベルを高くし、
再び平均を加算する。そして、対数変換部8で対数変換
し、もう−度SN比比較手段11へ送り、設定値のSN
比かどうかを判定する。
Data that is better than the SN ratio of the set value is stored in the data storage means 1.
If the data is worse than the SN ratio of the set value, the gain of the amplifier section 6 is further increased to raise the signal level.
Add the averages again. Then, the logarithmic conversion unit 8 performs logarithmic conversion, and sends it to the SN ratio comparison means 11, where the SN ratio of the set value is
Determine whether it is a comparison.

以下、同じようにしてSN比のよいデータは記憶手段1
2へ送って記憶し、SN比の悪いデータは、さらに増幅
部6の利得を上げて平均を加算する。増@部6の利得が
最大になり、それでも設定値のSN比が得られないとき
、加算平均処理部7の平均回数を増やす。平均加算後の
データを対数変換部8で対数変換し、データ記憶手段1
2へ送り、記憶していたデータと結合して1つの測定波
形データとする。
In the same way, data with a good SN ratio is stored in the storage means 1.
For data with a poor S/N ratio, the gain of the amplifying section 6 is further increased and the average is added. When the gain of the increasing part 6 reaches the maximum and the set value of the SN ratio is still not obtained, the number of times of averaging in the averaging processing part 7 is increased. The data after the average addition is logarithmically converted by the logarithm converter 8, and the data is stored in the data storage means 1.
2 and combine it with the stored data to create one measured waveform data.

次に、第1図のフローチャートを第2図により説明する
Next, the flowchart shown in FIG. 1 will be explained with reference to FIG. 2.

ステップ21では対数変換部8のデータをSN比較手段
11へ送り、ステップ22ではSN比較手段11に設定
されている設定値と対数変換部8から送られてきたデー
タとを比較する。
In step 21, the data of the logarithmic conversion section 8 is sent to the SN comparison means 11, and in step 22, the setting value set in the SN comparison means 11 and the data sent from the logarithm conversion section 8 are compared.

設定値よりも対数変換部8のデータの方がよい場合は、
ステップ28に進み、設定値よりも対数変換部8のデー
タの方が悪い場合は、ステップ23に進む。
If the data of the logarithmic conversion unit 8 is better than the set value,
The process proceeds to step 28, and if the data from the logarithmic conversion unit 8 is worse than the set value, the process proceeds to step 23.

ステップ23では増幅部6の利得は最大かを判断し、最
大の場合はステップ24へ進み、最大でない場合はステ
ップ25へ進む。
In step 23, it is determined whether the gain of the amplifying section 6 is maximum. If it is the maximum, the process proceeds to step 24; if it is not the maximum, the process proceeds to step 25.

ステップ25では増幅部6の利得を上げ、ステップ26
では平均加算処理部7で平均加算をする。
In step 25, the gain of the amplifier section 6 is increased, and in step 26
Then, the average addition processing section 7 performs average addition.

ステップ27では、平均加算回数を増やすかを判断し、
平均加算回数を増やす場合はステップ28に進み、平均
加算回数を増やさない場合はステップ22に進む。
In step 27, it is determined whether to increase the number of average additions,
If the number of average additions is to be increased, the process proceeds to step 28; if the number of average additions is not to be increased, the process is to proceed to step 22.

ステップ28ではデータをデータ記憶手段11へ送り、
ステップ29では送られてきたデータをデータ記憶手段
11に記憶する。
In step 28, the data is sent to the data storage means 11,
In step 29, the sent data is stored in the data storage means 11.

ステップ30ではデータ記憶手段11内のデータを結合
し、ステップ31では結合したデータを表示部9に表示
する。
In step 30, the data in the data storage means 11 are combined, and in step 31, the combined data is displayed on the display section 9.

[実施例] 次に、平均加算処理部7でX回の平均を加算し、対数変
換部8で対数変換をした後の○TDRの測定波形を第3
図により説明する。
[Example] Next, the average addition processing unit 7 adds the average of X times, and the logarithmic conversion unit 8 performs logarithmic conversion.
This will be explained using figures.

第1図のSN比比較手段11に設定する設定値を例えば
SN比20dBとし、第3図のA点がSN比20dBと
すると、A点よりも左側のデータはSN比20dB以上
になる。そこで、A点から左側のデータをデータ記憶手
段12へ送って記憶する。
If the setting value set in the SN ratio comparison means 11 in FIG. 1 is, for example, 20 dB, and the SN ratio at point A in FIG. 3 is 20 dB, then the data to the left of point A will have an SN ratio of 20 dB or more. Therefore, data on the left side from point A is sent to the data storage means 12 and stored.

第3図のB点はノイズフロアと同じレベルなのでSN比
OdBである。第1図の増幅部6で利得を20dB上げ
て信号を大きくし、X回の平均を加算し、第4図の測定
波形を得る。そして、A点からB点までのデータを記憶
手段12へ送り、記憶する。
Since point B in FIG. 3 is at the same level as the noise floor, the S/N ratio is O dB. The gain is increased by 20 dB in the amplifying section 6 of FIG. 1 to increase the signal, and the average of X times is added to obtain the measured waveform of FIG. 4. Then, the data from point A to point B is sent to storage means 12 and stored.

第4図の0点は、ノイズフロアと同じレベルな(7)で
SN比OdBである。0点をSN比20dBに上げるた
めには、B点と同じように増幅部6の利得を20dB上
げてからX回の平均を加算する。
The 0 point in FIG. 4 is at the same level as the noise floor (7) and has an S/N ratio of O dB. In order to raise the SN ratio from point 0 to 20 dB, the gain of the amplifier section 6 is increased by 20 dB in the same way as point B, and then the average of X times is added.

第5図はこの状態を示したものである。第5図のデータ
をデータ記憶手段12へ送って記憶する。
FIG. 5 shows this state. The data shown in FIG. 5 is sent to the data storage means 12 and stored therein.

データ記憶手段12では、先頭からA点、A点からB点
、B点から0点、そして0点から末尾まで、送られたデ
ータのすべてを順番に並べ、かつそのレベルを合せて1
つの波形として結合し、第6図のように表示する。
In the data storage means 12, all of the sent data is arranged in order from the beginning to point A, from point A to point B, from point B to point 0, and from point 0 to the end, and the levels are combined into one.
The signals are combined into one waveform and displayed as shown in FIG.

[発明の効果] この発明によれば、従来の○TDRにSN比比較手段と
データ記憶手段を追加し、SN比に応じて平均回数をか
えているので、測定波形上のSN比の均一化を図ること
ができ、測定時間を短縮することができる。また、これ
らの手段は、ソフトウェアとメモリで実現できるので、
簡単な回路で実現することができる。
[Effects of the Invention] According to the present invention, an SN ratio comparison means and a data storage means are added to the conventional ○TDR, and the number of times of averaging is changed according to the SN ratio, so that the SN ratio on the measured waveform can be made uniform. The measurement time can be shortened. In addition, these means can be realized with software and memory, so
This can be realized with a simple circuit.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの発明による0TDRの構成図、第2図は第
1図のフローチャート、第3図から第6図は0TDRの
測定波形の変化図、第7図は0TDRの構成図、第8図
は平均回数とSN比の関係図、第9図は0TDRの測定
波形図である。 1・・・・・・タイミング発生部、2・・・・・・駆動
回路、3・・・・・・光源、4・・・・・・光方向性結
合器、5・・・・・・受光器、6・・・・・・増幅部、
7・・・・・・加算平均処理部、8・・・・・・対数変
換部、9・・・・・・表示部、10・・・・・・測定さ
れる光ファイバ、11・・・・・・SN比比較手段、1
2・・・・・・データ記憶手段。 代理人  弁理士  小 俣 欽 同 第1図 第2図 第3図 第4図 第5図 第6図 第7図
Fig. 1 is a block diagram of the 0TDR according to the present invention, Fig. 2 is a flowchart of Fig. 1, Figs. 3 to 6 are changes in measured waveforms of the 0TDR, Fig. 7 is a block diagram of the 0TDR, and Fig. 8 9 is a diagram showing the relationship between the number of averages and the SN ratio, and FIG. 9 is a diagram showing the measured waveform of 0TDR. DESCRIPTION OF SYMBOLS 1... Timing generator, 2... Drive circuit, 3... Light source, 4... Optical directional coupler, 5... Photoreceiver, 6...Amplification section,
7...Additional averaging processing unit, 8...Logarithmic conversion unit, 9...Display unit, 10...Optical fiber to be measured, 11... ...SN ratio comparison means, 1
2...Data storage means. Agent Patent Attorney Kin Omata Figure 1 Figure 2 Figure 3 Figure 4 Figure 5 Figure 6 Figure 7

Claims (1)

【特許請求の範囲】 1、光源(3)から出射される光パルスを光方向性結合
器(4)から光ファイバ(10)に入射し、光ファイバ
(10)からの戻り光を光方向性結合器(4)から受光
器(5)へ送り、受光器(5)の出力を増幅部(6)で
増幅し、平均加算処理部(7)でディジタル信号に変換
して加算平均し、平均加算処理部(7)の出力を対数変
換部(8)で対数変換し、表示部(9)で表示する光パ
ルス試験器において、 SN比が設定され、対数変換部(8)の出力と設定され
たSN比とを比較するSN比較手段(11)と、平均加
算データを記憶するデータ記憶手段(12)とを備え、 対数変換部(8)の出力がSN比の設定値よりよいとき
は対数変換部(8)の出力をデータ記憶手段(12)に
記憶し、対数変換部(8)の出力がSN比の設定値より
悪いときは増幅部 (6)の利得を上げてSN比を改善するか、または平均
加算処理部(7)の平均回数を増やして対数変換部(8
)の出力のSN比を改善し、データ記憶手段(12)が
記憶しているSN比のよいデータを結合して表示部(9
)に表示することを特徴とする光パルス試験器。
[Claims] 1. A light pulse emitted from a light source (3) is inputted from an optical directional coupler (4) into an optical fiber (10), and the return light from the optical fiber (10) is It is sent from the coupler (4) to the photoreceiver (5), the output of the photoreceiver (5) is amplified by the amplification section (6), converted into a digital signal by the averaging processing section (7), added and averaged, and then averaged. In the optical pulse tester, the output of the addition processing section (7) is logarithmically converted by the logarithmic conversion section (8) and displayed on the display section (9). and a data storage means (12) for storing average addition data, and when the output of the logarithmic conversion section (8) is better than the set value of the SN ratio. The output of the logarithmic conversion section (8) is stored in the data storage means (12), and when the output of the logarithm conversion section (8) is worse than the set value of the SN ratio, the gain of the amplification section (6) is increased to improve the SN ratio. or by increasing the number of times of averaging in the average addition processing unit (7) and
), and combine the data stored in the data storage means (12) with a good signal-to-noise ratio to display the display section (9).
) An optical pulse tester characterized by displaying the following:
JP2284000A 1990-10-22 1990-10-22 Optical pulse tester Expired - Lifetime JP3014134B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2284000A JP3014134B2 (en) 1990-10-22 1990-10-22 Optical pulse tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2284000A JP3014134B2 (en) 1990-10-22 1990-10-22 Optical pulse tester

Publications (2)

Publication Number Publication Date
JPH04158237A true JPH04158237A (en) 1992-06-01
JP3014134B2 JP3014134B2 (en) 2000-02-28

Family

ID=17672997

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2284000A Expired - Lifetime JP3014134B2 (en) 1990-10-22 1990-10-22 Optical pulse tester

Country Status (1)

Country Link
JP (1) JP3014134B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5870184A (en) * 1996-10-09 1999-02-09 Ando Electric Co., Ltd. Optical pulse tester
WO2008004443A1 (en) 2006-07-03 2008-01-10 Anritsu Corporation Optical time domain reflectometer and method for testing optical fiber using optical pulse
US7620513B2 (en) 2005-11-04 2009-11-17 Anritsu Corporation Optical time domain reflectometer, and optical fiber measuring method and optical fiber measuring system using the same

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5870184A (en) * 1996-10-09 1999-02-09 Ando Electric Co., Ltd. Optical pulse tester
US7620513B2 (en) 2005-11-04 2009-11-17 Anritsu Corporation Optical time domain reflectometer, and optical fiber measuring method and optical fiber measuring system using the same
WO2008004443A1 (en) 2006-07-03 2008-01-10 Anritsu Corporation Optical time domain reflectometer and method for testing optical fiber using optical pulse
US8237921B2 (en) 2006-07-03 2012-08-07 Anritsu Corporation Optical time domain reflectometer and method for testing optical fiber using optical pulse
EP2037250A4 (en) * 2006-07-03 2015-03-25 Anritsu Corp Optical time domain reflectometer and method for testing optical fiber using optical pulse

Also Published As

Publication number Publication date
JP3014134B2 (en) 2000-02-28

Similar Documents

Publication Publication Date Title
US5062704A (en) Optical time domain reflectometer having pre and post front panel connector testing capabilities
US4732469A (en) Low noise optical time domain reflectometer
US12546682B2 (en) Optical signal detection apparatus and method and related device
CN108199767A (en) A kind of detection method and device of high dynamic range optical time domain reflection
JPH06201482A (en) Light pulse tester
CN111740775B (en) Method for improving event blind area performance of optical time domain reflectometer and application
US5129721A (en) Advanced waveform observation system using waveform smoothing with restricted waveform level difference
US5933227A (en) Testing method for optical fiber
US5949533A (en) Optical fiber distortion measurement device and method thereof
JPH04158237A (en) Photopulse tester
JP2011007618A (en) Light pulse test apparatus
JPH09318492A (en) Otdr measuring device
JP3002343B2 (en) Optical pulse tester
JP3161198B2 (en) OTDR that automatically sets pulse width and gain
JP2001305017A (en) Optical pulse testing device
JPH06109841A (en) Distance detection method
JP2002221467A (en) Method for judging remote end position of optical fiber in optical pulse tester
JPH10111212A (en) Light pulse test equipment
JP2008020229A (en) Optical pulse tester
JP2003207413A (en) Optical line test apparatus and method for correcting transmission loss characteristics
JP4166473B2 (en) Optical line test apparatus and light source output level monitoring method
JP2006184038A (en) Light pulse tester
JP2008286578A (en) Optical pulse test apparatus and adjustment method thereof
JP5627848B2 (en) Optical pulse tester and optical pulse test method
JPS6086438A (en) Method and apparatus for testing optical fiber

Legal Events

Date Code Title Description
S111 Request for change of ownership or part of ownership

Free format text: JAPANESE INTERMEDIATE CODE: R313113

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20071217

Year of fee payment: 8

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20081217

Year of fee payment: 9

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20091217

Year of fee payment: 10

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20091217

Year of fee payment: 10

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20101217

Year of fee payment: 11

EXPY Cancellation because of completion of term