JPH0420965A - Photomask cleaning device - Google Patents
Photomask cleaning deviceInfo
- Publication number
- JPH0420965A JPH0420965A JP2126187A JP12618790A JPH0420965A JP H0420965 A JPH0420965 A JP H0420965A JP 2126187 A JP2126187 A JP 2126187A JP 12618790 A JP12618790 A JP 12618790A JP H0420965 A JPH0420965 A JP H0420965A
- Authority
- JP
- Japan
- Prior art keywords
- photomask
- cleaning
- cleaning solution
- purified water
- rotating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000004140 cleaning Methods 0.000 title claims abstract description 31
- 239000007788 liquid Substances 0.000 claims abstract description 10
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 abstract description 8
- 238000001035 drying Methods 0.000 abstract description 5
- 238000000034 method Methods 0.000 abstract description 2
- 239000008213 purified water Substances 0.000 abstract 4
- 239000000428 dust Substances 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000005856 abnormality Effects 0.000 description 1
- 230000001680 brushing effect Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000007261 regionalization Effects 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
Landscapes
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は半導体装置の製造プロセスに於いて使用される
フォトマスク洗浄装置に間する。DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a photomask cleaning apparatus used in the manufacturing process of semiconductor devices.
従来、フォトマスクに付着した塵や汚れを除去するフォ
トマスク洗浄装置は、洗浄槽内に溜めた洗浄液内にフォ
トマスクを浸漬するが、あるいは洗浄液をフォトマスク
上に供給しブラシでフォトマスクの表面をこすり、塵や
汚れを除去し、次で乾燥処理室内にフォトマスクを移動
させ蒸気乾燥を行うように構成されていた。Conventionally, photomask cleaning equipment for removing dust and dirt adhering to photomasks immerses the photomask in a cleaning solution stored in a cleaning tank, or supplies the cleaning solution onto the photomask and uses a brush to clean the surface of the photomask. The photomask was scrubbed to remove dust and dirt, and then the photomask was moved into a drying chamber for steam drying.
この従来のフォトマスク洗浄装置では、洗浄後から乾燥
を行うまでに、フォトマスクに付着している残液をすば
やく完全に除去することができないため、付着していた
残液によりしみ状の汚れを発生させ、フォトマスクに光
の透過率を部分的に低下させる欠陥を生じさせていた。With this conventional photomask cleaning equipment, it is not possible to quickly and completely remove residual liquid adhering to the photomask between cleaning and drying. This caused defects in the photomask that partially reduced the light transmittance.
このなめ、このフォトマスクを半導体装置の製造におけ
るパターン形成工程に使用した場合、パターン形成の異
常を発生させ、半導体装置の歩留及び品質低下を招いて
いた。For this reason, when this photomask is used in a pattern forming process in the manufacture of semiconductor devices, abnormalities in pattern formation occur, resulting in a decline in the yield and quality of the semiconductor devices.
この発明の目的は、かかる従来技術の欠点を除去し、残
液による汚れの発生のないフォトマスク洗浄装置を提供
することにある。SUMMARY OF THE INVENTION An object of the present invention is to eliminate the drawbacks of the prior art and provide a photomask cleaning apparatus that does not cause stains due to residual liquid.
本発明のフォトマスク洗浄装置は、フォトマスクを保持
し回転させるための手段と、前記フォトマスク上に洗浄
液を供給するための手段とを含んで構成される。The photomask cleaning apparatus of the present invention includes means for holding and rotating a photomask, and means for supplying a cleaning liquid onto the photomask.
この発明のフォトマスク洗浄装置は、フォトマスクを回
転させてその遠心力を利用し塵や汚れの除去、液切り及
び乾燥をすばやく行なうことができるため、フォトマス
クに洗浄液の残液によるしみ状の汚れが残るのをなくす
ことができる。The photomask cleaning device of the present invention can quickly remove dust and dirt, drain liquid, and dry the photomask by rotating the photomask and using its centrifugal force. It can eliminate remaining dirt.
次に本発明について図面を用いて説明する。 Next, the present invention will be explained using the drawings.
第1図はこの発明の第1の実施例の断面図である。FIG. 1 is a sectional view of a first embodiment of the invention.
第1図において、フォトマスク洗浄装置は、処理室3内
に純水供給ノズル1.洗浄液供給ノズル2、フォトマス
ク保持台5及びフォトマスク支持台5に回転力を伝達す
る回転軸6を有し、この回転軸6にはモーター7が連結
されている。フォトマスク保持台5に保持されたフォト
マスク4は、モーター7からの回転力を回転軸6より伝
達されて回転し、洗浄液供給ノズル2又は純水供給ノズ
ル1から洗浄液又は純水をフォトマスクに噴射すること
でフォトマスクの洗浄を行ない、洗浄完了後直ちに洗浄
液及び純水の供給を停止しフォトマスクの回転により素
早く液切りと乾燥ができる機能を有している。In FIG. 1, the photomask cleaning apparatus includes a pure water supply nozzle 1. It has a rotating shaft 6 that transmits rotational force to the cleaning liquid supply nozzle 2, the photomask holding stand 5, and the photomask supporting stand 5, and a motor 7 is connected to this rotating shaft 6. The photomask 4 held on the photomask holding table 5 is rotated by the rotational force from the motor 7 being transmitted from the rotating shaft 6, and the cleaning liquid or pure water is applied to the photomask from the cleaning liquid supply nozzle 2 or the pure water supply nozzle 1. It has the function of cleaning the photomask by spraying it, stopping the supply of cleaning liquid and pure water immediately after cleaning is completed, and quickly draining and drying the photomask by rotating it.
第2図は本発明の第2の実施例の断面図である。FIG. 2 is a sectional view of a second embodiment of the invention.
第2の実施例では第1図で説明したフォトマスク洗浄装
置にブラシ8を追加したものであり、洗浄液又は純水液
を使用すると同時に、ブラシ8を用いてフォトマスク4
の表面をブラッシングする機能を有している。従ってフ
ォトマスク4の洗浄はより効果的に行なえるという利点
がある。In the second embodiment, a brush 8 is added to the photomask cleaning apparatus described in FIG.
It has the function of brushing the surface. Therefore, there is an advantage that the photomask 4 can be cleaned more effectively.
以上説明したように本発明によれば、フォトマスクを回
転させその遠心力を利用し塵や汚れの除去、液切り及び
乾燥をすばやく行うことができるため、洗浄液の残液に
よるしみ状の汚れの発生をなくすことができるという効
果を有する。As explained above, according to the present invention, dust and dirt can be quickly removed, drained, and dried by rotating the photomask and using its centrifugal force, thereby removing stains caused by residual cleaning solution. It has the effect of eliminating the occurrence.
第1図及び第2図は本発明の第1及び第2の実施例の断
面図である。1 and 2 are cross-sectional views of first and second embodiments of the present invention.
Claims (1)
フォトマスク上に洗浄液を供給するための手段とを含む
ことを特徴とするフォトマスク洗浄装置。A photomask cleaning apparatus comprising: means for holding and rotating a photomask; and means for supplying a cleaning liquid onto the photomask.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2126187A JPH0420965A (en) | 1990-05-16 | 1990-05-16 | Photomask cleaning device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2126187A JPH0420965A (en) | 1990-05-16 | 1990-05-16 | Photomask cleaning device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0420965A true JPH0420965A (en) | 1992-01-24 |
Family
ID=14928851
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2126187A Pending JPH0420965A (en) | 1990-05-16 | 1990-05-16 | Photomask cleaning device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0420965A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008241069A (en) * | 2007-03-26 | 2008-10-09 | Mitsubishi Electric Corp | Air conditioner |
-
1990
- 1990-05-16 JP JP2126187A patent/JPH0420965A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008241069A (en) * | 2007-03-26 | 2008-10-09 | Mitsubishi Electric Corp | Air conditioner |
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