JPH04177152A - Observation of hole - Google Patents

Observation of hole

Info

Publication number
JPH04177152A
JPH04177152A JP30255590A JP30255590A JPH04177152A JP H04177152 A JPH04177152 A JP H04177152A JP 30255590 A JP30255590 A JP 30255590A JP 30255590 A JP30255590 A JP 30255590A JP H04177152 A JPH04177152 A JP H04177152A
Authority
JP
Japan
Prior art keywords
light
hole
image
wall
detection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP30255590A
Other languages
Japanese (ja)
Other versions
JP3020593B2 (en
Inventor
Yasuhiko Hara
靖彦 原
Satoshi Shinada
聡 品田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Hitachi Industry and Control Solutions Co Ltd
Original Assignee
Hitachi Ltd
Hitachi Video Engineering Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd, Hitachi Video Engineering Co Ltd filed Critical Hitachi Ltd
Priority to JP2302555A priority Critical patent/JP3020593B2/en
Publication of JPH04177152A publication Critical patent/JPH04177152A/en
Application granted granted Critical
Publication of JP3020593B2 publication Critical patent/JP3020593B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Instruments For Viewing The Inside Of Hollow Bodies (AREA)
  • Production Of Multi-Layered Print Wiring Board (AREA)

Abstract

PURPOSE:To observe even a fine and long hole by using a fluorescent detection method with only an image guide part. CONSTITUTION:Only the image guide part 11 of a fiberscope is taken out to be inserted in a through-hole 12. The illumination light 15 from a light source 14 becomes light composed only of a violet component by a violet filter 16 and this light is reflected by a wavelength separating filter 17 to be incident on the detection end 11a of the guide part 11 by an objective lens 18 to irradiate the inner wall 12a of the hole 12 at the observation end 11b of the guide part 11. The image of the inner wall 12a is guided to the focal surface of the line 18 through the guide part 11 and only the fluorescent component therein passes through the filter 17 and a yellow filter 19 as detection light 15 to be capable of being observed by an eyepiece 20. Even when the same optical fiber is used in the guide of the illumination light 15 and the guide of the detection light 15a in fluorescent detection, the halation due to the illumination light 15 is not generated in the detection light 15a. Further, in the observation by fluores cence, a copper plating part is made dark and a void part (base material ex posed part) is made bright to obtain an image improved in contrast.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、プリント基板等の積層基板等に設けられたス
ルーホールのホール内壁の状態を観察する方法に関する
。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method for observing the condition of the inner wall of a through hole provided in a laminated board such as a printed circuit board.

[従来の技術] 従来のwL察法は実開昭63−126856号公報に記
載のように、傾斜状反射面を先端に持つ軸をホール内部
に挿入し、ホール内壁の像を傾斜状反射面により反射さ
せ、ホール外部へ導びいて観察するものである。すなわ
ち、従来技術のホール観察法は第3図に示す様に、光源
14からの照明光15をハーフミラ−32で反射させ、
スルーホール12内部へ導びいて、スルーホール12内
部に挿入した軸34先端の反射面34aで、更に、反射
させスルーホール12の内壁12aに照射させる。スル
ーホール12の内壁12aの像は同様に軸34先端の反
射面34aで反射されスルーホール外部へ導ひかれた後
、今度はハーフミラ−32を通過したものが光学レンズ
系35によって光電変換素子36に結像し、検出されて
いた。
[Prior art] The conventional wL observation method, as described in Japanese Utility Model Application Publication No. 126856/1983, involves inserting a shaft with an inclined reflective surface at the tip into the hole, and then transmitting an image of the inner wall of the hole to the inclined reflecting surface. The beam is reflected by the beam and guided outside the hole for observation. That is, in the conventional hole observation method, as shown in FIG. 3, illumination light 15 from a light source 14 is reflected by a half mirror 32,
The light is guided into the through hole 12 and is further reflected by the reflective surface 34a at the tip of the shaft 34 inserted into the through hole 12 to illuminate the inner wall 12a of the through hole 12. The image on the inner wall 12a of the through hole 12 is similarly reflected by the reflective surface 34a at the tip of the shaft 34 and guided to the outside of the through hole.The image that passes through the half mirror 32 is then transferred to the photoelectric conversion element 36 by the optical lens system 35. It was imaged and detected.

もう一つの従来の観察法は第4図(a)に示す様な細径
のファイバースコープ40を用いてホール内壁を観察す
るものである。このファイバースコープ4oは、医学用
等に用いられている一般的なものと構造の上では同一の
ものである。光源(図示せず)からの照明光はライトガ
イド41によって導かれ、スルーホール12の内壁12
aを照射する。スルーホール12の内壁12aの像はイ
メージガイド部11によって接眼部へ導びかれて観察さ
れる。
Another conventional observation method is to observe the inner wall of the hole using a small-diameter fiberscope 40 as shown in FIG. 4(a). This fiberscope 4o is structurally the same as a general one used for medical purposes. Illumination light from a light source (not shown) is guided by a light guide 41 to the inner wall 12 of the through hole 12.
irradiate a. The image on the inner wall 12a of the through hole 12 is guided to the eyepiece section by the image guide section 11 and observed.

ファイバースコープ4oをスルーホール12に挿入すれ
ば(第4図(b))、スルーホール12の内壁12aの
観察が可能になる。この場合、観察される像はスルーホ
ール12の内壁12aが同心円状になったものであり、
第4図(c)の様になる。スルーホール12の口12b
は中心に観察されることになる。なおイメージガイド部
11には、先端に結像レンズ42が付属している。
If the fiberscope 4o is inserted into the through hole 12 (FIG. 4(b)), the inner wall 12a of the through hole 12 can be observed. In this case, the observed image is that the inner wall 12a of the through hole 12 has a concentric shape,
The result will be as shown in Figure 4(c). Mouth 12b of through hole 12
will be observed centrally. Note that the image guide section 11 has an imaging lens 42 attached to its tip.

更に、もう一つの従来の観察法は第5図に示す様に、フ
ァイバースコープ4oよりも細い穴径のスルーホール1
2でも観察可能にするため、ファイバースコープ40の
イメージガイド部11のみをスルーホール12に挿入し
、観察するものである。照明光15はハーフミラ−32
によって反射し、光学レンズ系35でイメージガイド部
11の検出端11aに入射して観察端11bよりスルー
ホール12の内壁12aを照射する。スルーホール12
の内壁12aの像はイメージガイド部11を伝って光学
レンズ系35を通り、ハーフミラ−32を通過して観察
される。
Furthermore, as shown in Figure 5, another conventional observation method uses a through hole 1 with a smaller diameter than the fiberscope 4o.
2, only the image guide section 11 of the fiberscope 40 is inserted into the through hole 12 for observation. The illumination light 15 is a half mirror 32
The light is reflected by the optical lens system 35 and enters the detection end 11a of the image guide section 11, and illuminates the inner wall 12a of the through hole 12 from the observation end 11b. Through hole 12
The image of the inner wall 12a is transmitted through the image guide section 11, passes through the optical lens system 35, and is observed after passing through the half mirror 32.

[発明が解決しようとする課題] 上記従来の実開昭63−126856号公報による観察
法はアスペクト比の高くないスルーホール12について
考えられたもので、高密度プリント基板のスルーホール
の様に、アスペクト比が高くスルーホール12の径が細
い場合は対応が困難である。
[Problems to be Solved by the Invention] The conventional observation method disclosed in the above-mentioned Japanese Utility Model Application Publication No. 126856/1985 was considered for the through holes 12 that do not have a high aspect ratio. This is difficult when the aspect ratio is high and the diameter of the through hole 12 is small.

すなわち、第6@に示す様な細くて長いスルーホール1
2では、軸34もスルーホール12に応して細くて長く
しなくてはならず、先端の反射面34aの製作が難かし
くなる。また、スルーホール12には傾きのあるものも
あり、軸34をスルーホール12内壁12aに接触させ
ずに出し入れさせたり、回動させたりする事が難しい。
In other words, a thin and long through hole 1 as shown in No. 6 @
In No. 2, the shaft 34 must also be made thin and long according to the through hole 12, making it difficult to manufacture the reflective surface 34a at the tip. Further, some of the through holes 12 have an inclination, and it is difficult to move the shaft 34 in and out of the through hole 12 or rotate it without contacting the inner wall 12a of the through hole 12.

軸34を接触させる事はスルーホール内壁12aに傷を
つけて状態を変えてしまう可能性や、軸34自体を損傷
する可能性があり問題である。更に、照明光15の一部
や検出光61の一部がスルーホール12の端12cによ
って遮られてしまい、充分な明るさの観察像を得る事が
出来ない。
Bringing the shaft 34 into contact is problematic because it may damage the inner wall 12a of the through hole and change its condition, or it may damage the shaft 34 itself. Furthermore, a portion of the illumination light 15 and a portion of the detection light 61 are blocked by the end 12c of the through hole 12, making it impossible to obtain an observation image with sufficient brightness.

他方、上記従来の第3図の観察法では、ファイバースコ
ープ40よりも細い穴径のスルーホール12の観察は事
実上無理である。(現在量も細いファイバースコープ4
0の径は0.55閣である。)ファイバースコープ40
の一般的な構造はライトガイド41とイメージガイド部
11が一組になっている。ライトガイド41はイメージ
ガイド部11で画像をm察する際の照明を導く手段とし
て必要であり、ライトガイド41を取り除いたものでは
スルーホール12の内壁12 aのm察が出来ない。
On the other hand, with the conventional observation method shown in FIG. 3, it is virtually impossible to observe the through-hole 12 having a diameter smaller than that of the fiberscope 40. (Currently, the amount is also thin fiber scope 4
The diameter of 0 is 0.55 mm. ) fiber scope 40
The general structure is that the light guide 41 and the image guide section 11 are combined into one set. The light guide 41 is necessary as a means for guiding illumination when observing an image in the image guide section 11, and if the light guide 41 is removed, the inner wall 12a of the through hole 12 cannot be observed.

また、従来の第4図の観察法ではイメージガイド部11
を、そのままライトガイドとして使用する事によってフ
ァイバースコープ40よりも細い穴径のスルーホール1
2をamしようとしているが、照明光15がイメージガ
イド11内で検出光に侵入してハレーションを起こして
しまい、実際に像が観察出来ない。
Furthermore, in the conventional observation method shown in FIG.
By using the through hole 1 as a light guide, the hole diameter is smaller than that of the fiberscope 40.
2, but the illumination light 15 enters the detection light within the image guide 11 and causes halation, making it impossible to actually observe the image.

照明光15をスルーホール12のイメージガイド部11
を挿入していない側から照射した場合も同様にハレーシ
ョンを起こしてしまう。
The illumination light 15 is passed through the image guide section 11 of the through hole 12.
Halation will also occur if the light is irradiated from the side that is not inserted.

本発明の目的は、細くて長いホールであっても不都合無
く観察出来る、ホール検査法を提供する事にある。
An object of the present invention is to provide a hole inspection method that allows even thin and long holes to be observed without any inconvenience.

[課題を解決するための手段] 上記目的は、第3図に示した様なミラーを用いる方法で
はなく、第5図の様にイメージガイド部のみを用い、か
つ、第4図に示したファイバースコープ40の様なライ
トガイド41とイメージガイド部11の二つの機能を持
たせ、イメージガイド部11にライトガイド41の光が
直接影響する事の無い様に出来る蛍光検出法を用いれば
達成される。
[Means for solving the problem] The above purpose is not to use a method using a mirror as shown in FIG. 3, but to use only an image guide section as shown in FIG. This can be achieved by providing the two functions of a light guide 41 like a scope 40 and an image guide section 11, and using a fluorescence detection method that prevents the image guide section 11 from being directly affected by the light from the light guide 41. .

[作用] 本発明では、ホール観察法がイメージを伝達する部分の
みのファイバー径が有れば済むので、傾きの有るホール
等でも挿入さえ出来、別に設けた照明で励起光を照射す
る事が出来れば、従来より細くて長いホールであっても
容易に観察することが可能になる。
[Function] In the present invention, since the hole observation method requires only the diameter of the fiber for the part that transmits the image, it is possible to insert even a hole with an inclination, and excitation light can be irradiated with a separately provided illumination. For example, it becomes possible to easily observe even holes that are thinner and longer than before.

[実施例] 以下添付の図面に示す実施例により、更に詳細に本発明
について説明する。
[Examples] The present invention will be described in more detail below with reference to Examples shown in the attached drawings.

第1図に本発明の第一の実施例を示す。図示する様に、
ファイバースコープよりも細い穴径をもつスルーホール
12に対し、ファイバースコープ40のイメージガイド
部11のみを取り立したものを挿入する。イメージガイ
ド部11の検出端11a側には蛍光顕微1It13を配
置する。光源14からの照明光15は紫色フィルタ16
によって紫色成分だけとなり、波長分離フィルタ17に
よって反射され、対物レンズ18でイメージガイド部1
1の検出端11aに入射して観察端11bよりスルーホ
ール12の内壁12aを照射する。スルーホール12の
内壁12aの像はイメージガイド部11を伝って顕微鏡
13の対物レンズ18の焦点面に導かれるが、内壁12
aの像の内、蛍光成分のみが波長分離フィルタ17と黄
フィルタ19を検出光15aとして通過して接眼レンズ
20より観察出来る。
FIG. 1 shows a first embodiment of the present invention. As shown,
A fiberscope 40 with only the image guide part 11 assembled is inserted into a through hole 12 having a diameter smaller than that of the fiberscope. A fluorescence microscope 1It13 is arranged on the detection end 11a side of the image guide section 11. Illumination light 15 from light source 14 is passed through violet filter 16
As a result, only the violet component is generated, which is reflected by the wavelength separation filter 17, and is transmitted to the image guide section 1 by the objective lens 18.
The light enters the detection end 11a of No. 1 and illuminates the inner wall 12a of the through hole 12 from the observation end 11b. The image on the inner wall 12a of the through hole 12 is guided to the focal plane of the objective lens 18 of the microscope 13 through the image guide section 11.
Of the image a, only the fluorescent component passes through the wavelength separation filter 17 and yellow filter 19 as detection light 15a and can be observed through the eyepiece lens 20.

蛍光検出を応用し、照明光15と検出光15aを分離出
来る様にする事によれば、照明光15のガイドと検出光
15aのガイドに同一の光ファイバを用いても、検出光
15aに照明光15によるハレーションが出ない。また
、蛍光による[1を察は銅めっき部を暗く、ボイド部(
基材が露出している所)を明るく観察出来るので、コン
トラストの良い画像が得られ、ボイドの有無が明確に分
る。
By applying fluorescence detection and making it possible to separate the illumination light 15 and the detection light 15a, even if the same optical fiber is used to guide the illumination light 15 and the detection light 15a, the illumination light 15a can be separated from the detection light 15a. There is no halation caused by light 15. In addition, when detecting [1] due to fluorescence, the copper plating area becomes darker and the void area (
Since the areas where the base material is exposed can be observed brightly, images with good contrast can be obtained, and the presence or absence of voids can be clearly seen.

プリント板基材による蛍光の発生は、文献IEEE T
rans、 PAMI Vol、lO,No、I P、
69(1988)に示されている。
The generation of fluorescence by printed board substrates is described in the document IEEE T
rans, PAMI Vol, IO, No, IP,
69 (1988).

第2図に本発明の第二の実施例を示す、第一の実施例と
同様にイメージガイド部11と蛍光顕微[13を用いる
が、照明としては別に照明用ファイバ21を用いている
。照明用ファイバ21から出射した光は、照明用ファイ
バ21の先端部に取り着けられた紫色フィルタ16によ
って紫色成分だけとなり、スルーホール12内部を照明
する。
FIG. 2 shows a second embodiment of the present invention. Similar to the first embodiment, an image guide section 11 and a fluorescence microscope [13] are used, but an illumination fiber 21 is separately used for illumination. The light emitted from the illumination fiber 21 becomes only a violet component by the violet filter 16 attached to the tip of the illumination fiber 21, and illuminates the inside of the through hole 12.

照明光そのものが黄フィルタ19によってカットされ、
蛍光成分のみが観察出来るのは第一の実施例と同様であ
る。
The illumination light itself is cut by the yellow filter 19,
As in the first embodiment, only the fluorescent component can be observed.

[発明の効果] 本発明によれば、高密度積層プリント基板のスルーホー
ルの様に特に細くて長いホールであってもその内壁を観
察する事が出来る。従来は内壁を観察するためには、基
板を破壊検査せざるを得なかったが、本発明により、破
壊検査をせずに済むようになる。また、螢光を用いた場
合には、内壁めっきはがれ欠陥(ボイド)の有無が直接
II!察できるようになる。
[Effects of the Invention] According to the present invention, it is possible to observe the inner wall of even a particularly narrow and long hole such as a through hole in a high-density laminated printed circuit board. Conventionally, in order to observe the inner wall, it was necessary to conduct a destructive inspection of the board, but with the present invention, it is no longer necessary to conduct a destructive inspection. In addition, when fluorescent light is used, the presence or absence of peeling defects (voids) on the inner wall plating can be directly detected! You will be able to understand.

【図面の簡単な説明】[Brief explanation of drawings]

第1図および第2図は本発明によるホール観察法の説明
図、 第3図ないし第6図はホール観察法の従来技術の説明図
である。 符号の説明 11・・・イメージガイド部。 13・・・蛍光顕微鏡、 16・・・紫色フィルタ、 17・・・波長分離フィルタ、 19・・・黄フィルタ。 /2Q 第 2図 第 30 第40
1 and 2 are explanatory diagrams of the hole observation method according to the present invention, and FIGS. 3 to 6 are explanatory diagrams of the conventional hole observation method. Explanation of symbols 11: Image guide section. 13...Fluorescence microscope, 16...Purple filter, 17...Wavelength separation filter, 19...Yellow filter. /2Q Figure 2 30th 40th

Claims (3)

【特許請求の範囲】[Claims] 1.細長い穴の内壁を観察するため、先端に結像レンズ
の付けられた画像伝達用の光フアイバを前記穴の中に押
入し、前記光フアイバにより前記穴の内部の画像を、前
記穴の外に伝達し、伝達した前記画像を外部に設けられ
た拡大光学系により観察することを特徴とするホール観
察法。
1. In order to observe the inner wall of a long and narrow hole, an optical fiber for image transmission with an imaging lens attached to the tip is pushed into the hole, and the optical fiber transmits an image of the inside of the hole to the outside of the hole. A hole observation method characterized by transmitting the image and observing the transmitted image using an externally provided magnifying optical system.
2.請求項1において、挿入した前記光フアイバに光を
入射させ、前記光ファイバから出射した光を前記穴の内
壁照明光として利用するホール観察法。
2. 2. The hole observation method according to claim 1, wherein light is incident on the inserted optical fiber, and the light emitted from the optical fiber is used as light for illuminating the inner wall of the hole.
3.請求項2において、対象穴内壁の材質が、螢光を発
生する材質と、発生しない材質から構成されている場合
、照明光として、螢光を励起する帯域の波長の光を用い
るか、同帯域の光のみを通す光学フィルタを付加するこ
とによって、特定帯域の光を照明光として用い、また、
前記光フアイバによって前記穴の外部に伝達された光の
うち、螢光帯域の光のみを選択する光学フィルタを設け
ることにより、螢光による前記穴の内壁画像を観察する
ホール観察法。
3. In claim 2, when the material of the inner wall of the target hole is composed of a material that generates fluorescence and a material that does not generate fluorescence, the illumination light is either light with a wavelength in a band that excites fluorescence, or light with a wavelength in a band that excites fluorescent light, or By adding an optical filter that only allows light to pass through, light in a specific band can be used as illumination light, and
A hole observation method for observing an image of the inner wall of the hole caused by fluorescence by providing an optical filter that selects only light in the fluorescence band from among the light transmitted to the outside of the hole by the optical fiber.
JP2302555A 1990-11-09 1990-11-09 Method and apparatus for observing inner surface of through hole Expired - Fee Related JP3020593B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2302555A JP3020593B2 (en) 1990-11-09 1990-11-09 Method and apparatus for observing inner surface of through hole

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2302555A JP3020593B2 (en) 1990-11-09 1990-11-09 Method and apparatus for observing inner surface of through hole

Publications (2)

Publication Number Publication Date
JPH04177152A true JPH04177152A (en) 1992-06-24
JP3020593B2 JP3020593B2 (en) 2000-03-15

Family

ID=17910388

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2302555A Expired - Fee Related JP3020593B2 (en) 1990-11-09 1990-11-09 Method and apparatus for observing inner surface of through hole

Country Status (1)

Country Link
JP (1) JP3020593B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN119335717A (en) * 2024-10-19 2025-01-21 哈尔滨工业大学 A micro-hole microscopic imaging system and method based on gradient refractive index lens

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5645573B2 (en) * 2010-09-29 2014-12-24 三菱電機株式会社 Knock control device for internal combustion engine

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JPS52135788A (en) * 1976-05-07 1977-11-14 Sony Corp Detection of impurities
JPS5858376A (en) * 1981-09-30 1983-04-06 松下電工株式会社 Gate and door unlock apparatus
JPS641940A (en) * 1987-06-25 1989-01-06 Hitachi Ltd Through hole void inspection

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52135788A (en) * 1976-05-07 1977-11-14 Sony Corp Detection of impurities
JPS5858376A (en) * 1981-09-30 1983-04-06 松下電工株式会社 Gate and door unlock apparatus
JPS641940A (en) * 1987-06-25 1989-01-06 Hitachi Ltd Through hole void inspection

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN119335717A (en) * 2024-10-19 2025-01-21 哈尔滨工业大学 A micro-hole microscopic imaging system and method based on gradient refractive index lens

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