JPH04256828A - Sampling device - Google Patents
Sampling deviceInfo
- Publication number
- JPH04256828A JPH04256828A JP3018650A JP1865091A JPH04256828A JP H04256828 A JPH04256828 A JP H04256828A JP 3018650 A JP3018650 A JP 3018650A JP 1865091 A JP1865091 A JP 1865091A JP H04256828 A JPH04256828 A JP H04256828A
- Authority
- JP
- Japan
- Prior art keywords
- container
- gas
- introducing pipe
- refrigerant
- quartz
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Sampling And Sample Adjustment (AREA)
Abstract
Description
【0001】0001
【産業上の利用分野】本発明は高温雰囲気の中で発生す
る金属および化合物の蒸気を捕集し、その成分を分析す
るためのサンプリング装置に関するもの。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a sampling device for collecting vapors of metals and compounds generated in a high-temperature atmosphere and analyzing their components.
【0002】0002
【従来の技術】図3に示すようにインピンジャーと称す
る通気構造を有する容器10に気体中の目的成分が溶解
もしくは化学反応により吸収される吸収液14を満たし
、吸引口11より吸引し、気体を導入口12およびノズ
ル13を通じてバブリングさせて目的分析成分を吸収液
中に捕集するための装置が主流であった。2. Description of the Related Art As shown in FIG. 3, a container 10 having a ventilation structure called an impinger is filled with an absorption liquid 14 in which a target component in the gas is dissolved or absorbed by a chemical reaction, and the liquid is sucked through a suction port 11 to form a gas. The mainstream has been a device that collects target analytical components in an absorption liquid by bubbling them through an inlet 12 and a nozzle 13.
【0003】0003
【発明が解決しようとする課題】このような従来のイン
ピンジャーによる捕集方法は、室温付近の気体中の成分
を捕集するのに支障はないが、高温の気体には適用が難
しい。すなわち、高温の気体が直接に吸収液に接するこ
とにより吸収液の温度上昇によって、吸収液の蒸発,分
解,吸収効率の低下,等の問題が生じてくる。更に高温
、例えば800℃以上の炉内の気体に適用するとなると
、突沸の危険性をともなうため直接に気体をインピンジ
ャーに導入することはできない。[Problems to be Solved by the Invention] Such a conventional collection method using an impinger has no problem in collecting components in gas at around room temperature, but is difficult to apply to high temperature gas. That is, when high-temperature gas comes into direct contact with the absorption liquid, the temperature of the absorption liquid rises, causing problems such as evaporation, decomposition, and reduction in absorption efficiency of the absorption liquid. Furthermore, if the method is applied to gas in a furnace at a high temperature, for example, 800° C. or higher, the gas cannot be directly introduced into the impinger because of the risk of bumping.
【0004】本発明は上記課題を解決するもので、高温
の気体中に存在する金属蒸気および高沸点化合物の蒸気
を効率よく捕集するサンプリング装置を提供することを
目的としている。The present invention has been made to solve the above-mentioned problems, and it is an object of the present invention to provide a sampling device that efficiently collects metal vapors and high-boiling point compound vapors present in high-temperature gases.
【0005】[0005]
【課題を解決するための手段】本発明は上記目的を達成
するために、ガラス,石英またはセラミックスからなる
2重構造の外側と内側の容器の間に冷媒を流すことので
きる容器と、この容器内に気体を導くことのできる取り
外し可能な気体導入管を配してなるものである。[Means for Solving the Problems] In order to achieve the above object, the present invention provides a container in which a refrigerant can flow between an outer container and an inner container having a double structure made of glass, quartz, or ceramics, and this container. It is equipped with a removable gas introduction tube that can introduce gas into the tank.
【0006】[0006]
【作用】本発明は上記した構成により、導入管から流入
してきた気体が容器内で冷却され、金属蒸気あるいは高
沸点化合物の蒸気が器壁面に凝集して効率的に捕集でき
るものである。[Function] With the above-described structure, the present invention allows the gas flowing in from the inlet pipe to be cooled in the container, and the metal vapor or the vapor of a high boiling point compound to condense on the wall surface of the container and to be efficiently collected.
【0007】[0007]
【実施例】以下、本発明の一実施例について図1および
図2を参照しながら説明する。Embodiment An embodiment of the present invention will be described below with reference to FIGS. 1 and 2.
【0008】図1に示すように気体の導入管1は、2重
構造の容器2と摺り合わせ接合部8を通じて接合されて
いる。導入管1の容器内にある先端7は、容器底部9近
くまで達している。導入管1および容器2の材質は、耐
熱性を有し目的とする捕集成分の分析値に影響を与えな
いものであれば何でもよいが、石英ガラスが最も適して
いる。As shown in FIG. 1, a gas introduction pipe 1 is connected to a double-structured container 2 through a sliding joint 8. As shown in FIG. The tip 7 of the introduction tube 1 inside the container reaches close to the bottom 9 of the container. The introduction tube 1 and the container 2 may be made of any material as long as it is heat resistant and does not affect the analysis value of the target collected component, but quartz glass is most suitable.
【0009】本装置の使用にあたって、容器2は冷媒供
給口3と4の間に冷媒を通す。導入管1の外側先端を測
定しようとする雰囲気内にセットし、吸引口6より吸引
ポンプを用いて適当な流速で吸引する。導入された気体
は容器の内壁面5で冷却され、金属蒸気および高沸点化
合物は凝集し捕捉される。サンプリングが終了したなら
ば、導入管1を通じて酸あるいは水等の適当な溶解液を
注ぎ入れる。特に蒸気圧の低い金属および高沸点化合物
は、空冷された導入管部分に凝集していることがあるの
で、溶解液は導入管の全内面に行きわたるように注ぎ入
れる。導入管1を取り外し、図2に示す容器2の内壁面
5に付着している成分を溶解する。必要ならば冷媒供給
口3から温水を注入し加温して溶解する。[0009] In use of the apparatus, container 2 passes refrigerant between refrigerant supply ports 3 and 4. The outer tip of the introduction tube 1 is set in the atmosphere to be measured, and suction is applied from the suction port 6 at an appropriate flow rate using a suction pump. The introduced gas is cooled on the inner wall surface 5 of the container, and metal vapor and high boiling point compounds are condensed and captured. When sampling is completed, an appropriate solution such as acid or water is poured through the introduction tube 1. In particular, metals with low vapor pressure and high boiling point compounds may aggregate in the air-cooled portion of the introduction tube, so the solution is poured so as to cover the entire inner surface of the introduction tube. The introduction tube 1 is removed, and the components adhering to the inner wall surface 5 of the container 2 shown in FIG. 2 are dissolved. If necessary, hot water is injected from the refrigerant supply port 3 and heated to dissolve the refrigerant.
【0010】この溶解液中の成分を原子吸光法、ICP
発光分析法等の適当な方法により測定して気体中の目的
成分濃度を求めることができる。[0010] The components in this solution were analyzed by atomic absorption spectrometry, ICP
The concentration of the target component in the gas can be determined by measurement using an appropriate method such as emission spectrometry.
【0011】[0011]
【発明の効果】本発明は電子部品,高純度材料の処理工
程の雰囲気ガスの制御や、不純物汚染源調査を目的とす
る気体中の蒸気成分の捕集に適している。気体導入管と
捕集容器が着脱できる構造となっているため、サンプリ
ング後の容器2がそのまま前処理容器として使え、測定
操作が容易で使い勝手のよいサンプリングができる。[Effects of the Invention] The present invention is suitable for controlling atmospheric gas in processing steps for electronic parts and high-purity materials, and for collecting vapor components in gas for the purpose of investigating impurity contamination sources. Since the gas introduction tube and the collection container are constructed to be removable, the container 2 after sampling can be used as a pretreatment container as is, allowing for easy measurement operations and convenient sampling.
【図1】本発明の一実施例のサンプリング装置の側面図
FIG. 1 is a side view of a sampling device according to an embodiment of the present invention.
【図2】導入管を取り外した容器の側面図[Figure 2] Side view of the container with the introduction tube removed
【図3】従来
の気体中の成分捕集用サンプリング装置;インピンジャ
ーの側面図[Figure 3] Conventional sampling device for collecting components in gas; side view of impinger
1 導入管 2 容器 3 冷媒供給口 4 冷媒排出口 5 容器内壁面 6 吸引口 7 導入管先端 8 摺り合わせ接合部 9 容器底部 10 インピンジャー容器 11 吸引口 12 導入口 13 ノズル 14 吸収液 1 Introductory pipe 2 Container 3 Refrigerant supply port 4 Refrigerant outlet 5 Container inner wall surface 6 Suction port 7 Tip of introduction tube 8 Grinded joint part 9 Bottom of container 10 Impinger container 11 Suction port 12 Introduction port 13 Nozzle 14 Absorption liquid
Claims (1)
2重構造の外側と内側の容器の間に冷媒を通すことので
きる容器と前記容器に取り外し可能な気体導入管を有す
るサンプリング装置Claim 1: A sampling device comprising a double-structured container made of glass, quartz, or ceramics, capable of passing a refrigerant between the outer and inner containers, and a removable gas introduction pipe into the container.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3018650A JPH04256828A (en) | 1991-02-12 | 1991-02-12 | Sampling device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3018650A JPH04256828A (en) | 1991-02-12 | 1991-02-12 | Sampling device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH04256828A true JPH04256828A (en) | 1992-09-11 |
Family
ID=11977493
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3018650A Pending JPH04256828A (en) | 1991-02-12 | 1991-02-12 | Sampling device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH04256828A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101000288B (en) | 2006-12-20 | 2011-02-02 | 南京大学 | Atmosphere vapour gradient sampling device and its application method |
| JP2011504235A (en) * | 2007-11-21 | 2011-02-03 | フィリップ・モーリス・プロダクツ・ソシエテ・アノニム | Exhalation condenser |
-
1991
- 1991-02-12 JP JP3018650A patent/JPH04256828A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101000288B (en) | 2006-12-20 | 2011-02-02 | 南京大学 | Atmosphere vapour gradient sampling device and its application method |
| JP2011504235A (en) * | 2007-11-21 | 2011-02-03 | フィリップ・モーリス・プロダクツ・ソシエテ・アノニム | Exhalation condenser |
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