JPH04286Y2 - - Google Patents

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Publication number
JPH04286Y2
JPH04286Y2 JP1981146468U JP14646881U JPH04286Y2 JP H04286 Y2 JPH04286 Y2 JP H04286Y2 JP 1981146468 U JP1981146468 U JP 1981146468U JP 14646881 U JP14646881 U JP 14646881U JP H04286 Y2 JPH04286 Y2 JP H04286Y2
Authority
JP
Japan
Prior art keywords
optical path
photodetector
slit
mirror
filter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1981146468U
Other languages
Japanese (ja)
Other versions
JPS5851236U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP14646881U priority Critical patent/JPS5851236U/en
Publication of JPS5851236U publication Critical patent/JPS5851236U/en
Application granted granted Critical
Publication of JPH04286Y2 publication Critical patent/JPH04286Y2/ja
Granted legal-status Critical Current

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  • Spectrometry And Color Measurement (AREA)

Description

【考案の詳細な説明】 本考案は出射スリツトを分光器のスペクトル面
に沿つて移動させて測光を行うようにした分光光
度計に関する。
[Detailed Description of the Invention] The present invention relates to a spectrophotometer that measures light by moving an output slit along the spectral plane of the spectrometer.

例えば発光分析用分光器で固定検出器と移動検
出器とが併用できるようになつている場合、移動
検出器でカバーできる波長範囲はなるべく広いこ
とが望まれる。しかし出射スリツトを移動させる
構成の場合、従来は出射スリツトの背後に単一の
光検出器を配置したものであつたから測定できる
波長範囲は2500Å〜3800Å程度と云つたようにせ
まいものであつた。
For example, when a fixed detector and a moving detector can be used together in a spectrometer for emission analysis, it is desirable that the wavelength range that can be covered by the moving detector is as wide as possible. However, in the case of a configuration in which the output slit is moved, conventionally a single photodetector was placed behind the output slit, so the measurable wavelength range was narrow, about 2500 Å to 3800 Å.

本考案は共通ベース上に出射スリツトと2個の
光検出器と光路切換え用の鏡及び妨害光カツト用
のフイルタを操作する機構をマウントした移動ス
リツトを提供することにより広い波長範囲をカバ
ーできるようにしようとするものである。以下実
施例によつて本考案を説明する。
The present invention can cover a wide wavelength range by providing a movable slit with an output slit, two photodetectors, a mirror for optical path switching, and a mechanism for operating a filter for cutting interference light mounted on a common base. This is what we are trying to do. The present invention will be explained below with reference to Examples.

第1図において8はベースであり、2は出射ス
リツト、6、7が光検出器で、スリツト2、光検
出器6,7はベース8上に取付けられている。4
は鏡で出射スリツト2の後方に出入り自在に設け
られ、出射スリツト2から出射した光の光路をA
の方に反射させ光検出器7に入射させる。鏡4が
スリツト2の後から取除かれるとスリツト2を出
射した光は直進してBの光路を採り光検出器6に
入射する。鏡4はスリツト2を通る光路と45°の
角度で交わる軸Xを中心に回転する腕5に取付け
られており、腕5を回転させることによつて光路
B内に出入せしめられる。腕5の鏡4とは反対側
の端にフイルタ3が取付けられており、腕5を第
1図に示す位置から180°回転させるとフイルタ3
が光路B内に挿入される。
In FIG. 1, 8 is a base, 2 is an output slit, and 6 and 7 are photodetectors. The slit 2 and the photodetectors 6 and 7 are mounted on the base 8. 4
is a mirror that can move in and out at the rear of the output slit 2, and directs the optical path of the light emitted from the output slit 2 to A.
The light is reflected toward the photodetector 7 and is incident on the photodetector 7. When the mirror 4 is removed from behind the slit 2, the light emitted from the slit 2 travels straight, takes an optical path B, and enters the photodetector 6. The mirror 4 is attached to an arm 5 that rotates around an axis X that intersects the optical path passing through the slit 2 at an angle of 45°, and can be moved into and out of the optical path B by rotating the arm 5. A filter 3 is attached to the end of the arm 5 opposite to the mirror 4, and when the arm 5 is rotated 180 degrees from the position shown in FIG.
is inserted into optical path B.

上の構成で、第1図の状態では出射スリツト2
を出射した光は鏡4で反射されて光検出器7に入
射している。この状態は測定波長範囲の短波長域
測定のモードである。次に腕5を90°回転させる
と鏡4がスリツト2の背後から外れ、スリツト2
を出射した光は直進して光検出器6に直接入射す
る。この状態は測定波長範囲のうち中間波長域測
定モードである。更に腕5を90°回転させると出
射スリツト2の後にフイルタ3が挿入され、スリ
ツト2を出射した光は直進してフイルタ3を透過
した後光検出器6に入射する。この状態ではフイ
ルタ3によつて2次以上の高次回折光がカツトさ
れ、測定波長範囲中の長波域の測定モードであ
る。
In the above configuration, in the state shown in Figure 1, the exit slit 2
The emitted light is reflected by the mirror 4 and enters the photodetector 7. This state is a short wavelength measurement mode in the measurement wavelength range. Next, when arm 5 is rotated 90 degrees, mirror 4 comes off from behind slit 2, and slit 2
The emitted light travels straight and directly enters the photodetector 6. This state is an intermediate wavelength region measurement mode within the measurement wavelength range. When the arm 5 is further rotated by 90 degrees, a filter 3 is inserted after the output slit 2, and the light emitted from the slit 2 travels straight, passes through the filter 3, and then enters the photodetector 6. In this state, the filter 3 cuts out second-order and higher-order diffracted light, and the mode is a long-wavelength measurement mode within the measurement wavelength range.

9は腕5を回転させるモータである。腕5の軸
には3本のピン10,10′,10″が角距離で
90°ずつ距てて植立してある。腕5の軸の側方に
この軸と並行して3個のリミツトスイツチ11,
12,13が固定してあり、夫々のスイツチのア
クチユエータは上記ピン10,10′,10″の通
過軌跡に臨んでいる。上述モータ9及び各リミツ
トスイツチともベース8にマウントされている。
第1図はピン10′がリミツトスイツチ12に当
つている状態で、この状態でモータ9を回転させ
る信号が入ると、モータ9が回転し、ピン10が
リミツトスイツチ11に当ることにより、リミツ
トスイツチ11の動作によつて発せられる信号で
モータ9が停止せしめられ、鏡4が出射スリツト
2の後から除かれた状態となる。この状態で再び
モータ9を回転させる信号が入るとモータ9が回
転してピン10″がリミツトスイツチ13に当り、
モータ9が停止せしめられる。この状態ではフイ
ルタ3が出射スリツト2と光検出器6との間に挿
入されている。更にモータを回転させると腕5が
180°回転し、ピン10′がリミツトスイツチ12
に当つてモータ9が止り、第1図の状態に戻る。
9 is a motor that rotates the arm 5. Three pins 10, 10', 10'' are attached to the axis of arm 5 at angular distances.
They are planted 90° apart. Three limit switches 11 are installed on the sides of the axis of the arm 5 and parallel to this axis.
12 and 13 are fixed, and the actuator of each switch faces the path of passage of the pins 10, 10', 10''.The motor 9 and each limit switch are both mounted on the base 8.
FIG. 1 shows a state in which the pin 10' is in contact with the limit switch 12. In this state, when a signal to rotate the motor 9 is input, the motor 9 rotates and the pin 10 is in contact with the limit switch 11, causing the limit switch 11 to operate. The motor 9 is stopped by the signal emitted by the mirror 4, and the mirror 4 is removed from behind the exit slit 2. In this state, when a signal to rotate the motor 9 is input again, the motor 9 rotates and the pin 10'' hits the limit switch 13.
Motor 9 is stopped. In this state, the filter 3 is inserted between the output slit 2 and the photodetector 6. When the motor is further rotated, arm 5
Rotate 180°, pin 10' becomes limit switch 12
When this happens, the motor 9 stops and returns to the state shown in FIG.

第2図は第1図の構成の側面図で1は分光素子
(図外)から来る分光された光束Fを反射させて
出射スリツト2の方に向ける鏡である。出射スリ
ツト2、光検出器6,7、鏡1,4、フイルタ3
及びモータ9等はベース8上にマウントされ、こ
のマウント全体が第1図においては紙面に平行に
第2図では紙面に垂直に移動してスペクトル面を
走査する。
FIG. 2 is a side view of the configuration shown in FIG. 1, and reference numeral 1 designates a mirror that reflects the separated light flux F coming from the spectroscopic element (not shown) and directs it toward the exit slit 2. Output slit 2, photodetectors 6, 7, mirrors 1, 4, filter 3
The motor 9 and the like are mounted on a base 8, and the entire mount scans the spectral plane by moving parallel to the plane of the paper in FIG. 1 and perpendicular to the plane of the paper in FIG.

光検出器7は1600Å〜3200Åの波長範囲で感度
を有し、光検出器6は2000Å〜6000Åの範囲で感
度を持つている。第3図でaは一次回折光のスペ
クトルを示し、bは二次回折光のスペクトルを示
す。一次スペクトル上で1900Å〜3200Åの範囲が
第1図に示される光検出器7で測光を行う領域で
ある。この範囲では2次回折光は959Å〜1100Å
で光検出器7に対して感度を持つていないから、
1900〜2200Åは光検出器7によつて妨害光なしに
測定できる。次に一次回折光の2200〜3800Åの範
囲は第1図で腕5を90°回転させて光検出器6に
スリツト2の出射光が直接入射するようにしたモ
ードでの測定領域で、この場合2次回折光は1100
〜1900Åで光検出器6(2000〜6000Åに対して感
度を持つ)に対して感度を与えない。従つてフイ
ルタなしで測光できる。一次回折光の3800〜5150
Åの範囲は第1図で腕5を180°回転させてフイル
タ3をスリツト2と光検出器6との間に挿入した
モードにおける測定領域である。この場合光検出
器6は3800〜5150Åの光に感度を示すが、同時に
2次回折光の2000〜2600Åの光に対しても感度が
あるから、この妨害光である2次回折光をフイル
タ3でカツトしているのである。
Photodetector 7 has a sensitivity in the wavelength range of 1600 Å to 3200 Å, and photodetector 6 has sensitivity in the wavelength range of 2000 Å to 6000 Å. In FIG. 3, a indicates the spectrum of the first-order diffracted light, and b indicates the spectrum of the second-order diffracted light. The range from 1900 Å to 3200 Å on the primary spectrum is the area in which photometry is performed by the photodetector 7 shown in FIG. In this range, the second-order diffracted light is 959 Å to 1100 Å.
Since it has no sensitivity to the photodetector 7,
The range from 1900 to 2200 Å can be measured by the photodetector 7 without any interference light. Next, the range of 2200 to 3800 Å of the first-order diffracted light is the measurement area in the mode in which the arm 5 is rotated 90 degrees in Fig. 1 so that the emitted light from the slit 2 is directly incident on the photodetector 6. The second order diffracted light is 1100
It does not give any sensitivity to the photodetector 6 (which has sensitivity for 2000 to 6000 Å) at ~1900 Å. Therefore, photometry can be performed without a filter. 3800~5150 of the first order diffracted light
The range Å is the measurement area in the mode in which the arm 5 is rotated 180 degrees and the filter 3 is inserted between the slit 2 and the photodetector 6 in FIG. In this case, the photodetector 6 is sensitive to light of 3800 to 5150 Å, but at the same time it is also sensitive to the second-order diffracted light of 2000 to 2600 Å, so the filter 3 cuts out the second-order diffracted light, which is the interference light. That's what I'm doing.

本考案分光光度計は上述したような構成で、単
一スリツトの背後に2個の光検出器を配置し、光
路の切換えとフイルタの出入によつて3通りの測
定モードを与えることによつて広い波長範囲をカ
バーできるものである。
The spectrophotometer of the present invention has the above-described configuration, with two photodetectors placed behind a single slit, and three measurement modes provided by switching the optical path and entering and exiting the filter. It can cover a wide wavelength range.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本考案の一実施例における出射スリツ
トマウントの平面図、第2図は同じく側面図、第
2図は測定波長範囲の区分を示す線図である。 2……出射スリツト、3……フイルタ、4……
鏡、5……回転腕、6,7……光検出器、8……
ベース、9……モータ、10,10′,10″……
ピン、11,12,13……リミツトスイツチ。
FIG. 1 is a plan view of an output slit mount according to an embodiment of the present invention, FIG. 2 is a side view of the same, and FIG. 2 is a diagram showing the division of the measurement wavelength range. 2... Output slit, 3... Filter, 4...
Mirror, 5... Rotating arm, 6, 7... Photodetector, 8...
Base, 9... Motor, 10, 10', 10''...
Pins, 11, 12, 13...limit switch.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] スペクトル像面上を測光手段を移動させて分光
測光を行う構成で、スペクトル面上を移動する出
射スリツトを保持している移動ベースに、出射ス
リツト後方の直進光路上に置かれた可視光域に感
度を有する第1の光検出器と、この光路と交わる
光路上に置かれた紫外域のみに感度を有する第2
の光検出器を配置すると共に、上記二つの光路と
交わる回転軸を有し、角度を隔てて鏡とフイルタ
を保持させた回転腕と、同腕に三種の角位置を取
らせる手段を設け、上記腕の一つの角位置におい
て上記鏡が上記二つの光路の分岐点上に位置し
て、上記スリツト出射光を一方の光路に向けて反
射させ、もう一つの角位置で、光路上には鏡もフ
イルタもないようにし、更に他の角位置でフイル
タが出射スリツトの後方の直進光路上に位置する
ようにし、上記フイルタを、測定波長範囲中の長
波長域に重なる回拆格子の高次回拆光をカツトス
する特性のものとした分光光度計。
This configuration performs spectrophotometry by moving a photometric means on the spectral image plane, with a movable base holding an exit slit that moves on the spectral image plane, and a visible light range detector placed on the straight optical path behind the exit slit. A first photodetector that is sensitive and a second photodetector that is sensitive only to the ultraviolet region and placed on an optical path that intersects this optical path.
a photodetector, a rotary arm having a rotation axis that intersects with the two optical paths and holding a mirror and a filter separated by an angle, and means for causing the arm to assume three different angular positions; At one corner position of the arm, the mirror is located on the branch point of the two optical paths to reflect the light emitted from the slit toward one optical path, and at the other corner position, the mirror is located on the optical path. In addition, at another angular position, the filter is located on the straight optical path behind the exit slit, and the filter is placed in the high-order grid of the recursive grating that overlaps the long wavelength region in the measurement wavelength range. A spectrophotometer with the characteristic of cutting light.
JP14646881U 1981-09-30 1981-09-30 spectrophotometer Granted JPS5851236U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14646881U JPS5851236U (en) 1981-09-30 1981-09-30 spectrophotometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14646881U JPS5851236U (en) 1981-09-30 1981-09-30 spectrophotometer

Publications (2)

Publication Number Publication Date
JPS5851236U JPS5851236U (en) 1983-04-07
JPH04286Y2 true JPH04286Y2 (en) 1992-01-07

Family

ID=29939373

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14646881U Granted JPS5851236U (en) 1981-09-30 1981-09-30 spectrophotometer

Country Status (1)

Country Link
JP (1) JPS5851236U (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5872245U (en) * 1981-11-05 1983-05-16 光洋工業株式会社 Auxiliary materials for getting up on your stomach
JPH0510028Y2 (en) * 1987-01-08 1993-03-11

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5924977Y2 (en) * 1976-06-30 1984-07-23 株式会社島津製作所 spectrophotometer
GB2043288B (en) * 1979-03-02 1983-01-26 Pye Electronic Prod Ltd Ebert monochromator

Also Published As

Publication number Publication date
JPS5851236U (en) 1983-04-07

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