JPH0418377U - - Google Patents

Info

Publication number
JPH0418377U
JPH0418377U JP5980290U JP5980290U JPH0418377U JP H0418377 U JPH0418377 U JP H0418377U JP 5980290 U JP5980290 U JP 5980290U JP 5980290 U JP5980290 U JP 5980290U JP H0418377 U JPH0418377 U JP H0418377U
Authority
JP
Japan
Prior art keywords
edges
test
logic device
predetermined number
test patterns
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5980290U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP5980290U priority Critical patent/JPH0418377U/ja
Publication of JPH0418377U publication Critical patent/JPH0418377U/ja
Pending legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの考案の実施例を示すブロツク図、
第2図はその動作を説明するためのタイムチヤー
ト、第3図は小レベル不要パルスの問題を説明す
るための波形図、第4図は従来の試験装置を示す
ブロツク図、第5図は不要パルスの例を示す図、
第6図は従来の不要パルスの検出法を示す図、第
7図はその問題点を説明するための図、第8図は
第7図の問題を解決した従来の不要パルス検出法
を示す図である。
Figure 1 is a block diagram showing an embodiment of this invention.
Figure 2 is a time chart to explain its operation, Figure 3 is a waveform diagram to explain the problem of small level unnecessary pulses, Figure 4 is a block diagram showing the conventional test equipment, Figure 5 is unnecessary. Diagram showing an example of a pulse,
Figure 6 is a diagram showing the conventional unnecessary pulse detection method, Figure 7 is a diagram to explain the problem, and Figure 8 is a diagram showing the conventional unnecessary pulse detection method that solves the problem in Figure 7. It is.

Claims (1)

【実用新案登録請求の範囲】 被測定論理デバイスにテストパターンを印加す
るパターン発生器と、 上記被測定論理デバイスの出力波形のエツジの
数を計数するカウンタと、 所定数のテストパターンの印加後に、上記カウ
ンタから得られる、その所定数のテストパターン
の間におけるエツジ数が、その所定数のテストパ
ターンに対する期待波形のエツジ数と一致してい
るか否かを検出する手段と、 を有する論理デバイス試験装置。
[Scope of Utility Model Registration Claim] A pattern generator that applies a test pattern to a logic device under test; a counter that counts the number of edges of an output waveform of the logic device under test; and after applying a predetermined number of test patterns, means for detecting whether the number of edges between the predetermined number of test patterns obtained from the counter matches the number of edges of the expected waveform for the predetermined number of test patterns; and a logic device testing apparatus comprising: .
JP5980290U 1990-06-06 1990-06-06 Pending JPH0418377U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5980290U JPH0418377U (en) 1990-06-06 1990-06-06

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5980290U JPH0418377U (en) 1990-06-06 1990-06-06

Publications (1)

Publication Number Publication Date
JPH0418377U true JPH0418377U (en) 1992-02-17

Family

ID=31586621

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5980290U Pending JPH0418377U (en) 1990-06-06 1990-06-06

Country Status (1)

Country Link
JP (1) JPH0418377U (en)

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