JPH04296601A - Micrometer - Google Patents

Abstract

PURPOSE:To realize a micrometer with less dispersion of a measured value by standardizing the measuring pressure at the time of measurement. CONSTITUTION:A measured article 30 is placed between an anvil 10 and a spindle 20 of a micrometer 1. The spindle 20 is moved to bring the anvil 10, the measured article 30 and the spindle 20 contact to each other closely, and a measured value of measurement is read from the scales at this time. A pressure detection means to output a detection signal by way of detecting that a pressure force comes to be a specified pressure and a display means 50 to display the detection signal output from the pressure detection means 40 are provided in the anvil 10.

Description

[Detailed description of the invention]

0001

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a micrometer that maintains a constant pressure during measurement. For example, in recent years, with the progress of optical communication technology, optical communication has come to be used in a wide range of areas. Considering the optical connector used here, in order to satisfy the performance required of the optical connector, it is necessary to control the dimensional accuracy of the various parts that make up the optical connector with high precision.

[0002] In order to realize such high-precision various parts, it is necessary to measure dimensions accurately, and it is required to improve the measurement precision of a micrometer, which is one of the dimension measuring instruments.

0003

2. Description of the Related Art FIG. 3 shows a diagram illustrating a conventional example. 1A
1 is a conventional micrometer, in which 10 is an anvil, 20 is a spindle, 30 is an object to be measured, 60 is a sleeve, 70 is a thimble, 80 is a ratchet stop, and 90 is a conventional micrometer.
is a frame.

The conventional measuring method is to place the object to be measured 30 between the anvil 10 and the spindle 20, move the spindle 20 forward by rotating the ratchet stop 80, and move the anvil 10, the object to be measured 30, and the spindle 2 forward.
0 in close contact.

[0005] At this time, after confirming the adhesion visually and by feeling with the hand, move the ratchet stop 80 lightly so that it makes a "click, click" sound, and after keeping the pressure constant, measure from the scales on the sleeve 60 and thimble 70. reading the value.

[0006]

[Problems to be Solved by the Invention] Measured values in the conventional example shown in FIG. After that, the amount of feed of the ratchet stop 80 varies depending on the measurer, and this difference causes variations in the measured values.

Furthermore, when the micrometer 1 is replaced and measurements are made, variations in the pressing force occur due to differences in the ratchet stops 80. Such variations in pressing force appear as variations in measured values. The pressure applied during measurement with the micrometer 1 is generally about 500 to 1000 gr.

[0008] The present invention aims to realize a micrometer that can reduce variations in measured values by keeping the pressing force constant during measurement.

[0009]

[Means for Solving the Problems] FIG. 1 is a diagram illustrating the principle of the present invention. 1 in the figure is an anvil 10, a spindle 20, an object to be measured 30, a sleeve 60, a thimble 70,
A micrometer consisting of a ratchet stop 80 and a frame 90, 40 is provided in the anvil 10,
A pressure detection means detects that the pressure applied to the anvil 10 reaches a predetermined pressure and outputs a detection signal, and 50 is a display means for displaying a detection signal output from the pressure detection means 40. The ratchet stop 8 detects that the applied pressure has reached a predetermined pressure and displays it on the display means 50.
By stopping the advance of the spindle 20 by stopping the feed of the anvil 10, the object to be measured 30, and the spindle 20,
The pressing force between can be kept constant.

0010

[Function] Anvil 10, object to be measured 30, and spindle 20
The pressurizing force when the anvil 10 is in close contact with the anvil 10 is measured by a pressure detection means 40 provided in the anvil 10, and when a predetermined pressure is detected, a detection signal is outputted, and the display means 50 displays this. The measurer sees this display and sets the ratchet stop 8.
Since the zero feed is stopped, the pressing force during measurement can always be kept constant, making it possible to improve the accuracy of dimension measurement.

[0011]

Embodiment FIG. 2 is a diagram illustrating an embodiment of the present invention. In the figure, 10 is an anvil, 20 is a spindle, 30 is an object to be measured, and 90 is a frame. Further, the sleeve 60, thimble 70, and ratchet stop 80 are the same components as those explained in the conventional example of FIG. 3, and are omitted from illustration.

In this embodiment, a piezoelectric element 41 is provided in the anvil 10 as the pressure detection means 40 explained in the principle diagram, and an amplifier 51 for amplifying the output voltage of the piezoelectric element 41 and a lamp 52 are used as the display means 50. , and a power source 53.

In this embodiment, an anvil 10 and an object to be measured 30
After the spindle 20 is in close contact with the ratchet stop 80, lightly feed it. The piezoelectric element 41 detects the applied force at that time and generates an output voltage when the applied force reaches 500 gf, for example. This output voltage is amplified by an amplifier 51 and displayed on a lamp 52. Power supply 53 includes amplifier 51 and lamp 5
This is the power supply for operating the 2.

Since the measurer moves the ratchet stop 80 while looking at the display on the lamp 52, it is possible to stop feeding the ratchet stop 80 the moment the lamp 52 lights up.

[0015] Therefore, the pressing force at the time of measurement is, for example, 50
When it is set to 0 gf, the variation can be reduced to about ±1 gr, making it possible to reduce the variation in measured values.

[0016]

[Effects of the Invention] A pressure detection means is provided in the anvil of the micrometer to detect that the applied pressure has reached a specified value and generate a detection signal, and the output is displayed on the display means. By performing the measurement, it is possible to keep the pressing force at the time of measurement constant, and it is possible to realize a micrometer that can reduce variations in measured values of dimensions.

[Brief explanation of drawings]

[Figure 1] Diagram explaining the principle of the present invention

[Fig. 2] Diagram explaining an embodiment of the present invention

[Figure 3] Diagram explaining a conventional example

[Explanation of symbols]

1, 1A micrometer 10 Anvil 20 Spindle 30 Object to be measured 40 Pressure detection means 41 Piezoelectric element 50 Display means 51 Amplifier 52 Lamp 53 Power supply 60 Sleeve 70 Thimble 80 Ratchet stop 90 frame

Claims (1)

[Claims] Claim 1: An anvil (10) and a spindle (2
0), and moving the spindle (20) to bring the anvil (10), the object to be measured (30), and the spindle (20) into close contact with each other; In the micrometer (1) that reads the measured value of the dimension from the scale at that time, pressure detection means (40) detects that the pressurizing force in the anvil (10) reaches a predetermined pressure and outputs a detection signal. and the pressure detection means (
Display means (50) for displaying the detection signal output from 40)
A micrometer characterized by being provided with.