JPH0421984U - - Google Patents

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Publication number
JPH0421984U
JPH0421984U JP6253990U JP6253990U JPH0421984U JP H0421984 U JPH0421984 U JP H0421984U JP 6253990 U JP6253990 U JP 6253990U JP 6253990 U JP6253990 U JP 6253990U JP H0421984 U JPH0421984 U JP H0421984U
Authority
JP
Japan
Prior art keywords
circuit
command input
latch
under test
latch command
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6253990U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP6253990U priority Critical patent/JPH0421984U/ja
Publication of JPH0421984U publication Critical patent/JPH0421984U/ja
Pending legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの考案の一実施例を示す接続図、第
2図はその動作を説明するための波形図、第3図
は従来の技術を説明するための接続図、第4図は
デイジタル入力用プローブの動作を説明するため
の波形図である。 1A〜1N,1X……接触子、2……プローブ
本体、3……バツフア、4……ラツチ回路、5…
…ケーブル、6……測定器本体、7……ラツチ指
令入力回路、8……極性切替回路。
Figure 1 is a connection diagram showing an embodiment of this invention, Figure 2 is a waveform diagram to explain its operation, Figure 3 is a connection diagram to explain the conventional technology, and Figure 4 is a digital input. FIG. 4 is a waveform diagram for explaining the operation of the probe for use in the computer. 1A~1N, 1X...Contact, 2...Probe body, 3...Buffer, 4...Latch circuit, 5...
...Cable, 6...Measuring instrument body, 7...Latch command input circuit, 8...Polarity switching circuit.

Claims (1)

【実用新案登録請求の範囲】 A 被測定回路に接触して被測定信号を取込む接
触子と、 B この接触子で取込んだ信号をラツチするラツ
チ回路と、 C このラツチ回路のラツチ指令入力端子に被測
定回路からラツチ指令入力パルスを与えるラツチ
指令入力回路と、 D このラツチ指令入力回路に挿入され、ラツチ
指令入力信号の極性を切替る極性切替回路と、 を具備して成るデイジタル入力用プローブ。
[Scope of Claim for Utility Model Registration] A: A contact that contacts the circuit under test and captures the signal under test, B: A latch circuit that latches the signal captured by this contact, and C: A latch command input for this latch circuit. A latch command input circuit that applies a latch command input pulse from the circuit under test to a terminal; and a polarity switching circuit that is inserted into the latch command input circuit and switches the polarity of the latch command input signal. probe.
JP6253990U 1990-06-13 1990-06-13 Pending JPH0421984U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6253990U JPH0421984U (en) 1990-06-13 1990-06-13

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6253990U JPH0421984U (en) 1990-06-13 1990-06-13

Publications (1)

Publication Number Publication Date
JPH0421984U true JPH0421984U (en) 1992-02-24

Family

ID=31591782

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6253990U Pending JPH0421984U (en) 1990-06-13 1990-06-13

Country Status (1)

Country Link
JP (1) JPH0421984U (en)

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