JPH04332185A - Forward emitted light detection mechanism and light intensity adjustment method for semiconductor laser - Google Patents
Forward emitted light detection mechanism and light intensity adjustment method for semiconductor laserInfo
- Publication number
- JPH04332185A JPH04332185A JP3101321A JP10132191A JPH04332185A JP H04332185 A JPH04332185 A JP H04332185A JP 3101321 A JP3101321 A JP 3101321A JP 10132191 A JP10132191 A JP 10132191A JP H04332185 A JPH04332185 A JP H04332185A
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor laser
- light
- apc
- emitted light
- light detection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title claims description 34
- 238000001514 detection method Methods 0.000 title claims description 30
- 238000000034 method Methods 0.000 title claims description 10
- 230000003287 optical effect Effects 0.000 claims description 30
- 238000010586 diagram Methods 0.000 description 21
- 210000001747 pupil Anatomy 0.000 description 10
- 230000005855 radiation Effects 0.000 description 1
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- Semiconductor Lasers (AREA)
- Optical Head (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【0001】0001
【産業上の利用分野】本発明は、光メモリ装置の半導体
レーザ前方出射光検出に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to detection of forward emitted light from a semiconductor laser in an optical memory device.
【0002】0002
【従来の技術】従来の光学ヘッドの概略図を図9に示し
、図に基づいて説明する。半導体レーザ901から出射
した発散光はコリメータレンズ902により平行光とさ
れビームスプリッター903により光量検出部907、
と対物レンズ905で記録媒体904上に集光される光
路に分けられる。また、記録媒体904により反射され
た光はビームスプリッター903により信号検出部90
6に入射し、サーボに用いられるエラー信号、データの
再生信号を得る。2. Description of the Related Art A schematic diagram of a conventional optical head is shown in FIG. 9, and will be explained based on the diagram. The diverging light emitted from the semiconductor laser 901 is converted into parallel light by a collimator lens 902, and is then converted into a parallel light by a beam splitter 903.
and an optical path that is focused onto a recording medium 904 by an objective lens 905. Further, the light reflected by the recording medium 904 is passed through the beam splitter 903 to the signal detection unit 90.
6 to obtain an error signal used for servo and a data reproduction signal.
【0003】光メモリー装置においては、温度、戻り光
の変化によりレーザ出射光量を変化させない為に、出射
光量を検出しレーザにフィードバックをかけ出射光量を
一定にする、オート・パワー・コントロール(APC)
というサーボループが組まれている。APCに用いられ
る光量検出は、図9のビームスプリッター903により
半導体レーザから出射した光を光量検出部に導き行われ
る。In optical memory devices, auto power control (APC) is used to detect the amount of emitted light and apply feedback to the laser to keep the amount of emitted light constant, so that the amount of laser emitted light does not change due to changes in temperature or returned light.
It has a servo loop called. The light amount detection used in APC is performed by guiding the light emitted from the semiconductor laser to the light amount detection section by the beam splitter 903 in FIG.
【0004】また、APCによる半導体レーザの駆動は
、図10の概略図に示すようになっている。半導体レー
ザ951からの出射光をAPC用フォトダイオード95
4で検出し、その出力を電流電圧変換部952で電圧に
変換し、次の段の出力調整部953で出力当たり規定値
になるようボリュウムにより出力を規格化する。この出
力を半導体レーザ駆動回路955に負帰還をかける事に
よりAPC動作を行っている。Further, driving of a semiconductor laser by APC is shown in a schematic diagram in FIG. 10. The light emitted from the semiconductor laser 951 is transferred to the APC photodiode 95.
4, the output is converted into a voltage by a current-voltage converter 952, and the output is normalized by the volume so that the output adjuster 953 in the next stage has a specified value per output. APC operation is performed by applying negative feedback to this output to the semiconductor laser drive circuit 955.
【0005】[0005]
【発明が解決しようとする課題】しかし、光学ヘッドの
小型化及び、光学部品の簡略化、集積化に伴いAPCの
ための光量検出部が相対的に大きくなり小型化を阻む大
きな要因となるという問題点が有った。また、APC駆
動回路に出力調整部を持つ事により、個々の光学ヘッド
間で、APC検出部の帯域、S/N等のばらつきが発生
した。[Problems to be Solved by the Invention] However, as optical heads become smaller and optical components become simpler and more integrated, the light amount detection section for APC becomes relatively large, which becomes a major factor hindering miniaturization. There was a problem. Further, since the APC drive circuit includes an output adjustment section, variations in the band, S/N, etc. of the APC detection section occur between individual optical heads.
【0006】本発明は、上記の問題点を解決するもので
、その目的とするところは、光学ヘッドをより小型化し
、しかも、回路での出力調整を必要としない光メモリー
装置を提供する事にある。The present invention solves the above-mentioned problems, and its purpose is to provide an optical memory device in which the optical head is made smaller and does not require output adjustment in a circuit. be.
【0007】[0007]
【課題を解決するための手段】本発明による半導体レー
ザ用前方出射光検出機構及び光量調整方法は、(1)
半導体レーザを用いた光メモリドライブの光学ヘッド
で,半導体レーザ出射光の光出力を一定に保つ(APC
)ための出射光量検出において、半導体レーザの前方出
射光の内、コリメータレンズ又は対物レンズの有効径以
外に放射される光を検出する機構を有する事を特徴とす
る。[Means for Solving the Problems] The forward emitted light detection mechanism and light amount adjustment method for a semiconductor laser according to the present invention are as follows: (1)
The optical head of an optical memory drive using a semiconductor laser keeps the optical output of the semiconductor laser emitted light constant (APC
) is characterized by having a mechanism for detecting light emitted outside the effective diameter of the collimator lens or the objective lens among the forward emitted light of the semiconductor laser.
【0008】(2) 前記光検出機構にコリメータレ
ンズ又は対物レンズの有効径外で且つ半導体レーザ出射
光の存在する範囲内にプリズムを設置する事を特徴とす
る。
(3) 前記プリズムを光検出素子と同一部材とする
、又は、前記プリズムを光検出素子に接着する事を特徴
とする。(2) The light detection mechanism is characterized in that a prism is installed outside the effective diameter of the collimator lens or the objective lens and within the range where the semiconductor laser emitted light exists. (3) The prism is made of the same member as the photodetecting element, or the prism is bonded to the photodetecting element.
【0009】(4) 半導体レーザ前方出射光検出機
構を、コリメータレンズ鏡筒に取付け、又は、同一部材
で構成し、コリメータレンズと同時に移動する事を特徴
とする。(4) The semiconductor laser forward emitted light detection mechanism is attached to the collimator lens barrel, or is constructed of the same member, and moves simultaneously with the collimator lens.
【0010】(5) ホログラム素子を用いてサーボ
エラー信号、又は、再生信号を得る光学ヘッドにおいて
、ホログラム素子により回折された光をAPC用光量検
出として用いる事を特徴とする。(5) An optical head that uses a hologram element to obtain a servo error signal or a reproduction signal is characterized in that the light diffracted by the hologram element is used to detect the amount of light for APC.
【0011】(6) APCに用いる光検出素子を移
動させ検出光量調整を行う事を特徴とする。(6) A feature is that the amount of detected light is adjusted by moving the photodetecting element used for APC.
【0012】(7) APCに用いる光検出素子を、
光出射方向と垂直方向に移動させ、検出光量調整を行う
事を特徴とする。(7) The photodetection element used for APC is
It is characterized by adjusting the amount of detected light by moving it in a direction perpendicular to the light emission direction.
【0013】(8) APCに用いるプリズムと光検
出素子を、レンズの光軸と平行方向に移動させ、検出光
量調整を行う事を特徴とする。(8) A feature is that the amount of detected light is adjusted by moving the prism and photodetecting element used in APC in a direction parallel to the optical axis of the lens.
【0014】[0014]
(実施例1)図1は、本発明による第1の実施例におけ
るAPC用光検出部の概略図である。半導体レーザ10
5より出射した光は、108に示すような広がりを持つ
。その放射光がコリメータレンズ103に入射する事に
よりコリメータレンズの入射瞳径101内の放射状の光
束106のみが平行化され情報の記録再生に寄与する。
半導体レーザからの放射光でコリメータレンズの入射瞳
外の放射光107をAPC用光検出センサー102に取
り込む。これによりAPC用光検出素子で拾う光が従来
であれば捨てている光であるので、記録再生及びサーボ
エラー信号検出には全く影響せず、しかも、光量の損失
も無くAPC用光検出できる。また、半導体レーザの放
射角の大きい方向(接合面に垂直方向)にAPC用光検
出素子を配置する事により、より多くの光量をAPC用
光検出部に入射する事が出来安定した周波数特性の良い
APC動作が得られる。(Embodiment 1) FIG. 1 is a schematic diagram of a photodetector for APC in a first embodiment of the present invention. Semiconductor laser 10
The light emitted from 5 has a spread as shown at 108. When the emitted light enters the collimator lens 103, only the radial light beam 106 within the entrance pupil diameter 101 of the collimator lens is collimated and contributes to recording and reproducing information. Emitted light 107 from the semiconductor laser outside the entrance pupil of the collimator lens is taken into the APC light detection sensor 102. As a result, the light picked up by the APC photodetector element is the light that would have been discarded in the conventional case, so it does not affect recording/reproduction and servo error signal detection at all, and moreover, APC light can be detected without loss of light quantity. In addition, by arranging the APC photodetector in the direction of the large radiation angle of the semiconductor laser (perpendicular to the bonding surface), more light can be incident on the APC photodetector, resulting in stable frequency characteristics. Good APC operation can be obtained.
【0015】(実施例2)図2は、本発明における第2
の実施例におけるAPC用光検出部を示す概略図である
。半導体レーザ205からの放射光でコリメータレンズ
209の入射瞳径外のエリア207内に全反射プリズム
210を設置し光路206を通り光検出素子202に入
射させる。プリズム210により光検出素子を光軸に平
行に設置する事が出来、光検出素子の大きさの制限が無
くなり、しかも薄型にする事ができる構造とした。(Embodiment 2) FIG. 2 shows the second embodiment of the present invention.
FIG. 2 is a schematic diagram showing an APC photodetection section in an embodiment of the present invention. A total reflection prism 210 is installed in an area 207 outside the entrance pupil diameter of the collimator lens 209, and the emitted light from the semiconductor laser 205 passes through the optical path 206 and enters the photodetector element 202. The prism 210 allows the photodetection element to be installed parallel to the optical axis, eliminating any restrictions on the size of the photodetection element, and allowing for a thin structure.
【0016】(実施例3)図3は、本発明における第3
の実施例におけるAPC用光検出部を示す概略図である
。半導体レーザ305からの放射光でコリメータレンズ
309の入射瞳径外のエリア307内に全反射プリズム
310を設置し光路306を通り光検出素子302に入
射させる。ここでプリズム310と光検出素子302を
接着してある。プリズム310は光検出素子と同一部材
となっているため、新たなプリズム固定部材を必要とせ
ず非常にシンプルな構造となる。(Embodiment 3) FIG. 3 shows the third embodiment of the present invention.
FIG. 2 is a schematic diagram showing an APC photodetection section in an embodiment of the present invention. A total reflection prism 310 is installed in an area 307 outside the entrance pupil diameter of the collimator lens 309, and the emitted light from the semiconductor laser 305 passes through an optical path 306 and enters the photodetector element 302. Here, the prism 310 and the photodetecting element 302 are bonded together. Since the prism 310 is made of the same member as the photodetecting element, a new prism fixing member is not required, resulting in a very simple structure.
【0017】(実施例4)図4は、本発明における第4
の実施例におけるAPC用光検出部を示す概略図である
。半導体レーザ405からの放射光でコリメータレンズ
409の入射瞳径外のエリア407内に全反射プリズム
410を設置し光路406を通り光検出素子402に入
射させる。ここでプリズム410と光検出素子402及
びコリメータレンズ鏡筒411を同一部材としてある。
従って、プリズム410、光検出素子402は光検出素
子とを固定する部材をコリメートレンズの鏡筒411と
兼用としているため、APC用光検出部が非常にシンプ
ルになると同時に小型化する事が出来た。また、APC
用光検出部がコリメータレンズの鏡筒に予め固定されて
いるためプリズム410がコリメータレンズの入射瞳径
内に入る事がなく、無調整で取り付ける事ができる。(Embodiment 4) FIG. 4 shows the fourth embodiment of the present invention.
FIG. 2 is a schematic diagram showing an APC photodetection section in an embodiment of the present invention. A total reflection prism 410 is installed in an area 407 outside the entrance pupil diameter of the collimator lens 409, and the emitted light from the semiconductor laser 405 passes through an optical path 406 and enters the photodetector element 402. Here, the prism 410, the photodetector element 402, and the collimator lens barrel 411 are made of the same member. Therefore, since the member for fixing the prism 410 and the photodetecting element 402 to the photodetecting element also serves as the lens barrel 411 of the collimating lens, the APC photodetecting unit can be made very simple and at the same time downsized. . Also, APC
Since the optical detection section is fixed in advance to the lens barrel of the collimator lens, the prism 410 does not enter the entrance pupil diameter of the collimator lens, and can be attached without adjustment.
【0018】(実施例5)図5は、本発明における第5
の実施例におけるAPC用光検出部を示す概略図である
。半導体レーザ501からの放射光がコリメータレンズ
503により平行化され、ホログラム素子504に入射
する。ホログラム504により回折の影響を受けなかっ
た光束509はそのまま対物レンズにより記録媒体上に
集光され記録再生及びエラー信号検出に用いられる。
一方、コリメーターレンズを通過し、ホログラム素子5
04で開設した光は光軸に対しある回折角を持ち508
に示す光路を進む。光束508の中で且つ光束509の
エリア外にAPC用光検出素子510を設置してある。(Embodiment 5) FIG. 5 shows the fifth embodiment of the present invention.
FIG. 2 is a schematic diagram showing an APC photodetection section in an embodiment of the present invention. Emitted light from a semiconductor laser 501 is collimated by a collimator lens 503 and enters a hologram element 504 . A light beam 509 that has not been affected by diffraction by the hologram 504 is directly focused onto the recording medium by the objective lens and used for recording/reproduction and error signal detection. On the other hand, it passes through the collimator lens and the hologram element 5
The light opened at 04 has a certain diffraction angle with respect to the optical axis and is 508
Proceed along the optical path shown in . An APC photodetector element 510 is installed within the light beam 508 and outside the area of the light beam 509.
【0019】(実施例6)図6は、本発明における第6
の実施例におけるAPC用光検出部の調整方法を示す概
略図である。半導体レーザ601からの放射光でコリメ
ータレンズ603の入射瞳径外のエリア604内に光検
出素子605を設置し、606方向に移動調整できる構
造とした。光検出素子605を方向606に移動調整す
る事によりセンサーがコリメートレンズ603の入射瞳
径内607に侵入させず、しかも、光検出素子入射光量
を調整できるため、ブロック図8に示すようにAPC動
作回路上に出力調整の無いAPC動作回路が組める。(Embodiment 6) FIG. 6 shows the sixth embodiment of the present invention.
It is a schematic diagram showing the adjustment method of the light detection part for APC in the example. A photodetector element 605 is installed in an area 604 outside the entrance pupil diameter of the collimator lens 603 using emitted light from the semiconductor laser 601, and has a structure that can be adjusted by moving in 606 directions. By adjusting the movement of the photodetecting element 605 in the direction 606, the sensor does not enter the entrance pupil diameter 607 of the collimating lens 603, and the amount of light incident on the photodetecting element can be adjusted, so that APC operation is performed as shown in block diagram 8. An APC operation circuit without output adjustment can be built on the circuit.
【0020】(実施例7)図7は、本発明における第7
の実施例におけるAPC用光検出部の調整方法を示す概
略図である。半導体レーザ701からの放射光でコリメ
ータレンズ702の入射瞳径外のエリア703内にプリ
ズム704、光検出素子705を設置し、709方向に
移動調整できる構造とした。光検出素子705と一体に
なったプリズム704を方向709に移動調整する事に
より、点線で示すプリズム706、光検出素子708の
位置に移動でき、光の取り込む量を調整出来る。従って
、プリズムの先端がコリメートレンズ702の入射瞳径
内710に侵入させず、しかも、移動方向が光軸と平行
であるので簡単な調整機構で光検出素子入射光量を調整
できるため、ブロック図8に示すようにAPC動作回路
上に出力調整の無いAPC動作回路が組める。(Embodiment 7) FIG. 7 shows the seventh embodiment of the present invention.
It is a schematic diagram showing the adjustment method of the light detection part for APC in the example. A prism 704 and a photodetector element 705 are installed in an area 703 outside the entrance pupil diameter of a collimator lens 702 using emitted light from a semiconductor laser 701, and are configured to be movable and adjustable in 709 directions. By moving and adjusting the prism 704 integrated with the photodetecting element 705 in the direction 709, the prism 706 and the photodetecting element 708 can be moved to the positions indicated by dotted lines, and the amount of light taken in can be adjusted. Therefore, the tip of the prism does not enter the entrance pupil diameter 710 of the collimating lens 702, and since the moving direction is parallel to the optical axis, the amount of light incident on the photodetecting element can be adjusted with a simple adjustment mechanism. As shown in the figure, an APC operation circuit without output adjustment can be built on an APC operation circuit.
【0021】[0021]
【発明の効果】以上説明したように、本発明によれば光
メモリー装置の光学ヘッドを小型化し、ホログラム素子
などを用い半導体レーザと信号検出素子を一体にした構
造においても、APC用光検出の為に新たな空間を必要
とせず、しかも、従来捨てている光を検出しているため
、光利用効率及び信号検出には全く影響しない安定した
APC用光検出ができる。また、本発明によるAPC用
光検出部で調整を行う事により、非常に簡単な機構で光
量調整が正確に出来、しかも、APC駆動回路の出力ゲ
イン調整を省く事ができる。As explained above, according to the present invention, the optical head of an optical memory device can be miniaturized, and even in a structure in which a semiconductor laser and a signal detection element are integrated using a hologram element, etc., the optical head for APC can be easily detected. This method does not require a new space, and since it detects light that would otherwise have been discarded, stable light detection for APC can be achieved that does not affect the light utilization efficiency or signal detection at all. Further, by performing the adjustment using the APC photodetector according to the present invention, the light amount can be adjusted accurately with a very simple mechanism, and furthermore, the output gain adjustment of the APC drive circuit can be omitted.
【図1】本発明による第1の実施例に基づくAPC用光
検出部を示す概略図。FIG. 1 is a schematic diagram showing a photodetector for APC according to a first embodiment of the present invention.
【図2】本発明による第2の実施例に基づくAPC用光
検出部を示す概略図。FIG. 2 is a schematic diagram showing a photodetector for APC according to a second embodiment of the present invention.
【図3】本発明による第3の実施例に基づくAPC用光
検出部を示す概略図。FIG. 3 is a schematic diagram showing a photodetector for APC according to a third embodiment of the present invention.
【図4】本発明による第4の実施例に基づくAPC用光
検出部を示す概略図。FIG. 4 is a schematic diagram showing a photodetector for APC according to a fourth embodiment of the present invention.
【図5】本発明による第5の実施例に基づくAPC用光
検出部を示す概略図。FIG. 5 is a schematic diagram showing a photodetector for APC according to a fifth embodiment of the present invention.
【図6】本発明による第6の実施例に基づくAPC用光
検出素子の調整方法を示す概略図。FIG. 6 is a schematic diagram showing a method for adjusting an APC photodetector element according to a sixth embodiment of the present invention.
【図7】本発明による第7の実施例に基づくAPC用光
検出素子の調整方法を示す概略図。FIG. 7 is a schematic diagram showing a method for adjusting an APC photodetector element according to a seventh embodiment of the present invention.
【図8】本発明によるAPC駆動回路を示すブロック図
。FIG. 8 is a block diagram showing an APC drive circuit according to the present invention.
【図9】従来のAPC用光検出部を示す概略図。FIG. 9 is a schematic diagram showing a conventional photodetector for APC.
【図10】従来のAPC駆動回路を示すブロック図。FIG. 10 is a block diagram showing a conventional APC drive circuit.
Claims (8)
ブの光学ヘッドで,半導体レーザ出射光の光出力を一定
に保つオート・パワー・コントロール(以下、APCと
いう)ための出射光量検出において、半導体レーザの前
方出射光の内、コリメータレンズ又は対物レンズの有効
径以外に放射される光を検出する機構を有する事を特徴
とする半導体レーザ用前方出射光検出機構。[Claim 1] In an optical head of an optical memory drive using a semiconductor laser, in detecting the amount of emitted light for automatic power control (hereinafter referred to as APC) to keep the optical output of the semiconductor laser emitted light constant, A forward emitted light detection mechanism for a semiconductor laser, comprising a mechanism for detecting light emitted outside the effective diameter of a collimator lens or an objective lens among the emitted light.
は対物レンズの有効径外で且つ半導体レーザ出射光の存
在する範囲内にプリズムを設置する事を特徴とする請求
項1記載の半導体レーザ用前方出射光検出機構。2. The forward emitting device for a semiconductor laser according to claim 1, wherein a prism is installed in the photodetection mechanism outside the effective diameter of the collimator lens or the objective lens and within a range where the semiconductor laser emitted light exists. Light detection mechanism.
とする、又は、前記プリズムを光検出素子に接着する事
を特徴とする請求項1記載の半導体レーザ用前方出射光
検出機構。3. The forward emitted light detection mechanism for a semiconductor laser according to claim 1, wherein the prism is made of the same member as a photodetection element, or the prism is bonded to the photodetection element.
コリメータレンズ鏡筒に取付け、又は、同一部材で構成
し、コリメータレンズと同時に移動する事を特徴とする
請求項1記載の半導体レーザ用前方出射光検出機構。4. A semiconductor laser forward emitted light detection mechanism,
2. The forward emitted light detection mechanism for a semiconductor laser according to claim 1, wherein the mechanism is attached to a collimator lens barrel or is constructed of the same member and moves simultaneously with the collimator lens.
信号、又は、再生信号を得る光学ヘッドにおいて、ホロ
グラム素子により回折された光をAPC用光量検出とし
て用いる事を特徴とする半導体レーザ用前方出射光検出
機構。5. Forward emitted light detection for a semiconductor laser, characterized in that, in an optical head that uses a hologram element to obtain a servo error signal or a reproduction signal, the light diffracted by the hologram element is used as light amount detection for APC. mechanism.
検出光量調整を行う事を特徴とする請求項1または請求
項3記載の光量調整方法。6. The light amount adjustment method according to claim 1, wherein the amount of detected light is adjusted by moving a photodetecting element used for APC.
方向と垂直方向に移動させ、検出光量調整を行う事を特
徴とする請求項1記載の半導体レーザ用前方出射光検出
機構の、請求項6記載の光量調整方法。7. The forward emitted light detection mechanism for a semiconductor laser according to claim 1, wherein the light detection element used for APC is moved in a direction perpendicular to the light emission direction to adjust the amount of detected light. 6. The light amount adjustment method described in 6.
を、レンズの光軸と平行方向に移動させ、検出光量調整
を行う事を特徴とする請求項3記載の半導体レーザ用前
方出射光検出機構の、請求項6記載の光量調整方法。8. The forward emitted light detection mechanism for a semiconductor laser according to claim 3, wherein the prism and the light detection element used for APC are moved in a direction parallel to the optical axis of the lens to adjust the amount of detected light. , The light amount adjustment method according to claim 6.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3101321A JPH04332185A (en) | 1991-05-07 | 1991-05-07 | Forward emitted light detection mechanism and light intensity adjustment method for semiconductor laser |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3101321A JPH04332185A (en) | 1991-05-07 | 1991-05-07 | Forward emitted light detection mechanism and light intensity adjustment method for semiconductor laser |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH04332185A true JPH04332185A (en) | 1992-11-19 |
Family
ID=14297553
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3101321A Pending JPH04332185A (en) | 1991-05-07 | 1991-05-07 | Forward emitted light detection mechanism and light intensity adjustment method for semiconductor laser |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH04332185A (en) |
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6687272B2 (en) | 2001-09-18 | 2004-02-03 | Kabushiki Kaisha Toshiba | Semiconductor laser device |
| US7023787B2 (en) | 2002-03-01 | 2006-04-04 | Sharp Kabushiki Kaisha | Optical pickup device |
| JP2006139814A (en) * | 2004-11-10 | 2006-06-01 | Hitachi Media Electoronics Co Ltd | Optical processing apparatus, optical pickup and optical disc system |
| JP2006252773A (en) * | 2006-06-26 | 2006-09-21 | Hitachi Media Electoronics Co Ltd | Optical pickup and optical disc apparatus |
| CN100382168C (en) * | 2004-06-01 | 2008-04-16 | 三星电机株式会社 | Integrated optical system and method of manufacturing the same and information recording and/or reproducing apparatus |
| US7417934B2 (en) * | 2003-01-24 | 2008-08-26 | Samsung Electronics Co., Ltd. | Optical pickup |
| US7492695B2 (en) | 2004-03-29 | 2009-02-17 | Sharp Kabushiki Kaisha | Optical pick-up capable of increasing the quantity of received laser beam |
| JP2010157353A (en) * | 2010-03-12 | 2010-07-15 | Hitachi Media Electoronics Co Ltd | Optical pickup |
| JP2013039714A (en) * | 2011-08-15 | 2013-02-28 | Ricoh Co Ltd | Light source apparatus, light scanning apparatus, and image formation apparatus |
| DE102017207224A1 (en) * | 2017-04-28 | 2018-10-31 | pmdtechnologies ag | Illumination module with a surface emitter and a monitor receiver |
-
1991
- 1991-05-07 JP JP3101321A patent/JPH04332185A/en active Pending
Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6687272B2 (en) | 2001-09-18 | 2004-02-03 | Kabushiki Kaisha Toshiba | Semiconductor laser device |
| US7023787B2 (en) | 2002-03-01 | 2006-04-04 | Sharp Kabushiki Kaisha | Optical pickup device |
| US7417934B2 (en) * | 2003-01-24 | 2008-08-26 | Samsung Electronics Co., Ltd. | Optical pickup |
| US7492695B2 (en) | 2004-03-29 | 2009-02-17 | Sharp Kabushiki Kaisha | Optical pick-up capable of increasing the quantity of received laser beam |
| CN100382168C (en) * | 2004-06-01 | 2008-04-16 | 三星电机株式会社 | Integrated optical system and method of manufacturing the same and information recording and/or reproducing apparatus |
| US7558161B2 (en) | 2004-06-01 | 2009-07-07 | Samsung Electro-Mechanics Co., Ltd | Integrated optical system and method of manufacturing the same and information recording and/or reproducing apparatus using the integrated optical system |
| JP2006139814A (en) * | 2004-11-10 | 2006-06-01 | Hitachi Media Electoronics Co Ltd | Optical processing apparatus, optical pickup and optical disc system |
| JP2006252773A (en) * | 2006-06-26 | 2006-09-21 | Hitachi Media Electoronics Co Ltd | Optical pickup and optical disc apparatus |
| JP2010157353A (en) * | 2010-03-12 | 2010-07-15 | Hitachi Media Electoronics Co Ltd | Optical pickup |
| JP2013039714A (en) * | 2011-08-15 | 2013-02-28 | Ricoh Co Ltd | Light source apparatus, light scanning apparatus, and image formation apparatus |
| DE102017207224A1 (en) * | 2017-04-28 | 2018-10-31 | pmdtechnologies ag | Illumination module with a surface emitter and a monitor receiver |
| DE102017207224B4 (en) | 2017-04-28 | 2024-01-04 | pmdtechnologies ag | Illumination module with a surface emitter and a monitor receiver |
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