JPH04325499A - Manufacture of potassium sulfide added cadmium-zinc mixed crystal thin film - Google Patents

Manufacture of potassium sulfide added cadmium-zinc mixed crystal thin film

Info

Publication number
JPH04325499A
JPH04325499A JP3097480A JP9748091A JPH04325499A JP H04325499 A JPH04325499 A JP H04325499A JP 3097480 A JP3097480 A JP 3097480A JP 9748091 A JP9748091 A JP 9748091A JP H04325499 A JPH04325499 A JP H04325499A
Authority
JP
Japan
Prior art keywords
cadmium
molecular beam
sulfur
thin film
zinc
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3097480A
Other languages
Japanese (ja)
Inventor
Shigeo Hayashi
茂生 林
Yoshio Manabe
由雄 真鍋
Tsuneo Mitsuyu
常男 三露
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP3097480A priority Critical patent/JPH04325499A/en
Publication of JPH04325499A publication Critical patent/JPH04325499A/en
Pending legal-status Critical Current

Links

Landscapes

  • Crystals, And After-Treatments Of Crystals (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】本発明は、カリウム添加硫化カド
ミウム亜鉛混晶薄膜の製造方法に関するものである。特
に本発明は、可視短波長域の発光素子などに有用な硫化
カドミウム亜鉛混晶半導体において、pn接合発光素子
の作製に必要不可欠なp型伝導を示すカリウム添加硫化
カドミウム亜鉛混晶薄膜の製造方法に関するものである
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for producing a potassium-added cadmium-zinc sulfide mixed crystal thin film. In particular, the present invention provides a method for producing a potassium-doped cadmium-zinc sulfide mixed-crystal thin film that exhibits p-type conductivity, which is essential for the production of p-n junction light-emitting devices, in cadmium-zinc sulfide mixed-crystal semiconductors useful for light-emitting devices in the visible short wavelength range. It is related to.

【0002】0002

【従来の技術】II−VI族化合物半導体は一般に伝導
型の制御が困難であるとされているが、p型伝導を示す
硫化亜鉛または硫化カドミウムを得る試みとして、リチ
ウムやナトリウムまたは窒素や砒素や燐をドーピングす
る方法が行われている。
[Prior Art] It is generally said that it is difficult to control the conductivity type of II-VI group compound semiconductors. A method of doping with phosphorus has been used.

【0003】0003

【発明が解決しようとする課題】しかしながら前記のよ
うな従来の方法では、ドーパントとしてI族元素である
リチウムやナトリウムを用いた場合、ドーパント原子の
大きさが置換すべきカドミウムや亜鉛に比べて小さく、
熱や電気的なエネルギーによって半導体内で容易に動い
てしまい、安定した特性が得られないといった問題点が
あった。
[Problems to be Solved by the Invention] However, in the conventional method as described above, when lithium or sodium, which is a Group I element, is used as a dopant, the size of the dopant atom is smaller than that of cadmium or zinc to be replaced. ,
The problem was that it easily moved within the semiconductor due to heat or electrical energy, making it difficult to obtain stable characteristics.

【0004】また、ドーパントとしてV族元素である窒
素や砒素や燐を用いた場合、アクセプタとしての活性化
率が低く低抵抗のp型伝導を示す半導体が得られないと
いう問題点があった。本発明はかかる点に鑑み、硫化カ
ドミウム亜鉛混晶中で容易に動き回ることがない大きさ
で化学的活性度の高いカリウムを効率よく添加すること
によりp型伝導を示す硫化カドミウム亜鉛混晶薄膜を製
造する方法を提供することを目的とする。
[0004] Furthermore, when nitrogen, arsenic, or phosphorus, which are group V elements, are used as a dopant, there is a problem that the activation rate as an acceptor is low and a semiconductor exhibiting low resistance p-type conduction cannot be obtained. In view of this, the present invention has been developed to create a cadmium-zinc sulfide mixed crystal thin film exhibiting p-type conductivity by efficiently adding potassium, which has a size that does not easily move around in the cadmium-zinc sulfide mixed crystal and has high chemical activity. The purpose is to provide a method for manufacturing.

【0005】[0005]

【課題を解決するための手段】前記目的を達成するため
、本発明のカリウム添加硫化カドミウム亜鉛混晶薄膜の
製造方法は、真空中で、基板表面に硫黄分子線とカドミ
ウム分子線と亜鉛分子線を照射する分子線エピタキシー
法で硫化カドミウム亜鉛混晶薄膜を製造するに際し、加
熱蒸発させた硫化カリウムの分子線を同時に照射して混
晶薄膜にカリウムを添加することを特徴とする。
[Means for Solving the Problems] In order to achieve the above object, the method for producing a potassium-added cadmium-zinc sulfide mixed crystal thin film of the present invention provides a method for producing a potassium-added cadmium-zinc sulfide mixed crystal thin film, in which sulfur molecular beams, cadmium molecular beams, and zinc molecular beams are formed on the surface of a substrate in vacuum. When manufacturing a cadmium-zinc sulfide mixed crystal thin film using the molecular beam epitaxy method using irradiation with ions, the method is characterized in that potassium is added to the mixed crystal thin film by simultaneously irradiating a molecular beam of heated and evaporated potassium sulfide.

【0006】前記構成においては、硫黄分子線が硫黄を
加熱蒸発させるか、硫化水素、ジメチル硫黄、ジエチル
硫黄、メチルメルカプタンおよびエチルメルカプタンか
ら成る群から選ばれた少なくとも1種の硫黄化合物を加
熱分解して得た硫黄分子線であり、カドミウム分子線が
金属カドミウムを加熱蒸発させるか、ジメチルカドミウ
ムおよびジエチルカドミウムから成る群から選ばれた少
なくとも1種のカドミウム化合物の蒸気を加熱分解して
得た分子線であり、亜鉛分子線が金属亜鉛を加熱蒸発さ
せるか、ジメチル亜鉛およびジエチル亜鉛から成る群か
ら選ばれた少なくとも1種の亜鉛化合物の蒸気を加熱分
解して得た分子線である事が好ましい。
In the above configuration, the sulfur molecular beam heats and evaporates sulfur, or heats and decomposes at least one sulfur compound selected from the group consisting of hydrogen sulfide, dimethyl sulfur, diethyl sulfur, methyl mercaptan, and ethyl mercaptan. A sulfur molecular beam obtained by heating and vaporizing metal cadmium, or by thermally decomposing the vapor of at least one cadmium compound selected from the group consisting of dimethyl cadmium and diethyl cadmium. The zinc molecular beam is preferably a molecular beam obtained by heating and evaporating metallic zinc or thermally decomposing the vapor of at least one zinc compound selected from the group consisting of dimethylzinc and diethylzinc.

【0007】また前記構成においては、基板がガリウム
砒素、ガリウム燐、インジウム燐のうちいずれかの単結
晶である事が好ましい。また、前記構成において、更に
、基板温度が200℃以上500℃以下である事が好ま
しい。
Further, in the above structure, it is preferable that the substrate is a single crystal of gallium arsenide, gallium phosphide, or indium phosphide. Further, in the above configuration, it is further preferable that the substrate temperature is 200° C. or more and 500° C. or less.

【0008】[0008]

【作用】本発明は、真空中で、基板表面に硫黄分子線と
カドミウム分子線と亜鉛分子線を照射する分子線エピタ
キシー法で硫化カドミウム亜鉛混晶薄膜を製造するに際
し、加熱蒸発させた硫化カリウムの分子線を同時に照射
して混晶薄膜にカリウムを添加することにより、不純物
源として硫化カドミウム亜鉛の構成元素である硫黄を含
む硫化カリウムを用いている。硫化カリウムを加熱蒸発
して得られる分子は、II−VI族化合物半導体結晶と
原子並びが似ており、II族元素(カドミウム、亜鉛)
位置に入るべきカリウム原子がちょうどVI族元素であ
る硫黄原子と隣合っており、カリウムがII族元素位置
におさまりやすく、アクセプタとして効率よく取り込ま
れるという作用がある。
[Operation] The present invention uses heated and evaporated potassium sulfide when producing a cadmium zinc sulfide mixed crystal thin film by the molecular beam epitaxy method in which the surface of a substrate is irradiated with a sulfur molecular beam, a cadmium molecular beam, and a zinc molecular beam in a vacuum. Potassium sulfide containing sulfur, which is a constituent element of cadmium zinc sulfide, is used as an impurity source by adding potassium to the mixed crystal thin film by simultaneous irradiation with molecular beams. The molecules obtained by heating and evaporating potassium sulfide have an atomic arrangement similar to that of II-VI group compound semiconductor crystals, and contain group II elements (cadmium, zinc).
The potassium atom that should enter the position is exactly adjacent to the sulfur atom, which is a group VI element, and potassium easily settles in the group II element position, so that it is efficiently taken in as an acceptor.

【0009】また、硫黄分子線が硫黄を加熱蒸発させる
か、硫化水素、ジメチル硫黄、ジエチル硫黄、メチルメ
ルカプタンおよびエチルメルカプタンから成る群から選
ばれた少なくとも1種の硫黄化合物を加熱分解して得た
硫黄分子線であり、カドミウム分子線が金属カドミウム
を加熱蒸発させるか、ジメチルカドミウムおよびジエチ
ルカドミウムから成る群から選ばれた少なくとも1種の
カドミウム化合物の蒸気を加熱分解して得た分子線であ
り、亜鉛分子線が金属亜鉛を加熱蒸発させるか、ジメチ
ル亜鉛およびジエチル亜鉛から成る群から選ばれた少な
くとも1種の亜鉛化合物の蒸気を加熱分解して得た分子
線を採用する本発明の好ましい態様により、硫化カドミ
ウム亜鉛混晶薄膜に取り込まれる不必要な不純物成分が
、得られる薄膜の性質に悪影響を及ぼさないので好まし
い。
[0009] In addition, sulfur molecular beams can be used to thermally evaporate sulfur or to thermally decompose at least one sulfur compound selected from the group consisting of hydrogen sulfide, dimethyl sulfur, diethyl sulfur, methyl mercaptan, and ethyl mercaptan. It is a sulfur molecular beam, and the cadmium molecular beam is a molecular beam obtained by heating and vaporizing metal cadmium or thermally decomposing the vapor of at least one cadmium compound selected from the group consisting of dimethyl cadmium and diethyl cadmium, According to a preferred embodiment of the present invention, the zinc molecular beam is obtained by heating and evaporating metallic zinc or thermally decomposing the vapor of at least one zinc compound selected from the group consisting of dimethylzinc and diethylzinc. This is preferable because unnecessary impurity components incorporated into the cadmium zinc sulfide mixed crystal thin film do not adversely affect the properties of the obtained thin film.

【0010】また、基板としてガリウム砒素、ガリウム
燐、インジウム燐のうちいずれかの単結晶を採用する本
発明の好ましい態様により、これらの基板の格子定数が
基板上に生成するカリウム添加硫化カドミウム亜鉛混晶
の格子定数と類似しているので、純粋な単結晶が生成し
やすい。また、更に、基板温度を200℃以上500℃
以下にする本発明の好ましい態様により、生成した薄膜
を構成する原子のマイグレーションが十分に行われ、各
原子が正確な格子位置に安定して配置される。また原子
の再蒸発が過剰になる事による原子の空孔が生じる欠点
が抑制されるので、より完全な結晶が得やすい。
Further, according to a preferred embodiment of the present invention in which a single crystal of gallium arsenide, gallium phosphide, or indium phosphide is used as the substrate, the lattice constant of these substrates is lower than that of the potassium-doped cadmium zinc sulfide mixture formed on the substrate. Since the lattice constant is similar to that of crystals, pure single crystals can be easily produced. Furthermore, the substrate temperature should be increased to 200°C or higher and 500°C.
According to the preferred embodiments of the present invention described below, the atoms constituting the produced thin film are sufficiently migrated, and each atom is stably arranged at a precise lattice position. Further, since the defect of atomic vacancies caused by excessive re-evaporation of atoms is suppressed, it is easier to obtain more perfect crystals.

【0011】[0011]

【実施例】以下、本発明を実施例により詳細に説明する
。図1は本発明の製造方法の一実施例で用いられる分子
線エピタキシャル装置(MBE装置)の構造を示す概略
図である。同図において6a、7a、8a、9aはそれ
ぞれ通常の蒸発用ルツボに入った金属カドミウム、金属
亜鉛、硫黄、硫化カリウムで、加熱蒸発させてカドミウ
ム分子線6c、亜鉛分子線7c、硫黄分子線8c、硫化
カリウム分子線9cを得る。
[Examples] The present invention will be explained in detail below with reference to Examples. FIG. 1 is a schematic diagram showing the structure of a molecular beam epitaxial apparatus (MBE apparatus) used in an embodiment of the manufacturing method of the present invention. In the figure, 6a, 7a, 8a, and 9a are metal cadmium, metal zinc, sulfur, and potassium sulfide, respectively, placed in a normal evaporation crucible, and heated and evaporated to form a cadmium molecular beam 6c, a zinc molecular beam 7c, and a sulfur molecular beam 8c. , a potassium sulfide molecular beam 9c is obtained.

【0012】実際の薄膜成長は次のような手順で行なう
。まず表面を清浄にした基板4を例えばモリブデン等か
らなる基板ホルダー13に装着する。基板材料としては
本実施例では硫化カドミウム亜鉛のとり得る格子定数に
近い格子定数をもつガリウム砒素単結晶を用いた。次に
真空容器1を10−9Torr以下程度の超高真空まで
超高真空排気装置2により排気する。尚、図1中、超高
真空排気装置2は、その位置を示したのみで詳細は省略
してある。その後ルツボ6a、7a、8aを例えば12
0℃、240℃、100℃程度に加熱し、それぞれ1×
10−6Torr程度の適切な強度のカドミウム分子線
6c、亜鉛分子線7c、硫黄分子線8cが得られるよう
にする。 また硫化カリウム9aは例えばルツボを200℃程度に
加熱して1×10−7Torr程度の適切な強度の硫化
カリウム分子線9cが得られるようにする。
[0012] Actual thin film growth is performed according to the following procedure. First, the substrate 4 whose surface has been cleaned is mounted on a substrate holder 13 made of, for example, molybdenum. In this example, a gallium arsenide single crystal having a lattice constant close to that of cadmium zinc sulfide was used as the substrate material. Next, the vacuum container 1 is evacuated to an ultra-high vacuum of about 10 -9 Torr or less by the ultra-high vacuum exhaust device 2 . In FIG. 1, the position of the ultra-high vacuum evacuation device 2 is only shown, and the details are omitted. After that, for example, 12 crucibles 6a, 7a, 8a
Heat to around 0°C, 240°C, and 100°C, 1x each.
Cadmium molecular beams 6c, zinc molecular beams 7c, and sulfur molecular beams 8c having appropriate strengths of about 10<-6 >Torr are obtained. Further, the potassium sulfide 9a is heated, for example, in a crucible to about 200 DEG C. so that a potassium sulfide molecular beam 9c having an appropriate strength of about 1.times.10@-7 Torr can be obtained.

【0013】次に基板4を約600℃に加熱して表面酸
化膜を除去する。その後基板を結晶成長に適切な温度ま
で下げる。この実施例においては300℃で実施した。 この後シャッター6b、7b、8b、9bを同時に開き
、カドミウム、亜鉛、硫黄および硫化カリウムの各分子
線を基板に照射し結晶成長を行なった。以上のような方
法で形成したカリウム添加硫化カドミウム亜鉛混晶薄膜
は、硫化カリウムをドーパントとして用いたことにより
、効率よくカリウムが膜中に取り込まれ、フォトルミネ
ッセンス特性の測定の結果、図2に示すようにアクセプ
タ束縛励起発光(I1 発光)と、ドナー・アクセプタ
対発光(DAP発光)が支配的であり、アクセプタが充
分にドーピングされ、p型の硫化カドミウム亜鉛混晶薄
膜が形成されていることが確認できた。
Next, the substrate 4 is heated to about 600° C. to remove the surface oxide film. The substrate is then lowered to a temperature suitable for crystal growth. In this example, the temperature was 300°C. Thereafter, the shutters 6b, 7b, 8b, and 9b were simultaneously opened, and the substrate was irradiated with molecular beams of cadmium, zinc, sulfur, and potassium sulfide to grow crystals. In the potassium-doped cadmium zinc sulfide mixed crystal thin film formed by the method described above, by using potassium sulfide as a dopant, potassium was efficiently incorporated into the film, and as a result of photoluminescence characteristics measurement, the results are shown in Figure 2. As shown in FIG. It could be confirmed.

【0014】また、この試料は真空中で加熱(400℃
・1時間)しても、フォトルミネッセンス特性に変化が
見られず、安定した特性を示した。なお、上述の実施例
では硫黄分子線として単体硫黄を加熱蒸発させたものを
用いたが、この他に硫化水素またはジメチル硫黄または
ジエチル硫黄またはメチルメルカプタン(CH3 SH
)またはエチルメルカプタン(C2 H5 SH)のう
ちいずれか一つ以上を加熱分解して得た硫黄分子線を用
いても同様の効果が見られた。
[0014] This sample was also heated in vacuum (400°C
・Even after 1 hour), no change was observed in the photoluminescence properties, indicating stable properties. In addition, in the above-mentioned example, a sulfur molecular beam obtained by heating and vaporizing elemental sulfur was used, but hydrogen sulfide, dimethyl sulfur, diethyl sulfur, or methyl mercaptan (CH3 SH
) or ethyl mercaptan (C2 H5 SH), a similar effect was observed using a sulfur molecular beam obtained by thermally decomposing at least one of them.

【0015】また、カドミウム分子線として金属カドミ
ウムを加熱蒸発させたものを用いたが、この他にジメチ
ルカドミウムまたはジエチルカドミウムの蒸気を加熱分
解して得たカドミウム分子線を用いても同様の効果がみ
られた。また、亜鉛分子線として金属亜鉛を加熱蒸発さ
せたものを用いたが、この他にジメチル亜鉛またはジエ
チル亜鉛の蒸気を加熱分解して得た亜鉛分子線を用いて
も同様の効果が得られた。
Although a cadmium molecular beam obtained by heating and vaporizing metallic cadmium was used as the cadmium molecular beam, a similar effect can also be obtained by using a cadmium molecular beam obtained by thermally decomposing dimethyl cadmium or diethyl cadmium vapor. It was seen. In addition, although the zinc molecular beam obtained by heating and vaporizing metallic zinc was used, the same effect could also be obtained by using a zinc molecular beam obtained by thermally decomposing dimethylzinc or diethylzinc vapor. .

【0016】また、薄膜形成中の基板温度は生成した薄
膜を構成する原子のマイグレーションが十分に行われ、
各原子が正確な格子位置に安定して配置され易いこと、
また原子の再蒸発が過剰になる事による原子の空孔が生
じる欠点が抑制される事などにより、200℃以上50
0℃以下がより完全な結晶が得やすく好ましい温度範囲
であった。
[0016] Furthermore, the substrate temperature during thin film formation is such that the migration of atoms constituting the formed thin film is sufficiently carried out.
Each atom is easily arranged stably at a precise lattice position,
In addition, by suppressing the defect of atomic vacancies caused by excessive re-evaporation of atoms,
A preferable temperature range was 0° C. or lower because it was easier to obtain more perfect crystals.

【0017】また、基板材料としては、ガリウム砒素以
外に、格子定数が基板上に生成するカリウム添加硫化カ
ドミウム亜鉛混晶の格子定数と類似しているガリウム燐
、インジウム燐の単結晶を用いてもほぼ同様の結果が得
られた。また、真空の程度は分子線源と基板との距離や
、用いる分子線源の種類によっても異なるが、分子線源
と基板との距離が、分子線の平均自由行程内に入る程度
の真空にすることが好ましく、通常10−5Torr以
下で高真空であれば高真空であるほど好ましい。
In addition to gallium arsenide, single crystals of gallium phosphorus and indium phosphorus, whose lattice constants are similar to those of the potassium-added cadmium zinc sulfide mixed crystal formed on the substrate, may also be used as the substrate material. Almost similar results were obtained. The degree of vacuum varies depending on the distance between the molecular beam source and the substrate and the type of molecular beam source used, but the vacuum is such that the distance between the molecular beam source and the substrate is within the mean free path of the molecular beam. It is preferable to do so, and the higher the vacuum, the higher the vacuum is usually 10 −5 Torr or less.

【0018】本発明方法により、熱や電気的なエネルギ
ーに対しても安定な特性を有し、p型伝導を示す硫化カ
ドミウム亜鉛混晶薄膜を容易に作製することが可能とな
った。現在作製可能なn型伝導を示す硫化カドミウム亜
鉛とのpn接合からは可視短波長域の発光素子が期待で
き、その実用的効果は大きい。
By the method of the present invention, it has become possible to easily produce a cadmium zinc sulfide mixed crystal thin film that has stable characteristics against heat and electrical energy and exhibits p-type conductivity. A light-emitting device in the visible short wavelength range can be expected from a pn junction with cadmium zinc sulfide that exhibits n-type conductivity, which can be produced at present, and its practical effects are significant.

【0019】[0019]

【発明の効果】以上説明したように、本発明方法によれ
ば、不純物源として硫化カドミウム亜鉛との原子の並び
の似ている硫化カリウムを用いる分子線エピタキシー法
により、カリウムの膜中への取り込まれ率が増加し、熱
や電気的なエネルギーによっても容易にカリウムが拡散
されることなく安定した特性を示すp型伝導を示す硫化
カドミウム亜鉛混晶薄膜を容易に作製することが可能と
なる。
As explained above, according to the method of the present invention, potassium can be incorporated into a film by molecular beam epitaxy using potassium sulfide, which has a similar atomic arrangement to cadmium zinc sulfide, as an impurity source. It becomes possible to easily produce a cadmium zinc sulfide mixed crystal thin film exhibiting p-type conductivity and exhibiting stable characteristics without easily diffusing potassium even by heat or electrical energy.

【0020】また、硫黄分子線が硫黄を加熱蒸発させる
か、硫化水素、ジメチル硫黄、ジエチル硫黄、メチルメ
ルカプタンおよびエチルメルカプタンから成る群から選
ばれた少なくとも1種の硫黄化合物を加熱分解して得た
硫黄分子線であり、カドミウム分子線が金属カドミウム
を加熱蒸発させるか、ジメチルカドミウムおよびジエチ
ルカドミウムから成る群から選ばれた少なくとも1種の
カドミウム化合物の蒸気を加熱分解して得た分子線であ
り、亜鉛分子線が金属亜鉛を加熱蒸発させるか、ジメチ
ル亜鉛およびジエチル亜鉛から成る群から選ばれた少な
くとも1種の亜鉛化合物の蒸気を加熱分解して得た分子
線を採用する本発明の好ましい態様により、硫化カドミ
ウム亜鉛混晶薄膜に取り込まれる不必要な不純物成分が
薄膜の性質に悪影響を及ぼさない。
[0020] Furthermore, the sulfur molecular beam is obtained by heating and evaporating sulfur or by thermally decomposing at least one sulfur compound selected from the group consisting of hydrogen sulfide, dimethyl sulfur, diethyl sulfur, methyl mercaptan, and ethyl mercaptan. It is a sulfur molecular beam, and the cadmium molecular beam is a molecular beam obtained by heating and vaporizing metal cadmium or thermally decomposing the vapor of at least one cadmium compound selected from the group consisting of dimethyl cadmium and diethyl cadmium, According to a preferred embodiment of the present invention, the zinc molecular beam is obtained by heating and evaporating metallic zinc or thermally decomposing the vapor of at least one zinc compound selected from the group consisting of dimethylzinc and diethylzinc. , unnecessary impurity components incorporated into the cadmium-zinc sulfide mixed crystal thin film do not adversely affect the properties of the thin film.

【0021】また、基板としてガリウム砒素、ガリウム
燐、インジウム燐のうちいずれかの単結晶を採用する本
発明の好ましい態様により、これらの基板の格子定数が
基板上に生成するカリウム添加硫化カドミウム亜鉛混晶
の格子定数と類似しているので、純粋な単結晶が生成し
やすい。また、更に、基板温度を200℃以上500℃
以下にする本発明の好ましい態様により、生成した薄膜
を構成する原子のマイグレーションが十分に行われ、各
原子が正確な格子位置に安定して配置される。また原子
の再蒸発が過剰になる事による原子の空孔が生じる欠点
が抑制されるので、より完全な結晶が得やすい。
Further, according to a preferred embodiment of the present invention in which a single crystal of gallium arsenide, gallium phosphide, or indium phosphide is used as the substrate, the lattice constant of these substrates is lower than that of the potassium-doped cadmium zinc sulfide mixture formed on the substrate. Since the lattice constant is similar to that of crystals, pure single crystals can be easily produced. Furthermore, the substrate temperature should be increased to 200°C or higher and 500°C.
According to the preferred embodiments of the present invention described below, the atoms constituting the produced thin film are sufficiently migrated, and each atom is stably arranged at a precise lattice position. Further, since the defect of atomic vacancies caused by excessive re-evaporation of atoms is suppressed, it is easier to obtain more perfect crystals.

【図面の簡単な説明】[Brief explanation of the drawing]

【図1】本発明の一実施例におけるカリウム添加硫化カ
ドミウム亜鉛混晶薄膜を作製する分子線エピタキシャル
装置の構造を示す概略図である。
FIG. 1 is a schematic diagram showing the structure of a molecular beam epitaxial apparatus for producing a potassium-added cadmium-zinc sulfide mixed crystal thin film in one embodiment of the present invention.

【図2】本発明の一実施例におけるカリウム添加硫化カ
ドミウム亜鉛混晶薄膜の温度12Kにおけるフォトルミ
ネッセンススペクトルを示す図である。
FIG. 2 is a diagram showing a photoluminescence spectrum of a potassium-added cadmium-zinc sulfide mixed crystal thin film at a temperature of 12K in an example of the present invention.

【符号の説明】[Explanation of symbols]

1  真空容器 2  超高真空排気装置 3  基板ホルダー 4  基板 5  硫化カドミウム亜鉛混晶薄膜 6a  ルツボに入った金属カドミウム6b  シャッ
ター 6c  カドミウム分子線 7a  ルツボに入った金属亜鉛 7b  シャッター 7c  亜鉛分子線 8a  ルツボに入った硫黄 8b  シャッター 8c  硫黄分子線 9a  ルツボに入った硫化カリウム 9b  シャッター 9c  硫化カリウム分子線
1 Vacuum container 2 Ultra-high vacuum evacuation device 3 Substrate holder 4 Substrate 5 Cadmium-zinc sulfide mixed crystal thin film 6a Metal cadmium in the crucible 6b Shutter 6c Cadmium molecular beam 7a Metal zinc in the crucible 7b Shutter 7c Zinc molecular beam 8a In the crucible Sulfur entered 8b Shutter 8c Sulfur molecular beam 9a Potassium sulfide 9b entered the crucible Shutter 9c Potassium sulfide molecular beam

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】  真空中で、基板表面に硫黄分子線とカ
ドミウム分子線と亜鉛分子線を照射する分子線エピタキ
シー法で硫化カドミウム亜鉛混晶薄膜を製造するに際し
、加熱蒸発させた硫化カリウムの分子線を同時に照射し
て混晶薄膜にカリウムを添加することを特徴とするカリ
ウム添加硫化カドミウム亜鉛混晶薄膜の製造方法。
Claim 1: When producing a cadmium zinc sulfide mixed crystal thin film using a molecular beam epitaxy method in which the substrate surface is irradiated with a sulfur molecular beam, a cadmium molecular beam, and a zinc molecular beam in a vacuum, potassium sulfide molecules are heated and evaporated. A method for producing a potassium-added cadmium-zinc sulfide mixed crystal thin film, characterized in that potassium is added to the mixed crystal thin film by simultaneously irradiating the same with radiation.
【請求項2】  硫黄分子線が硫黄を加熱蒸発させるか
、硫化水素、ジメチル硫黄、ジエチル硫黄、メチルメル
カプタンおよびエチルメルカプタンから成る群から選ば
れた少なくとも1種の硫黄化合物を加熱分解して得た硫
黄分子線であり、カドミウム分子線が金属カドミウムを
加熱蒸発させるか、ジメチルカドミウムおよびジエチル
カドミウムから成る群から選ばれた少なくとも1種のカ
ドミウム化合物の蒸気を加熱分解して得た分子線であり
、亜鉛分子線が金属亜鉛を加熱蒸発させるか、ジメチル
亜鉛およびジエチル亜鉛から成る群から選ばれた少なく
とも1種の亜鉛化合物の蒸気を加熱分解して得た分子線
である請求項1記載のカリウム添加硫化カドミウム亜鉛
混晶薄膜の製造方法。
[Claim 2] The sulfur molecular beam is obtained by thermally evaporating sulfur or by thermally decomposing at least one sulfur compound selected from the group consisting of hydrogen sulfide, dimethyl sulfur, diethyl sulfur, methyl mercaptan, and ethyl mercaptan. It is a sulfur molecular beam, and the cadmium molecular beam is a molecular beam obtained by heating and vaporizing metal cadmium or thermally decomposing the vapor of at least one cadmium compound selected from the group consisting of dimethyl cadmium and diethyl cadmium, The potassium addition according to claim 1, wherein the zinc molecular beam is a molecular beam obtained by heating and evaporating metallic zinc or thermally decomposing the vapor of at least one zinc compound selected from the group consisting of dimethylzinc and diethylzinc. A method for producing a cadmium zinc sulfide mixed crystal thin film.
【請求項3】  基板がガリウム砒素、ガリウム燐、イ
ンジウム燐のうちいずれかの単結晶である請求項1記載
のカリウム添加硫化カドミウム亜鉛混晶薄膜の製造方法
3. The method for producing a potassium-doped cadmium zinc sulfide mixed crystal thin film according to claim 1, wherein the substrate is a single crystal of gallium arsenide, gallium phosphorus, or indium phosphorus.
【請求項4】  基板温度が200℃以上500℃以下
である請求項1から3のいずれかに記載のカリウム添加
硫化カドミウム亜鉛混晶薄膜の製造方法。
4. The method for producing a potassium-added cadmium zinc sulfide mixed crystal thin film according to claim 1, wherein the substrate temperature is 200° C. or higher and 500° C. or lower.
JP3097480A 1991-04-26 1991-04-26 Manufacture of potassium sulfide added cadmium-zinc mixed crystal thin film Pending JPH04325499A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3097480A JPH04325499A (en) 1991-04-26 1991-04-26 Manufacture of potassium sulfide added cadmium-zinc mixed crystal thin film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3097480A JPH04325499A (en) 1991-04-26 1991-04-26 Manufacture of potassium sulfide added cadmium-zinc mixed crystal thin film

Publications (1)

Publication Number Publication Date
JPH04325499A true JPH04325499A (en) 1992-11-13

Family

ID=14193450

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3097480A Pending JPH04325499A (en) 1991-04-26 1991-04-26 Manufacture of potassium sulfide added cadmium-zinc mixed crystal thin film

Country Status (1)

Country Link
JP (1) JPH04325499A (en)

Similar Documents

Publication Publication Date Title
JP3098773B2 (en) Preparation and doping method of highly insulating single crystal gallium nitride thin film
US3751310A (en) Germanium doped epitaxial films by the molecular beam method
JP3540275B2 (en) P-type ZnO single crystal and method for producing the same
US6896731B1 (en) P-type single crystal zinc-oxide having low resistivity and method for preparation thereof
US5425860A (en) Pulsed energy synthesis and doping of silicon carbide
Zhang et al. Sb2Se3 films fabricated by thermal evaporation and post annealing
US5187116A (en) Process for preparing electroluminescent device of compound semiconductor
US5474622A (en) Solar cell having chalcopyrite semiconductor film
US5100832A (en) Process for preparing epitaxial compound semiconductor
Greene et al. Growth of single crystal GaAs and metastable (GaSb) 1− xGexAlloys by sputter deposition: Ion-surface interaction effects
Georgobiani et al. Methods of high-energy chemistry in the technology of wide-gap chalcogenide semiconductors
JPH0647515B2 (en) Compound semiconductor epitaxial growth method
Hartmann Vapour phase epitaxy of II–VI compounds: A review
Akiyama et al. MOCVD growth of β-FeSi2 film on modified Si surface by silver and enhancement of luminescence
JPS6226568B2 (en)
JPH0334534A (en) Manufacture of phosphorus-doped ii-vi compound semiconductor
JPS62119193A (en) Production of semiconductor
RAMIREZ SANCHEZ OPTOELECTRONIC PROPERTIES OF CU (IN, GA) SE2 SINGLE CRYSTALS WITH ALKALI POSTDEPOSITION TREATMENTS
JPS6270290A (en) Production of semiconductor
Kyriakos et al. Growth and some properties of Ga23PS3 single crystals
JP2671848B2 (en) 2-6 Semiconductor impurity addition method
JPS63303899A (en) Production of semiconductor
JPH07517B2 (en) Semiconductor crystal thin film manufacturing equipment
JPS62271438A (en) Semiconductor device and manufacture thereof
JPH03160734A (en) Manufacture of arsenic added ii-vi compound semiconductor