JPH04276076A - Chemical vapor growth method - Google Patents
Chemical vapor growth methodInfo
- Publication number
- JPH04276076A JPH04276076A JP12065891A JP12065891A JPH04276076A JP H04276076 A JPH04276076 A JP H04276076A JP 12065891 A JP12065891 A JP 12065891A JP 12065891 A JP12065891 A JP 12065891A JP H04276076 A JPH04276076 A JP H04276076A
- Authority
- JP
- Japan
- Prior art keywords
- metal
- raw material
- chemical vapor
- film
- gas
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Chemical Vapour Deposition (AREA)
Abstract
Description
【0001】0001
【産業上の利用分野】本発明は、化学気相成長方法に関
し、さらに詳しくは、金属膜の製造方法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a chemical vapor deposition method, and more particularly to a method for manufacturing metal films.
【0002】0002
【従来の技術】化学気相成長(Chemical V
apor Deposition、CVD)法は、高
性能膜を量産できる方法として広く実用化されている。
金属膜の化学気相成長法の原料として金属の塩化物が広
く用いられている。[Prior art] Chemical vapor deposition (Chemical V
The apor deposition (CVD) method has been widely put into practical use as a method for mass-producing high-performance films. Metal chlorides are widely used as raw materials for chemical vapor deposition of metal films.
【0003】0003
【発明が解決しようとする課題】しかし、薄膜合成時に
反応器材料に対する腐食性の強い塩化水素ガスを発生す
る。本発明は上記難点に鑑みてなされたものであり、そ
の目的とするところは、安価で取り扱いやすい原料を用
いて、腐食性のガスを発生することなく、金属膜を容易
に合成し得る新たな化学気相成長法の提供にある。However, during thin film synthesis, hydrogen chloride gas, which is highly corrosive to reactor materials, is generated. The present invention has been made in view of the above-mentioned difficulties, and its purpose is to provide a new method for easily synthesizing metal films using inexpensive and easy-to-handle raw materials and without generating corrosive gases. Provides chemical vapor deposition method.
【0004】0004
【課題を解決するための手段】金属の有機酸塩、例えば
、金属の酢酸酸塩または金属の酢酸酸塩の誘導体を原料
として用い、反応ガス、例えば、水素を原料ガスに加え
ることにより、被処理物表面に金属膜を成長させること
を特徴とする化学気相成長方法。[Means for Solving the Problems] An organic acid salt of a metal, such as a metal acetate or a derivative of a metal acetate, is used as a raw material, and a reactive gas, such as hydrogen, is added to the raw material gas. A chemical vapor deposition method characterized by growing a metal film on the surface of a treated object.
【0005】[0005]
【作用】本発明方法によるときは、取り扱い上も安全な
原料を用いて、少ない工程で、腐食性のガスを発生する
ことなく、優れた金属膜を容易にに成長させることがで
きる。[Operation] According to the method of the present invention, an excellent metal film can be easily grown using raw materials that are safe to handle, in a small number of steps, and without generating corrosive gases.
【実施例】以下、本発明の実施例について説明する。図
1に成膜装置の模式図を示す。原料として酢酸コバルト
を用い、これを300℃に保った気化器内で気化し、窒
素ガス(流量300cm3/min)をキャリアガスと
してこれを反応器内に導入した。反応ガスとして水素ガ
ス(流量300cm3/min)を用い、これを同軸噴
流として、反応器中で原料ガスと拡散混合し、大気圧下
で成膜した。基板として、硼珪酸ガラスとシリコン単結
晶を用いた。反応温度350〜500℃で反応させたと
ころ、金属光沢を持ち高い導電性を示す結晶性のコバル
ト膜が得られた。図2に合成された薄膜のX線回折パタ
ーンの1例を示す。図3に薄膜の成膜速度を反応温度に
対して示す。図4に合成された膜の抵抗率を示す。40
0℃で成膜した膜の抵抗率は4×10−4Ω・cmでバ
ルク材の抵抗率とほぼ一致している。以上本発明につき
好適な実施例を挙げて種々説明したが、本発明はこの実
施例に限定されるものではなく、発明の精神を逸脱しな
い範囲内で多くの改変を施し得るのはもちろんのことで
ある。[Examples] Examples of the present invention will be described below. FIG. 1 shows a schematic diagram of the film forming apparatus. Cobalt acetate was used as a raw material and was vaporized in a vaporizer maintained at 300° C., and introduced into the reactor using nitrogen gas (flow rate 300 cm 3 /min) as a carrier gas. Hydrogen gas (flow rate: 300 cm 3 /min) was used as the reaction gas, and was mixed with the raw material gas in a coaxial jet by diffusion in a reactor to form a film under atmospheric pressure. Borosilicate glass and silicon single crystal were used as the substrate. When the reaction was carried out at a reaction temperature of 350 to 500°C, a crystalline cobalt film with metallic luster and high conductivity was obtained. FIG. 2 shows an example of the X-ray diffraction pattern of the synthesized thin film. FIG. 3 shows the thin film deposition rate versus reaction temperature. Figure 4 shows the resistivity of the synthesized film. 40
The resistivity of the film formed at 0° C. is 4×10 −4 Ω·cm, which is almost the same as the resistivity of the bulk material. Although the present invention has been variously explained above with reference to preferred embodiments, the present invention is not limited to these embodiments, and it goes without saying that many modifications can be made without departing from the spirit of the invention. It is.
【図1】装置の概略図である。FIG. 1 is a schematic diagram of the device.
【図2】合成された膜のX線回折パターンの1例を示す
図である。FIG. 2 is a diagram showing an example of an X-ray diffraction pattern of a synthesized film.
【図3】薄膜の成膜速度を反応温度に対して示した図で
ある。FIG. 3 is a diagram showing the thin film deposition rate versus reaction temperature.
【図4】合成された薄膜の抵抗率を反応温度に対して示
した図である。FIG. 4 is a diagram showing the resistivity of a synthesized thin film versus reaction temperature.
1 キャリアガスボンベ 2 反応ガスボンベ 3 ガス流量制御器 4 温度検出器 5 気化器 6 原料 7 反応器 8 ヒーター 9 被処理物 1 Carrier gas cylinder 2 Reaction gas cylinder 3 Gas flow controller 4 Temperature detector 5. Vaporizer 6 Raw materials 7 Reactor 8 Heater 9. Object to be treated
Claims (3)
応ガスを原料ガスに加えることにより、被処理物表面に
金属膜を成長させることを特徴とする化学気相成長方法
。1. A chemical vapor deposition method characterized in that a metal organic acid salt is used as a raw material and a reactive gas is added to the raw material gas to grow a metal film on the surface of a workpiece.
は金属の酢酸酸塩の誘導体である特許請求範囲第1項記
載の化学気相成長方法。2. The chemical vapor deposition method according to claim 1, wherein the metal organic acid salt is a metal acetate or a derivative of a metal acetate.
1項記載の化学気相成長方法。3. The chemical vapor deposition method according to claim 1, wherein the reaction gas is hydrogen.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12065891A JPH04276076A (en) | 1991-02-28 | 1991-02-28 | Chemical vapor growth method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12065891A JPH04276076A (en) | 1991-02-28 | 1991-02-28 | Chemical vapor growth method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH04276076A true JPH04276076A (en) | 1992-10-01 |
Family
ID=14791691
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12065891A Pending JPH04276076A (en) | 1991-02-28 | 1991-02-28 | Chemical vapor growth method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH04276076A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19635894B4 (en) * | 1995-09-04 | 2008-02-07 | Fujifilm Corp. | Method of making an endless optical compensatory sheet |
-
1991
- 1991-02-28 JP JP12065891A patent/JPH04276076A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19635894B4 (en) * | 1995-09-04 | 2008-02-07 | Fujifilm Corp. | Method of making an endless optical compensatory sheet |
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