JPH04314865A - Method for synthesizing cubic boron nitride - Google Patents
Method for synthesizing cubic boron nitrideInfo
- Publication number
- JPH04314865A JPH04314865A JP10837491A JP10837491A JPH04314865A JP H04314865 A JPH04314865 A JP H04314865A JP 10837491 A JP10837491 A JP 10837491A JP 10837491 A JP10837491 A JP 10837491A JP H04314865 A JPH04314865 A JP H04314865A
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- Prior art keywords
- gas
- boron nitride
- cubic boron
- substrate
- film
- Prior art date
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- Chemical Vapour Deposition (AREA)
Abstract
Description
【0001】0001
【産業上の利用分野】本発明は、切削工具等の工具材料
やヒートシンク等の電子材料となる立方晶窒化硼素の合
成方法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for synthesizing cubic boron nitride, which can be used as tool materials such as cutting tools and electronic materials such as heat sinks.
【0002】0002
【従来の技術】立方晶窒化硼素(c−BN)は、ダイヤ
モンドに次ぐ硬さと熱伝導率を有し、鉄族合金に対して
極めて化学的に安定であり、切削工具、金型等の耐久性
向上への応用あるいは半導体素子、発光素子等への応用
など、幅広い用途が考えられる。[Prior Art] Cubic boron nitride (c-BN) has hardness and thermal conductivity second only to diamond, is extremely chemically stable to iron group alloys, and is durable for cutting tools, molds, etc. A wide range of applications can be considered, including applications to improve performance, semiconductor devices, light emitting devices, etc.
【0003】従来、エキシマレーザーCVD法とプラズ
マCVD法を組み合わせて用いた立方晶窒化硼素(c−
BN)の合成方法としては、特開昭63−134662
号公告に開示されるように、硼素原子含有ガスおよび窒
素原子含有ガスをエキシマレーザーにて分解、励起状態
とした後、高周波プラズマ中を通過させ、300〜20
00℃に過熱した基板の表面に導入し、c−BNを析出
させる方法が知られている。また、硼素原子含有ガス中
の硼素原子数と窒素原子含有ガス中の窒素原子数の比を
B/N=0.1〜10の範囲として反応ガスに水素を用
いない方法が開示されている。Conventionally, cubic boron nitride (c-
The method for synthesizing BN) is described in Japanese Patent Application Laid-Open No. 63-134662
As disclosed in the publication, a boron atom-containing gas and a nitrogen atom-containing gas are decomposed and excited by an excimer laser, and then passed through a high-frequency plasma to
A method is known in which c-BN is introduced onto the surface of a substrate heated to 00° C. to precipitate c-BN. Furthermore, a method is disclosed in which the ratio of the number of boron atoms in the boron atom-containing gas to the number of nitrogen atoms in the nitrogen atom-containing gas is set in a range of B/N=0.1 to 10, and no hydrogen is used as the reaction gas.
【0004】また、熱電子放射材を用いた立方晶窒化硼
素の合成方法としては、特開昭60−277766号公
報に開示されるように、硼素原子含有ガスと窒素原子含
有ガスを別個に反応系内に導入し、窒素原子含有ガスの
みをマイクロ波無極放電中を通過させた後、硼素原子含
有ガスと混合して、さらにその混合ガスを1000℃以
上に加熱した熱電子放射材中を通過させ、300〜20
00℃に加熱した基板の表面に導入し、c−BNを析出
させる方法が知られている。また、硼素原子含有ガス中
の硼素原子数と窒素原子含有ガス中の窒素原子数との比
B/Nを0.0001〜10000の範囲とする方法が
開示されている。[0004] Furthermore, as a method for synthesizing cubic boron nitride using a thermionic emitting material, as disclosed in JP-A-60-277766, a boron atom-containing gas and a nitrogen atom-containing gas are reacted separately. Introduced into the system, only the nitrogen atom-containing gas is passed through a microwave non-polar discharge, mixed with a boron atom-containing gas, and then passed through a thermionic emissive material that has been heated to over 1000°C. let, 300~20
A method is known in which c-BN is introduced onto the surface of a substrate heated to 00° C. to precipitate c-BN. Further, a method is disclosed in which the ratio B/N of the number of boron atoms in the boron atom-containing gas to the number of nitrogen atoms in the nitrogen atom-containing gas is in the range of 0.0001 to 10,000.
【0005】[0005]
【発明が解決しようとする課題】一般に、高温に加熱し
た基板上では、通常原料ガスのみ導入した場合、c−B
N構造とともにh−BN,a−BN構造が形成される。
このため、c−BN構造以外のBN構造を選択的にエッ
チング除去する目的で、水素ガスまたは不活性ガスが原
料ガスに混入されている。[Problems to be Solved by the Invention] Generally, on a substrate heated to a high temperature, when only the raw material gas is introduced, c-B
Along with the N structure, h-BN and a-BN structures are formed. For this reason, hydrogen gas or inert gas is mixed into the raw material gas for the purpose of selectively etching away BN structures other than the c-BN structure.
【0006】しかし、特開昭60−134662号公報
の従来方法においては、原料ガスに水素ガスまたは不活
性ガスを混入しないため、所望のc−BNだけの構造が
得られにくいという問題点があった。また、従来方法に
おける励起手法では、水素ガスまたは不活性ガスを混入
した場合でも、c−BN構造の選択的形成に寄与すると
言われている原子状水素等の活性種を発生させることは
困難であった。However, the conventional method disclosed in JP-A-60-134662 does not mix hydrogen gas or inert gas into the raw material gas, so there is a problem that it is difficult to obtain the desired structure consisting only of c-BN. Ta. Furthermore, with conventional excitation methods, even when hydrogen gas or inert gas is mixed, it is difficult to generate active species such as atomic hydrogen, which is said to contribute to the selective formation of c-BN structures. there were.
【0007】一方、熱電子放射材を用いた合成方法であ
る特開昭60−277766号公報の従来方法において
も、原料ガスに水素ガスまたは不活性ガスが混入されず
、特開昭60−134662号公報の方法と同様な問題
点があった。On the other hand, even in the conventional method disclosed in JP-A No. 60-277766, which is a synthesis method using a thermionic emitting material, hydrogen gas or inert gas is not mixed into the raw material gas; There were problems similar to the method in the publication.
【0008】本発明は、上記従来の問題点に鑑みてなさ
れたもので、気相化学析出方法において、c−BN形成
に有利なc−BNの合成方法を提供することを目的とす
る。The present invention has been made in view of the above-mentioned conventional problems, and it is an object of the present invention to provide a method for synthesizing c-BN which is advantageous for c-BN formation in a vapor phase chemical precipitation method.
【0009】[0009]
【課題を解決するための手段】上記目的を達成するため
に、本発明は、硼素原子含有ガスおよび窒素原子含有ガ
スを材料ガスとして用い、気相化学蒸着法により立方晶
窒化硼素を合成する方法において、前記原料ガスに水素
または不活性ガスの少なくともいずれか一方を混入し、
エキシマレーザーまたは低圧水銀ランプを光源する紫外
光を照射し、その後基板近傍に配置した熱電子放射材に
通過させ、300〜1300℃に過熱した基板表面に立
方晶窒化硼素膜を形成することとした。[Means for Solving the Problems] In order to achieve the above object, the present invention provides a method for synthesizing cubic boron nitride by a vapor phase chemical vapor deposition method using a boron atom-containing gas and a nitrogen atom-containing gas as material gases. , mixing at least one of hydrogen or an inert gas into the raw material gas,
We decided to irradiate ultraviolet light from an excimer laser or low-pressure mercury lamp, and then pass it through a thermionic emitter placed near the substrate, forming a cubic boron nitride film on the substrate surface heated to 300 to 1300 degrees Celsius. .
【0010】また、本発明において、水素および不活性
ガスを熱電子放射材に通過させ、その後原料ガスととも
にチャンバー内に導入して前記紫外光を照射し、前記基
盤表面に立方晶窒化硼素膜を形成してもよい。Further, in the present invention, hydrogen and an inert gas are passed through the thermionic emitting material, and then introduced into the chamber together with the source gas and irradiated with the ultraviolet light to form a cubic boron nitride film on the surface of the substrate. may be formed.
【0011】[0011]
【作用】本発明においては、硼素原子含有ガス、窒素原
子含有ガスを原料ガスとして用い、水素または不活性ガ
スを混入する。これらのガスは紫外光に曝されて励起さ
れ、ラジカルを主体とする活性種として基板近傍に拡散
していく。その後、基板直前に配置された熱電子放射材
により、さらにイオンの活性種として分解し、300〜
1300℃と高温に加熱した基板表面の近傍で活性な反
応を生じさせ、基板に結晶性の高い立方晶窒化硼素を析
出させる。[Operation] In the present invention, a boron atom-containing gas and a nitrogen atom-containing gas are used as raw material gases, and hydrogen or an inert gas is mixed therein. These gases are excited when exposed to ultraviolet light and diffuse into the vicinity of the substrate as active species, mainly radicals. After that, the thermionic emitter placed just in front of the substrate further decomposes it into active species of ions, resulting in 300 ~
An active reaction occurs near the surface of the substrate heated to a high temperature of 1300° C., and highly crystalline cubic boron nitride is precipitated on the substrate.
【0012】本発明の特徴はエキシマレーザーまたは低
圧水銀ランプで紫外光を照射し、かつ熱電子放射材によ
り活性化する点である。A feature of the present invention is that ultraviolet light is irradiated with an excimer laser or a low-pressure mercury lamp, and activation is performed with a thermionic emitter.
【0013】c−BN構造の形成には、原子状水素、窒
素分子イオンなどの活性種の生成が不可欠であることが
知られている。そこで、本発明は、紫外光照射によるラ
ジカル生成と熱電子放射材によるイオン生成という比較
的性質の異なる活性化の手段を組み合わせて用いること
により、所望の膜を形成するような前駆体をもらさず、
選択的に高濃度で発生させ、c−BNの形成を有利にす
るものである。特に、熱電子放射材により原子状水素が
高濃度で発生することが知られており、紫外光で励起さ
れた活性種と相互作用させることでc−BN構造のみの
形成に効果的である。It is known that the generation of active species such as atomic hydrogen and nitrogen molecular ions is essential for the formation of the c-BN structure. Therefore, the present invention uses a combination of activation means that have relatively different properties, ie, radical generation by ultraviolet light irradiation and ion generation by a thermionic emitting material, thereby eliminating the need for precursors that can form the desired film. ,
It is selectively generated at a high concentration and favors the formation of c-BN. In particular, it is known that atomic hydrogen is generated at a high concentration by thermionic emitting materials, and interaction with active species excited by ultraviolet light is effective in forming only the c-BN structure.
【0014】上記のように本発明は、活性種の状態に比
較的異なる励起手段の組み合わせでなされるため、光源
のパワーおよび電子放射材電流を調整することで各々の
活性種の生成量が制御でき、c−BN膜の最適条件を設
定できる。このため、所望の組成、すなわち所望のB/
N比の立方晶窒化硼素を生成させることができる。As described above, since the present invention uses a combination of excitation means that are relatively different in the state of the active species, the amount of each active species produced can be controlled by adjusting the power of the light source and the current of the electron emitting material. It is possible to set the optimum conditions for the c-BN film. Therefore, the desired composition, that is, the desired B/
Cubic boron nitride with an N ratio can be produced.
【0015】[0015]
【実施例1】図1に示す合成装置を用いて、c−BN膜
の形成を行った。基板1としてシリコンウエハーを用い
、原料ガスとしてBCl3 ガス2、N2 ガス3、ア
シスタントガスとしてH2 ガス4を用いた。基板1を
サセプター5の上に設置し、排気系6によりチャンバー
7内を減圧した。Example 1 A c-BN film was formed using the synthesis apparatus shown in FIG. A silicon wafer was used as the substrate 1, BCl3 gas 2 and N2 gas 3 were used as source gases, and H2 gas 4 was used as the assistant gas. The substrate 1 was placed on the susceptor 5, and the pressure inside the chamber 7 was reduced by the exhaust system 6.
【0016】あらかじめBCl3 ガス2、N2 ガス
3およびH2 ガス4をそれぞれ1cc/min 、1
0cc/min および100cc/min の流速で
混合してチャンバー7内に導入し、チャンバー7の外部
に設けたエキシマレーザー8により石英窓9を介して紫
外光を照射し、さらに基板1の直上に配置した熱電子放
射材11の部分を通過させた。チャンバー7内の圧力は
15Torrで、基板1の温度はDC電源12と連結し
たヒータ13により900℃とした。そして、2時間反
応させ、基板1の表面に1μmの厚さの膜を成膜した。
なお、図中14で示すのは、熱電子放射材11に連結し
たDC電源である。BCl3 gas 2, N2 gas 3 and H2 gas 4 were supplied in advance at 1 cc/min and 1 cc/min, respectively.
The mixture was mixed at a flow rate of 0 cc/min and 100 cc/min, introduced into the chamber 7, irradiated with ultraviolet light through a quartz window 9 by an excimer laser 8 provided outside the chamber 7, and then placed directly above the substrate 1. The portion of the thermionic emitting material 11 that had been heated was allowed to pass through. The pressure inside the chamber 7 was 15 Torr, and the temperature of the substrate 1 was set to 900° C. by a heater 13 connected to a DC power source 12. Then, the reaction was carried out for 2 hours, and a film having a thickness of 1 μm was formed on the surface of the substrate 1. Note that 14 in the figure is a DC power supply connected to the thermionic radiation material 11.
【0017】この膜をFT−IR(フーリエ変換赤外線
吸収スペクトル)で調べたところ、1050cm−1に
顕著な吸収を示した。これにより、c−BN膜の形成を
確認することができた。When this film was examined by FT-IR (Fourier transform infrared absorption spectrum), it showed significant absorption at 1050 cm-1. Thereby, formation of the c-BN film could be confirmed.
【0018】[0018]
【実施例2】図2に示す合成装置を用いて、実施例1と
同様にc−BN膜の成膜を行った。基板1としてシリコ
ンウエハーを用い原料ガスとしてBCl3 ガス2、N
H3 ガス15,アシストガスとしてArガス16を用
いた。基板1をサセプター5の上に設置し、排気系6に
よりチャンバー7内を減圧した。Example 2 A c-BN film was formed in the same manner as in Example 1 using the synthesis apparatus shown in FIG. A silicon wafer is used as the substrate 1, and BCl3 gas 2, N as the raw material gas.
H3 gas 15 and Ar gas 16 were used as assist gas. The substrate 1 was placed on the susceptor 5, and the pressure inside the chamber 7 was reduced by the exhaust system 6.
【0019】BCl3 ガス2を2cc/min の流
速でチャンバー7内に導入し、チャンバー7の外部に設
けた低圧水銀ランプ17により石英窓9を介して紫外光
を照射した。一方、あらかじめNH3 ガス15,Ar
ガス16をそれぞれ2cc/min 、50cc/mi
n の流速で混合し、チャンバー7内の熱電子放射材1
1の直前に導入した。そして、紫外線光を照射したBC
l3 ガス2とNH3 ガス15、Arガス16をチャ
ンバ7内で混合し、基板1の直上に配置した熱電子放射
材11の部分を通過させた。
チャンバー7内の圧力は10Torrで、基板1の温度
は900℃とし、上記ガスを混合する領域はチャンバー
7の外部に設けた加熱炉18により200〜300℃に
加熱した。そして、2時間反応させ、基板1の表面に1
.5μmの厚さの膜を成膜した。BCl3 gas 2 was introduced into the chamber 7 at a flow rate of 2 cc/min, and ultraviolet light was irradiated through the quartz window 9 by a low-pressure mercury lamp 17 provided outside the chamber 7. On the other hand, NH3 gas 15, Ar
Gas 16 at 2cc/min and 50cc/mi respectively
The thermionic emissive material 1 in the chamber 7 is mixed at a flow rate of n.
It was introduced just before 1. Then, BC was irradiated with ultraviolet light.
13 gas 2, NH3 gas 15, and Ar gas 16 were mixed in the chamber 7 and passed through the thermionic emitter 11 placed directly above the substrate 1. The pressure inside the chamber 7 was 10 Torr, the temperature of the substrate 1 was 900° C., and the region where the above gases were mixed was heated to 200 to 300° C. using a heating furnace 18 provided outside the chamber 7. Then, after reacting for 2 hours, 1
.. A film with a thickness of 5 μm was formed.
【0020】この膜をFT−IRで調べたところ、10
50cm−1に顕著な吸収を示し、c−BN膜の形成を
確認できた。[0020] When this film was examined by FT-IR, it was found that 10
Remarkable absorption was observed at 50 cm −1 , confirming the formation of a c-BN film.
【0021】[0021]
【実施例3】図3に示す合成装置を用いて、実施例1と
同様にc−BN膜の成膜を行った。基板1としてシリコ
ンウエハーを用い、原料ガスとしてB2H6 ガス20
、NH3 ガス15、アシストガスとしてH2 ガス4
を用いた。基板1をサセプター5の上に設置し、排気系
6によりチャンバー7内を減圧した。Example 3 A c-BN film was formed in the same manner as in Example 1 using the synthesis apparatus shown in FIG. A silicon wafer is used as the substrate 1, and B2H6 gas 20 is used as the raw material gas.
, NH3 gas 15, H2 gas 4 as assist gas
was used. The substrate 1 was placed on the susceptor 5, and the pressure inside the chamber 7 was reduced by the exhaust system 6.
【0022】あらかじめB2 H6 ガス20、NH3
ガス15を共に1cc/min の流速で混合してチ
ャンバー7内に導入し、チャンバー7の外部に設けたエ
キシマレーザー8により石英窓9を介して紫外光を照射
した。一方H2 ガス4の流速を100cc/min
とし、あらかじめ熱電子放射材11の部分を通過させて
チャンバー7内に導入した。チャンバー7内の圧力は2
0Torrで、基板1の温度は850℃とした。そして
、1時間反応させ、基板1の表面に1μmの厚さの膜を
成膜した。[0022] B2 H6 gas 20, NH3
Gases 15 were mixed together at a flow rate of 1 cc/min and introduced into the chamber 7, and ultraviolet light was irradiated through the quartz window 9 by an excimer laser 8 provided outside the chamber 7. On the other hand, the flow rate of H2 gas 4 was set to 100cc/min.
The sample was introduced into the chamber 7 by passing through the thermionic emitting material 11 in advance. The pressure inside chamber 7 is 2
The temperature of the substrate 1 was 850° C. at 0 Torr. Then, the reaction was carried out for 1 hour, and a film having a thickness of 1 μm was formed on the surface of the substrate 1.
【0023】この膜をFT−IRで調べたところ、10
50cm−1に顕著な吸収を示し、c−BN膜の形成を
確認することができた。When this film was examined by FT-IR, it was found that 10
Remarkable absorption was observed at 50 cm −1 , and formation of a c-BN film could be confirmed.
【0024】[0024]
【発明の効果】以上のように、本発明のc−BNの合成
方法によれば、原料ガスに水素または不活性ガスを混入
し、紫外光を照射するとともに、熱電子放射材に通過さ
せるというラジカル生成とイオン生成という比較性質の
異なる活性化の手段を組み合わせて用いることとしたの
で、a−BN、h−BN構造をほとんど形成させずにc
−BN膜を選択的に形成することができる。As described above, according to the c-BN synthesis method of the present invention, hydrogen or an inert gas is mixed into the raw material gas, irradiated with ultraviolet light, and passed through a thermionic emitting material. Since we decided to use a combination of activation means with different comparative properties, radical generation and ion generation, c
- A BN film can be selectively formed.
【0025】また、光源のパワーおよび電子放射材電流
を調整することにより、所望のB/N比の立方晶窒化硼
素膜を生成することができる。Furthermore, by adjusting the power of the light source and the current of the electron emitting material, a cubic boron nitride film having a desired B/N ratio can be produced.
【0026】したがって、これまではダイヤモンドと同
様に超高圧、高温化でしか合成できなかった立方晶窒化
硼素膜を、安価な装置、材料を用いて、人工的に薄膜合
成することができる。[0026] Therefore, cubic boron nitride films, which could previously only be synthesized under ultra-high pressure and high temperature like diamond, can be artificially synthesized into thin films using inexpensive equipment and materials.
【図1】本発明の実施例1で用いた合成装置の概略構成
である。FIG. 1 is a schematic configuration of a synthesis apparatus used in Example 1 of the present invention.
【図2】本発明の実施例2で用いた合成装置の概略構成
図である。FIG. 2 is a schematic configuration diagram of a synthesis apparatus used in Example 2 of the present invention.
【図3】本発明の実施例3で用いた合成装置の概略構成
図である。FIG. 3 is a schematic configuration diagram of a synthesis apparatus used in Example 3 of the present invention.
1 基板 2 BCl3 ガス 3 N2 ガス 4 H2 ガス 7 チャンバー 8 エキシマレーザー 11 熱電子放射材 15 NH3 ガス 16 Arガス 17 低圧水銀ランプ 20 B2 H6 ガス 1 Board 2 BCl3 gas 3 N2 gas 4 H2 gas 7 Chamber 8 Excimer laser 11 Thermionic emissive material 15 NH3 gas 16 Ar gas 17 Low pressure mercury lamp 20 B2 H6 gas
Claims (2)
ガスを原料ガスとして用い、気相化学蒸着法により立方
晶窒化硼素を合成する方法において、前記原料ガスに水
素または不活性ガスの少なくともいずれか一方を混入し
、エキシマレーザーまたは低圧水銀ランプを光源とする
紫外光を照射し、その後基板近傍に配置した熱電子放射
材に通過させ、300〜1300℃に過熱した基板表面
に立方晶窒化硼素膜を形成することを特徴とする立方晶
窒化硼素の合成方法。1. A method for synthesizing cubic boron nitride by a vapor phase chemical vapor deposition method using a boron atom-containing gas and a nitrogen atom-containing gas as source gases, wherein the source gas is at least one of hydrogen or an inert gas. is mixed with ultraviolet light from an excimer laser or a low-pressure mercury lamp as a light source, and then passed through a thermionic emitter placed near the substrate to form a cubic boron nitride film on the substrate surface heated to 300 to 1300°C. A method for synthesizing cubic boron nitride, characterized by forming cubic boron nitride.
に通過させ、その後原料ガスとともにチャンバー内に導
入して前記紫外光を照射し、前記基板表面に立方晶窒化
硼素膜を形成することを特徴とする請求項1記載の立方
晶窒化硼素の合成方法。2. Forming a cubic boron nitride film on the surface of the substrate by passing hydrogen and an inert gas through a thermionic emitting material, and then introducing the material into a chamber together with the source gas and irradiating the ultraviolet light. A method for synthesizing cubic boron nitride according to claim 1.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10837491A JPH04314865A (en) | 1991-04-12 | 1991-04-12 | Method for synthesizing cubic boron nitride |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10837491A JPH04314865A (en) | 1991-04-12 | 1991-04-12 | Method for synthesizing cubic boron nitride |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH04314865A true JPH04314865A (en) | 1992-11-06 |
Family
ID=14483155
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10837491A Withdrawn JPH04314865A (en) | 1991-04-12 | 1991-04-12 | Method for synthesizing cubic boron nitride |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH04314865A (en) |
-
1991
- 1991-04-12 JP JP10837491A patent/JPH04314865A/en not_active Withdrawn
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| A300 | Application deemed to be withdrawn because no request for examination was validly filed |
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