JPH0417366B2 - - Google Patents
Info
- Publication number
- JPH0417366B2 JPH0417366B2 JP5472783A JP5472783A JPH0417366B2 JP H0417366 B2 JPH0417366 B2 JP H0417366B2 JP 5472783 A JP5472783 A JP 5472783A JP 5472783 A JP5472783 A JP 5472783A JP H0417366 B2 JPH0417366 B2 JP H0417366B2
- Authority
- JP
- Japan
- Prior art keywords
- laser beam
- interference
- output
- scanning mirror
- interference output
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000005070 sampling Methods 0.000 claims description 8
- 239000000284 extract Substances 0.000 claims description 3
- 238000001514 detection method Methods 0.000 description 5
- 238000005259 measurement Methods 0.000 description 2
- 238000007493 shaping process Methods 0.000 description 2
- 230000000903 blocking effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/45—Interferometric spectrometry
- G01J3/453—Interferometric spectrometry by correlation of the amplitudes
- G01J3/4535—Devices with moving mirror
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Spectrometry And Color Measurement (AREA)
Description
【発明の詳細な説明】 イ 産業上の利用分野 本発明はフーリエ変換分光光度計に関する。[Detailed description of the invention] B Industrial application field The present invention relates to Fourier transform spectrophotometers.
ロ 従来技術
フーリエ変換分光光度計では主光束の測光出力
をサンプリングするためのサンプリング信号とか
走査鏡の移動速度制御のために主光束と平行に入
射させたレーザービームの干渉出力を用いてい
る。所でこのレーザービームの干渉出力は色々な
原因によるノイズを含んでおり、特に外部のわづ
かな振動の影響を敏感に受ける。B. Prior Art A Fourier transform spectrophotometer uses a sampling signal for sampling the photometric output of the main beam and an interference output of a laser beam incident parallel to the main beam to control the moving speed of the scanning mirror. However, the interference output of this laser beam contains noise due to various causes, and is particularly sensitive to the influence of slight external vibrations.
図は本発明の一実施例を示すものであるが、こ
の図を借りて上述した点を具体的に説明する。こ
の例ではフーリエ変換分光光度計はマイケルソン
干渉計によつて構成されている。1はビームスプ
リツタ、2は固定鏡3が走査鏡で、4は主光束光
源、5はレーザーである。主光束Fとレーザービ
ームLとは平行している。D1は主光束の干渉に
よる変化を検出する受光素子、D2はレーザービ
ームの干渉を検出する受光素子である。主光束は
赤外光であり、レーザービームは主光束の光の波
長より波長の短い可視光である。レーザービーム
の干渉出力を波形整形して主光束の干渉出力のサ
ンプリング信号とする。またレーザービームの干
渉出力はレーザー光の波長の1/2を単位とした走
査鏡の移動量の目盛でもあるから、走査鏡の移動
速度の制御に用いられる。このレーザービームの
干渉出力は電気的な原因によるノイズの他に走査
鏡を駆動するときの機構部の運動によつて生ずる
機械的な振動及び外部からの振動によるノイズも
含んでいる。機械的な原因によるノイズは機械的
な攪乱が走査鏡、固定鏡、干渉計のフレーム等の
自由振動を誘発して、この振動が干渉状態を変動
させるので、上述各部の共振周波数及びその整数
倍の周波数を持つたものが優勢である。 The figure shows one embodiment of the present invention, and the above-mentioned points will be specifically explained with reference to this figure. In this example, the Fourier transform spectrophotometer is constructed by a Michelson interferometer. 1 is a beam splitter, 2 is a fixed mirror 3 is a scanning mirror, 4 is a main beam source, and 5 is a laser. The principal beam F and the laser beam L are parallel. D1 is a light-receiving element that detects changes due to interference in the principal beam, and D2 is a light-receiving element that detects interference between laser beams. The main beam is infrared light, and the laser beam is visible light whose wavelength is shorter than the wavelength of the main beam. The interference output of the laser beam is waveform-shaped and used as a sampling signal of the interference output of the principal beam. Furthermore, since the interference output of the laser beam is also a scale of the amount of movement of the scanning mirror in units of 1/2 of the wavelength of the laser beam, it is used to control the movement speed of the scanning mirror. The interference output of this laser beam includes not only noise caused by electrical causes but also noise caused by mechanical vibration caused by the movement of the mechanism when driving the scanning mirror and noise caused by external vibration. Noise due to mechanical causes is caused by mechanical disturbances that induce free vibrations of the scanning mirror, fixed mirror, frame of the interferometer, etc., and this vibration changes the interference state. The one with the frequency is dominant.
上述したレーザービームの干渉出力のノイズは
サンプリング信号の位相を狂わせ、測定誤差の原
因となる。従来はこれらのノイズに対する対策と
して干渉計を構造的に頑丈にすること、装置の設
置環境を良くする(防振、電気的影響の遮断等)
ことに重点を重いていたので、装置価格、装置設
置の費用とも高くなつていた。 The noise of the interference output of the laser beam described above shifts the phase of the sampling signal, causing measurement errors. Conventionally, countermeasures against these noises include making the interferometer structurally more robust and improving the environment in which the device is installed (vibration isolation, blocking electrical influences, etc.)
As a result, both the equipment price and the equipment installation cost were high.
ハ 目的
本発明は従来のノイズ対策とは異なる観点から
レーザービーム干渉出力のノイズ軽減を計り、従
来の装置より価格等の増加を招来しないでレーザ
ービーム干渉出力のS/N比の向上を得ることを
目的とする。C. Purpose The present invention aims to reduce noise in laser beam interference output from a different perspective from conventional noise countermeasures, and to improve the S/N ratio of laser beam interference output without causing an increase in price compared to conventional devices. With the goal.
ニ 構成
本発明は走査鏡が特定の速度の近辺の速度で移
動しているときだけレーザービーム干渉出力を取
出すようにし、かつ走査鏡の上記特定移動速度に
おける干渉出力の周波数を中心周波数とするバン
ドパスフイルタを通してレーザービーム干渉出力
を取出すようにしたフーリエ変換分光光度計であ
る。D. Configuration The present invention extracts laser beam interference output only when the scanning mirror is moving at a speed near a specific speed, and a band whose center frequency is the frequency of the interference output at the specific moving speed of the scanning mirror. This is a Fourier transform spectrophotometer that extracts the laser beam interference output through a pass filter.
ホ 実施例
図に本発明の一実施例を示す。既に一部説明し
たので、その分の説明は略す。レーザービーム干
渉検出用受光素子D2の出力はプリアンプA1で
増幅され、バンドパスフイルタAを通した後、メ
インアンプA3で増幅され、波形整形回路A4で
パルス信号に変換される。主光束の干渉検出用受
光素子D1の出力はアンプA5で増幅された後、
A4によつて得られたパルス信号がサンプリング
パルスとして印加されるサンプルホールド回路
SHに入力され、サンプリングされた信号はA/
D変換器ADでデイジタル化されてデータ処理回
路Cに入力される。A4によつて得られたパルス
信号は、パルス周期検出回路Kでパルス周期が検
出され、比較回路Cpで検出されたパルス周期が
基準周期と比較され、両者の差が0となるように
モータ駆動制御回路DRが制御され、DRによつ
て走査鏡3を駆動するモータMが駆動される。他
方比較回路Cpの差出力はもう一つの比較回路
Cp′で一つの基準値と比較され、Cpの差出力がこ
の基準値以下のときだけゲートGが開いてサンプ
リングパルスがサンプルホールド回路SHに送ら
れる。この構成により走査鏡が走査運動を開始し
て未だ所定速度に達しない前における主光束の干
渉出力のサンプリング動作が禁止される。E. Example The figure shows an example of the present invention. Since I have already explained some of it, I will omit that part of the explanation. The output of the laser beam interference detection light receiving element D2 is amplified by a preamplifier A1, passed through a bandpass filter A, then amplified by a main amplifier A3, and converted into a pulse signal by a waveform shaping circuit A4. After the output of the light-receiving element D1 for detecting interference of the main beam is amplified by the amplifier A5,
A sample hold circuit to which the pulse signal obtained by A4 is applied as a sampling pulse.
The sampled signal input to SH is A/
The signal is digitized by the D converter AD and input to the data processing circuit C. The pulse period of the pulse signal obtained by A4 is detected by a pulse period detection circuit K, the pulse period detected by a comparator circuit Cp is compared with a reference period, and the motor is driven so that the difference between the two becomes 0. The control circuit DR is controlled, and the motor M that drives the scanning mirror 3 is driven by the DR. The difference output of the other comparator circuit Cp is the other comparator circuit.
Cp' is compared with a reference value, and only when the difference output of Cp is less than this reference value, the gate G is opened and the sampling pulse is sent to the sample-and-hold circuit SH. With this configuration, the sampling operation of the interference output of the main beam is prohibited before the scanning mirror starts the scanning movement and has not yet reached a predetermined speed.
バンドパスフイルタA2の中心周波数は走査鏡
3の正規の移動速度におけるレーザービーム干渉
出力の周波数に合せてある。干渉計が構造的に或
る程度頑丈に作られていると、走査鏡停止時にお
いて、通常程度の外部振動の影響を受けても、干
渉計の振動的撓みによる干渉計の二光束の光路差
の変化はレーザー光の半波長分以下とすることが
できる。従つてこのような場合受光素子D2の出
力は干渉計の構造の色々なモードの自由振動の周
波数を重ねた波形の変化を示す。この波形が機械
的原因によるノイズの重要成分と考えられるか
ら、走査鏡の正規の移動速度を、それによつて得
られるレーザービーム干渉出力の周波数が上記し
た干渉計の静止時の外的作用によるレーザービー
ム干渉出力の変化の周波数成分の何れとも異つて
いるように選択することができれば(これは設計
上の問題)、フイルタA2の作用で、機械的原因
によるノイズを略完全に除去することができる。 The center frequency of the bandpass filter A2 is matched to the frequency of the laser beam interference output at a normal moving speed of the scanning mirror 3. If the interferometer is made to have a certain degree of structural strength, even if it is affected by normal external vibrations when the scanning mirror is stopped, the optical path difference between the two beams of the interferometer due to the vibrational deflection of the interferometer will be reduced. The change in can be less than half the wavelength of the laser beam. Therefore, in such a case, the output of the light-receiving element D2 shows a waveform change in which the free vibration frequencies of various modes of the structure of the interferometer are superimposed. Since this waveform is considered to be an important component of noise due to mechanical causes, the frequency of the laser beam interference output obtained by it is determined by the normal moving speed of the scanning mirror, which is caused by the external action when the interferometer is stationary. If the frequency component of the change in beam interference output can be selected to be different from any of the frequency components (this is a design problem), noise due to mechanical causes can be almost completely removed by the action of filter A2. .
ヘ 効果
本発明フーリエ変換分光光度計は上述したよう
な構成で、レーザービーム干渉出力が一定周波数
となるように走査鏡を制御し、レーザービーム干
渉出力を特定周波数のフイルタを通して取出すよ
うにしたので、ノイズとして影響するのもその周
波数近辺の周波数のノイズだけとなり、ノイズの
総量が低減されて、高精度の測定が可能となり、
しかも電気回路上の構成によつて実現されるもの
であるから、装置価格を押し上げると云うことが
殆どない。Effect The Fourier transform spectrophotometer of the present invention has the above-described configuration, and the scanning mirror is controlled so that the laser beam interference output has a constant frequency, and the laser beam interference output is extracted through a filter of a specific frequency. Only the noise at frequencies near that frequency will be affected as noise, reducing the total amount of noise and enabling highly accurate measurements.
Moreover, since it is realized by a configuration on an electric circuit, there is almost no increase in the price of the device.
図面は本発明の一実施例装置の構成を示すブロ
ツク図である。
1……ビームスプリツタ、2……固定鏡、3…
…走査鏡、4……主光束光源、5……レーザー、
D1……主光束干渉検出用受光素子、D2……レ
ーザービーム干渉検出用受光素子、A2……バン
ドパスフイルタ、A4……波形整形回路、SH…
…サンプルホールド回路、C……データ処理回
路、K……パルス周期検出回路、Cp,Cp′……比
較回路、G……ゲート、DR……モータ駆動制御
回路、M……走査鏡駆動用モータ。
The drawing is a block diagram showing the configuration of an apparatus according to an embodiment of the present invention. 1...Beam splitter, 2...Fixed mirror, 3...
...Scanning mirror, 4...Primary flux light source, 5...Laser,
D1... Light receiving element for main beam interference detection, D2... Light receiving element for laser beam interference detection, A2... Bandpass filter, A4... Waveform shaping circuit, SH...
...Sample hold circuit, C...Data processing circuit, K...Pulse period detection circuit, Cp, Cp'...Comparison circuit, G...Gate, DR...Motor drive control circuit, M...Scanning mirror drive motor .
Claims (1)
して主光束の干渉出力のサンプリングパルスとす
る構成において、走査鏡を一定速度で駆動させる
制御手段を有し、その走査速度におけるレーザー
ビームの干渉出力の周波数を中心周波数とするバ
ンドパスフイルタを介してレーザービーム干渉出
力を取出すようにしたフーリエ変換分光光度計。1 In a configuration in which the interference of a laser beam parallel to the main beam is detected and used as a sampling pulse of the interference output of the main beam, there is a control means for driving the scanning mirror at a constant speed, and the interference output of the laser beam at the scanning speed is A Fourier transform spectrophotometer that extracts the laser beam interference output through a bandpass filter whose center frequency is .
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5472783A JPS59178325A (en) | 1983-03-29 | 1983-03-29 | Fourier transformation spectrophotometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5472783A JPS59178325A (en) | 1983-03-29 | 1983-03-29 | Fourier transformation spectrophotometer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS59178325A JPS59178325A (en) | 1984-10-09 |
| JPH0417366B2 true JPH0417366B2 (en) | 1992-03-25 |
Family
ID=12978831
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5472783A Granted JPS59178325A (en) | 1983-03-29 | 1983-03-29 | Fourier transformation spectrophotometer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59178325A (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2784468B2 (en) * | 1988-07-15 | 1998-08-06 | 株式会社アドバンテスト | Optical interference signal extraction device |
| US4933584A (en) * | 1988-12-22 | 1990-06-12 | General Electric Company | Electronically commutated motor having skewed magnetics |
-
1983
- 1983-03-29 JP JP5472783A patent/JPS59178325A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS59178325A (en) | 1984-10-09 |
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