JPH043263Y2 - - Google Patents

Description

[Detailed description of the invention] [Industrial application field] This invention relates to a probe pin for an automatic printed circuit board inspection machine.

[Conventional technology]

FIG. 3 is a perspective view showing a probe pin of a conventional automatic printed circuit board inspection machine, and FIG. 4 is a plan view thereof. In the figure, 1 is a probe pin, and the head 3 of the cylindrical main body 2 has a pyramidal shape. A large number of probe pins 1 are arranged on a grid with an interval D of 1.27 mm.

The probe pins 1 arranged as above are
By contacting the through holes (not shown) of the printed circuit board on the 1.27 mm grid and passing a current between the probe pins 1, conduction or non-conduction between the through holes of the printed circuit board is detected.

[Problem that the invention attempts to solve]

The probe pins of conventional printed circuit board automatic inspection machines are configured as described above, so in order to prevent the probe pins 1 from coming into contact with each other, it is necessary to reduce the diameter of the probe pin 1 to φ0.8 mm or less. It was hot. For this reason, there was a problem in that it was not possible to inspect component holes, which were made up of through holes with a diameter of 0.8 to 1.1 mm, which accounted for most of the through holes in printed circuit boards.

This invention was made to solve the above problems, and the purpose is to provide a probe pin for an automatic printed circuit board inspection machine that can prevent contact between probe pins and inspect component holes. shall be.

[Means for solving problems]

The probe pin for an automatic printed circuit board inspection machine of this invention is a probe pin for an automatic printed circuit board inspection machine that checks electrical continuity between through-holes on a printed circuit board. , and are arranged on a lattice in a diagonal direction with respect to the lattice direction.

[Effect]

The probe pins of the automatic printed circuit board inspection machine of this invention come into contact with the through holes of the printed circuit board and allow current to flow between the probe pins, thereby detecting conduction or non-conduction between the through holes of the printed circuit board. In this case, the longitudinal length of the probe pins can be made larger than the diameter of conventional probe pins without contact between the probe pins, making it possible to inspect component holes consisting of through holes of φ0.8 to 1.1 mm. be.

〔Example〕

An embodiment of this invention will be described below with reference to the drawings. FIG. 1 is a perspective view showing an embodiment of this invention;
FIG. 2 is a plan view of the probe pin 1. In the figure, the probe pin 1 has a thin plate-like main body 2 and a pyramid-like head 3.
It has a shape similar to that of a conventional probe pin 1 sliced thinly in the vertical direction. The probe pins 1 have a length L in the longitudinal direction of 1.3 mm, and are arranged substantially parallel to the grid at an angle of about 45° diagonally to the grid with an interval D of 1.27 mm.

In the probe pin of the automatic printed circuit board inspection machine configured as described above, the probe pin 1 comes into contact with the through hole part (not shown) of the printed circuit board on the 1.27 mm grid, as in the conventional one. By passing a current between the probe pins 1, conduction or non-conduction between the through holes of the printed circuit board is detected. In this case, the length L in the longitudinal direction of the probe pin 1 is 1.3 mm, which is larger than the diameter of the conventional one.
Therefore, inspection of component holes consisting of through holes with a diameter of 0.8 to 1.1 mm is also possible. Even if L is made larger than the diameter of the conventional one, contact between the probe pins 1 does not occur because the probe pins 1 are arranged obliquely with respect to the lattice direction.

In the above embodiment, the head 3 of the probe pin 1 is shaped like a square pyramid, but it may also be shaped like a triangular pyramid, a polygonal pyramid larger than a pentagonal pyramid, or a truncated pyramid.

[Effect of idea]

As described above, according to this invention, the probe pin of an automatic printed circuit board inspection machine is formed to have a thin body and a pyramidal or truncated pyramidal head, and is placed on a grid at an angle with respect to the grid direction. Since the probe pins are arranged in the same direction, there is no contact between the probe pins, and the
It is possible to inspect component holes consisting of 1.1mm through holes.

[Brief explanation of the drawing]

Fig. 1 is a perspective view showing an embodiment of this invention, Fig. 2 is a plan view thereof, Fig. 3 is a perspective view of a probe pin of a conventional automatic printed circuit board inspection machine, and Fig. 4 is a plan view thereof. . In each figure, the same reference numerals indicate the same or corresponding parts; 1 is the probe pin, 2 is the main body, and 3 is the head.

Claims (1)

[Claims for Utility Model Registration] (1) A probe pin for an automatic printed circuit board inspection machine that checks electrical continuity between through holes in a printed circuit board, the probe pin has a thin plate-like body and a pyramid-shaped or truncated pyramid-shaped head. What is claimed is: 1. A probe pin for an automatic printed circuit board inspection machine, characterized in that the probe pin is formed to have a section and is arranged on a lattice in a diagonal direction with respect to the lattice direction. (2) The probe pin for an automatic printed circuit board inspection machine according to claim 1, wherein the arrangement direction of the probe pin is approximately 45° with respect to the grid direction.