JPH04236780A - Formation of film by photo assisted cvd - Google Patents

Formation of film by photo assisted cvd

Info

Publication number
JPH04236780A
JPH04236780A JP346091A JP346091A JPH04236780A JP H04236780 A JPH04236780 A JP H04236780A JP 346091 A JP346091 A JP 346091A JP 346091 A JP346091 A JP 346091A JP H04236780 A JPH04236780 A JP H04236780A
Authority
JP
Japan
Prior art keywords
film
chamber
light
light transmission
raw material
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP346091A
Other languages
Japanese (ja)
Inventor
Masayoshi Taki
正佳 滝
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toyota Motor Corp
Original Assignee
Toyota Motor Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toyota Motor Corp filed Critical Toyota Motor Corp
Priority to JP346091A priority Critical patent/JPH04236780A/en
Publication of JPH04236780A publication Critical patent/JPH04236780A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To continuously form a film by photo assisted CVD or a long time without clouding a light-transmissive window or without cleaning or exchanging the window. CONSTITUTION:A light transmission chamber 38 is partitioned by a gate valve 40 and set on the light-transmissive window 42 side of a reaction chamber 10, the flow rates of the raw gas and purge gas are adjusted so that the purge gas pressure in the chamber 38 is made higher than the raw gas pressure in the reaction chamber 10, and then the valve 40 is opened to form a film on a substrate 18 by photo assisted CVD. The infiltration of the raw gas into the chamber 38 is completely prevented by the pressure difference between the reaction chamber 10 and the chamber 38, hence a thin-film product is not deposited on the inner surface of the window 42, and the window 42 is never clouded while the film is formed.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】本発明は光CVDによる皮膜形成
方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for forming a film by photo-CVD.

【0002】0002

【従来の技術】光CVDは、光エネルギーを利用してガ
ス材料に化学反応を起こし、基板上に薄膜を形成させる
手法である。その中でも、材料分子を光励起して分解さ
せる方法が代表的なものであって、光子一個を吸収させ
て分解させるため、エネルギーの大きい紫外光が必要で
ある。そのほか、赤外光によって分子を振動励起した効
果を利用する方法や、基板をレーザ加熱して熱分解を起
こさせる方法もある。
2. Description of the Related Art PhotoCVD is a method of forming a thin film on a substrate by causing a chemical reaction in a gas material using light energy. Among these methods, the most typical method is to optically excite material molecules and decompose them, and in order to absorb a single photon and cause the decomposition, high-energy ultraviolet light is required. Other methods include using the effect of vibrationally exciting molecules with infrared light, and heating the substrate with a laser to cause thermal decomposition.

【0003】光CVDの装置としては、従来から例えば
図3に示すようなものが用いられている。図3において
反応室10はロータリポンプ24により排気され真空が
保たれており、反応室10の中央にはヒータ12を埋め
込んだホルダ16に基板18が取り付けられ、この基板
18の上には原料ガス供給管28から原料ガスが供給さ
れる。また、基板18に対向する面には石英ガラス等か
らなる光透過窓42が取り付けられ、低圧水銀灯等の強
力な紫外光を発光する光源44からこの光透過窓42を
通して基板18上に光エネルギーが導入される。さらに
、この光透過窓42には原料ガスが分解したものが堆積
して光透過窓42が曇り、光の透過率を低下させるので
、光透過窓42の内側にパージガス供給管48が取り付
けられ内側から不活性ガス等のパージガスが吹きつけら
れる構造になっている。
As an optical CVD apparatus, one shown in FIG. 3, for example, has conventionally been used. In FIG. 3, the reaction chamber 10 is evacuated by a rotary pump 24 to maintain a vacuum, and a substrate 18 is attached to a holder 16 in which a heater 12 is embedded in the center of the reaction chamber 10. Raw material gas is supplied from the supply pipe 28. Further, a light transmission window 42 made of quartz glass or the like is attached to the surface facing the substrate 18, and light energy is transmitted onto the substrate 18 through the light transmission window 42 from a light source 44 that emits strong ultraviolet light such as a low-pressure mercury lamp. be introduced. Further, the decomposed raw material gas accumulates in the light transmission window 42, clouding the light transmission window 42 and reducing the light transmittance, so a purge gas supply pipe 48 is installed inside the light transmission window 42. The structure is such that a purge gas such as an inert gas is blown from the tank.

【0004】0004

【発明が解決しようとする課題】しかしながら、前記の
光CVDの従来装置においては、光透過窓の内面に不活
性ガス等のパージガスを吹きつけることによって、光透
過窓内面近傍への原料ガスの供給を抑止し、光透過窓の
曇りはかなり防止されるものの、ガス導入時のバルブ操
作の際に、瞬間的に原料ガスとパージガスの間に圧力変
動が生じ、原料ガスの一部が光透過窓内面に流れて、光
透過窓の曇りを完全に防止することはできない。
[Problems to be Solved by the Invention] However, in the conventional optical CVD apparatus described above, source gas is supplied to the vicinity of the inner surface of the light-transmitting window by blowing a purge gas such as an inert gas onto the inner surface of the light-transmitting window. However, when the valve is operated during gas introduction, a pressure fluctuation occurs momentarily between the raw material gas and the purge gas, and a portion of the raw gas leaks through the light transmitting window. It is impossible to completely prevent fogging of the light-transmitting window by flowing to the inner surface.

【0005】そのため、光透過窓の洗浄あるいは交換の
ために成膜作業をしばしば中断する必要があり、長時間
の連続成膜が不可能であって、皮膜生成作業の中断によ
り皮膜に界面が生ずるとともに、光透過窓の交換に費用
を要するという問題点があった。
[0005] Therefore, it is necessary to frequently interrupt the film-forming operation to clean or replace the light-transmitting window, making it impossible to perform continuous film-forming for a long time, and interfering with the film due to interruption of the film-forming operation. In addition, there is a problem in that replacing the light transmitting window requires expense.

【0006】本発明は従来の光CVD装置を用いて皮膜
を形成する場合に、原料ガスの分解生成物が光透過窓に
堆積し、光透過窓の曇りにより透過光量が減衰するとい
う問題点を解決するためになされたものであって、光導
入窓である光透過窓の内面に薄膜生成物の堆積すること
を防止し、光透過窓の洗浄、交換を不要とすることによ
り、長時間の連続成膜を可能とし、界面の無い厚膜を形
成することができる光CVDによる皮膜形成方法を提供
することを目的とする。
[0006] The present invention solves the problem that when forming a film using a conventional photo-CVD apparatus, decomposition products of the raw material gas accumulate on the light-transmitting window, and the amount of transmitted light is attenuated due to clouding of the light-transmitting window. This was developed to solve the problem, and it prevents the accumulation of thin film products on the inner surface of the light transmitting window, which is the light introducing window, and eliminates the need for cleaning and replacing the light transmitting window. It is an object of the present invention to provide a method for forming a film by photo-CVD, which enables continuous film formation and can form a thick film without an interface.

【0007】[0007]

【課題を解決するための手段】発明者等は従来の光CV
D法において、光透過窓の内面に薄膜生成物が堆積され
るのは、光透過窓近傍に原料ガスが侵入することにその
原因があることに鑑み、光透過窓近傍への原料ガスの侵
入を完全に防止する方法について、鋭意研究を重ねた。 その結果、反応室の光透過窓側に光透過室を設けるとと
もに、光透過室内のパージガスの圧力を反応室内の原料
ガスの圧力よりも高く保てば、光透過窓近傍への原料ガ
スの侵入を完全に防止することができることを見出して
本発明を完成した。
[Means for solving the problem] The inventors have proposed a conventional optical CV
In Method D, the reason why a thin film product is deposited on the inner surface of the light-transmitting window is that the source gas enters the vicinity of the light-transmitting window. We have conducted extensive research on ways to completely prevent this. As a result, by providing a light transmission chamber on the light transmission window side of the reaction chamber and keeping the pressure of the purge gas in the light transmission chamber higher than the pressure of the raw material gas in the reaction chamber, it is possible to prevent the raw material gas from entering near the light transmission window. We have completed the present invention by discovering that this can be completely prevented.

【0008】本発明の光CVDによる薄膜形成方法は、
パージガス供給口48とパージガス排出口54を有し容
量がV2の光透過室38と原料ガス供給口26と原料ガ
ス排出口20とを有し容量がV1の反応室10とをゲー
トバルブ40によって仕切り、前記光透過室38にパー
ジガスをガス圧P2で満たし、前記反応室10に原料ガ
スをガス圧P1で満たし、P1<P2とした後、(v1
/V1)<(v2/V2)なる関係を満足するように流
速v1で前記原料ガスを流速v2で前記パージガスを供
給しながら前記パージガス排出口54を閉じるとともに
前記ゲートバルブ40を開き、前記光透過室38に設け
た光透過窓42を介して光エネルギーを照射することに
より、前記反応室10内に設置した基板18に皮膜を形
成させることを要旨とする。
[0008] The method for forming a thin film by photoCVD of the present invention is as follows:
A light transmission chamber 38 having a purge gas supply port 48 and a purge gas discharge port 54 and having a capacity of V2 and a reaction chamber 10 having a capacity of V1 and having a raw material gas supply port 26 and a raw material gas discharge port 20 are partitioned by a gate valve 40. , the light transmission chamber 38 is filled with purge gas at gas pressure P2, the reaction chamber 10 is filled with source gas at gas pressure P1, and after P1<P2, (v1
/V1)<(v2/V2) While supplying the raw material gas at a flow rate v1 and the purge gas at a flow rate v2, the purge gas outlet 54 is closed and the gate valve 40 is opened to reduce the light transmission. The gist is to form a film on the substrate 18 placed in the reaction chamber 10 by irradiating light energy through a light transmission window 42 provided in the chamber 38 .

【0009】[0009]

【作用】本発明の作用を図1に示す本発明方法で用いら
れる光CVD装置の概略図に基づいて説明する。最初は
V1cm3の容量の反応室10とV2cm3の容量の光
透過室38とはゲートバルブ40によって仕切られてい
る。 次いで、反応室10には原料ガス供給口26からv1c
m3/minの流速で原料ガスを供給し、原料ガス排出
口20からロータリポンプ24によって排気するととも
に、光透過室38にはパージガス供給口46からv2c
m3/minの流速でパージガスを供給し、パージガス
排出口54からロータリポンプ60によって排気する。
[Operation] The operation of the present invention will be explained based on the schematic diagram of a photo-CVD apparatus used in the method of the present invention shown in FIG. Initially, the reaction chamber 10 with a capacity of V1 cm3 and the light transmission chamber 38 with a capacity of V2 cm3 are separated by a gate valve 40. Next, v1c is supplied to the reaction chamber 10 from the raw material gas supply port 26.
The raw material gas is supplied at a flow rate of m3/min, and is exhausted from the raw material gas outlet 20 by the rotary pump 24.
Purge gas is supplied at a flow rate of m3/min and exhausted from the purge gas outlet 54 by a rotary pump 60.

【0010】この時ゲートバルブ40は依然として閉じ
られているので、原料ガスが光透過窓42の近傍に供給
されることはない。また、反応室10の原料ガスのモル
数をn1モル、光透過室38のパージガスのモル数をn
2モルとすると、 n1∝v1  n2∝v2  であるので、反応室10の原料ガスの圧力P1および光
透過室38のパージガスの圧力P2はそれぞれP1=α
(v1/V1)T            α:比例係
数P2=β(v2/V2)T            
β:比例係数となる。
At this time, since the gate valve 40 is still closed, the source gas is not supplied to the vicinity of the light transmitting window 42. In addition, the number of moles of the raw material gas in the reaction chamber 10 is n1 mole, and the number of moles of the purge gas in the light transmission chamber 38 is n1 mole.
Assuming 2 moles, n1∝v1 n2∝v2, so the pressure P1 of the raw material gas in the reaction chamber 10 and the pressure P2 of the purge gas in the light transmission chamber 38 are each P1=α
(v1/V1)T α: proportional coefficient P2=β(v2/V2)T
β: Proportionality coefficient.

【0011】ここで、P1<P2の状態になるように原
料ガスおよびパージガスの流量を調整した後、バルブ5
0を閉じてパージガス排出口54を閉じるとともにゲー
トバルブ40を開く。そうすることによって、パージガ
スも反応室10を通ってロータリポンプ24により原料
ガスと一緒に排気される。従って、パージガスも原料ガ
スも同じロータリーポンプによって排気されるので、P
1およびP2の比例係数αとβは、α=βとなる。故に
P1−P2=α(v1/V1−v2/V2)T<0とな
る条件、すなわち (v1/V1)<(v2/V2)          
となる関係を満足していれば、原料ガスは光透過窓42
の方へ供給されることがない。
After adjusting the flow rates of the source gas and purge gas so that P1<P2, the valve 5
0, the purge gas outlet 54 is closed, and the gate valve 40 is opened. By doing so, the purge gas is also exhausted together with the raw material gas through the reaction chamber 10 by the rotary pump 24. Therefore, since both the purge gas and the source gas are exhausted by the same rotary pump, P
The proportional coefficients α and β of 1 and P2 are α=β. Therefore, the condition that P1-P2=α(v1/V1-v2/V2)T<0, that is, (v1/V1)<(v2/V2)
If the relationship is satisfied, the raw material gas passes through the light transmission window 42
It is never supplied to

【0012】続いて、光透過室38に設けた光透過窓4
2を介して光源44から光エネルギーを照射すると、原
料ガスの分解により反応室10内に設置した基板18の
上に皮膜が形成されるが、光透過窓42への原料ガスの
供給が完全に防止されているので、光透過窓42が曇る
ことがなく、長時間の成膜作業が可能となる。
Next, the light transmitting window 4 provided in the light transmitting chamber 38
When light energy is irradiated from the light source 44 through the light transmitting window 2, a film is formed on the substrate 18 installed in the reaction chamber 10 due to the decomposition of the raw material gas, but the supply of the raw material gas to the light transmission window 42 is completely interrupted. Since this is prevented, the light transmission window 42 does not become cloudy, and a long time film forming operation is possible.

【0013】[0013]

【実施例】本発明の実施例を従来例と比較して説明し、
本発明の効果を明らかにする。図1は本発明に用いた光
CVD装置の概略図である。反応室10の中央にはヒー
タ12および熱電対14を埋め込んだホルダ16が設置
され、このホルダ16には基板18が傾斜して固定され
ている。
[Example] An example of the present invention will be explained in comparison with a conventional example,
The effects of the present invention will be clarified. FIG. 1 is a schematic diagram of a photo-CVD apparatus used in the present invention. A holder 16 in which a heater 12 and a thermocouple 14 are embedded is installed in the center of the reaction chamber 10, and a substrate 18 is fixed to the holder 16 at an angle.

【0014】ホルダ16の下方の反応室10の底面には
原料ガス排出口20設けられており、この原料ガス排出
口20に接続された原料ガス排気管22に取り付けられ
たロータリーポンプ24により、反応室10内のガスが
排気され反応室10は真空に保たれている。
A raw material gas exhaust port 20 is provided at the bottom of the reaction chamber 10 below the holder 16, and a rotary pump 24 attached to a raw material gas exhaust pipe 22 connected to this raw material gas discharge port 20 is used to carry out the reaction. The gas in the chamber 10 is exhausted and the reaction chamber 10 is kept in a vacuum.

【0015】また基板18の上方に臨む反応室10の天
井には原料ガス供給口26が設けられており、この原料
ガス供給口26に接続された原料供給管28には、前後
に2つのバルブ30・30を有するリザーバ32とマス
フローコントローラ34とが取り付けられている。リザ
ーバ32の中にはCVD用の原料36が設置され、リザ
ーバ32の減圧雰囲気により昇華されて昇華ガスとなる
。H2等のキャリャガスがマスフローコントローラ34
により流量調整されてリザーバ32に供給されるので、
キャリャガスが昇華ガスと混合し原料ガスとなって、原
料ガス供給口26から反応室10に供給される。
A raw material gas supply port 26 is provided on the ceiling of the reaction chamber 10 facing above the substrate 18, and a raw material supply pipe 28 connected to this raw material gas supply port 26 has two valves at the front and rear. A reservoir 32 and a mass flow controller 34 are attached. A raw material 36 for CVD is installed in the reservoir 32, and is sublimated by the reduced pressure atmosphere of the reservoir 32 to become a sublimated gas. A carrier gas such as H2 is passed through the mass flow controller 34.
Since the flow rate is adjusted by and supplied to the reservoir 32,
The carrier gas is mixed with the sublimation gas to become a raw material gas, which is supplied to the reaction chamber 10 from the raw material gas supply port 26 .

【0016】基板18を側面から臨む反応室10の側壁
には光透過室38が設けられ、反応室10との間に開閉
可能なゲートバルブ40が取り付けられている。光透過
室38の一番奥には光透過窓42が取り付けられており
、この光透過窓42の外側には紫外光を発光する光源4
4が置かれ、光透過窓42を通して基板18に向かって
紫外光を照射するようになっている。
A light transmitting chamber 38 is provided on the side wall of the reaction chamber 10 facing the substrate 18 from the side, and a gate valve 40 that can be opened and closed is installed between the chamber 38 and the reaction chamber 10 . A light transmitting window 42 is installed at the innermost part of the light transmitting chamber 38, and a light source 4 that emits ultraviolet light is installed outside the light transmitting window 42.
4 is placed so as to irradiate ultraviolet light toward the substrate 18 through the light transmission window 42.

【0017】光透過室38の光透過窓42の近傍には光
透過窓42に向けてパージガス供給口46が開口してお
り、このバージガス供給口46に接続するパージガス供
給管48にはバルブ50とマスフローコントローラ52
とが取り付けられており、マスフローコントローラ52
により流量調整されたH2等のバージガスが光透過窓4
2に向けて供給される。
A purge gas supply port 46 is opened toward the light transmission window 42 near the light transmission window 42 of the light transmission chamber 38, and a purge gas supply pipe 48 connected to the purge gas supply port 46 is equipped with a valve 50. Mass flow controller 52
is attached to the mass flow controller 52.
The barge gas such as H2 whose flow rate is adjusted by the light transmitting window 4
2 will be supplied.

【0018】また、光透過室38のゲートバルブ40の
近傍にはパージガス排出口54が設けられ、このパージ
ガス排出口54に接続するパージガス排出管56にはバ
ルブ58とロータリーポンプ60が取り付けられており
、光透過室38内のパージガスが排気される。なお、6
2は反応室10に取り付けられた圧力計、64は光透過
室38に取り付けられた圧力計である。
A purge gas exhaust port 54 is provided near the gate valve 40 of the light transmission chamber 38, and a valve 58 and a rotary pump 60 are attached to a purge gas exhaust pipe 56 connected to the purge gas exhaust port 54. , the purge gas in the light transmission chamber 38 is exhausted. In addition, 6
2 is a pressure gauge attached to the reaction chamber 10, and 64 is a pressure gauge attached to the light transmission chamber 38.

【0019】本実施例装置を用いて本発明方法により光
CVDによる皮膜形成を行うには、ゲートバルブ40を
閉じた状態で、容量V1の反応室10へマスフローコン
トローラ34によりv1に流量を制御した原料ガスを原
料ガス供給口26から供給し、ロータリーポンプ24に
より、反応室10内のガスを排気する。一方、容量V2
の光透過室38へマスフローコントローラ52によりv
2に流量を制御したパージガスをパージガス供給口46
から供給し、ロータリーポンプ60により、パージガス
排出口54から光透過室42内のパージガスを排気する
。
To form a film by photo-CVD according to the method of the present invention using the apparatus of this embodiment, the flow rate was controlled to v1 by the mass flow controller 34 into the reaction chamber 10 having a capacity of V1 with the gate valve 40 closed. The raw material gas is supplied from the raw material gas supply port 26, and the gas in the reaction chamber 10 is exhausted by the rotary pump 24. On the other hand, capacity V2
v to the light transmission chamber 38 by the mass flow controller 52
2, the purge gas with a controlled flow rate is supplied to the purge gas supply port 46.
The purge gas in the light transmission chamber 42 is exhausted from the purge gas outlet 54 by the rotary pump 60.

【0020】ここで、圧力計62で示される反応室10
の圧力P1よりも圧力計64で示される光透過室38の
圧力P2の方が高くなるように原料ガスの流量v1およ
びパージガスの流量v2を調整した後、バルブ58を閉
じるとともに、ゲートバルブ40を開放する。そうする
ことによって、パージガスも反応室10を通ってロータ
リポンプ24により原料ガスと一緒に排気される。従っ
て、P1およびP2の比例係数αとβは、α=βとなる
。 故に P1−P2=α(v1/V1−v2/V2)T<0とな
る条件、すなわち (v1/V1)<(v2/V2)          
となる関係を満足することとなり、原料ガスは光透過窓
42の方へ供給されることがない。
Here, the reaction chamber 10 indicated by the pressure gauge 62
After adjusting the flow rate v1 of the source gas and the flow rate v2 of the purge gas so that the pressure P2 in the light transmission chamber 38 indicated by the pressure gauge 64 is higher than the pressure P1 in the pressure gauge 64, the valve 58 is closed and the gate valve 40 is Open. By doing so, the purge gas is also exhausted together with the raw material gas through the reaction chamber 10 by the rotary pump 24. Therefore, the proportional coefficients α and β of P1 and P2 are α=β. Therefore, the condition that P1-P2=α(v1/V1-v2/V2)T<0, that is, (v1/V1)<(v2/V2)
The following relationship is satisfied, and the raw material gas is not supplied toward the light transmission window 42.

【0021】続いて、光透過室38に設けた光透過窓4
2を通して光源44から紫外光を基板18に照射すると
、原料ガスの分解により反応室10内に設置した基板1
8の上に皮膜が形成されるが、光透過窓42への原料ガ
スの供給が完全に防止されているので、光透過窓42が
曇ることがなく、長時間の成膜作業が可能となる。
Next, the light transmitting window 4 provided in the light transmitting chamber 38
When the substrate 18 is irradiated with ultraviolet light from the light source 44 through 2, the substrate 18 placed in the reaction chamber 10 decomposes the raw material gas.
Although a film is formed on the surface of the light-transmitting window 42, the supply of raw material gas to the light-transmitting window 42 is completely prevented, so the light-transmitting window 42 does not become cloudy, and a long time film-forming operation is possible. .

【0022】次に、本発明例として、反応室10の容量
V1が5000cm3、光透過室38の内径50mm、
長さ200mmで容量V2が500cm3である装置を
用い、リザーバ32に原料としてW(CO)6を設置し
、キャリャガスとしてH2を用い原料ガス流量v1を5
0cc/minとし、パージガスとしてH2を用い流量
v2を50cc/minとして、前記の手順に従って1
時間の成膜作業を10回繰り返して基板18上にW膜を
形成した。
Next, as an example of the present invention, the capacity V1 of the reaction chamber 10 is 5000 cm3, the inner diameter of the light transmission chamber 38 is 50 mm,
Using a device with a length of 200 mm and a capacity V2 of 500 cm3, W(CO)6 is installed as a raw material in the reservoir 32, H2 is used as a carrier gas, and the raw material gas flow rate v1 is set to 5.
0 cc/min, using H2 as the purge gas and setting the flow rate v2 to 50 cc/min, following the above procedure.
The film-forming process was repeated 10 times to form a W film on the substrate 18.

【0023】なお、前記実施例におけるv1/V1=0
.01、v2/V2=0.1であって、(v1/V1)
<(v2/V2)なる関係を満足するものである。比較
のために図3に示す従来装置を用い、従来例として同じ
原料ガスとパージガスを用いて、同様に1時間の成膜作
業を10回繰り返して基板18上にW膜を形成した。基
板18上にW膜を形成した後に、本発明例と従来例の光
透過窓42に堆積したW膜の膜圧を測定し、得られた結
果を図2にまとめて示した。
Note that v1/V1=0 in the above embodiment
.. 01, v2/V2=0.1, (v1/V1)
<(v2/V2). For comparison, a W film was formed on the substrate 18 using the conventional apparatus shown in FIG. 3 and using the same raw material gas and purge gas as in the conventional example, and repeating the same one-hour film forming operation 10 times. After forming the W film on the substrate 18, the film thickness of the W film deposited on the light transmission window 42 of the present invention example and the conventional example was measured, and the obtained results are summarized in FIG. 2.

【0024】図2に示したように、従来法でW膜を形成
した場合に光透過窓のW膜厚は約1200Åであったの
に対して、本発明法では光透過窓へのW膜の堆積が全く
認められず、本発明の効果が確認された。
As shown in FIG. 2, when the W film was formed using the conventional method, the W film thickness on the light transmission window was approximately 1200 Å, whereas in the method of the present invention, the W film on the light transmission window was approximately 1200 Å thick. No deposition was observed at all, confirming the effectiveness of the present invention.

【0025】[0025]

【発明の効果】本発明の光CVD法による皮膜形成方法
は以上詳述したように、反応室の光透過窓側にゲートバ
ルブで仕切られた光透過室を設け、反応室の原料ガス圧
力よりも光透過室のパージガス圧力が高くなるように原
料ガス流量およびパージガス流量を調整した後ゲートバ
ルブを開き、光CVD法により基板上に皮膜形成を行う
ものであり、反応室と光透過室との圧力差により原料ガ
スの光透過室への侵入が完全に遮断されるので、光透過
窓の内面に薄膜生成物の堆積することを防止し、皮膜形
成中に光透過窓が曇ることが完全に防止される。そのた
め、透過窓の洗浄、交換が不要となり、長時間の連続成
膜により界面の無い厚膜の形成を可能とする。
Effects of the Invention As described in detail above, the film forming method using the photoCVD method of the present invention includes a light transmitting chamber partitioned off by a gate valve on the light transmitting window side of the reaction chamber, and the material gas pressure in the reaction chamber is lower than the After adjusting the raw material gas flow rate and purge gas flow rate so that the purge gas pressure in the light transmission chamber is high, the gate valve is opened and a film is formed on the substrate by the photoCVD method, and the pressure between the reaction chamber and the light transmission chamber is The difference completely blocks the raw material gas from entering the light transmission chamber, which prevents thin film products from accumulating on the inner surface of the light transmission window and completely prevents the light transmission window from fogging during film formation. be done. Therefore, there is no need to clean or replace the transmission window, and it is possible to form a thick film without an interface by continuous film formation over a long period of time.

【図面の簡単な説明】[Brief explanation of the drawing]

【図1】本発明方法に用いられる光CVD装置の概略図
である。
FIG. 1 is a schematic diagram of a photo-CVD apparatus used in the method of the present invention.

【図2】従来法と本発明法により皮膜形成した後の光透
過窓の形成膜厚を示す図である。
FIG. 2 is a diagram showing the thickness of a light transmission window formed after film formation by a conventional method and a method of the present invention.

【図3】従来法で用いられている光CVD装置の概略図
である。
FIG. 3 is a schematic diagram of a photo-CVD apparatus used in a conventional method.

【符号の説明】[Explanation of symbols]

10  反応室 18  基板 20  原料ガス排出口 26  原料ガス供給口 38  光透過室 40  ゲートバルブ 42  光透過窓 44  光源 46  パージガス供給口 54  パージガス排出口 10 Reaction chamber 18 Board 20 Raw material gas outlet 26 Raw material gas supply port 38 Light transmission chamber 40 Gate valve 42 Light transmission window 44 Light source 46 Purge gas supply port 54 Purge gas outlet

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】  パージガス供給口48とパージガス排
出口54を有し容量がV2の光透過室38と原料ガス供
給口26と原料ガス排出口20とを有し容量がV1の反
応室10とをゲートバルブ40によって仕切り、前記光
透過室38にパージガスをガス圧P2で満たし、前記反
応室10に原料ガスをガス圧P1で満たし、P1<P2
とした後、(v1/V1)<(v2/V2)なる関係を
満足するように流速v1で前記原料ガスを流速v2で前
記パージガスを供給しながら前記パージガス排出口54
を閉じるとともに前記ゲートバルブ40を開き、前記光
透過室38に設けた光透過窓42を介して光エネルギー
を照射することにより、前記反応室10内に設置した基
板18に皮膜を形成させることを特徴とする光CVDに
よる皮膜形成方法。
1. A light transmission chamber 38 having a capacity of V2 and having a purge gas supply port 48 and a purge gas discharge port 54, and a reaction chamber 10 having a capacity of V1 and having a raw material gas supply port 26 and a raw material gas discharge port 20. Partitioned by a gate valve 40, the light transmission chamber 38 is filled with purge gas at a gas pressure P2, the reaction chamber 10 is filled with source gas at a gas pressure P1, and P1<P2.
After that, the purge gas outlet 54 is supplied while supplying the raw material gas at a flow rate v1 and the purge gas at a flow rate v2 so as to satisfy the relationship (v1/V1)<(v2/V2).
is closed, the gate valve 40 is opened, and a film is formed on the substrate 18 installed in the reaction chamber 10 by irradiating light energy through the light transmission window 42 provided in the light transmission chamber 38. Characteristic film forming method using photo-CVD.
JP346091A 1991-01-16 1991-01-16 Formation of film by photo assisted cvd Pending JPH04236780A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP346091A JPH04236780A (en) 1991-01-16 1991-01-16 Formation of film by photo assisted cvd

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP346091A JPH04236780A (en) 1991-01-16 1991-01-16 Formation of film by photo assisted cvd

Publications (1)

Publication Number Publication Date
JPH04236780A true JPH04236780A (en) 1992-08-25

Family

ID=11557941

Family Applications (1)

Application Number Title Priority Date Filing Date
JP346091A Pending JPH04236780A (en) 1991-01-16 1991-01-16 Formation of film by photo assisted cvd

Country Status (1)

Country Link
JP (1) JPH04236780A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114746576A (en) * 2019-11-28 2022-07-12 皮考逊公司 Substrate processing apparatus and method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114746576A (en) * 2019-11-28 2022-07-12 皮考逊公司 Substrate processing apparatus and method
CN114746576B (en) * 2019-11-28 2024-11-15 皮考逊公司 Substrate processing apparatus and method
US12325915B2 (en) 2019-11-28 2025-06-10 Picosun Oy Substrate processing apparatus and method

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