JPH04192519A - Vertical process for semiconductor heat processing tube structure - Google Patents
Vertical process for semiconductor heat processing tube structureInfo
- Publication number
- JPH04192519A JPH04192519A JP32481990A JP32481990A JPH04192519A JP H04192519 A JPH04192519 A JP H04192519A JP 32481990 A JP32481990 A JP 32481990A JP 32481990 A JP32481990 A JP 32481990A JP H04192519 A JPH04192519 A JP H04192519A
- Authority
- JP
- Japan
- Prior art keywords
- tube
- gas
- piping
- outer tube
- inner tube
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims abstract description 22
- 239000004065 semiconductor Substances 0.000 title claims abstract description 15
- 238000010438 heat treatment Methods 0.000 claims description 7
- 239000000758 substrate Substances 0.000 abstract description 11
- 238000004140 cleaning Methods 0.000 abstract description 6
- 239000007789 gas Substances 0.000 description 22
- 238000005530 etching Methods 0.000 description 3
- 239000012495 reaction gas Substances 0.000 description 3
- 230000007423 decrease Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は半導体熱処理用プロセスチューブの構造に関し
、特に縦型プロセスチューブに関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to the structure of a process tube for semiconductor heat treatment, and particularly to a vertical process tube.
従来の縦型プロセスチューブは第2図(a) 、 (b
)に示すように、単管のプロセスチューブ8であり、反
応ガスはガス導入管7を通ってプロセスチューブ8の外
壁に沿って垂直に上かり、前記プロセスチューブ8の上
部からプロセスチューブ8の内部に置かれた半導体基板
に供給されるというものであり、反応ガス及び未反応の
余剰ガスはプロセスチューブ8に収り付けられた排気配
管6を通って外部に放出される構造になっている。Conventional vertical process tubes are shown in Figure 2 (a) and (b).
), the process tube 8 is a single pipe, and the reaction gas passes through the gas introduction pipe 7 and vertically ascends along the outer wall of the process tube 8, and flows from the top of the process tube 8 to the inside of the process tube 8. The reaction gas and unreacted surplus gas are discharged to the outside through an exhaust pipe 6 housed in a process tube 8.
この従来の縦型プロセスチューブでは、熱処理温度に比
べて室温〜600°C程度の冷たいガスがガス導入管7
を通ってプロセスチューブ8の上部まで送られる。In this conventional vertical process tube, gas that is colder than the heat treatment temperature, from room temperature to about 600°C, enters the gas inlet tube 7.
and is sent to the upper part of the process tube 8.
このとき、ガス導入管側のプロセスチューブ面は、温度
が下がり、半導体基板の温度も局所的に下がるなめ、実
効的な熱処理!、さらに酸化膜厚か基板内でばらつくと
いう間駈点か発生している。At this time, the temperature of the process tube surface on the gas introduction tube side decreases, and the temperature of the semiconductor substrate also decreases locally, resulting in effective heat treatment! Furthermore, there is a problem with variations in oxide film thickness within the substrate.
また、従来技術においては、プロセスチューブの外側に
ガス導入管7及び排気配管6が突き出ているため、上記
縦型プロセスチューブは、洗浄を行なう際に横型用プロ
セスチューブのように回転をさせながら、エツチング、
リンス等を行なえなかった。このため、洗浄(エツチン
グ+リンス)に時間がかかり、取り扱いが難しいという
問題点があった。Furthermore, in the prior art, since the gas introduction pipe 7 and the exhaust pipe 6 protrude from the outside of the process tube, the vertical process tube is rotated like a horizontal process tube when cleaning. etching,
I was unable to perform rinsing, etc. Therefore, cleaning (etching + rinsing) takes time and handling is difficult.
本発明の目的は前記課題を解決した縦型プロセスチュー
ブの構造を提供することにある。An object of the present invention is to provide a vertical process tube structure that solves the above problems.
前記目的を達成するため、本発明に係る半導体熱処理用
縦型プロセスチューブの構造においては、内部チューブ
と、外部チューブと、配管ホルダとを有する半導体処理
用縦型プロセスチューブの構造であって、
内部チューブは、上部にガス導入用の穴を有するもので
あり、
外部チューブは、内部チューブの外周側に設置されたも
のであり、
内部チューブの外壁又は、外部チューブの内壁には、熱
交換板を有しており、
配管ホルダは、内部チューブと外部チューブとを内外2
重構造に支持するもので、ガス導入用配管および排気用
配管を備えたものである。In order to achieve the above object, the structure of a vertical process tube for semiconductor heat treatment according to the present invention includes an inner tube, an outer tube, and a piping holder, the structure comprising: an inner tube; The tube has a hole at the top for introducing gas, and the outer tube is installed on the outer circumferential side of the inner tube.A heat exchange plate is installed on the outer wall of the inner tube or the inner wall of the outer tube. The piping holder has an inner tube and an outer tube that are connected to the inner and outer tubes.
It is supported by a heavy structure and is equipped with gas introduction piping and exhaust piping.
内外2重構造の内部チューブと外部チューブとを配管ホ
ルダに支持させ、かつチューブに熱交換板を備えた構造
となっている。It has a structure in which an inner tube and an outer tube with a dual structure inside and outside are supported by a piping holder, and the tube is equipped with a heat exchange plate.
内部チューブに熱交換されたガスを導入し、また、配管
ホルダから内外チューブを取り外して洗浄を行なう。Heat-exchanged gas is introduced into the inner tube, and the inner and outer tubes are removed from the piping holder for cleaning.
次に本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.
(実施例1)
第1図(a)は、本発明の実施例1を示す縦断面図、第
1図(b)は、同横断面図である。(Example 1) FIG. 1(a) is a longitudinal cross-sectional view showing Example 1 of the present invention, and FIG. 1(b) is a cross-sectional view thereof.
図において、内部チューブ1は、上部にガス導入用の穴
3を有しており、外部チューブ2は、内部チューブ1よ
り大径であり、内部チューブ1と外部チューブ2は内外
2g構造に組合されて配管ホルダ5に支持されている。In the figure, the inner tube 1 has a gas introduction hole 3 at the top, the outer tube 2 has a larger diameter than the inner tube 1, and the inner tube 1 and the outer tube 2 are combined into an inner and outer 2g structure. and is supported by the piping holder 5.
また、配管ホルダ5はガス導入管7と排気配管6とを有
している。さらに、外部チューブ2は、その内周側に熱
交換板4を有している。Further, the pipe holder 5 has a gas introduction pipe 7 and an exhaust pipe 6. Furthermore, the external tube 2 has a heat exchange plate 4 on its inner peripheral side.
チューブ1.2間のすき間か、配管の役目を果たし、ガ
ス導入管7から入ったガスは、内部チューブ1の外壁及
び外部チューブ2の内壁及び熱交換板4から一様に熱を
奪い、半導体基板の熱処理温度に十分達してから穴3を
通って、内部チューブl内の半導体基板に供給される。The gap between the tubes 1 and 2 acts as piping, and the gas entering from the gas introduction pipe 7 uniformly removes heat from the outer wall of the inner tube 1, the inner wall of the outer tube 2, and the heat exchange plate 4, and the semiconductor After the heat treatment temperature of the substrate has been sufficiently reached, it passes through the hole 3 and is supplied to the semiconductor substrate in the inner tube 1.
反応ガスは排気配管6を通って外へ排気される。The reaction gas is exhausted to the outside through an exhaust pipe 6.
内部チューブ1及び外部チューブ2は、自重で配管ホル
ダ5の中に入っている。チューブ1.2と配管ホルダ5
の間には、すき間があるが、ガス導入管7のガス圧を常
圧より高くすることで半導体基板に清浄なガスを供給で
きる。The inner tube 1 and the outer tube 2 are contained in the piping holder 5 under their own weight. Tube 1.2 and piping holder 5
Although there is a gap between them, clean gas can be supplied to the semiconductor substrate by increasing the gas pressure of the gas introduction pipe 7 higher than normal pressure.
(実施例2) 第4図は、本発明の実施例2を示す縦断面図である。(Example 2) FIG. 4 is a longitudinal sectional view showing a second embodiment of the present invention.
実線例1においては、外部チューブ2の内壁に熱交換板
4を有しているが、本実施例では内部チューブ1の外壁
にら取付けている。さらに、配管ホルダ5に不活性ガス
導入部9を形成することにより、半導体基板が内部チュ
ーブ1に入炉する際の空気巻き込みによる火炉中の酸化
も低減できるという利点がある。In solid line example 1, the heat exchange plate 4 is provided on the inner wall of the outer tube 2, but in this embodiment, it is attached to the outer wall of the inner tube 1. Furthermore, by forming the inert gas introduction part 9 in the piping holder 5, there is an advantage that oxidation in the furnace due to air entrainment when the semiconductor substrate enters the inner tube 1 can be reduced.
第3図は、従来く○印)及び本発明(・印)の縦型プロ
セスチューブ(内径200IWfI)を用いて950°
Cで、水泉気酸化した時の半導体基板直径方向の膜厚分
布を示すグラフである7従来技術においては、ガス導入
管近くの膜厚が極端に薄くなっているか、本発明により
改善されていることが分かる。Figure 3 shows a 950°
C is a graph showing the film thickness distribution in the diametrical direction of a semiconductor substrate when oxidized with water and air.7 In the conventional technology, the film thickness near the gas introduction pipe is extremely thin, or has been improved by the present invention. I understand that.
以上説明したように本発明は、ガス導入管から入った冷
たいガスが内部チューブの外壁に沿って流れ、熱交換板
により効率的にガス温度を上げているので、従来より流
すガスの量を増やすことができる。また、内部チューブ
■内の動径方向の温度分布は同じ円状となり、半導体基
板は面内内熱処理量及び酸化膜厚等が従来縦型プロセス
チューブより均一になる。As explained above, in the present invention, the cold gas entering from the gas introduction pipe flows along the outer wall of the inner tube, and the gas temperature is efficiently raised by the heat exchange plate, so the amount of gas flowing can be increased compared to the conventional method. be able to. In addition, the temperature distribution in the radial direction within the inner tube (1) becomes the same circular shape, and the in-plane heat treatment amount and oxide film thickness of the semiconductor substrate are more uniform than in the conventional vertical process tube.
さらに本発明の縦型プロセスチューブにおいては、配管
ホルダかチューブと切り離し可能であり、回転をさせな
がら、エツチング、リンスが可能となり、洗浄(エツチ
ング士リンス)を容易に行うことができるという効果か
ある。Furthermore, in the vertical process tube of the present invention, the piping holder can be separated from the tube, and etching and rinsing can be performed while rotating, which has the advantage that cleaning (etcher rinsing) can be easily performed. .
第1図fa)は、本発明の実施例1を示す縦断面図、第
1図(b)は、上部からみたときの横断面図、第2図f
a)は、従来例を示す縦断面図、第2図(b)は、同横
断面図、第3図は、膜厚分布を示す図、第4図は、本発
明の実施例2を示す縦断面図である。
1・・・内部チューブ 2・・・外部チューブ3・
・・穴 4・・・熱交換板5・・・配管
ホルタ 6・・・排気配管7・・・ガス導入管
第1図
(b)
第1図
r。
第4図Fig. 1 fa) is a longitudinal sectional view showing Embodiment 1 of the present invention, Fig. 1(b) is a transverse sectional view when viewed from above, and Fig. 2 f
a) is a longitudinal cross-sectional view showing the conventional example, FIG. 2(b) is a cross-sectional view thereof, FIG. 3 is a view showing the film thickness distribution, and FIG. 4 is a view showing Example 2 of the present invention. FIG. 1... Internal tube 2... External tube 3.
... Hole 4 ... Heat exchange plate 5 ... Piping holter 6 ... Exhaust pipe 7 ... Gas introduction pipe Fig. 1 (b) Fig. 1 r. Figure 4
Claims (1)
を有する半導体処理用縦型プロセスチューブの構造であ
って、 内部チューブは、上部にガス導入用の穴を有するもので
あり、 外部チューブは、内部チューブの外周側に設置されたも
のであり、 内部チューブの外壁又は、外部チューブの内壁には、熱
交換板を有しており、 配管ホルダは、内部チューブと外部チューブとを内外2
重構造に支持するもので、ガス導入用配管および排気用
配管を備えたものであることを特徴とする半導体熱処理
用縦型プロセスチューブの構造。(1) The structure of a vertical process tube for semiconductor processing that has an inner tube, an outer tube, and a piping holder, where the inner tube has a hole at the top for introducing gas, and the outer tube has the following components: It is installed on the outer circumferential side of the inner tube, and has a heat exchange plate on the outer wall of the inner tube or the inner wall of the outer tube, and the piping holder connects the inner tube and the outer tube between the inside and outside.
A structure of a vertical process tube for semiconductor heat treatment, characterized in that it is supported in a heavy structure and is equipped with gas introduction piping and exhaust piping.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP02324819A JP3077195B2 (en) | 1990-11-27 | 1990-11-27 | Structure of vertical process tube for semiconductor heat treatment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP02324819A JP3077195B2 (en) | 1990-11-27 | 1990-11-27 | Structure of vertical process tube for semiconductor heat treatment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH04192519A true JPH04192519A (en) | 1992-07-10 |
| JP3077195B2 JP3077195B2 (en) | 2000-08-14 |
Family
ID=18170028
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP02324819A Expired - Lifetime JP3077195B2 (en) | 1990-11-27 | 1990-11-27 | Structure of vertical process tube for semiconductor heat treatment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3077195B2 (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5782980A (en) * | 1996-05-14 | 1998-07-21 | Advanced Micro Devices, Inc. | Low pressure chemical vapor deposition apparatus including a process gas heating subsystem |
| KR100559198B1 (en) * | 1999-12-21 | 2006-03-10 | 액셀리스 테크놀로지스, 인크. | Bell jar having integral gas distribution channeling |
| EP1345254A3 (en) * | 2002-03-15 | 2006-03-15 | Asm International N.V. | Process tube support sleeve with circumferential channels |
| JP2012156510A (en) * | 2011-01-21 | 2012-08-16 | Asm Internatl Nv | Thermal processing furnace and liner for the same |
-
1990
- 1990-11-27 JP JP02324819A patent/JP3077195B2/en not_active Expired - Lifetime
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5782980A (en) * | 1996-05-14 | 1998-07-21 | Advanced Micro Devices, Inc. | Low pressure chemical vapor deposition apparatus including a process gas heating subsystem |
| KR100559198B1 (en) * | 1999-12-21 | 2006-03-10 | 액셀리스 테크놀로지스, 인크. | Bell jar having integral gas distribution channeling |
| EP1345254A3 (en) * | 2002-03-15 | 2006-03-15 | Asm International N.V. | Process tube support sleeve with circumferential channels |
| JP2012156510A (en) * | 2011-01-21 | 2012-08-16 | Asm Internatl Nv | Thermal processing furnace and liner for the same |
Also Published As
| Publication number | Publication date |
|---|---|
| JP3077195B2 (en) | 2000-08-14 |
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